JPWO2021209855A1 - - Google Patents
Info
- Publication number
- JPWO2021209855A1 JPWO2021209855A1 JP2022514869A JP2022514869A JPWO2021209855A1 JP WO2021209855 A1 JPWO2021209855 A1 JP WO2021209855A1 JP 2022514869 A JP2022514869 A JP 2022514869A JP 2022514869 A JP2022514869 A JP 2022514869A JP WO2021209855 A1 JPWO2021209855 A1 JP WO2021209855A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
- G06F7/38—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation
- G06F7/48—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
- G06F7/544—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices for evaluating functions by calculation
- G06F7/5443—Sum of products
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K39/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
- H10K39/30—Devices controlled by radiation
- H10K39/32—Organic image sensors
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/10—Complex mathematical operations
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
- G06F7/38—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation
- G06F7/48—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
- G06F7/50—Adding; Subtracting
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
- G06F7/38—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation
- G06F7/48—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
- G06F7/52—Multiplying; Dividing
- G06F7/523—Multiplying only
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/045—Combinations of networks
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/048—Activation functions
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/06—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons
- G06N3/063—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
- H10D30/6733—Multi-gate TFTs
- H10D30/6734—Multi-gate TFTs having gate electrodes arranged on both top and bottom sides of the channel, e.g. dual-gate TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6757—Thin-film transistors [TFT] characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/08—Manufacture or treatment characterised by using material-based technologies using combinations of technologies, e.g. using both Si and SiC technologies or using both Si and Group III-V technologies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/421—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer
- H10D86/423—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/481—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs integrated with passive devices, e.g. auxiliary capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D87/00—Integrated devices comprising both bulk components and either SOI or SOS components on the same substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D88/00—Three-dimensional [3D] integrated devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Pure & Applied Mathematics (AREA)
- Computational Mathematics (AREA)
- Mathematical Analysis (AREA)
- Computing Systems (AREA)
- Mathematical Optimization (AREA)
- Mathematical Physics (AREA)
- Data Mining & Analysis (AREA)
- Biomedical Technology (AREA)
- Software Systems (AREA)
- Biophysics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Artificial Intelligence (AREA)
- Computational Linguistics (AREA)
- Evolutionary Computation (AREA)
- Molecular Biology (AREA)
- Algebra (AREA)
- Databases & Information Systems (AREA)
- Neurology (AREA)
- Thin Film Transistor (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Complex Calculations (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2024177458A JP2025003452A (ja) | 2020-04-17 | 2024-10-09 | 半導体装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020074001 | 2020-04-17 | ||
| JP2020074001 | 2020-04-17 | ||
| PCT/IB2021/052804 WO2021209855A1 (ja) | 2020-04-17 | 2021-04-05 | 半導体装置、及び電子機器 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024177458A Division JP2025003452A (ja) | 2020-04-17 | 2024-10-09 | 半導体装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2021209855A1 true JPWO2021209855A1 (https=) | 2021-10-21 |
| JP7571127B2 JP7571127B2 (ja) | 2024-10-22 |
Family
ID=78084356
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022514869A Active JP7571127B2 (ja) | 2020-04-17 | 2021-04-05 | 半導体装置、及び電子機器 |
| JP2024177458A Withdrawn JP2025003452A (ja) | 2020-04-17 | 2024-10-09 | 半導体装置 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024177458A Withdrawn JP2025003452A (ja) | 2020-04-17 | 2024-10-09 | 半導体装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12376447B2 (https=) |
