JPWO2024075385A1 - - Google Patents
Info
- Publication number
- JPWO2024075385A1 JPWO2024075385A1 JP2024555636A JP2024555636A JPWO2024075385A1 JP WO2024075385 A1 JPWO2024075385 A1 JP WO2024075385A1 JP 2024555636 A JP2024555636 A JP 2024555636A JP 2024555636 A JP2024555636 A JP 2024555636A JP WO2024075385 A1 JPWO2024075385 A1 JP WO2024075385A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022160869 | 2022-10-05 | ||
| PCT/JP2023/028558 WO2024075385A1 (ja) | 2022-10-05 | 2023-08-04 | 表面粗さ計算装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024075385A1 true JPWO2024075385A1 (https=) | 2024-04-11 |
Family
ID=90607934
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024555636A Pending JPWO2024075385A1 (https=) | 2022-10-05 | 2023-08-04 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20250207913A1 (https=) |
| JP (1) | JPWO2024075385A1 (https=) |
| DE (1) | DE112023004143T5 (https=) |
| WO (1) | WO2024075385A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN120412857B (zh) * | 2025-07-02 | 2025-09-16 | 北京特思迪半导体设备有限公司 | 粗糙表面生成方法及设备 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6105987B2 (ja) * | 2013-03-15 | 2017-03-29 | キヤノン株式会社 | 画像処理装置及びその制御方法 |
| US9797716B2 (en) * | 2015-01-09 | 2017-10-24 | Ricoh Company, Ltd. | Estimating surface properties using a plenoptic camera |
| JP2017071476A (ja) * | 2015-10-07 | 2017-04-13 | 三菱レイヨン株式会社 | ロールおよびウェブ搬送装置 |
| JP7488224B2 (ja) * | 2021-06-08 | 2024-05-21 | 住友重機械工業株式会社 | 表面粗さ測定方法、表面粗さ測定装置、及びプログラム |
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2023
- 2023-08-04 JP JP2024555636A patent/JPWO2024075385A1/ja active Pending
- 2023-08-04 WO PCT/JP2023/028558 patent/WO2024075385A1/ja not_active Ceased
- 2023-08-04 DE DE112023004143.1T patent/DE112023004143T5/de active Pending
-
2025
- 2025-03-10 US US19/075,745 patent/US20250207913A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024075385A1 (ja) | 2024-04-11 |
| DE112023004143T5 (de) | 2025-07-24 |
| US20250207913A1 (en) | 2025-06-26 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260213 |