JPWO2022059629A5 - - Google Patents
Download PDFInfo
- Publication number
- JPWO2022059629A5 JPWO2022059629A5 JP2022550537A JP2022550537A JPWO2022059629A5 JP WO2022059629 A5 JPWO2022059629 A5 JP WO2022059629A5 JP 2022550537 A JP2022550537 A JP 2022550537A JP 2022550537 A JP2022550537 A JP 2022550537A JP WO2022059629 A5 JPWO2022059629 A5 JP WO2022059629A5
- Authority
- JP
- Japan
- Prior art keywords
- reference data
- similarity
- wavelengths
- degree
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 claims description 15
- 239000007788 liquid Substances 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 2
- 239000007787 solid Substances 0.000 claims description 2
- 239000000463 material Substances 0.000 claims 40
- 238000000034 method Methods 0.000 claims 25
- 238000010438 heat treatment Methods 0.000 claims 6
- 239000000203 mixture Substances 0.000 claims 5
- 239000012925 reference material Substances 0.000 claims 3
- 230000002159 abnormal effect Effects 0.000 claims 2
- 230000002950 deficient Effects 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 238000005457 optimization Methods 0.000 claims 1
- 239000007789 gas Substances 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020155085 | 2020-09-16 | ||
| JP2020155085 | 2020-09-16 | ||
| PCT/JP2021/033443 WO2022059629A1 (ja) | 2020-09-16 | 2021-09-13 | 非接触材料同定方法、非接触温度同定方法、及び熱処理加工進行度同定方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2022059629A1 JPWO2022059629A1 (https=) | 2022-03-24 |
| JPWO2022059629A5 true JPWO2022059629A5 (https=) | 2023-06-05 |
| JP7460202B2 JP7460202B2 (ja) | 2024-04-02 |
Family
ID=80776644
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022550537A Active JP7460202B2 (ja) | 2020-09-16 | 2021-09-13 | 非接触材料同定方法、非接触温度同定方法、及び熱処理加工進行度同定方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US12345648B2 (https=) |
| JP (1) | JP7460202B2 (https=) |
| WO (1) | WO2022059629A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117169273B (zh) * | 2023-09-07 | 2024-04-26 | 华南理工大学 | 一种基于反射法测量材料常温方向发射率的装置及方法 |
| CN118443156B (zh) * | 2024-07-08 | 2024-10-18 | 深圳查尔孟科技有限公司 | 一种精确测温控制系统及方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60169742A (ja) * | 1984-02-13 | 1985-09-03 | Shinkawa Ltd | ダイボンド接着状態の検査装置 |
| US4561786A (en) | 1984-03-15 | 1985-12-31 | Williamson Corporation | Temperature measuring apparatus |
| US6333501B1 (en) | 2000-01-27 | 2001-12-25 | Perkin-Elmer Corporation | Methods, apparatus, and articles of manufacture for performing spectral calibration |
| JP4689093B2 (ja) | 2001-06-29 | 2011-05-25 | 浜松ホトニクス株式会社 | レーザ照射領域監視装置、レーザ照射領域監視方法、レーザ加工装置及びレーザ加工方法 |
| US9297749B2 (en) * | 2012-03-27 | 2016-03-29 | Innovative Science Tools, Inc. | Optical analyzer for identification of materials using transmission spectroscopy |
| US8829437B2 (en) | 2012-07-04 | 2014-09-09 | Apple Inc. | Method for quantifying amorphous content in bulk metallic glass parts using thermal emissivity |
| JP6831350B2 (ja) | 2018-06-20 | 2021-02-17 | 日立グローバルライフソリューションズ株式会社 | 誘導加熱調理器 |
-
2021
- 2021-09-13 US US18/026,190 patent/US12345648B2/en active Active
- 2021-09-13 JP JP2022550537A patent/JP7460202B2/ja active Active
- 2021-09-13 WO PCT/JP2021/033443 patent/WO2022059629A1/ja not_active Ceased
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPWO2022059629A5 (https=) | ||
| CN105008898B (zh) | 用于组合的libs和ir吸收光谱法研究的系统和方法 | |
| JP5279481B2 (ja) | 核酸分析装置 | |
| US9846148B2 (en) | Method and device for dissolved gas analysis | |
| JP2020508568A5 (https=) | ||
| JP2011191129A (ja) | 錠剤検査装置、錠剤包装装置、錠剤検査方法及び錠剤包装方法 | |
| US10739286B2 (en) | Method for coating a surface of a metal strip and a metal strip-coating device | |
| WO2001079773A1 (en) | Method of monitoring a freeze drying process | |
| US20150185154A1 (en) | Raman spectroscopic detection method for detecting sample in vessel | |
| TW542909B (en) | The method for controlling production process | |
| Theobald et al. | Identification of unknown nanofabrication chemicals using Raman spectroscopy and deep learning | |
| Raeissi et al. | Detection of different chemical binders in coatings using hyperspectral imaging | |
| JP7460202B2 (ja) | 非接触材料同定方法、非接触温度同定方法、及び熱処理加工進行度同定方法 | |
| JP2015059858A (ja) | 半導体の抵抗率検査装置および半導体の抵抗率検査方法 | |
| JP7128733B2 (ja) | 吸光分析装置 | |
| TWI662273B (zh) | 缺陷檢測設備及缺陷檢測方法 | |
| US12209907B2 (en) | Method of determining an optical pathlength through a cuvette | |
| JP2019020419A (ja) | 膜厚計算方法、膜厚計算プログラム及び膜厚計算装置 | |
| JP6580937B2 (ja) | 検査装置及び検査方法 | |
| JP5919218B2 (ja) | 核酸分析装置及び核酸分析方法 | |
| JP2015206625A (ja) | 赤外分光光度計 | |
| JP2025172466A (ja) | 分光測定装置及びこれを備えた物品検査装置 | |
| Kunkel et al. | Raman database considerations for near-infrared systems | |
| WO2009050177A1 (en) | Inline measurement of moving containers with infrared (ir) spectroscopy | |
| CA3168197C (en) | Method of determining an optical pathlength through a cuvette |