JPWO2025018126A5 - - Google Patents

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Publication number
JPWO2025018126A5
JPWO2025018126A5 JP2025533943A JP2025533943A JPWO2025018126A5 JP WO2025018126 A5 JPWO2025018126 A5 JP WO2025018126A5 JP 2025533943 A JP2025533943 A JP 2025533943A JP 2025533943 A JP2025533943 A JP 2025533943A JP WO2025018126 A5 JPWO2025018126 A5 JP WO2025018126A5
Authority
JP
Japan
Prior art keywords
waveform
sample
analysis unit
abnormality
replaced
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2025533943A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2025018126A1 (https=
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2024/023542 external-priority patent/WO2025018126A1/ja
Publication of JPWO2025018126A1 publication Critical patent/JPWO2025018126A1/ja
Publication of JPWO2025018126A5 publication Critical patent/JPWO2025018126A5/ja
Pending legal-status Critical Current

Links

JP2025533943A 2023-07-19 2024-06-28 Pending JPWO2025018126A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2023117789 2023-07-19
PCT/JP2024/023542 WO2025018126A1 (ja) 2023-07-19 2024-06-28 分析装置および異常の有無を判定する方法

Publications (2)

Publication Number Publication Date
JPWO2025018126A1 JPWO2025018126A1 (https=) 2025-01-23
JPWO2025018126A5 true JPWO2025018126A5 (https=) 2025-11-26

Family

ID=94281337

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2025533943A Pending JPWO2025018126A1 (https=) 2023-07-19 2024-06-28

Country Status (3)

Country Link
JP (1) JPWO2025018126A1 (https=)
CN (1) CN120752524A (https=)
WO (1) WO2025018126A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025258698A1 (ja) * 2024-06-11 2025-12-18 株式会社日立ハイテク 自動分析装置、異常検知システム及び異常検知方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004219352A (ja) * 2003-01-17 2004-08-05 Toshiba Corp 分析装置及び管理システム
JP5080211B2 (ja) * 2007-11-09 2012-11-21 ベックマン コールター， インコーポレイテッド 分析装置
JP6896684B2 (ja) * 2018-09-13 2021-06-30 株式会社日立ハイテク 電解質濃度測定装置
JP7267865B2 (ja) * 2019-07-19 2023-05-02 株式会社日立ハイテク 分析装置及び分析方法

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