JPWO2020246170A1 - - Google Patents
Info
- Publication number
- JPWO2020246170A1 JPWO2020246170A1 JP2021524707A JP2021524707A JPWO2020246170A1 JP WO2020246170 A1 JPWO2020246170 A1 JP WO2020246170A1 JP 2021524707 A JP2021524707 A JP 2021524707A JP 2021524707 A JP2021524707 A JP 2021524707A JP WO2020246170 A1 JPWO2020246170 A1 JP WO2020246170A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/70—Auxiliary operations or equipment
- B23K26/702—Auxiliary equipment
- B23K26/706—Protective screens
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/70—Auxiliary operations or equipment
- B23K26/702—Auxiliary equipment
- B23K26/707—Auxiliary equipment for monitoring laser beam transmission optics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Laser Beam Processing (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019103835 | 2019-06-03 | ||
JP2019103835 | 2019-06-03 | ||
PCT/JP2020/017623 WO2020246170A1 (ja) | 2019-06-03 | 2020-04-24 | レーザ加工ヘッド及びそれを備えたレーザ加工装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2020246170A1 true JPWO2020246170A1 (ja) | 2020-12-10 |
JP7316500B2 JP7316500B2 (ja) | 2023-07-28 |
Family
ID=73652755
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021524707A Active JP7316500B2 (ja) | 2019-06-03 | 2020-04-24 | レーザ加工ヘッド及びそれを備えたレーザ加工装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20220118557A1 (ja) |
EP (1) | EP3978179B1 (ja) |
JP (1) | JP7316500B2 (ja) |
WO (1) | WO2020246170A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112518145A (zh) * | 2020-12-16 | 2021-03-19 | 普适激光技术(苏州)有限公司 | 一种新型光纤激光切割头 |
JP2023059618A (ja) * | 2021-10-15 | 2023-04-27 | 株式会社アマダ | 保護ガラス汚れ検知装置及び保護ガラス汚れ検知方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01186296A (ja) * | 1988-01-19 | 1989-07-25 | Miyachi Electric Co | レーザ出射口保護ガラス板の汚れ検出装置 |
DE19605018A1 (de) * | 1996-01-31 | 1997-08-07 | Inpro Innovations Gmbh | Verfahren zum Überwachen der Verschmutzung eines Schutzglases einer Laserschweißoptik beim Laserschweißen und Anordnung zur Durchführung des Verfahrens |
JP2002361452A (ja) * | 2001-03-20 | 2002-12-18 | Precitec Kg | レーザ加工ヘッドの保護ガラスの汚れの程度を測定する方法およびこの方法を実施するレーザ加工システム |
JP2014237150A (ja) * | 2013-06-07 | 2014-12-18 | 株式会社アマダ | 保護ガラスの汚れ検出方法及びレーザ加工ヘッド |
JP2018075610A (ja) * | 2016-11-10 | 2018-05-17 | 株式会社アマダホールディングス | 光学素子の汚れ検出方法及び装置並びにレーザ加工ヘッド |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5253109A (en) * | 1992-04-27 | 1993-10-12 | Donnelly Corporation | Electro-optic device with constant light transmitting area |
SE508426C2 (sv) * | 1997-01-24 | 1998-10-05 | Permanova Lasersystem Ab | Metod och anordning för att övervaka renheten hos ett skyddsglas vid laserbearbetning |
SE512097C2 (sv) | 1998-05-20 | 2000-01-24 | Permanova Lasersystem Ab | Metod och anordning för att övervaka status hos ett skyddsglas vid laserbearbetning |
KR100334461B1 (ko) * | 1999-09-20 | 2002-05-03 | 이형도 | 폴리건 스캐닝 모터 및 이 폴리건 스캐닝 모터에 사용되는 회전 다면경을 가공하기 위한 지그 그리고 이 지그를 통한 회전 다면경의 가공방법 |
