JPWO2022172588A1 - - Google Patents

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Publication number
JPWO2022172588A1
JPWO2022172588A1 JP2022581212A JP2022581212A JPWO2022172588A1 JP WO2022172588 A1 JPWO2022172588 A1 JP WO2022172588A1 JP 2022581212 A JP2022581212 A JP 2022581212A JP 2022581212 A JP2022581212 A JP 2022581212A JP WO2022172588 A1 JPWO2022172588 A1 JP WO2022172588A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022581212A
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Japanese (ja)
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JP7842041B2 (ja
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Publication of JPWO2022172588A1 publication Critical patent/JPWO2022172588A1/ja
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Publication of JP7842041B2 publication Critical patent/JP7842041B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/40FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
    • H10D30/47FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having two-dimensional [2D] charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
    • H10D30/471High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT]
    • H10D30/475High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/015Manufacture or treatment of FETs having heterojunction interface channels or heterojunction gate electrodes, e.g. HEMT
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/111Field plates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/85Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
    • H10D62/8503Nitride Group III-V materials, e.g. AlN or GaN
JP2022581212A 2021-02-10 2021-12-16 窒化物半導体装置および窒化物半導体装置の製造方法 Active JP7842041B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021020035 2021-02-10
JP2021020035 2021-02-10
PCT/JP2021/046551 WO2022172588A1 (ja) 2021-02-10 2021-12-16 窒化物半導体装置および窒化物半導体装置の製造方法

Publications (2)

Publication Number Publication Date
JPWO2022172588A1 true JPWO2022172588A1 (https=) 2022-08-18
JP7842041B2 JP7842041B2 (ja) 2026-04-07

Family

ID=82838669

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022581212A Active JP7842041B2 (ja) 2021-02-10 2021-12-16 窒化物半導体装置および窒化物半導体装置の製造方法

Country Status (3)

Country Link
US (1) US20230387285A1 (https=)
JP (1) JP7842041B2 (https=)
WO (1) WO2022172588A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117133801A (zh) * 2022-05-20 2023-11-28 联华电子股份有限公司 具有场板结构的氮化镓元件及其制作方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015195288A (ja) * 2014-03-31 2015-11-05 住友電工デバイス・イノベーション株式会社 半導体装置及び半導体装置の製造方法
JP2017073506A (ja) * 2015-10-08 2017-04-13 ローム株式会社 窒化物半導体装置およびその製造方法
WO2020158394A1 (ja) * 2019-02-01 2020-08-06 ローム株式会社 窒化物半導体装置
WO2020174956A1 (ja) * 2019-02-28 2020-09-03 ローム株式会社 窒化物半導体装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7137947B2 (ja) * 2018-03-22 2022-09-15 ローム株式会社 窒化物半導体装置
US11127846B2 (en) * 2019-07-12 2021-09-21 Vanguard International Semiconductor Corporation High electron mobility transistor devices and methods for forming the same
US11398546B2 (en) * 2019-08-06 2022-07-26 Vanguard International Semiconductor Corporation Semiconductor devices and methods for fabricating the same
US11114532B2 (en) * 2019-11-20 2021-09-07 Vanguard International Semiconductor Corporation Semiconductor structures and methods of forming the same

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015195288A (ja) * 2014-03-31 2015-11-05 住友電工デバイス・イノベーション株式会社 半導体装置及び半導体装置の製造方法
JP2017073506A (ja) * 2015-10-08 2017-04-13 ローム株式会社 窒化物半導体装置およびその製造方法
WO2020158394A1 (ja) * 2019-02-01 2020-08-06 ローム株式会社 窒化物半導体装置
WO2020174956A1 (ja) * 2019-02-28 2020-09-03 ローム株式会社 窒化物半導体装置

Also Published As

Publication number Publication date
US20230387285A1 (en) 2023-11-30
WO2022172588A1 (ja) 2022-08-18
JP7842041B2 (ja) 2026-04-07

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