JPWO2023002585A1 - - Google Patents
Info
- Publication number
- JPWO2023002585A1 JPWO2023002585A1 JP2023536276A JP2023536276A JPWO2023002585A1 JP WO2023002585 A1 JPWO2023002585 A1 JP WO2023002585A1 JP 2023536276 A JP2023536276 A JP 2023536276A JP 2023536276 A JP2023536276 A JP 2023536276A JP WO2023002585 A1 JPWO2023002585 A1 JP WO2023002585A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
- G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2021/027218 WO2023002585A1 (ja) | 2021-07-20 | 2021-07-20 | 遠赤外分光装置、及び試料アダプター |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2023002585A1 true JPWO2023002585A1 (ja) | 2023-01-26 |
JPWO2023002585A5 JPWO2023002585A5 (ja) | 2024-03-15 |
Family
ID=84979025
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023536276A Pending JPWO2023002585A1 (ja) | 2021-07-20 | 2021-07-20 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20240288365A1 (ja) |
JP (1) | JPWO2023002585A1 (ja) |
DE (1) | DE112021007663T5 (ja) |
WO (1) | WO2023002585A1 (ja) |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4201118B2 (ja) * | 2001-10-19 | 2008-12-24 | 日本フイルコン株式会社 | 光分析用セルとこのセルを用いた光分析装置及び光分析方法 |
JP5014466B2 (ja) * | 2010-06-04 | 2012-08-29 | 徹 小幡 | ゲル粒子測定装置 |
JP2014209094A (ja) * | 2013-03-29 | 2014-11-06 | キヤノン株式会社 | テラヘルツ波を用いて試料の情報を取得する情報取得装置および情報取得方法 |
JP2014196966A (ja) * | 2013-03-29 | 2014-10-16 | コニカミノルタ株式会社 | 屈折率分布測定用基準素子ならびに屈折率分布測定装置および該方法 |
JP6700699B2 (ja) * | 2014-12-08 | 2020-05-27 | キヤノン株式会社 | 屈折率分布計測方法、屈折率分布計測装置、及び光学素子の製造方法 |
JP6605603B2 (ja) * | 2015-07-22 | 2019-11-13 | 株式会社日立ハイテクノロジーズ | 遠赤外分光装置 |
JP7012098B2 (ja) | 2017-12-13 | 2022-02-10 | 株式会社日立ハイテク | 遠赤外光源、遠赤外分光装置 |
JP2020051915A (ja) * | 2018-09-27 | 2020-04-02 | ウシオ電機株式会社 | 光学測定装置および光学測定方法 |
WO2021131014A1 (ja) * | 2019-12-27 | 2021-07-01 | 株式会社日立ハイテク | 遠赤外分光装置、遠赤外分光方法 |
-
2021
- 2021-07-20 JP JP2023536276A patent/JPWO2023002585A1/ja active Pending
- 2021-07-20 WO PCT/JP2021/027218 patent/WO2023002585A1/ja active Application Filing
- 2021-07-20 DE DE112021007663.9T patent/DE112021007663T5/de active Pending
- 2021-07-20 US US18/569,861 patent/US20240288365A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
DE112021007663T5 (de) | 2024-02-29 |
US20240288365A1 (en) | 2024-08-29 |
WO2023002585A1 (ja) | 2023-01-26 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20231211 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20231211 |