US8053700B2 (en) * | 2003-04-16 | 2011-11-08 | Mks Instruments, Inc. | Applicators and cooling systems for a plasma device |
DE20314918U1 (de) * | 2003-09-25 | 2005-02-03 | Scansonic Gmbh | Vorrichtung zur Überwachung eines Schutzglases einer Laseroptik auf Bruch und/oder Verschmutzung |
EP1643281A1 (de) * | 2004-10-02 | 2006-04-05 | Trumpf Werkzeugmaschinen GmbH + Co. KG | Optisches Element einer Laserbearbeitungsmaschine und Halterung des optischen Elements |
JP2007277636A (ja) * | 2006-04-06 | 2007-10-25 | Yamazaki Mazak Corp | レーザ焼入れ方法 |
US7916408B2 (en) * | 2008-10-30 | 2011-03-29 | Corning Incorporated | X-Y adjustable optical mount |
EP2667998B1 (de) * | 2011-01-27 | 2020-11-18 | Bystronic Laser AG | Laserbearbeitungsmaschine sowie verfahren zum zentrieren eines fokussierten laserstrahles |
DE102011007176B4 (de) * | 2011-04-12 | 2015-06-25 | Trumpf Werkzeugmaschinen Gmbh + Co. Kg | Vorrichtung zur Fokussierung eines Laserstrahls und Verfahren zum Überwachen einer Laserbearbeitung |
DE102012216632A1 (de) * | 2012-09-18 | 2014-03-20 | Trumpf Laser Gmbh + Co. Kg | Bearbeitungsmaschine und Verfahren zum Bearbeiten eines Werkstücks |
CN106029290B (zh) * | 2014-02-25 | 2019-12-20 | 松下知识产权经营株式会社 | 激光加工系统 |
JP6379361B2 (ja) * | 2014-03-13 | 2018-08-29 | パナソニックIpマネジメント株式会社 | レーザ加工ヘッド |
JP6757018B2 (ja) * | 2016-04-26 | 2020-09-16 | 株式会社Nishihara | 保護ガラスの汚れ検出装置とそれを備えるレーザ加工機及び保護ガラスの汚れ検出方法 |
JP6616368B2 (ja) * | 2017-09-14 | 2019-12-04 | ファナック株式会社 | レーザ加工前に光学系の汚染レベルに応じて加工条件を補正するレーザ加工装置 |
JP6659746B2 (ja) * | 2018-02-16 | 2020-03-04 | ファナック株式会社 | 保護ウインドの汚れを抑制するレーザ加工ヘッド |
-
2020
- 2020-04-24 EP EP20819074.4A patent/EP3978179B1/en active Active
- 2020-04-24 WO PCT/JP2020/017623 patent/WO2020246170A1/ja unknown
- 2020-04-24 JP JP2021524707A patent/JP7316500B2/ja active Active
-
2021
- 2021-11-19 US US17/531,291 patent/US20220118557A1/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01186296A (ja) * | 1988-01-19 | 1989-07-25 | Miyachi Electric Co | レーザ出射口保護ガラス板の汚れ検出装置 |
DE19605018A1 (de) * | 1996-01-31 | 1997-08-07 | Inpro Innovations Gmbh | Verfahren zum Überwachen der Verschmutzung eines Schutzglases einer Laserschweißoptik beim Laserschweißen und Anordnung zur Durchführung des Verfahrens |
JP2002361452A (ja) * | 2001-03-20 | 2002-12-18 | Precitec Kg | レーザ加工ヘッドの保護ガラスの汚れの程度を測定する方法およびこの方法を実施するレーザ加工システム |
JP2014237150A (ja) * | 2013-06-07 | 2014-12-18 | 株式会社アマダ | 保護ガラスの汚れ検出方法及びレーザ加工ヘッド |
JP2018075610A (ja) * | 2016-11-10 | 2018-05-17 | 株式会社アマダホールディングス | 光学素子の汚れ検出方法及び装置並びにレーザ加工ヘッド |
Also Published As
Publication number | Publication date |
---|---|
EP3978179B1 (en) | 2023-10-04 |
EP3978179A1 (en) | 2022-04-06 |
US20220118557A1 (en) | 2022-04-21 |
EP3978179A4 (en) | 2022-08-03 |
JP7316500B2 (ja) | 2023-07-28 |
WO2020246170A1 (ja) | 2020-12-10 |
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