JPWO2022224636A1 - - Google Patents

Info

Publication number
JPWO2022224636A1
JPWO2022224636A1 JP2023516342A JP2023516342A JPWO2022224636A1 JP WO2022224636 A1 JPWO2022224636 A1 JP WO2022224636A1 JP 2023516342 A JP2023516342 A JP 2023516342A JP 2023516342 A JP2023516342 A JP 2023516342A JP WO2022224636 A1 JPWO2022224636 A1 JP WO2022224636A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023516342A
Other versions
JPWO2022224636A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022224636A1 publication Critical patent/JPWO2022224636A1/ja
Publication of JPWO2022224636A5 publication Critical patent/JPWO2022224636A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427Coatings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8841Illumination and detection on two sides of object
JP2023516342A 2021-04-22 2022-03-15 Pending JPWO2022224636A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021072442 2021-04-22
PCT/JP2022/011654 WO2022224636A1 (ja) 2021-04-22 2022-03-15 検査装置

Publications (2)

Publication Number Publication Date
JPWO2022224636A1 true JPWO2022224636A1 (ja) 2022-10-27
JPWO2022224636A5 JPWO2022224636A5 (ja) 2024-01-31

Family

ID=83722893

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023516342A Pending JPWO2022224636A1 (ja) 2021-04-22 2022-03-15

Country Status (6)

Country Link
EP (1) EP4328571A1 (ja)
JP (1) JPWO2022224636A1 (ja)
KR (1) KR20230174235A (ja)
CN (1) CN117222886A (ja)
TW (1) TW202242392A (ja)
WO (1) WO2022224636A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117491391B (zh) * 2023-12-29 2024-03-15 登景(天津)科技有限公司 基于芯片计算的玻璃基板光三维健康检测方法及设备

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5761550U (ja) * 1980-09-17 1982-04-12
JPH0723211U (ja) * 1993-10-04 1995-04-25 三菱樹脂株式会社 透明プラスチック板の検査装置
JP2001201429A (ja) * 2000-01-18 2001-07-27 Mitsubishi Chemicals Corp 検査基体の欠陥検査方法および装置
JP2003172707A (ja) 2001-12-05 2003-06-20 Shibuya Kogyo Co Ltd 反射防止膜を付した物品の検査方法とその装置
GB0307345D0 (en) * 2003-03-29 2003-05-07 Pilkington Plc Glazing inspection
JP4779506B2 (ja) * 2005-08-30 2011-09-28 大日本印刷株式会社 カラーフィルター用の基板およびその検査方法、検査装置
JP4960638B2 (ja) 2006-02-08 2012-06-27 積水化学工業株式会社 透明フィルムの検査方法
KR100838655B1 (ko) * 2006-10-27 2008-06-16 (주)쎄미시스코 유리기판의 품질 검사장치 및 그 검사방법
JP5253038B2 (ja) 2008-08-19 2013-07-31 日立造船株式会社 シート・フィルムのロール成形装置およびロール成形方法
TWI497061B (zh) * 2009-04-30 2015-08-21 Corning Inc 用以偵測玻璃板中的缺陷之方法及設備
US8935104B2 (en) * 2010-03-10 2015-01-13 3M Innovative Properties Company Application-specific repeat defect detection in web manufacturing processes
JP2012078144A (ja) * 2010-09-30 2012-04-19 Kaneka Corp 透明体シート状物の表面欠陥検査装置
JP6244260B2 (ja) * 2014-05-08 2017-12-06 株式会社神戸製鋼所 欠陥分析装置及び欠陥分析方法
CN108603847A (zh) * 2016-02-05 2018-09-28 东丽株式会社 片状物的检查装置及片状物的检查方法
JP7076280B2 (ja) 2018-04-27 2022-05-27 日立造船株式会社 測定方法および測定装置

Also Published As

Publication number Publication date
CN117222886A (zh) 2023-12-12
EP4328571A1 (en) 2024-02-28
WO2022224636A1 (ja) 2022-10-27
KR20230174235A (ko) 2023-12-27
TW202242392A (zh) 2022-11-01

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Legal Events

Date Code Title Description
A521 Request for written amendment filed

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Effective date: 20231010