JPWO2020246170A1 - - Google Patents

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Publication number
JPWO2020246170A1
JPWO2020246170A1 JP2021524707A JP2021524707A JPWO2020246170A1 JP WO2020246170 A1 JPWO2020246170 A1 JP WO2020246170A1 JP 2021524707 A JP2021524707 A JP 2021524707A JP 2021524707 A JP2021524707 A JP 2021524707A JP WO2020246170 A1 JPWO2020246170 A1 JP WO2020246170A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021524707A
Other versions
JP7316500B2 (ja
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Publication of JPWO2020246170A1 publication Critical patent/JPWO2020246170A1/ja
Application granted granted Critical
Publication of JP7316500B2 publication Critical patent/JP7316500B2/ja
Active legal-status Critical Current
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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/70Auxiliary operations or equipment
    • B23K26/702Auxiliary equipment
    • B23K26/706Protective screens
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/70Auxiliary operations or equipment
    • B23K26/702Auxiliary equipment
    • B23K26/707Auxiliary equipment for monitoring laser beam transmission optics
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Laser Beam Processing (AREA)
JP2021524707A 2019-06-03 2020-04-24 レーザ加工ヘッド及びそれを備えたレーザ加工装置 Active JP7316500B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019103835 2019-06-03
JP2019103835 2019-06-03
PCT/JP2020/017623 WO2020246170A1 (ja) 2019-06-03 2020-04-24 レーザ加工ヘッド及びそれを備えたレーザ加工装置

Publications (2)

Publication Number Publication Date
JPWO2020246170A1 true JPWO2020246170A1 (ja) 2020-12-10
JP7316500B2 JP7316500B2 (ja) 2023-07-28

Family

ID=73652755

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021524707A Active JP7316500B2 (ja) 2019-06-03 2020-04-24 レーザ加工ヘッド及びそれを備えたレーザ加工装置

Country Status (4)

Country Link
US (1) US20220118557A1 (ja)
EP (1) EP3978179B1 (ja)
JP (1) JP7316500B2 (ja)
WO (1) WO2020246170A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112518145A (zh) * 2020-12-16 2021-03-19 普适激光技术(苏州)有限公司 一种新型光纤激光切割头
JP2023059618A (ja) * 2021-10-15 2023-04-27 株式会社アマダ 保護ガラス汚れ検知装置及び保護ガラス汚れ検知方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01186296A (ja) * 1988-01-19 1989-07-25 Miyachi Electric Co レーザ出射口保護ガラス板の汚れ検出装置
DE19605018A1 (de) * 1996-01-31 1997-08-07 Inpro Innovations Gmbh Verfahren zum Überwachen der Verschmutzung eines Schutzglases einer Laserschweißoptik beim Laserschweißen und Anordnung zur Durchführung des Verfahrens
JP2002361452A (ja) * 2001-03-20 2002-12-18 Precitec Kg レーザ加工ヘッドの保護ガラスの汚れの程度を測定する方法およびこの方法を実施するレーザ加工システム
JP2014237150A (ja) * 2013-06-07 2014-12-18 株式会社アマダ 保護ガラスの汚れ検出方法及びレーザ加工ヘッド
JP2018075610A (ja) * 2016-11-10 2018-05-17 株式会社アマダホールディングス 光学素子の汚れ検出方法及び装置並びにレーザ加工ヘッド

