JPWO2021152928A1 - - Google Patents

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Publication number
JPWO2021152928A1
JPWO2021152928A1 JP2021574456A JP2021574456A JPWO2021152928A1 JP WO2021152928 A1 JPWO2021152928 A1 JP WO2021152928A1 JP 2021574456 A JP2021574456 A JP 2021574456A JP 2021574456 A JP2021574456 A JP 2021574456A JP WO2021152928 A1 JPWO2021152928 A1 JP WO2021152928A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2021574456A
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JP7287507B2 (ja
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Publication of JPWO2021152928A1 publication Critical patent/JPWO2021152928A1/ja
Application granted granted Critical
Publication of JP7287507B2 publication Critical patent/JP7287507B2/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/31—Accessories, mechanical or electrical features temperature control
    • G01N2223/3103—Accessories, mechanical or electrical features temperature control cooling, cryostats
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/31—Accessories, mechanical or electrical features temperature control
    • G01N2223/3106—Accessories, mechanical or electrical features temperature control heating, furnaces

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2021574456A 2020-01-27 2020-10-15 蛍光ｘ線分析装置 Active JP7287507B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020010907 2020-01-27
JP2020010907 2020-01-27
PCT/JP2020/038875 WO2021152928A1 (ja) 2020-01-27 2020-10-15 蛍光ｘ線分析装置

Publications (2)

Publication Number Publication Date
JPWO2021152928A1 true JPWO2021152928A1 (ja) 2021-08-05
JP7287507B2 JP7287507B2 (ja) 2023-06-06

Family

ID=77079721

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021574456A Active JP7287507B2 (ja) 2020-01-27 2020-10-15 蛍光ｘ線分析装置

Country Status (4)

Country Link
US (1) US20230057233A1 (ja)
JP (1) JP7287507B2 (ja)
CN (1) CN115023606A (ja)
WO (1) WO2021152928A1 (ja)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000329714A (ja) * 1999-05-24 2000-11-30 Rigaku Industrial Co 蛍光ｘ線分析装置
JP2003107021A (ja) * 2001-09-28 2003-04-09 Ours Tex Kk 蛍光ｘ線分析装置
US20050285046A1 (en) * 2004-06-29 2005-12-29 Iwanczyk Jan S Radiation detector system having heat pipe based cooling
JP2010175404A (ja) * 2009-01-29 2010-08-12 Shimadzu Corp Ｘ線分析装置
JP2013160614A (ja) * 2012-02-03 2013-08-19 Horiba Ltd Ｘ線検出装置
JP2015081783A (ja) * 2013-10-21 2015-04-27 株式会社島津製作所 蛍光ｘ線分析装置
JP2016206191A (ja) * 2015-04-23 2016-12-08 株式会社堀場製作所 放射線検出器及び放射線検出装置
JP2017003460A (ja) * 2015-06-11 2017-01-05 日本電子株式会社 放射線検出器およびその製造方法
JP2017118428A (ja) * 2015-12-25 2017-06-29 日本電子株式会社 固体撮像素子のクリーニング方法および放射線検出装置
CN207263671U (zh) * 2017-10-10 2018-04-20 天津市博智伟业科技股份有限公司 一种x荧光光谱仪探测器冷却装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51146893A (en) * 1975-06-11 1976-12-16 Matsushita Electric Ind Co Ltd Fluorescent x ray analyzing apparatus
JPS51146892A (en) * 1975-06-11 1976-12-16 Matsushita Electric Ind Co Ltd Fluorescent x ray analyzing apparatus
JP6082634B2 (ja) * 2013-03-27 2017-02-15 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
JP6244897B2 (ja) * 2013-12-26 2017-12-13 株式会社島津製作所 Ｘ線分析装置
GB2540000A (en) * 2015-04-23 2017-01-04 Horiba Ltd Radiation detector and radiation detection apparatus
US10278273B2 (en) * 2016-06-30 2019-04-30 Shimadzu Corporation X-ray generator and X-ray analyzer

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000329714A (ja) * 1999-05-24 2000-11-30 Rigaku Industrial Co 蛍光ｘ線分析装置
JP2003107021A (ja) * 2001-09-28 2003-04-09 Ours Tex Kk 蛍光ｘ線分析装置
US20050285046A1 (en) * 2004-06-29 2005-12-29 Iwanczyk Jan S Radiation detector system having heat pipe based cooling
JP2010175404A (ja) * 2009-01-29 2010-08-12 Shimadzu Corp Ｘ線分析装置
JP2013160614A (ja) * 2012-02-03 2013-08-19 Horiba Ltd Ｘ線検出装置
JP2015081783A (ja) * 2013-10-21 2015-04-27 株式会社島津製作所 蛍光ｘ線分析装置
JP2016206191A (ja) * 2015-04-23 2016-12-08 株式会社堀場製作所 放射線検出器及び放射線検出装置
JP2017003460A (ja) * 2015-06-11 2017-01-05 日本電子株式会社 放射線検出器およびその製造方法
JP2017118428A (ja) * 2015-12-25 2017-06-29 日本電子株式会社 固体撮像素子のクリーニング方法および放射線検出装置
CN207263671U (zh) * 2017-10-10 2018-04-20 天津市博智伟业科技股份有限公司 一种x荧光光谱仪探测器冷却装置

Also Published As

Publication number Publication date
CN115023606A (zh) 2022-09-06
JP7287507B2 (ja) 2023-06-06
US20230057233A1 (en) 2023-02-23
WO2021152928A1 (ja) 2021-08-05

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