JPWO2023002585A1 - - Google Patents

Info

Publication number
JPWO2023002585A1
JPWO2023002585A1 JP2023536276A JP2023536276A JPWO2023002585A1 JP WO2023002585 A1 JPWO2023002585 A1 JP WO2023002585A1 JP 2023536276 A JP2023536276 A JP 2023536276A JP 2023536276 A JP2023536276 A JP 2023536276A JP WO2023002585 A1 JPWO2023002585 A1 JP WO2023002585A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023536276A
Other versions
JPWO2023002585A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023002585A1 publication Critical patent/JPWO2023002585A1/ja
Publication of JPWO2023002585A5 publication Critical patent/JPWO2023002585A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2023536276A 2021-07-20 2021-07-20 Pending JPWO2023002585A1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/027218 WO2023002585A1 (ja) 2021-07-20 2021-07-20 遠赤外分光装置、及び試料アダプター

Publications (2)

Publication Number Publication Date
JPWO2023002585A1 true JPWO2023002585A1 (ja) 2023-01-26
JPWO2023002585A5 JPWO2023002585A5 (ja) 2024-03-15

Family

ID=84979025

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023536276A Pending JPWO2023002585A1 (ja) 2021-07-20 2021-07-20

Country Status (3)

Country Link
JP (1) JPWO2023002585A1 (ja)
DE (1) DE112021007663T5 (ja)
WO (1) WO2023002585A1 (ja)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4201118B2 (ja) * 2001-10-19 2008-12-24 日本フイルコン株式会社 光分析用セルとこのセルを用いた光分析装置及び光分析方法
JP5014466B2 (ja) * 2010-06-04 2012-08-29 徹 小幡 ゲル粒子測定装置
JP2014209094A (ja) * 2013-03-29 2014-11-06 キヤノン株式会社 テラヘルツ波を用いて試料の情報を取得する情報取得装置および情報取得方法
JP2014196966A (ja) * 2013-03-29 2014-10-16 コニカミノルタ株式会社 屈折率分布測定用基準素子ならびに屈折率分布測定装置および該方法
JP6700699B2 (ja) * 2014-12-08 2020-05-27 キヤノン株式会社 屈折率分布計測方法、屈折率分布計測装置、及び光学素子の製造方法
DE112015006624T5 (de) * 2015-07-22 2018-03-22 Hitachi High-Technologies Corporation Ferninfrarotspektroskopievorrichtung
DE112017008083B4 (de) 2017-12-13 2024-03-21 Hitachi High-Tech Corporation Ferninfrarotlichtquelle und ferninfrarotspektrometer
JP2020051915A (ja) * 2018-09-27 2020-04-02 ウシオ電機株式会社 光学測定装置および光学測定方法
WO2021131014A1 (ja) * 2019-12-27 2021-07-01 株式会社日立ハイテク 遠赤外分光装置、遠赤外分光方法

Also Published As

Publication number Publication date
WO2023002585A1 (ja) 2023-01-26
DE112021007663T5 (de) 2024-02-29

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Legal Events

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Effective date: 20231211

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