JPWO2023276765A1 - - Google Patents
Info
- Publication number
- JPWO2023276765A1 JPWO2023276765A1 JP2023531827A JP2023531827A JPWO2023276765A1 JP WO2023276765 A1 JPWO2023276765 A1 JP WO2023276765A1 JP 2023531827 A JP2023531827 A JP 2023531827A JP 2023531827 A JP2023531827 A JP 2023531827A JP WO2023276765 A1 JPWO2023276765 A1 JP WO2023276765A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021109255 | 2021-06-30 | ||
PCT/JP2022/024600 WO2023276765A1 (ja) | 2021-06-30 | 2022-06-20 | 光出力測定装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2023276765A1 true JPWO2023276765A1 (zh) | 2023-01-05 |
Family
ID=84691765
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023531827A Pending JPWO2023276765A1 (zh) | 2021-06-30 | 2022-06-20 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPWO2023276765A1 (zh) |
WO (1) | WO2023276765A1 (zh) |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62298728A (ja) * | 1986-06-18 | 1987-12-25 | Fujitsu Ltd | 照度測定装置 |
JP2000332324A (ja) * | 1999-05-17 | 2000-11-30 | Ushio Inc | エキシマ光照射装置の照度測定機構 |
JP2002022602A (ja) * | 2000-07-07 | 2002-01-23 | Sony Corp | 光量むら検査装置及び光量むら検査方法 |
JP2002340667A (ja) * | 2001-05-15 | 2002-11-27 | Nikon Corp | 照度計測装置および露光装置 |
JP2004163272A (ja) * | 2002-11-13 | 2004-06-10 | Hamamatsu Photonics Kk | 冷却式光検出装置 |
JP4400156B2 (ja) * | 2003-09-19 | 2010-01-20 | パナソニック株式会社 | レーザ用出力モニタ |
JP5567912B2 (ja) * | 2010-06-25 | 2014-08-06 | リンテック株式会社 | 光照射装置及び光照射方法 |
JP2016200425A (ja) * | 2015-04-07 | 2016-12-01 | コニカミノルタ株式会社 | 紫外線照度測定装置および紫外線照射装置 |
KR101914191B1 (ko) * | 2015-05-15 | 2018-11-01 | 주식회사 파이맥스 | 램프의 광도분포 측정을 위한 고속 다채널 배광측정장치 |
CN211553075U (zh) * | 2020-02-21 | 2020-09-22 | 河北申科磁性材料有限公司 | 一种非晶材料熔炼红外测温系统 |
-
2022
- 2022-06-20 WO PCT/JP2022/024600 patent/WO2023276765A1/ja active Application Filing
- 2022-06-20 JP JP2023531827A patent/JPWO2023276765A1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2023276765A1 (ja) | 2023-01-05 |