JPWO2025022875A1 - - Google Patents
Info
- Publication number
- JPWO2025022875A1 JPWO2025022875A1 JP2025535638A JP2025535638A JPWO2025022875A1 JP WO2025022875 A1 JPWO2025022875 A1 JP WO2025022875A1 JP 2025535638 A JP2025535638 A JP 2025535638A JP 2025535638 A JP2025535638 A JP 2025535638A JP WO2025022875 A1 JPWO2025022875 A1 JP WO2025022875A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/04—Display or data processing devices
- G01Q30/06—Display or data processing devices for error compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Microscoopes, Condenser (AREA)
- Image Processing (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023120659 | 2023-07-25 | ||
| PCT/JP2024/021980 WO2025022875A1 (ja) | 2023-07-25 | 2024-06-18 | 画像処理方法、プログラム、画像処理装置、および走査型プローブ顕微鏡 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2025022875A1 true JPWO2025022875A1 (https=) | 2025-01-30 |
| JPWO2025022875A5 JPWO2025022875A5 (https=) | 2026-04-21 |
Family
ID=94374961
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025535638A Pending JPWO2025022875A1 (https=) | 2023-07-25 | 2024-06-18 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2025022875A1 (https=) |
| CN (1) | CN121844213A (https=) |
| WO (1) | WO2025022875A1 (https=) |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06147821A (ja) * | 1992-11-12 | 1994-05-27 | Hitachi Constr Mach Co Ltd | 走査型探針顕微鏡像の傾斜補正方法 |
| JP4136157B2 (ja) * | 1999-02-09 | 2008-08-20 | オリンパス株式会社 | 分子測長方法 |
| JP2002092586A (ja) * | 2000-09-14 | 2002-03-29 | Olympus Optical Co Ltd | 画像解析装置、画像解析方法および画像解析処理をするための処理プログラムを記録した記録媒体 |
| JP2004233242A (ja) * | 2003-01-31 | 2004-08-19 | Jeol Ltd | 走査プローブ顕微鏡 |
| JP5481883B2 (ja) * | 2009-03-05 | 2014-04-23 | 株式会社島津製作所 | 特定部位検出方法を用いた試料分析装置 |
| JP5601133B2 (ja) * | 2010-10-01 | 2014-10-08 | 大日本印刷株式会社 | 画像処理装置、画像処理方法、プログラムおよび記憶媒体 |
| JP7218262B2 (ja) * | 2019-09-12 | 2023-02-06 | 株式会社日立ハイテク | パターン高さ情報補正システム及びパターン高さ情報の補正方法 |
| KR102275433B1 (ko) * | 2019-09-23 | 2021-07-09 | 전남대학교산학협력단 | Afm 이미지의 그림자 효과 제거를 위한 보정 시스템 및 그 방법 |
| CN118974567A (zh) * | 2022-04-07 | 2024-11-15 | 株式会社岛津制作所 | 数据处理方法、程序、图像处理装置以及扫描型探针显微镜 |
-
2024
- 2024-06-18 CN CN202480058982.1A patent/CN121844213A/zh active Pending
- 2024-06-18 WO PCT/JP2024/021980 patent/WO2025022875A1/ja active Pending
- 2024-06-18 JP JP2025535638A patent/JPWO2025022875A1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CN121844213A (zh) | 2026-04-10 |
| WO2025022875A1 (ja) | 2025-01-30 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20260123 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260123 |