JPWO2021079728A1 - - Google Patents

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Publication number
JPWO2021079728A1
JPWO2021079728A1 JP2021554232A JP2021554232A JPWO2021079728A1 JP WO2021079728 A1 JPWO2021079728 A1 JP WO2021079728A1 JP 2021554232 A JP2021554232 A JP 2021554232A JP 2021554232 A JP2021554232 A JP 2021554232A JP WO2021079728 A1 JPWO2021079728 A1 JP WO2021079728A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2021554232A
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Japanese (ja)
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JP7248144B2 (ja
JPWO2021079728A5 (https=
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Publication of JPWO2021079728A1 publication Critical patent/JPWO2021079728A1/ja
Publication of JPWO2021079728A5 publication Critical patent/JPWO2021079728A5/ja
Application granted granted Critical
Publication of JP7248144B2 publication Critical patent/JP7248144B2/ja
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Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/0008Industrial image inspection checking presence/absence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • G06T7/73Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/75Determining position or orientation of objects or cameras using feature-based methods involving models
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/888Marking defects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20081Training; Learning
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30204Marker

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2021554232A 2019-10-25 2020-10-05 欠陥位置判定システム、外観検査方法およびプログラム Active JP7248144B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019194144 2019-10-25
JP2019194144 2019-10-25
PCT/JP2020/037747 WO2021079728A1 (ja) 2019-10-25 2020-10-05 欠陥位置判定システム、外観検査方法およびプログラム

Publications (3)

Publication Number Publication Date
JPWO2021079728A1 true JPWO2021079728A1 (https=) 2021-04-29
JPWO2021079728A5 JPWO2021079728A5 (https=) 2022-06-23
JP7248144B2 JP7248144B2 (ja) 2023-03-29

Family

ID=75619958

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021554232A Active JP7248144B2 (ja) 2019-10-25 2020-10-05 欠陥位置判定システム、外観検査方法およびプログラム

Country Status (3)

Country Link
US (1) US12175653B2 (https=)
JP (1) JP7248144B2 (https=)
WO (1) WO2021079728A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021079728A1 (ja) * 2019-10-25 2021-04-29 日本電気株式会社 欠陥位置判定システム、外観検査方法およびプログラム

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04308979A (ja) * 1991-04-06 1992-10-30 Mazda Motor Corp カラー色の識別方法
JPH1178807A (ja) * 1997-08-29 1999-03-23 Koto Sangyo Kk 車体損傷部の測定用シート
JP2003075361A (ja) * 2001-09-06 2003-03-12 Hitachi Ltd 非破壊検査方法
JP2011035509A (ja) * 2009-07-30 2011-02-17 Fujifilm Corp 複眼撮影装置及びその制御方法
JP2017009528A (ja) * 2015-06-25 2017-01-12 ダイハツ工業株式会社 不具合の許否判定方法
JP2017055182A (ja) * 2015-09-07 2017-03-16 オムロン株式会社 撮影装置、撮影方法及び撮影プログラム
US20180165541A1 (en) * 2016-12-12 2018-06-14 Jack Cooper Logistics, LLC System, method, and apparatus for detection of damages on surfaces

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3503130B2 (ja) 1997-08-25 2004-03-02 日産自動車株式会社 表面検査装置
US20110218825A1 (en) * 2010-03-03 2011-09-08 International Business Machines Corporation Three-dimensional interactive vehicle damage claim interface
JP6326996B2 (ja) * 2014-06-13 2018-05-23 富士通株式会社 端末装置、情報処理システム、及び表示制御プログラム
US10755222B2 (en) * 2014-06-13 2020-08-25 Hitachi Systems, Ltd. Work management apparatus, work defect prevention program, and work defect prevention method
JP6924413B2 (ja) * 2017-12-25 2021-08-25 オムロン株式会社 データ生成装置、データ生成方法及びデータ生成プログラム
US20190278994A1 (en) * 2018-03-08 2019-09-12 Capital One Services, Llc Photograph driven vehicle identification engine
TWI805725B (zh) * 2018-06-07 2023-06-21 日商索尼半導體解決方案公司 資訊處理裝置、資訊處理方法及資訊處理系統
US10452915B1 (en) * 2018-08-08 2019-10-22 Capital One Services, Llc Systems and methods for depicting vehicle information in augmented reality
US11010888B2 (en) * 2018-10-29 2021-05-18 International Business Machines Corporation Precision defect detection based on image difference with respect to templates
US10410182B1 (en) * 2019-04-17 2019-09-10 Capital One Services, Llc Visualizing vehicle condition using extended reality
WO2021079728A1 (ja) * 2019-10-25 2021-04-29 日本電気株式会社 欠陥位置判定システム、外観検査方法およびプログラム
US10818042B1 (en) * 2020-01-14 2020-10-27 Capital One Services, Llc Vehicle information photo overlay
JPWO2022059710A1 (https=) * 2020-09-18 2022-03-24
KR20220130398A (ko) * 2021-03-18 2022-09-27 현대자동차주식회사 차량 검사 장치 및 차량의 검사 방법

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04308979A (ja) * 1991-04-06 1992-10-30 Mazda Motor Corp カラー色の識別方法
JPH1178807A (ja) * 1997-08-29 1999-03-23 Koto Sangyo Kk 車体損傷部の測定用シート
JP2003075361A (ja) * 2001-09-06 2003-03-12 Hitachi Ltd 非破壊検査方法
JP2011035509A (ja) * 2009-07-30 2011-02-17 Fujifilm Corp 複眼撮影装置及びその制御方法
JP2017009528A (ja) * 2015-06-25 2017-01-12 ダイハツ工業株式会社 不具合の許否判定方法
JP2017055182A (ja) * 2015-09-07 2017-03-16 オムロン株式会社 撮影装置、撮影方法及び撮影プログラム
US20180165541A1 (en) * 2016-12-12 2018-06-14 Jack Cooper Logistics, LLC System, method, and apparatus for detection of damages on surfaces

Also Published As

Publication number Publication date
WO2021079728A1 (ja) 2021-04-29
JP7248144B2 (ja) 2023-03-29
US20220392057A1 (en) 2022-12-08
US12175653B2 (en) 2024-12-24

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