JPWO2022244246A1 - - Google Patents

Info

Publication number
JPWO2022244246A1
JPWO2022244246A1 JP2021559707A JP2021559707A JPWO2022244246A1 JP WO2022244246 A1 JPWO2022244246 A1 JP WO2022244246A1 JP 2021559707 A JP2021559707 A JP 2021559707A JP 2021559707 A JP2021559707 A JP 2021559707A JP WO2022244246 A1 JPWO2022244246 A1 JP WO2022244246A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021559707A
Other versions
JP7053969B1 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of JP7053969B1 publication Critical patent/JP7053969B1/ja
Publication of JPWO2022244246A1 publication Critical patent/JPWO2022244246A1/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2021559707A 2021-05-21 2021-05-21 Ｉｃのノイズ耐量検出装置、ｉｃのノイズ耐量検出方法、およびｉｃの内部インピーダンス測定方法 Active JP7053969B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/019384 WO2022244246A1 (ja) 2021-05-21 2021-05-21 Ｉｃのノイズ耐量検出装置、ｉｃのノイズ耐量検出方法、およびｉｃの内部インピーダンス測定方法

Publications (2)

Publication Number Publication Date
JP7053969B1 JP7053969B1 (ja) 2022-04-12
JPWO2022244246A1 true JPWO2022244246A1 (ja) 2022-11-24

Family

ID=81260042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021559707A Active JP7053969B1 (ja) 2021-05-21 2021-05-21 Ｉｃのノイズ耐量検出装置、ｉｃのノイズ耐量検出方法、およびｉｃの内部インピーダンス測定方法

Country Status (5)

Country Link
JP (1) JP7053969B1 (ja)
KR (1) KR20230170949A (ja)
CN (1) CN117321429A (ja)
DE (1) DE112021007695T5 (ja)
WO (1) WO2022244246A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023223414A1 (ja) * 2022-05-17 2023-11-23 日本電信電話株式会社 周波数帯域推定装置、周波数帯域推定方法、ｅｍｓ試験方法、及び、周波数帯域推定プログラム
CN116318381B (zh) * 2023-05-22 2023-07-21 电子科技大学 一种微波段时间光子晶体的时间维度拓扑边界态观测方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3220995B2 (ja) * 1991-02-27 2001-10-22 安藤電気株式会社 Ｉｃ回路の入力インピーダンス測定回路
JP2000314755A (ja) * 1999-04-28 2000-11-14 Ricoh Co Ltd 近傍電磁界検知プローブシステム
JP2003107116A (ja) * 2001-09-28 2003-04-09 Hitachi Ltd 電磁波波源探査法および電磁波波源探査のためのプログラムならびに電磁波波源探査に用いる探査用アンテナ
WO2003051197A1 (en) * 2001-12-18 2003-06-26 Mri Devices Corporation Method and apparatus for noise tomography
JP3613269B2 (ja) * 2002-08-28 2005-01-26 日本電気株式会社 ノイズイミュニティ評価装置及びノイズイミュニティ評価方法
JP2004150840A (ja) * 2002-10-29 2004-05-27 Hitachi Ltd 半導体集積回路の不良解析装置、システムおよび検出方法
JP2011041209A (ja) * 2009-08-18 2011-02-24 Panasonic Corp 半導体装置
JP2013137222A (ja) * 2011-12-28 2013-07-11 Tokyo Denshi Koeki Kk 静電気放電検出装置、静電気放電検出方法、変動電界耐性検査装置
JP7075121B2 (ja) 2018-08-21 2022-05-25 地方独立行政法人東京都立産業技術研究センター 電子製品の評価方法および評価装置

Also Published As

Publication number Publication date
DE112021007695T5 (de) 2024-03-07
JP7053969B1 (ja) 2022-04-12
WO2022244246A1 (ja) 2022-11-24
KR20230170949A (ko) 2023-12-19
CN117321429A (zh) 2023-12-29

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