JPWO2023053728A1 - - Google Patents
Info
- Publication number
- JPWO2023053728A1 JPWO2023053728A1 JP2023550428A JP2023550428A JPWO2023053728A1 JP WO2023053728 A1 JPWO2023053728 A1 JP WO2023053728A1 JP 2023550428 A JP2023550428 A JP 2023550428A JP 2023550428 A JP2023550428 A JP 2023550428A JP WO2023053728 A1 JPWO2023053728 A1 JP WO2023053728A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/23—Clustering techniques
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—Two-dimensional [2D] image generation
- G06T11/20—Drawing from basic elements
- G06T11/23—Drawing from basic elements using straight lines or curves
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/11—Region-based segmentation
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/20—Image preprocessing
- G06V10/25—Determination of region of interest [ROI] or a volume of interest [VOI]
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/20—Image preprocessing
- G06V10/26—Segmentation of patterns in the image field; Cutting or merging of image elements to establish the pattern region, e.g. clustering-based techniques; Detection of occlusion
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/06—Recognition of objects for industrial automation
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/07—Target detection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Data Mining & Analysis (AREA)
- Pathology (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Evolutionary Computation (AREA)
- Geometry (AREA)
- Artificial Intelligence (AREA)
- General Engineering & Computer Science (AREA)
- Bioinformatics & Computational Biology (AREA)
- Evolutionary Biology (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021159740 | 2021-09-29 | ||
| JP2021159740 | 2021-09-29 | ||
| PCT/JP2022/030414 WO2023053728A1 (ja) | 2021-09-29 | 2022-08-09 | 表示処理装置、表示処理方法、及び、表示処理プログラム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2023053728A1 true JPWO2023053728A1 (https=) | 2023-04-06 |
| JPWO2023053728A5 JPWO2023053728A5 (https=) | 2024-06-17 |
| JP7828357B2 JP7828357B2 (ja) | 2026-03-11 |
Family
ID=85782287
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023550428A Active JP7828357B2 (ja) | 2021-09-29 | 2022-08-09 | 表示処理装置、表示処理方法、及び、表示処理プログラム |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20240221343A1 (https=) |
| EP (1) | EP4411356A4 (https=) |
| JP (1) | JP7828357B2 (https=) |
| CN (1) | CN117957439A (https=) |
| WO (1) | WO2023053728A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118318157A (zh) * | 2022-10-21 | 2024-07-09 | 株式会社东芝 | 判断装置 |
| JPWO2025023191A1 (https=) * | 2023-07-21 | 2025-01-30 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010164318A (ja) * | 2009-01-13 | 2010-07-29 | Nippon Steel Corp | 欠陥検査方法および欠陥検査装置 |
| JP2020144688A (ja) * | 2019-03-07 | 2020-09-10 | 株式会社Ihi | 学習方法、学習装置、及び当該学習装置を備える溶接欠陥検出装置 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0563897A1 (en) * | 1992-03-30 | 1993-10-06 | Fuji Photo Film Co., Ltd. | Defect inspection system |
| JP4211092B2 (ja) * | 1998-08-27 | 2009-01-21 | 株式会社Ｉｈｉ | 放射線透過検査における溶接欠陥自動検出法 |
| JP3964267B2 (ja) * | 2002-06-04 | 2007-08-22 | 大日本スクリーン製造株式会社 | 欠陥検出装置、欠陥検出方法、およびプログラム |
| JP4702952B2 (ja) * | 2006-06-01 | 2011-06-15 | 大日本スクリーン製造株式会社 | ムラ検査方法、ムラ検査装置およびプログラム |
| JP2008170256A (ja) * | 2007-01-11 | 2008-07-24 | Seiko Epson Corp | 欠陥検出方法、欠陥検出プログラムおよび検査装置 |
| JP4970101B2 (ja) | 2007-03-26 | 2012-07-04 | 大日本スクリーン製造株式会社 | 欠陥検出方法 |
| JP4262297B2 (ja) * | 2008-07-25 | 2009-05-13 | 大日本スクリーン製造株式会社 | クラスタ生成装置、欠陥分類装置、クラスタ生成方法およびプログラム |
| JP5351673B2 (ja) * | 2009-09-09 | 2013-11-27 | パナソニック株式会社 | 外観検査装置、外観検査方法 |
| JP5943722B2 (ja) * | 2012-06-08 | 2016-07-05 | 三菱重工業株式会社 | 欠陥判定装置、放射線撮像システム、及び欠陥判定方法 |
| JP2015040827A (ja) * | 2013-08-23 | 2015-03-02 | シャープ株式会社 | 欠陥判定装置および欠陥判定方法 |
| JP2016200444A (ja) * | 2015-04-08 | 2016-12-01 | 一般財団法人電力中央研究所 | ボイドの計測方法、計測装置、及び計測プログラム |
| JP6654649B2 (ja) * | 2015-12-14 | 2020-02-26 | 株式会社ニコン・トリンブル | 欠陥検出装置及びプログラム |
| US10325363B2 (en) * | 2016-01-15 | 2019-06-18 | Instrumental, Inc. | Methods for automatically generating a common measurement across multiple assembly units |
| KR102814354B1 (ko) * | 2019-12-05 | 2025-05-30 | 차나안 브라이트 사이트 컴퍼니 리미티드 | 문자 분할 방법, 장치 및 컴퓨터 판독 가능 저장 매체 |
| CN111462113B (zh) * | 2020-04-24 | 2021-12-28 | 上海精测半导体技术有限公司 | 无图形晶圆的复检方法 |
| WO2022116109A1 (en) * | 2020-12-03 | 2022-06-09 | Boe Technology Group Co., Ltd. | Computer-implemented method for defect analysis, apparatus for defect analysis, computer-program product, and intelligent defect analysis system |
-
2022
- 2022-08-09 WO PCT/JP2022/030414 patent/WO2023053728A1/ja not_active Ceased
- 2022-08-09 CN CN202280061993.6A patent/CN117957439A/zh active Pending
- 2022-08-09 JP JP2023550428A patent/JP7828357B2/ja active Active
- 2022-08-09 EP EP22875603.7A patent/EP4411356A4/en active Pending
-
2024
- 2024-03-19 US US18/609,290 patent/US20240221343A1/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010164318A (ja) * | 2009-01-13 | 2010-07-29 | Nippon Steel Corp | 欠陥検査方法および欠陥検査装置 |
| JP2020144688A (ja) * | 2019-03-07 | 2020-09-10 | 株式会社Ihi | 学習方法、学習装置、及び当該学習装置を備える溶接欠陥検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP4411356A1 (en) | 2024-08-07 |
| JP7828357B2 (ja) | 2026-03-11 |
| EP4411356A4 (en) | 2025-01-22 |
| WO2023053728A1 (ja) | 2023-04-06 |
| US20240221343A1 (en) | 2024-07-04 |
| CN117957439A (zh) | 2024-04-30 |
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