JPWO2021014674A1 - - Google Patents

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Publication number
JPWO2021014674A1
JPWO2021014674A1 JP2021534529A JP2021534529A JPWO2021014674A1 JP WO2021014674 A1 JPWO2021014674 A1 JP WO2021014674A1 JP 2021534529 A JP2021534529 A JP 2021534529A JP 2021534529 A JP2021534529 A JP 2021534529A JP WO2021014674 A1 JPWO2021014674 A1 JP WO2021014674A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021534529A
Other versions
JPWO2021014674A5 (ja
JP7378477B2 (ja
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Publication of JPWO2021014674A1 publication Critical patent/JPWO2021014674A1/ja
Publication of JPWO2021014674A5 publication Critical patent/JPWO2021014674A5/ja
Application granted granted Critical
Publication of JP7378477B2 publication Critical patent/JP7378477B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/28—Electrolytic cell components
    • G01N27/30—Electrodes, e.g. test electrodes; Half-cells
    • G01N27/301—Reference electrodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/28—Electrolytic cell components
    • G01N27/30—Electrodes, e.g. test electrodes; Half-cells
    • G01N27/38—Cleaning of electrodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G01N2035/0094—Scheduling optimisation; experiment design

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2021534529A 2019-07-22 2020-03-11 自動分析装置および試料の自動分析方法 Active JP7378477B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019134304 2019-07-22
JP2019134304 2019-07-22
PCT/JP2020/010581 WO2021014674A1 (ja) 2019-07-22 2020-03-11 自動分析装置および試料の自動分析方法

Publications (3)

Publication Number Publication Date
JPWO2021014674A1 true JPWO2021014674A1 (ja) 2021-01-28
JPWO2021014674A5 JPWO2021014674A5 (ja) 2022-06-08
JP7378477B2 JP7378477B2 (ja) 2023-11-13

Family

ID=74192648

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021534529A Active JP7378477B2 (ja) 2019-07-22 2020-03-11 自動分析装置および試料の自動分析方法

Country Status (5)

Country Link
US (1) US20220236213A1 (ja)
EP (1) EP4040158A4 (ja)
JP (1) JP7378477B2 (ja)
CN (1) CN114207447A (ja)
WO (1) WO2021014674A1 (ja)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6332367A (ja) * 1986-07-25 1988-02-12 Japan Spectroscopic Co 前処理による待ち時間をなくしたオ−トサンプラ
JPH03100455A (ja) * 1989-09-13 1991-04-25 Hitachi Ltd 電解質分析装置および電解質分析方法
JPH0484770A (ja) * 1990-07-27 1992-03-18 Jeol Ltd 分析機のライン制御方式
JP2010175275A (ja) * 2009-01-27 2010-08-12 Toshiba Corp 自動分析装置及び自動分析方法
WO2013099660A1 (ja) * 2011-12-26 2013-07-04 株式会社日立ハイテクノロジーズ 自動分析装置及び試料分注プローブ洗浄方法
JP2014041060A (ja) * 2012-08-22 2014-03-06 Hitachi High-Technologies Corp 電解質分析装置
JP2016085086A (ja) * 2014-10-24 2016-05-19 株式会社東芝 分注装置及び臨床検査装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6650358B2 (ja) 2016-06-30 2020-02-19 株式会社日立ハイテクノロジーズ 自動分析装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6332367A (ja) * 1986-07-25 1988-02-12 Japan Spectroscopic Co 前処理による待ち時間をなくしたオ−トサンプラ
JPH03100455A (ja) * 1989-09-13 1991-04-25 Hitachi Ltd 電解質分析装置および電解質分析方法
JPH0484770A (ja) * 1990-07-27 1992-03-18 Jeol Ltd 分析機のライン制御方式
JP2010175275A (ja) * 2009-01-27 2010-08-12 Toshiba Corp 自動分析装置及び自動分析方法
WO2013099660A1 (ja) * 2011-12-26 2013-07-04 株式会社日立ハイテクノロジーズ 自動分析装置及び試料分注プローブ洗浄方法
JP2014041060A (ja) * 2012-08-22 2014-03-06 Hitachi High-Technologies Corp 電解質分析装置
JP2016085086A (ja) * 2014-10-24 2016-05-19 株式会社東芝 分注装置及び臨床検査装置

Also Published As

Publication number Publication date
JP7378477B2 (ja) 2023-11-13
US20220236213A1 (en) 2022-07-28
WO2021014674A1 (ja) 2021-01-28
EP4040158A1 (en) 2022-08-10
EP4040158A4 (en) 2023-12-06
CN114207447A (zh) 2022-03-18

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