JPWO2023119897A1 - - Google Patents
Info
- Publication number
- JPWO2023119897A1 JPWO2023119897A1 JP2023569133A JP2023569133A JPWO2023119897A1 JP WO2023119897 A1 JPWO2023119897 A1 JP WO2023119897A1 JP 2023569133 A JP2023569133 A JP 2023569133A JP 2023569133 A JP2023569133 A JP 2023569133A JP WO2023119897 A1 JPWO2023119897 A1 JP WO2023119897A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021206915 | 2021-12-21 | ||
| PCT/JP2022/040970 WO2023119897A1 (ja) | 2021-12-21 | 2022-11-02 | プローブヘッド |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023119897A1 true JPWO2023119897A1 (https=) | 2023-06-29 |
| JPWO2023119897A5 JPWO2023119897A5 (https=) | 2025-10-21 |
Family
ID=86902033
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023569133A Pending JPWO2023119897A1 (https=) | 2021-12-21 | 2022-11-02 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20250060393A1 (https=) |
| JP (1) | JPWO2023119897A1 (https=) |
| CN (1) | CN118382811A (https=) |
| TW (1) | TW202326149A (https=) |
| WO (1) | WO2023119897A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7734517B2 (ja) * | 2021-06-24 | 2025-09-05 | 株式会社ヨコオ | ソケット |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006300581A (ja) * | 2005-04-18 | 2006-11-02 | Yokowo Co Ltd | プローブの組付け構造 |
| US8493085B2 (en) * | 2009-03-27 | 2013-07-23 | Essai, Inc. | Spring contact pin for an ic test socket and the like |
| KR101415722B1 (ko) * | 2010-06-25 | 2014-07-25 | 니혼 하츠쵸 가부시키가이샤 | 콘택트 프로브 및 프로브 유닛 |
| WO2015122472A1 (ja) * | 2014-02-13 | 2015-08-20 | 日本発條株式会社 | プローブユニット |
| JP2020165803A (ja) * | 2019-03-29 | 2020-10-08 | 山一電機株式会社 | コンタクトプローブ及びこれを備えた検査用ソケット |
| JP7335507B2 (ja) * | 2019-12-10 | 2023-08-30 | 山一電機株式会社 | 検査用ソケット |
| JP7602112B2 (ja) * | 2020-11-17 | 2024-12-18 | 山一電機株式会社 | 検査用ソケット |
| JP7734517B2 (ja) * | 2021-06-24 | 2025-09-05 | 株式会社ヨコオ | ソケット |
| JP7605717B2 (ja) * | 2021-09-02 | 2024-12-24 | 山一電機株式会社 | プローブ及び検査用ソケット |
-
2022
- 2022-11-02 WO PCT/JP2022/040970 patent/WO2023119897A1/ja not_active Ceased
- 2022-11-02 US US18/721,869 patent/US20250060393A1/en active Pending
- 2022-11-02 JP JP2023569133A patent/JPWO2023119897A1/ja active Pending
- 2022-11-02 CN CN202280081062.2A patent/CN118382811A/zh active Pending
- 2022-11-02 TW TW111141857A patent/TW202326149A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2023119897A1 (ja) | 2023-06-29 |
| TW202326149A (zh) | 2023-07-01 |
| US20250060393A1 (en) | 2025-02-20 |
| CN118382811A (zh) | 2024-07-23 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20251010 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20251010 |