JPWO2020143430A5 - - Google Patents
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- JPWO2020143430A5 JPWO2020143430A5 JP2020560904A JP2020560904A JPWO2020143430A5 JP WO2020143430 A5 JPWO2020143430 A5 JP WO2020143430A5 JP 2020560904 A JP2020560904 A JP 2020560904A JP 2020560904 A JP2020560904 A JP 2020560904A JP WO2020143430 A5 JPWO2020143430 A5 JP WO2020143430A5
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- 238000001514 detection method Methods 0.000 claims description 4
- 230000002093 peripheral Effects 0.000 claims 8
- 239000000758 substrate Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 1
- 230000001681 protective Effects 0.000 description 1
Description
縁線52が延びているボンディング領域51の一側は、タッチセンサの縁線に破断故障が発生する頻度が高い領域である。例示的な本実施例において、第1短絡線713及び第2短絡線723は、ボンディング領域51において縁線52の延在方向に沿ってボンディング領域51の外側まで延びることができる。第1短絡線713及び第2短絡線723は、図2に示すように、ボンディング領域51から上向き方向に沿って延びる。このような設置により、タッチセンサにおける縁線52が延びるボンディング領域51の一側のクラック状態を重点的に検出することができる。
図2を参照すると、第1短絡線713及び第2短絡線723は、それぞれテストピン群の1つのテストピンから始まりボンディング領域51の外側に延びて、テストピン群の他の1つのテストピンに接続される経路を有する。さらに詳細には、本実施例によれば、第1短絡線713及び第2短絡線723は、それぞれ互いに平行する2つのトレース(trace)を有する。前記2つのトレースは、それぞれ2つのテストピンに接続される。
One side of the bonding area 51 where the edge line 52 extends is an area where breakage failures in the edge line of the touch sensor frequently occur. In this exemplary embodiment, the first shorting line 713 and the second shorting line 723 can extend outside the bonding area 51 along the extending direction of the edge line 52 in the bonding area 51 . The first shorting line 713 and the second shorting line 723 extend along the upward direction from the bonding area 51, as shown in FIG. With such installation, it is possible to detect a crack state on one side of the bonding area 51 where the edge line 52 extends in the touch sensor.
Referring to FIG. 2, a first shorting line 713 and a second shorting line 723 each start from one test pin of the test pin group and extend outside the bonding area 51 to another test pin of the test pin group. It has a connected path. More specifically, according to this embodiment, the first shunt line 713 and the second shunt line 723 each have two traces parallel to each other. The two traces are connected to two test pins respectively.
タッチセンサを表示モジュールに集積する場合、基板に貼合される必要がある。上記の基板は、タッチセンサの集積方式によって、偏光シート、保護ガラスなどであってもよい。例示的な本実施例において、図3、4に示すように、図3は、本発明に係るタッチセンサの他の例示的な実施例の構造を示す模式図であり、図4は、図3におけるA―A線に沿った断面図である。前記タッチセンサ5は、基板8に貼合される。前記基板8には、スロット領域81が開設されている。前記ボンディング領域51は、前記スロット領域81に形成される。タッチセンサ5におけるスロット領域81に位置し且つボンディング領域51以外の位置には、フィルム層が何も貼り付けられていない。本実施例において、図4に示したように、スロット領域81からボンディング領域51を除去することにより異形状の領域を形成することができる。上記異形状の領域を異形状のスロット領域53と呼ぶ。フィルム層が貼り付けられていない当該領域を異形状のスロット領域53と定義する。前記異形状のスロット領域53は、タッチセンサにクラックが発生した頻度が高い領域である。例示的な本実施例において、前記第1短絡線713及び第2短絡線723は、前記異形状のスロット領域53を通過して前記タッチセンサ5と前記基板8との貼合領域まで延びることができる。このような設置により、タッチセンサのボンディング領域51の周囲にクラックが発生したか否かを検出することができ、異形状のスロット領域53にクラックが発生したか否かを検出することもできる。 When the touch sensor is integrated in the display module, it needs to be attached to the substrate. The above substrate may be a polarizing sheet, protective glass, etc., depending on the integration method of the touch sensor. In this exemplary embodiment, as shown in FIGS. 3 and 4, FIG. 3 is a schematic diagram showing the structure of another exemplary embodiment of the touch sensor according to the present invention, and FIG. 2 is a cross-sectional view taken along line AA in FIG. The touch sensor 5 is attached to the substrate 8 . A slot area 81 is formed in the substrate 8 . The bonding area 51 is formed in the slot area 81 . No film layer is attached to the slot region 81 of the touch sensor 5 and to a position other than the bonding region 51 . In this embodiment, as shown in FIG. 4, by removing the bonding area 51 from the slot area 81, an irregular shaped area can be formed. The irregularly shaped region is called an irregularly shaped slot region 53 . The area to which the film layer is not attached is defined as an irregular slot area 53 . The odd-shaped slot region 53 is a region in which cracks frequently occur in the touch sensor. In this exemplary embodiment, the first short-circuit line 713 and the second short-circuit line 723 may pass through the irregular-shaped slot area 53 and extend to the bonding area between the touch sensor 5 and the substrate 8 . can. With such installation, it is possible to detect whether or not a crack has occurred around the bonding area 51 of the touch sensor, and whether or not a crack has occurred in the odd-shaped slot area 53 can also be detected.
