JPWO2022124134A1 - - Google Patents

Info

Publication number
JPWO2022124134A1
JPWO2022124134A1 JP2022568202A JP2022568202A JPWO2022124134A1 JP WO2022124134 A1 JPWO2022124134 A1 JP WO2022124134A1 JP 2022568202 A JP2022568202 A JP 2022568202A JP 2022568202 A JP2022568202 A JP 2022568202A JP WO2022124134 A1 JPWO2022124134 A1 JP WO2022124134A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022568202A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022124134A1 publication Critical patent/JPWO2022124134A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Non-Insulated Conductors (AREA)
JP2022568202A 2020-12-11 2021-11-30 Pending JPWO2022124134A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020206277 2020-12-11
PCT/JP2021/043786 WO2022124134A1 (ja) 2020-12-11 2021-11-30 異方導電性シートおよび電気検査方法

Publications (1)

Publication Number Publication Date
JPWO2022124134A1 true JPWO2022124134A1 (ja) 2022-06-16

Family

ID=81973903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022568202A Pending JPWO2022124134A1 (ja) 2020-12-11 2021-11-30

Country Status (6)

Country Link
US (1) US20240036102A1 (ja)
JP (1) JPWO2022124134A1 (ja)
KR (1) KR20230104706A (ja)
CN (1) CN116746007A (ja)
TW (1) TW202243337A (ja)
WO (1) WO2022124134A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023074760A1 (ja) * 2021-11-01 2023-05-04 三井化学株式会社 異方導電性シート、電気検査装置及び電気検査方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0332560B1 (en) * 1988-03-11 1994-03-02 International Business Machines Corporation Elastomeric connectors for electronic packaging and testing
JPH05152019A (ja) * 1991-11-28 1993-06-18 Nitto Denko Corp 異方導電コネクター
JPH1010191A (ja) * 1996-06-20 1998-01-16 Hitachi Ltd コネクタおよびそれを用いる半導体検査方法ならびに装置
KR100496841B1 (ko) * 2000-05-15 2005-06-22 몰렉스 인코포레이티드 엘라스토머 전기 커넥터
JP2001332321A (ja) * 2000-05-19 2001-11-30 Citizen Electronics Co Ltd 電気コネクタ及びその製造方法
JP2002139541A (ja) * 2000-10-30 2002-05-17 Jsr Corp 電気回路部品の検査治具および電気回路部品の検査方法
JP4294078B1 (ja) * 2008-06-30 2009-07-08 株式会社フジクラ 両面接続型コネクタ
CN110582895B (zh) 2017-05-18 2022-01-14 信越聚合物株式会社 电连接器及其制造方法
JP7175132B2 (ja) 2018-08-10 2022-11-18 信越ポリマー株式会社 電気コネクターの製造方法

Also Published As

Publication number Publication date
TW202243337A (zh) 2022-11-01
CN116746007A (zh) 2023-09-12
KR20230104706A (ko) 2023-07-10
WO2022124134A1 (ja) 2022-06-16
US20240036102A1 (en) 2024-02-01

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