JPWO2021209855A1 - - Google Patents

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Publication number
JPWO2021209855A1
JPWO2021209855A1 JP2022514869A JP2022514869A JPWO2021209855A1 JP WO2021209855 A1 JPWO2021209855 A1 JP WO2021209855A1 JP 2022514869 A JP2022514869 A JP 2022514869A JP 2022514869 A JP2022514869 A JP 2022514869A JP WO2021209855 A1 JPWO2021209855 A1 JP WO2021209855A1
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JP
Japan
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JP2022514869A
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Japanese (ja)
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JP7571127B2 (ja
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/38Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation
    • G06F7/48Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
    • G06F7/544Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices for evaluating functions by calculation
    • G06F7/5443Sum of products
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K39/00Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
    • H10K39/30Devices controlled by radiation
    • H10K39/32Organic image sensors
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10Complex mathematical operations
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/38Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation
    • G06F7/48Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
    • G06F7/50Adding; Subtracting
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/38Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation
    • G06F7/48Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
    • G06F7/52Multiplying; Dividing
    • G06F7/523Multiplying only
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/04Architecture, e.g. interconnection topology
    • G06N3/045Combinations of networks
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/04Architecture, e.g. interconnection topology
    • G06N3/048Activation functions
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/06Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons
    • G06N3/063Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/6729Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/673Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
    • H10D30/6733Multi-gate TFTs
    • H10D30/6734Multi-gate TFTs having gate electrodes arranged on both top and bottom sides of the channel, e.g. dual-gate TFTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/674Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6755Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/6757Thin-film transistors [TFT] characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/08Manufacture or treatment characterised by using material-based technologies using combinations of technologies, e.g. using both Si and SiC technologies or using both Si and Group III-V technologies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/421Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer
    • H10D86/423Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/481Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs integrated with passive devices, e.g. auxiliary capacitors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D87/00Integrated devices comprising both bulk components and either SOI or SOS components on the same substrate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D88/00Three-dimensional [3D] integrated devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Pure & Applied Mathematics (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Computing Systems (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Physics (AREA)
  • Data Mining & Analysis (AREA)
  • Biomedical Technology (AREA)
  • Software Systems (AREA)
  • Biophysics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Computational Linguistics (AREA)
  • Evolutionary Computation (AREA)
  • Molecular Biology (AREA)
  • Algebra (AREA)
  • Databases & Information Systems (AREA)
  • Neurology (AREA)
  • Thin Film Transistor (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Complex Calculations (AREA)
JP2022514869A 2020-04-17 2021-04-05 半導体装置、及び電子機器 Active JP7571127B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024177458A JP2025003452A (ja) 2020-04-17 2024-10-09 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020074001 2020-04-17
JP2020074001 2020-04-17
PCT/IB2021/052804 WO2021209855A1 (ja) 2020-04-17 2021-04-05 半導体装置、及び電子機器

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024177458A Division JP2025003452A (ja) 2020-04-17 2024-10-09 半導体装置

Publications (2)

Publication Number Publication Date
JPWO2021209855A1 true JPWO2021209855A1 (https=) 2021-10-21
JP7571127B2 JP7571127B2 (ja) 2024-10-22

Family

ID=78084356

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2022514869A Active JP7571127B2 (ja) 2020-04-17 2021-04-05 半導体装置、及び電子機器
JP2024177458A Withdrawn JP2025003452A (ja) 2020-04-17 2024-10-09 半導体装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024177458A Withdrawn JP2025003452A (ja) 2020-04-17 2024-10-09 半導体装置

Country Status (4)

Country Link
US (1) US12376447B2 (https=)
JP (2) JP7571127B2 (https=)
CN (1) CN115427962A (https=)
WO (1) WO2021209855A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
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US20220326384A1 (en) * 2019-08-23 2022-10-13 Semiconductor Energy Laboratory Co., Ltd. Imaging device, distance estimation device, and moving object
US20210125049A1 (en) * 2019-10-29 2021-04-29 Taiwan Semiconductor Manufacturing Co., Ltd. System for executing neural network
US12537233B2 (en) * 2020-02-21 2026-01-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, power storage device, battery management circuit, electronic component, vehicle, and electronic device
WO2021209855A1 (ja) * 2020-04-17 2021-10-21 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
JP7596386B2 (ja) 2020-08-03 2024-12-09 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
JP2024126525A (ja) * 2023-03-07 2024-09-20 キヤノン株式会社 放射線検出器、放射線検出システムおよび放射線ct装置

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JP2006507557A (ja) * 2002-04-12 2006-03-02 インフィネオン テクノロジーズ アクチエンゲゼルシャフト 神経回路網の活動を計測するためのイベント検出装置および計測方法
JP2014030170A (ja) * 2012-07-04 2014-02-13 Makoto Shizukuishi 撮像素子、半導体集積回路及び撮像装置
JP2019047006A (ja) * 2017-09-05 2019-03-22 株式会社半導体エネルギー研究所 半導体装置、電子機器

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US9773832B2 (en) 2014-12-10 2017-09-26 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
US9685469B2 (en) 2015-04-03 2017-06-20 Apple Inc. Display with semiconducting oxide and polysilicon transistors
US9716852B2 (en) 2015-04-03 2017-07-25 Semiconductor Energy Laboratory Co., Ltd. Broadcast system
JP6674838B2 (ja) 2015-05-21 2020-04-01 株式会社半導体エネルギー研究所 電子装置
CN108701480B (zh) 2016-03-10 2022-10-14 株式会社半导体能源研究所 半导体装置
KR102382727B1 (ko) 2016-03-18 2022-04-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 이를 사용한 시스템
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CN114628425A (zh) 2017-05-26 2022-06-14 株式会社半导体能源研究所 摄像装置及电子设备
JP6956784B2 (ja) 2017-06-08 2021-11-02 株式会社半導体エネルギー研究所 撮像装置
KR102674906B1 (ko) 2017-06-27 2024-06-12 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 시스템 및 데이터 처리 방법
WO2020254909A1 (ja) 2019-06-21 2020-12-24 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
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WO2021209855A1 (ja) * 2020-04-17 2021-10-21 株式会社半導体エネルギー研究所 半導体装置、及び電子機器

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006507557A (ja) * 2002-04-12 2006-03-02 インフィネオン テクノロジーズ アクチエンゲゼルシャフト 神経回路網の活動を計測するためのイベント検出装置および計測方法
JP2014030170A (ja) * 2012-07-04 2014-02-13 Makoto Shizukuishi 撮像素子、半導体集積回路及び撮像装置
JP2019047006A (ja) * 2017-09-05 2019-03-22 株式会社半導体エネルギー研究所 半導体装置、電子機器

Also Published As

Publication number Publication date
CN115427962A (zh) 2022-12-02
JP2025003452A (ja) 2025-01-09
WO2021209855A1 (ja) 2021-10-21
JP7571127B2 (ja) 2024-10-22
US20230132059A1 (en) 2023-04-27
US12376447B2 (en) 2025-07-29

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