例示的な本実施例において、図5に示すように、本発明に係るタッチセンサの他の例示的な実施例の構造を示す模式図である。前記第1短絡線713及び前記第2短絡線723は、前記エッジ領域55の全体まで延びることができる。すなわち、第1短絡線713及び第2短絡線723は、タッチ領域を完全に囲むようになる。タッチセンサの周囲の任意の位置にクラックが発生して第1短絡線又は第2短絡線が破断された場合にも、上記のような検出方法により、クラックが発生したか否かを判断することができる。 In this exemplary embodiment, as shown in FIG. 5, it is a schematic diagram illustrating the structure of another exemplary embodiment of the touch sensor according to the present invention. The first shorting line 713 and the second shorting line 723 may extend all the way to the edge region 55 . That is, the first shorting line 713 and the second shorting line 723 completely surround the touch area. Even if a crack occurs at an arbitrary position around the touch sensor and the first short-circuit wire or the second short-circuit wire is broken, it is possible to determine whether or not the crack has occurred by the above detection method. can be done.
Claims (16)
前記ボンディング領域には、少なくとも1つのテストピン群が設置され、
前記少なくとも1つのテストピン群のそれぞれは、短絡線によって短絡される2つのテストピンを含み、
前記短絡線は、前記ボンディング領域の外側まで延びる
タッチパネル。 A touch panel including a touch area and a peripheral area surrounding the touch area, wherein the peripheral area on at least one side of the touch area includes a bonding area for bonding a circuit board,
At least one test pin group is installed in the bonding area,
each of the at least one test pin group includes two test pins shorted by a shorting wire;
The short-circuit line extends to the outside of the bonding area. The touch panel.
前記スロット領域におけるボンディング領域以外の位置は、異形状のスロット領域であり、
前記短絡線は、前記異形状のスロット領域を通過して前記スロット領域以外の周辺領域に延びる
請求項1に記載のタッチパネル。 the touch panel has a slot area in which the bonding area is located;
A position other than the bonding area in the slot area is an irregularly shaped slot area,
The touch panel according to claim 1, wherein the short-circuit line passes through the irregular-shaped slot area and extends to a peripheral area other than the slot area.
前記ボンディング領域には、複数のタッチピンが設置され、A plurality of touch pins are installed in the bonding area,
前記複数のタッチトレースのそれぞれは、タッチ電極に接続される第1端部と、前記複数のタッチピンのうちの一つのタッチピンに接続される第2端部とを含み、each of the plurality of touch traces includes a first end connected to a touch electrode and a second end connected to one of the plurality of touch pins;
前記テストピンは、前記複数のタッチピンが形成される領域の外側に設置されるThe test pins are installed outside the area where the plurality of touch pins are formed.
ことを特徴とする請求項1に記載のタッチパネル。The touch panel according to claim 1, characterized in that:
ことを特徴をする請求項3に記載のタッチパネル。The touch panel according to claim 3, characterized by:
請求項1に記載のタッチパネル。 The touch panel of claim 1, wherein the shorting line surrounds the touch area.
