JPWO2024116681A5 - - Google Patents

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Publication number
JPWO2024116681A5
JPWO2024116681A5 JP2024561262A JP2024561262A JPWO2024116681A5 JP WO2024116681 A5 JPWO2024116681 A5 JP WO2024116681A5 JP 2024561262 A JP2024561262 A JP 2024561262A JP 2024561262 A JP2024561262 A JP 2024561262A JP WO2024116681 A5 JPWO2024116681 A5 JP WO2024116681A5
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JP
Japan
Prior art keywords
sample
cryogen
freezing
liquid
contact area
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Pending
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JP2024561262A
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English (en)
Japanese (ja)
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JPWO2024116681A1 (https=
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Priority claimed from PCT/JP2023/038854 external-priority patent/WO2024116681A1/ja
Publication of JPWO2024116681A1 publication Critical patent/JPWO2024116681A1/ja
Publication of JPWO2024116681A5 publication Critical patent/JPWO2024116681A5/ja
Pending legal-status Critical Current

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JP2024561262A 2022-11-29 2023-10-27 Pending JPWO2024116681A1 (https=)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022189880 2022-11-29
JP2023122175 2023-07-27
PCT/JP2023/038854 WO2024116681A1 (ja) 2022-11-29 2023-10-27 凍結装置、顕微鏡、凍結方法、及び観察方法

Publications (2)

Publication Number Publication Date
JPWO2024116681A1 JPWO2024116681A1 (https=) 2024-06-06
JPWO2024116681A5 true JPWO2024116681A5 (https=) 2025-07-03

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ID=91323729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024561262A Pending JPWO2024116681A1 (https=) 2022-11-29 2023-10-27

Country Status (4)

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EP (1) EP4628868A4 (https=)
JP (1) JPWO2024116681A1 (https=)
CN (1) CN120265969A (https=)
WO (1) WO2024116681A1 (https=)

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59218417A (ja) * 1983-05-25 1984-12-08 Osaka Oxgen Ind Ltd 極低温検鏡法およびそれに用いる顕微鏡
JPS61263037A (ja) * 1985-05-16 1986-11-21 Univ Kyoto 凍結試料交換装置
JPH0725663Y2 (ja) * 1989-06-02 1995-06-07 株式会社ケット科学研究所 測定機用試料皿
JPH03134527A (ja) * 1989-10-19 1991-06-07 Osaka Gas Co Ltd 極微小量の試料の温度測定装置
GB0420657D0 (en) * 2004-09-16 2004-10-20 Thermo Shandon Ltd Cryostat and microtome
JP2007080517A (ja) * 2005-09-09 2007-03-29 Jeol Ltd 電子顕微鏡用クライオステージ
DE102012013267A1 (de) * 2012-07-04 2014-01-09 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Substrateinrichtung, Konservierungsgerät und Verfahren zur Kryokonservierung einer biologischen Probe
EP2853847B1 (en) * 2013-09-30 2016-02-03 Fei Company Preparation of cryogenic sample for charged-particle microscopy
JP6314051B2 (ja) 2014-05-29 2018-04-18 パナソニック インテレクチュアル プロパティ コーポレーション オブ アメリカＰａｎａｓｏｎｉｃ Ｉｎｔｅｌｌｅｃｔｕａｌ Ｐｒｏｐｅｒｔｙ Ｃｏｒｐｏｒａｔｉｏｎ ｏｆ Ａｍｅｒｉｃａ 空調機器を遠隔制御する端末装置の制御方法、端末装置が実行するプログラム及び端末装置が実行するレコメンド方法
EP3179229B1 (en) * 2015-12-11 2019-01-30 FEI Company Preparation of cryogenic sample for charged-particle microscopy
US10481055B2 (en) * 2016-08-26 2019-11-19 Simple Origin, Inc. System and method for refilling cryogen in microscope cryogen holders
US20240201056A1 (en) * 2021-04-27 2024-06-20 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Method and device for ultra-rapid cryo-fixation of a sample for microscopic studies
CN117642669A (zh) * 2021-05-12 2024-03-01 国立大学法人大阪大学 显微镜和观察方法
JP7759280B2 (ja) 2022-02-22 2025-10-23 Ｊｆｅ建材株式会社 デッキプレートの製造方法

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