JP7248144B2 - 欠陥位置判定システム、外観検査方法およびプログラム - Google Patents

欠陥位置判定システム、外観検査方法およびプログラム Download PDF

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JP7248144B2
JP7248144B2 JP2021554232A JP2021554232A JP7248144B2 JP 7248144 B2 JP7248144 B2 JP 7248144B2 JP 2021554232 A JP2021554232 A JP 2021554232A JP 2021554232 A JP2021554232 A JP 2021554232A JP 7248144 B2 JP7248144 B2 JP 7248144B2
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inspected
defect
image
determining
information
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JPWO2021079728A1 (https=
JPWO2021079728A5 (https=
Inventor
優香 大島
卓郎 鹿嶋
勇介 小板橋
淳 松田
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NEC Corp
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NEC Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/75—Determining position or orientation of objects or cameras using feature-based methods involving models
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2021554232A 2019-10-25 2020-10-05 欠陥位置判定システム、外観検査方法およびプログラム Active JP7248144B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019194144 2019-10-25
JP2019194144 2019-10-25
PCT/JP2020/037747 WO2021079728A1 (ja) 2019-10-25 2020-10-05 欠陥位置判定システム、外観検査方法およびプログラム

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JPWO2021079728A1 JPWO2021079728A1 (https=) 2021-04-29
JPWO2021079728A5 JPWO2021079728A5 (https=) 2022-06-23
JP7248144B2 true JP7248144B2 (ja) 2023-03-29

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021079728A1 (ja) * 2019-10-25 2021-04-29 日本電気株式会社 欠陥位置判定システム、外観検査方法およびプログラム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180165541A1 (en) 2016-12-12 2018-06-14 Jack Cooper Logistics, LLC System, method, and apparatus for detection of damages on surfaces

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04308979A (ja) 1991-04-06 1992-10-30 Mazda Motor Corp カラー色の識別方法
JP3503130B2 (ja) 1997-08-25 2004-03-02 日産自動車株式会社 表面検査装置
JPH1178807A (ja) 1997-08-29 1999-03-23 Koto Sangyo Kk 車体損傷部の測定用シート
JP2003075361A (ja) 2001-09-06 2003-03-12 Hitachi Ltd 非破壊検査方法
JP5127787B2 (ja) 2009-07-30 2013-01-23 富士フイルム株式会社 複眼撮影装置及びその制御方法
US20110218825A1 (en) * 2010-03-03 2011-09-08 International Business Machines Corporation Three-dimensional interactive vehicle damage claim interface
JP6326996B2 (ja) * 2014-06-13 2018-05-23 富士通株式会社 端末装置、情報処理システム、及び表示制御プログラム
US10755222B2 (en) * 2014-06-13 2020-08-25 Hitachi Systems, Ltd. Work management apparatus, work defect prevention program, and work defect prevention method
JP6570113B2 (ja) 2015-06-25 2019-09-04 ダイハツ工業株式会社 不具合の許否判定方法
JP6503990B2 (ja) 2015-09-07 2019-04-24 オムロン株式会社 撮影装置、撮影方法及び撮影プログラム
JP6924413B2 (ja) * 2017-12-25 2021-08-25 オムロン株式会社 データ生成装置、データ生成方法及びデータ生成プログラム
US20190278994A1 (en) * 2018-03-08 2019-09-12 Capital One Services, Llc Photograph driven vehicle identification engine
TWI805725B (zh) * 2018-06-07 2023-06-21 日商索尼半導體解決方案公司 資訊處理裝置、資訊處理方法及資訊處理系統
US10452915B1 (en) * 2018-08-08 2019-10-22 Capital One Services, Llc Systems and methods for depicting vehicle information in augmented reality
US11010888B2 (en) * 2018-10-29 2021-05-18 International Business Machines Corporation Precision defect detection based on image difference with respect to templates
US10410182B1 (en) * 2019-04-17 2019-09-10 Capital One Services, Llc Visualizing vehicle condition using extended reality
WO2021079728A1 (ja) * 2019-10-25 2021-04-29 日本電気株式会社 欠陥位置判定システム、外観検査方法およびプログラム
US10818042B1 (en) * 2020-01-14 2020-10-27 Capital One Services, Llc Vehicle information photo overlay
JPWO2022059710A1 (https=) * 2020-09-18 2022-03-24
KR20220130398A (ko) * 2021-03-18 2022-09-27 현대자동차주식회사 차량 검사 장치 및 차량의 검사 방법

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180165541A1 (en) 2016-12-12 2018-06-14 Jack Cooper Logistics, LLC System, method, and apparatus for detection of damages on surfaces

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WO2021079728A1 (ja) 2021-04-29
US20220392057A1 (en) 2022-12-08
US12175653B2 (en) 2024-12-24

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