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5253109A (en) * 1992-04-27 1993-10-12 Donnelly Corporation Electro-optic device with constant light transmitting area
SE508426C2 (sv) * 1997-01-24 1998-10-05 Permanova Lasersystem Ab Metod och anordning för att övervaka renheten hos ett skyddsglas vid laserbearbetning
SE512097C2 (sv) 1998-05-20 2000-01-24 Permanova Lasersystem Ab Metod och anordning för att övervaka status hos ett skyddsglas vid laserbearbetning
KR100334461B1 (ko) * 1999-09-20 2002-05-03 이형도 폴리건 스캐닝 모터 및 이 폴리건 스캐닝 모터에 사용되는 회전 다면경을 가공하기 위한 지그 그리고 이 지그를 통한 회전 다면경의 가공방법
US8053700B2 (en) * 2003-04-16 2011-11-08 Mks Instruments, Inc. Applicators and cooling systems for a plasma device
DE20314918U1 (de) * 2003-09-25 2005-02-03 Scansonic Gmbh Vorrichtung zur Überwachung eines Schutzglases einer Laseroptik auf Bruch und/oder Verschmutzung
EP1643281A1 (de) * 2004-10-02 2006-04-05 Trumpf Werkzeugmaschinen GmbH + Co. KG Optisches Element einer Laserbearbeitungsmaschine und Halterung des optischen Elements
JP2007277636A (ja) * 2006-04-06 2007-10-25 Yamazaki Mazak Corp レーザ焼入れ方法
US7916408B2 (en) * 2008-10-30 2011-03-29 Corning Incorporated X-Y adjustable optical mount
EP2667998B1 (de) * 2011-01-27 2020-11-18 Bystronic Laser AG Laserbearbeitungsmaschine sowie verfahren zum zentrieren eines fokussierten laserstrahles
DE102011007176B4 (de) * 2011-04-12 2015-06-25 Trumpf Werkzeugmaschinen Gmbh + Co. Kg Vorrichtung zur Fokussierung eines Laserstrahls und Verfahren zum Überwachen einer Laserbearbeitung
DE102012216632A1 (de) * 2012-09-18 2014-03-20 Trumpf Laser Gmbh + Co. Kg Bearbeitungsmaschine und Verfahren zum Bearbeiten eines Werkstücks
CN106029290B (zh) * 2014-02-25 2019-12-20 松下知识产权经营株式会社 激光加工系统
JP6379361B2 (ja) * 2014-03-13 2018-08-29 パナソニックIpマネジメント株式会社 レーザ加工ヘッド
JP6757018B2 (ja) * 2016-04-26 2020-09-16 株式会社Nishihara 保護ガラスの汚れ検出装置とそれを備えるレーザ加工機及び保護ガラスの汚れ検出方法
JP6616368B2 (ja) * 2017-09-14 2019-12-04 ファナック株式会社 レーザ加工前に光学系の汚染レベルに応じて加工条件を補正するレーザ加工装置
JP6659746B2 (ja) * 2018-02-16 2020-03-04 ファナック株式会社 保護ウインドの汚れを抑制するレーザ加工ヘッド

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01186296A (ja) * 1988-01-19 1989-07-25 Miyachi Electric Co レーザ出射口保護ガラス板の汚れ検出装置
DE19605018A1 (de) * 1996-01-31 1997-08-07 Inpro Innovations Gmbh Verfahren zum Überwachen der Verschmutzung eines Schutzglases einer Laserschweißoptik beim Laserschweißen und Anordnung zur Durchführung des Verfahrens
JP2002361452A (ja) * 2001-03-20 2002-12-18 Precitec Kg レーザ加工ヘッドの保護ガラスの汚れの程度を測定する方法およびこの方法を実施するレーザ加工システム
JP2014237150A (ja) * 2013-06-07 2014-12-18 株式会社アマダ 保護ガラスの汚れ検出方法及びレーザ加工ヘッド
JP2018075610A (ja) * 2016-11-10 2018-05-17 株式会社アマダホールディングス 光学素子の汚れ検出方法及び装置並びにレーザ加工ヘッド

Also Published As

Publication number Publication date
EP3978179B1 (en) 2023-10-04
EP3978179A1 (en) 2022-04-06
US20220118557A1 (en) 2022-04-21
EP3978179A4 (en) 2022-08-03
JP7316500B2 (ja) 2023-07-28
WO2020246170A1 (ja) 2020-12-10

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