JPWO2021002122A1 - - Google Patents

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Publication number
JPWO2021002122A1
JPWO2021002122A1 JP2021529921A JP2021529921A JPWO2021002122A1 JP WO2021002122 A1 JPWO2021002122 A1 JP WO2021002122A1 JP 2021529921 A JP2021529921 A JP 2021529921A JP 2021529921 A JP2021529921 A JP 2021529921A JP WO2021002122 A1 JPWO2021002122 A1 JP WO2021002122A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021529921A
Other versions
JP7170215B2 (ja
JPWO2021002122A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021002122A1 publication Critical patent/JPWO2021002122A1/ja
Publication of JPWO2021002122A5 publication Critical patent/JPWO2021002122A5/ja
Application granted granted Critical
Publication of JP7170215B2 publication Critical patent/JP7170215B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0091—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by using electromagnetic excitation or detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/08—Testing mechanical properties
    • G01M11/081—Testing mechanical properties by using a contact-less detection method, i.e. with a camera
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G01L1/248—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet using infrared
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0008—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings of bridges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10048—Infrared image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20076—Probabilistic image processing

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2021529921A 2019-07-03 2020-05-26 応力分布画像処理装置 Active JP7170215B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019124679 2019-07-03
JP2019124679 2019-07-03
PCT/JP2020/020767 WO2021002122A1 (ja) 2019-07-03 2020-05-26 応力分布画像処理装置

Publications (3)

Publication Number Publication Date
JPWO2021002122A1 true JPWO2021002122A1 (ja) 2021-01-07
JPWO2021002122A5 JPWO2021002122A5 (ja) 2022-03-15
JP7170215B2 JP7170215B2 (ja) 2022-11-14

Family

ID=74101063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021529921A Active JP7170215B2 (ja) 2019-07-03 2020-05-26 応力分布画像処理装置

Country Status (5)

Country Link
US (1) US11808657B2 (ja)
EP (1) EP3982095A4 (ja)
JP (1) JP7170215B2 (ja)
CN (1) CN114041160A (ja)
WO (1) WO2021002122A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7113359B2 (ja) * 2019-05-30 2022-08-05 パナソニックＩｐマネジメント株式会社 動体の応力解析装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06201625A (ja) * 1992-10-26 1994-07-22 Puranetsuto Kk 欠陥調査装置および欠陥調査方法
JP2007163390A (ja) * 2005-12-16 2007-06-28 Jfe Steel Kk 構造物の欠陥検出方法および装置
JP2012221486A (ja) * 2012-01-11 2012-11-12 Furuta Sekkei Co Ltd 画像処理装置及び建物画像診断装置
WO2018198702A1 (ja) * 2017-04-26 2018-11-01 パナソニックＩｐマネジメント株式会社 応力測定装置、応力測定システム及び応力測定方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7020345B2 (en) * 2001-04-26 2006-03-28 Industrial Technology Research Institute Methods and system for illuminant-compensation
US8369650B2 (en) * 2003-09-30 2013-02-05 DigitalOptics Corporation Europe Limited Image defect map creation using batches of digital images
JP5160227B2 (ja) * 2005-05-09 2013-03-13 株式会社日立メディコ 超音波診断装置及び超音波画像表示方法
JP6201625B2 (ja) 2013-10-22 2017-09-27 富士ゼロックス株式会社 用紙搬送装置、原稿読取装置、及び画像形成装置
WO2015142951A1 (en) * 2014-03-17 2015-09-24 Washington University System and method for quantifying deformation, disruption, and development in a sample
JP6587194B2 (ja) * 2016-02-15 2019-10-09 パナソニックＩｐマネジメント株式会社 応力分布測定方法及び応力分布測定システム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06201625A (ja) * 1992-10-26 1994-07-22 Puranetsuto Kk 欠陥調査装置および欠陥調査方法
JP2007163390A (ja) * 2005-12-16 2007-06-28 Jfe Steel Kk 構造物の欠陥検出方法および装置
JP2012221486A (ja) * 2012-01-11 2012-11-12 Furuta Sekkei Co Ltd 画像処理装置及び建物画像診断装置
WO2018198702A1 (ja) * 2017-04-26 2018-11-01 パナソニックＩｐマネジメント株式会社 応力測定装置、応力測定システム及び応力測定方法

Also Published As

Publication number Publication date
CN114041160A (zh) 2022-02-11
WO2021002122A1 (ja) 2021-01-07
EP3982095A4 (en) 2022-07-06
EP3982095A1 (en) 2022-04-13
US11808657B2 (en) 2023-11-07
JP7170215B2 (ja) 2022-11-14
US20220187162A1 (en) 2022-06-16

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