JPWO2022059710A1 - - Google Patents

Info

Publication number
JPWO2022059710A1
JPWO2022059710A1 JP2022550587A JP2022550587A JPWO2022059710A1 JP WO2022059710 A1 JPWO2022059710 A1 JP WO2022059710A1 JP 2022550587 A JP2022550587 A JP 2022550587A JP 2022550587 A JP2022550587 A JP 2022550587A JP WO2022059710 A1 JPWO2022059710 A1 JP WO2022059710A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022550587A
Other languages
Japanese (ja)
Other versions
JPWO2022059710A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022059710A1 publication Critical patent/JPWO2022059710A1/ja
Publication of JPWO2022059710A5 publication Critical patent/JPWO2022059710A5/ja
Priority to JP2024100718A priority Critical patent/JP7803369B2/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20212—Image combination
    • G06T2207/20221—Image fusion; Image merging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30136—Metal
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP2022550587A 2020-09-18 2021-09-15 Pending JPWO2022059710A1 (https=)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024100718A JP7803369B2 (ja) 2020-09-18 2024-06-21 欠陥検査装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020157140 2020-09-18
PCT/JP2021/033951 WO2022059710A1 (ja) 2020-09-18 2021-09-15 欠陥検査装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024100718A Division JP7803369B2 (ja) 2020-09-18 2024-06-21 欠陥検査装置

Publications (2)

Publication Number Publication Date
JPWO2022059710A1 true JPWO2022059710A1 (https=) 2022-03-24
JPWO2022059710A5 JPWO2022059710A5 (https=) 2023-05-08

Family

ID=80776719

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2022550587A Pending JPWO2022059710A1 (https=) 2020-09-18 2021-09-15
JP2024100718A Active JP7803369B2 (ja) 2020-09-18 2024-06-21 欠陥検査装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024100718A Active JP7803369B2 (ja) 2020-09-18 2024-06-21 欠陥検査装置

Country Status (4)

Country Link
US (1) US12482086B2 (https=)
JP (2) JPWO2022059710A1 (https=)
CN (1) CN116490767A (https=)
WO (1) WO2022059710A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7248144B2 (ja) * 2019-10-25 2023-03-29 日本電気株式会社 欠陥位置判定システム、外観検査方法およびプログラム
US20240225415A1 (en) * 2021-05-25 2024-07-11 C. R. Bard, Inc. Endoscope Imaging System
JP7757854B2 (ja) 2022-03-28 2025-10-22 株式会社島津製作所 欠陥検出装置
CN116030015B (zh) * 2023-01-08 2025-09-09 北京交通大学 紧固件松动状态人工智能监测方法和巡检设备
CN116862914B (zh) * 2023-09-04 2023-12-26 深圳长盛高精密五金有限公司 基于深度学习的金属轴表面缺陷识别方法及系统

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07301623A (ja) * 1994-05-02 1995-11-14 Olympus Optical Co Ltd 超音波画像形成装置
JPH0891543A (ja) * 1994-09-28 1996-04-09 Omron Corp 画像処理方法およびその装置
JP2009518625A (ja) * 2005-12-02 2009-05-07 ザ・ボーイング・カンパニー 欠陥と検査位置を投影するシステム及び関連方法
JP2013171026A (ja) * 2012-02-23 2013-09-02 Keyence Corp 検査領域表示装置及び検査領域表示方法
JP2013205377A (ja) * 2012-03-29 2013-10-07 Nisshin Steel Co Ltd 表面検査装置の調整方法
JP2016075554A (ja) * 2014-10-06 2016-05-12 株式会社ディスコ ウエーハ検査方法及びウエーハ検査装置
JP2019082397A (ja) * 2017-10-30 2019-05-30 三菱日立パワーシステムズ検査株式会社 超音波探傷データ処理プログラム、超音波探傷データ処理装置及び被検体の評価方法
US20200098121A1 (en) * 2018-09-20 2020-03-26 Zebra Technologies Corporation Method and apparatus for classifying depth scans
KR20200045264A (ko) * 2018-10-22 2020-05-04 주식회사 고영테크놀러지 검사 영역 결정 방법 및 이를 이용하는 외관 검사 장치
WO2020110197A1 (ja) * 2018-11-27 2020-06-04 株式会社島津製作所 欠陥検査装置および欠陥検査方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4982213B2 (ja) * 2007-03-12 2012-07-25 株式会社日立ハイテクノロジーズ 欠陥検査装置及び欠陥検査方法
US9726644B2 (en) * 2014-07-11 2017-08-08 The Boeing Company Nondestructive inspection using acousto-optics
JP6451695B2 (ja) 2016-06-02 2019-01-16 株式会社島津製作所 欠陥検査方法及び欠陥検査装置
JP6805930B2 (ja) 2017-03-29 2020-12-23 株式会社島津製作所 振動測定装置
WO2019239618A1 (ja) * 2018-06-11 2019-12-19 株式会社島津製作所 欠陥検出方法及び装置
CN112204385A (zh) * 2018-06-29 2021-01-08 富士胶片株式会社 缺陷显示装置及方法
KR101935932B1 (ko) * 2018-09-21 2019-04-03 선문대학교 산학협력단 실린더 형상에 대한 iet 기법을 이용한 동탄성 측정방법
CN113227781B (zh) * 2018-12-20 2024-02-13 株式会社岛津制作所 缺陷检查装置和缺陷检查方法
CN109708861A (zh) * 2018-12-29 2019-05-03 东南大学 一种汽车排气管热振动检测方法及检测系统、计算机程序

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07301623A (ja) * 1994-05-02 1995-11-14 Olympus Optical Co Ltd 超音波画像形成装置
JPH0891543A (ja) * 1994-09-28 1996-04-09 Omron Corp 画像処理方法およびその装置
JP2009518625A (ja) * 2005-12-02 2009-05-07 ザ・ボーイング・カンパニー 欠陥と検査位置を投影するシステム及び関連方法
JP2013171026A (ja) * 2012-02-23 2013-09-02 Keyence Corp 検査領域表示装置及び検査領域表示方法
JP2013205377A (ja) * 2012-03-29 2013-10-07 Nisshin Steel Co Ltd 表面検査装置の調整方法
JP2016075554A (ja) * 2014-10-06 2016-05-12 株式会社ディスコ ウエーハ検査方法及びウエーハ検査装置
JP2019082397A (ja) * 2017-10-30 2019-05-30 三菱日立パワーシステムズ検査株式会社 超音波探傷データ処理プログラム、超音波探傷データ処理装置及び被検体の評価方法
US20200098121A1 (en) * 2018-09-20 2020-03-26 Zebra Technologies Corporation Method and apparatus for classifying depth scans
KR20200045264A (ko) * 2018-10-22 2020-05-04 주식회사 고영테크놀러지 검사 영역 결정 방법 및 이를 이용하는 외관 검사 장치
WO2020110197A1 (ja) * 2018-11-27 2020-06-04 株式会社島津製作所 欠陥検査装置および欠陥検査方法

Also Published As

Publication number Publication date
US20230401688A1 (en) 2023-12-14
US12482086B2 (en) 2025-11-25
JP7803369B2 (ja) 2026-01-21
CN116490767A (zh) 2023-07-25
JP2024123175A (ja) 2024-09-10
WO2022059710A1 (ja) 2022-03-24

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