JPWO2025134255A5 - - Google Patents

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Publication number
JPWO2025134255A5
JPWO2025134255A5 JP2024543362A JP2024543362A JPWO2025134255A5 JP WO2025134255 A5 JPWO2025134255 A5 JP WO2025134255A5 JP 2024543362 A JP2024543362 A JP 2024543362A JP 2024543362 A JP2024543362 A JP 2024543362A JP WO2025134255 A5 JPWO2025134255 A5 JP WO2025134255A5
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JP
Japan
Prior art keywords
semiconductor layer
electromagnetic wave
layer
dimensional material
material layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2024543362A
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English (en)
Japanese (ja)
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JPWO2025134255A1 (https=
JP7562054B1 (ja
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Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/045632 external-priority patent/WO2025134255A1/ja
Application granted granted Critical
Publication of JP7562054B1 publication Critical patent/JP7562054B1/ja
Publication of JPWO2025134255A1 publication Critical patent/JPWO2025134255A1/ja
Publication of JPWO2025134255A5 publication Critical patent/JPWO2025134255A5/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2024543362A 2023-12-20 2023-12-20 電磁波検出器及び電磁波検出器アレイ Active JP7562054B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2023/045632 WO2025134255A1 (ja) 2023-12-20 2023-12-20 電磁波検出器及び電磁波検出器アレイ

Publications (3)

Publication Number Publication Date
JP7562054B1 JP7562054B1 (ja) 2024-10-04
JPWO2025134255A1 JPWO2025134255A1 (https=) 2025-06-26
JPWO2025134255A5 true JPWO2025134255A5 (https=) 2025-11-19

Family

ID=92909814

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024543362A Active JP7562054B1 (ja) 2023-12-20 2023-12-20 電磁波検出器及び電磁波検出器アレイ

Country Status (2)

Country Link
JP (1) JP7562054B1 (https=)
WO (1) WO2025134255A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120035233B (zh) * 2025-02-24 2025-11-25 中国科学院上海技术物理研究所 一种外尔半金属长波红外探测器及其制备方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101938934B1 (ko) * 2016-03-02 2019-04-10 광주과학기술원 이득조절이 가능한 그래핀-반도체 쇼트키 접합 광전소자
CN114041210B (zh) * 2019-07-04 2024-07-12 三菱电机株式会社 电磁波检测器
JP7374222B2 (ja) * 2019-12-17 2023-11-06 三菱電機株式会社 電磁波検出器および電磁波検出器集合体

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