JPWO2021251157A1 - - Google Patents
Info
- Publication number
- JPWO2021251157A1 JPWO2021251157A1 JP2022530126A JP2022530126A JPWO2021251157A1 JP WO2021251157 A1 JPWO2021251157 A1 JP WO2021251157A1 JP 2022530126 A JP2022530126 A JP 2022530126A JP 2022530126 A JP2022530126 A JP 2022530126A JP WO2021251157 A1 JPWO2021251157 A1 JP WO2021251157A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
- G03F1/64—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/22—Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70033—Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70983—Optical system protection, e.g. pellicles or removable covers for protection of mask
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Plasma & Fusion (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020099139 | 2020-06-08 | ||
JP2020099139 | 2020-06-08 | ||
PCT/JP2021/020161 WO2021251157A1 (ja) | 2020-06-08 | 2021-05-27 | ペリクルフレーム、ペリクル、ペリクル付露光原版、露光方法、半導体の製造方法及び液晶表示板の製造方法 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2024127953A Division JP2024150755A (ja) | 2020-06-08 | 2024-08-02 | ペリクルフレーム、ペリクル、ペリクル付露光原版、露光方法及び半導体の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2021251157A1 true JPWO2021251157A1 (ja) | 2021-12-16 |
JP7537494B2 JP7537494B2 (ja) | 2024-08-21 |
Family
ID=78845571
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022530126A Active JP7537494B2 (ja) | 2020-06-08 | 2021-05-27 | ペリクルフレーム、ペリクル、ペリクル付露光原版、露光方法、半導体の製造方法及び液晶表示板の製造方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US20230221634A1 (ja) |
EP (1) | EP4163720A4 (ja) |
JP (1) | JP7537494B2 (ja) |
KR (1) | KR20230019853A (ja) |
CN (2) | CN216118382U (ja) |
TW (2) | TWM618972U (ja) |
WO (1) | WO2021251157A1 (ja) |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004191986A (ja) * | 2002-12-09 | 2004-07-08 | Asml Holding Nv | 多孔質フィルタ挿入体及び突出したボンディング面を備えたペリクルフレームのための方法及び装置 |
JP2004294786A (ja) * | 2003-03-27 | 2004-10-21 | Semiconductor Leading Edge Technologies Inc | ペリクル |
US20060246234A1 (en) * | 2005-04-20 | 2006-11-02 | Yazaki Corporation | Photomask assembly incorporating a metal/scavenger pellicle frame |
WO2008105531A1 (ja) * | 2007-03-01 | 2008-09-04 | Nikon Corporation | ペリクルフレーム装置、マスク、露光方法及び露光装置並びにデバイスの製造方法 |
JP2010107986A (ja) * | 2008-11-03 | 2010-05-13 | Mst Technology Co Ltd | リソグラフィ用ペリクル |
JP2018200380A (ja) * | 2017-05-26 | 2018-12-20 | 日本特殊陶業株式会社 | ペリクル枠及びその製造方法 |
JP2019070745A (ja) * | 2017-10-10 | 2019-05-09 | 信越化学工業株式会社 | ペリクルフレーム及びペリクル |
WO2019188445A1 (ja) * | 2018-03-27 | 2019-10-03 | 三井化学株式会社 | ペリクル用支持枠、ペリクル、及びその製造方法、並びにこれらを用いた露光原版、半導体装置の製造方法 |
JP2020042105A (ja) * | 2018-09-07 | 2020-03-19 | 日本特殊陶業株式会社 | ペリクル枠及びペリクル |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6837433B2 (ja) * | 2014-11-17 | 2021-03-03 | エーエスエムエル ネザーランズ ビー.ブイ. | ペリクル取り付け装置及びペリクル取り付け方法 |
JP7357432B2 (ja) * | 2017-10-10 | 2023-10-06 | 信越化学工業株式会社 | Euv用ペリクルフレーム、ペリクル、ペリクル付露光原版、露光方法、及び半導体の製造方法 |
-
2021
- 2021-05-27 CN CN202121151382.XU patent/CN216118382U/zh active Active
- 2021-05-27 TW TW110206104U patent/TWM618972U/zh unknown
- 2021-05-27 WO PCT/JP2021/020161 patent/WO2021251157A1/ja unknown
- 2021-05-27 TW TW110119242A patent/TW202147018A/zh unknown
- 2021-05-27 CN CN202180036072.XA patent/CN115668055A/zh active Pending
- 2021-05-27 JP JP2022530126A patent/JP7537494B2/ja active Active
- 2021-05-27 US US18/009,019 patent/US20230221634A1/en active Pending
- 2021-05-27 KR KR1020227043362A patent/KR20230019853A/ko active Search and Examination
- 2021-05-27 EP EP21820863.5A patent/EP4163720A4/en active Pending
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004191986A (ja) * | 2002-12-09 | 2004-07-08 | Asml Holding Nv | 多孔質フィルタ挿入体及び突出したボンディング面を備えたペリクルフレームのための方法及び装置 |
JP2004294786A (ja) * | 2003-03-27 | 2004-10-21 | Semiconductor Leading Edge Technologies Inc | ペリクル |
US20060246234A1 (en) * | 2005-04-20 | 2006-11-02 | Yazaki Corporation | Photomask assembly incorporating a metal/scavenger pellicle frame |
WO2008105531A1 (ja) * | 2007-03-01 | 2008-09-04 | Nikon Corporation | ペリクルフレーム装置、マスク、露光方法及び露光装置並びにデバイスの製造方法 |
JP2010107986A (ja) * | 2008-11-03 | 2010-05-13 | Mst Technology Co Ltd | リソグラフィ用ペリクル |
JP2018200380A (ja) * | 2017-05-26 | 2018-12-20 | 日本特殊陶業株式会社 | ペリクル枠及びその製造方法 |
JP2019070745A (ja) * | 2017-10-10 | 2019-05-09 | 信越化学工業株式会社 | ペリクルフレーム及びペリクル |
WO2019188445A1 (ja) * | 2018-03-27 | 2019-10-03 | 三井化学株式会社 | ペリクル用支持枠、ペリクル、及びその製造方法、並びにこれらを用いた露光原版、半導体装置の製造方法 |
JP2020042105A (ja) * | 2018-09-07 | 2020-03-19 | 日本特殊陶業株式会社 | ペリクル枠及びペリクル |
Also Published As
Publication number | Publication date |
---|---|
EP4163720A1 (en) | 2023-04-12 |
TWM618972U (zh) | 2021-11-01 |
US20230221634A1 (en) | 2023-07-13 |
EP4163720A4 (en) | 2024-08-14 |
WO2021251157A1 (ja) | 2021-12-16 |
KR20230019853A (ko) | 2023-02-09 |
CN216118382U (zh) | 2022-03-22 |
TW202147018A (zh) | 2021-12-16 |
CN115668055A (zh) | 2023-01-31 |
JP7537494B2 (ja) | 2024-08-21 |
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