| JP (2) | JP7571127B2 (https=) |
| CN (1) | CN115427962A (https=) |
| WO (1) | WO2021209855A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220326384A1 (en) * | 2019-08-23 | 2022-10-13 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device, distance estimation device, and moving object |
| US20210125049A1 (en) * | 2019-10-29 | 2021-04-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | System for executing neural network |
| US12537233B2 (en) * | 2020-02-21 | 2026-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, power storage device, battery management circuit, electronic component, vehicle, and electronic device |
| WO2021209855A1 (ja) * | 2020-04-17 | 2021-10-21 | 株式会社半導体エネルギー研究所 | 半導体装置、及び電子機器 |
| JP7596386B2 (ja) | 2020-08-03 | 2024-12-09 | 株式会社半導体エネルギー研究所 | 半導体装置、及び電子機器 |
| JP2024126525A (ja) * | 2023-03-07 | 2024-09-20 | キヤノン株式会社 | 放射線検出器、放射線検出システムおよび放射線ct装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006507557A (ja) * | 2002-04-12 | 2006-03-02 | インフィネオン テクノロジーズ アクチエンゲゼルシャフト | 神経回路網の活動を計測するためのイベント検出装置および計測方法 |
| JP2014030170A (ja) * | 2012-07-04 | 2014-02-13 | Makoto Shizukuishi | 撮像素子、半導体集積回路及び撮像装置 |
| JP2019047006A (ja) * | 2017-09-05 | 2019-03-22 | 株式会社半導体エネルギー研究所 | 半導体装置、電子機器 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7809432B2 (en) | 2002-04-12 | 2010-10-05 | Infineon Technologies Ag | Event detection—apparatus and method for measuring the activity of neural networks |
| US9773832B2 (en) | 2014-12-10 | 2017-09-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
| US9685469B2 (en) | 2015-04-03 | 2017-06-20 | Apple Inc. | Display with semiconducting oxide and polysilicon transistors |
| US9716852B2 (en) | 2015-04-03 | 2017-07-25 | Semiconductor Energy Laboratory Co., Ltd. | Broadcast system |
| JP6674838B2 (ja) | 2015-05-21 | 2020-04-01 | 株式会社半導体エネルギー研究所 | 電子装置 |
| CN108701480B (zh) | 2016-03-10 | 2022-10-14 | 株式会社半导体能源研究所 | 半导体装置 |
| KR102382727B1 (ko) | 2016-03-18 | 2022-04-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 이를 사용한 시스템 |
| US9934826B2 (en) | 2016-04-14 | 2018-04-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US10109633B2 (en) | 2016-04-27 | 2018-10-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, electronic device, and authentication system |
| WO2018002774A1 (en) | 2016-06-29 | 2018-01-04 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device, operation method of the electronic device, and moving vehicle |
| JP6668182B2 (ja) | 2016-06-30 | 2020-03-18 | 株式会社日立製作所 | 回路設計装置及びそれを用いた回路設計方法 |
| US10319743B2 (en) | 2016-12-16 | 2019-06-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display system, and electronic device |
| CN114628425A (zh) | 2017-05-26 | 2022-06-14 | 株式会社半导体能源研究所 | 摄像装置及电子设备 |
| JP6956784B2 (ja) | 2017-06-08 | 2021-11-02 | 株式会社半導体エネルギー研究所 | 撮像装置 |
| KR102674906B1 (ko) | 2017-06-27 | 2024-06-12 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 시스템 및 데이터 처리 방법 |
| WO2020254909A1 (ja) | 2019-06-21 | 2020-12-24 | 株式会社半導体エネルギー研究所 | 半導体装置、及び電子機器 |
| US12002535B2 (en) | 2019-09-20 | 2024-06-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising memory cell array and arithmetic circuit |
| US12585431B2 (en) | 2019-12-27 | 2026-03-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
| KR20220144838A (ko) | 2020-02-21 | 2022-10-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 전자 기기 |
| WO2021209855A1 (ja) * | 2020-04-17 | 2021-10-21 | 株式会社半導体エネルギー研究所 | 半導体装置、及び電子機器 |
-
2021
- 2021-04-05 WO PCT/IB2021/052804 patent/WO2021209855A1/ja not_active Ceased
- 2021-04-05 CN CN202180028372.3A patent/CN115427962A/zh active Pending
- 2021-04-05 US US17/915,673 patent/US12376447B2/en active Active
- 2021-04-05 JP JP2022514869A patent/JP7571127B2/ja active Active
-
2024
- 2024-10-09 JP JP2024177458A patent/JP2025003452A/ja not_active Withdrawn
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006507557A (ja) * | 2002-04-12 | 2006-03-02 | インフィネオン テクノロジーズ アクチエンゲゼルシャフト | 神経回路網の活動を計測するためのイベント検出装置および計測方法 |
| JP2014030170A (ja) * | 2012-07-04 | 2014-02-13 | Makoto Shizukuishi | 撮像素子、半導体集積回路及び撮像装置 |
| JP2019047006A (ja) * | 2017-09-05 | 2019-03-22 | 株式会社半導体エネルギー研究所 | 半導体装置、電子機器 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115427962A (zh) | 2022-12-02 |
| JP2025003452A (ja) | 2025-01-09 |
| WO2021209855A1 (ja) | 2021-10-21 |
| JP7571127B2 (ja) | 2024-10-22 |
| US20230132059A1 (en) | 2023-04-27 |
| US12376447B2 (en) | 2025-07-29 |
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