前記ボンディング領域の第1側に設置されるとともに、第1短絡線によって短絡される2つの第1テストピンを含む第1テストピン群と、
前記ボンディング領域における前記第1側に対向する第2側に設置されるとともに、第2短絡線によって短絡される2つの第2テストピンを含む第2テストピン群と、を含む
請求項2に記載のタッチパネル。 The at least one test pin group,
a first test pin group including two first test pins located on the first side of the bonding area and shorted by a first shorting wire;
a second test pin group including two second test pins located on a second side of the bonding area opposite the first side and shorted by a second shorting wire. touch panel.
前記第1短絡線は、前記ボンディング領域の第1側で前記タッチパネルの前記周辺領域まで延びる
請求項6に記載のタッチパネル。 The first short-circuit line extends to the irregular-shaped slot region and extends along an edge line of the irregular-shaped slot region,
7. The touch panel of claim 6 , wherein the first shorting line extends to the peripheral area of the touch panel on the first side of the bonding area.
前記第2短絡線は、前記ボンディング領域における前記第1側に対向する第2側で前記タッチパネルの前記周辺領域まで延びる
請求項7に記載のタッチパネル。 The second short-circuit line extends to the irregular-shaped slot region and extends along an edge line of the irregular-shaped slot region,
8. The touch panel of claim 7 , wherein the second shorting line extends to the peripheral area of the touch panel on a second side opposite the first side of the bonding area.
請求項6に記載のタッチパネル。 7. The touch panel of claim 6 , wherein the first shorting line and the second shorting line extend throughout the peripheral area.
請求項9に記載のタッチパネル。 10. The touch panel of claim 9 , wherein the first shorting line and the second shorting line are adjacent at corners of the peripheral region but do not touch.
請求項6に記載のタッチパネル。 The touch panel according to claim 6, wherein extension lengths of the first short-circuit line and the second short-circuit line are different in the peripheral region.
ことを特徴とする請求項1に記載のタッチパネル。 The touch panel according to claim 1, characterized in that:
前記2つのトレースは、それぞれ2つのテストピンに接続されるThe two traces are connected to two test pins respectively
ことを特徴とする請求項12に記載のタッチパネル。13. The touch panel according to claim 12, characterized by:
前記回路基板のボンディング領域には、少なくとも1つのテストピン群が設置され、
前記テストピン群のそれぞれは、2つのテストピンを含み、
前記回路基板を前記タッチパネルにボンディングする場合、前記タッチパネルの2つの検出ピンのそれぞれが前記回路基板の2つの検出ピンに正対する
タッチモジュール。 A touch module, comprising: the touch panel according to any one of claims 1 to 13 ; and a circuit board on which a touch integrated circuit is installed and bonded to the touch panel,
At least one test pin group is installed in the bonding area of the circuit board,
each of the test pin groups includes two test pins;
When bonding the circuit board to the touch panel, each of the two detection pins of the touch panel faces two detection pins of the circuit board. A touch module.
電気信号収集ユニットを利用して、前記回路基板における2つのテストピンの間の電気信号を収集するステップと、
前記電気信号により、前記タッチセンサにクラックが発生したか否かを判断するステップと、を含む
タッチセンサのクラックの検出方法。 A touch sensor crack detection method for detecting a touch module according to claim 14 , comprising:
using an electrical signal acquisition unit to acquire electrical signals between two test pins on the circuit board;
and determining whether or not a crack has occurred in the touch sensor based on the electrical signal.
前記電気信号により、前記タッチパネルにクラックが発生したか否か及びクラックの発生位置を判断するステップと、をさらに含む
請求項15に記載のタッチセンサのクラックの検出方法。 using the electrical signal acquisition unit to acquire electrical signals between a plurality of test pin groups having short-circuit lines with different extension lengths;
16. The method of detecting a crack in a touch sensor according to claim 15 , further comprising determining whether a crack has occurred in the touch panel and a location of the crack based on the electric signal.
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CN201910016302.0 | 2019-01-08 | ||
CN201910016302.0A CN109739386B (en) | 2019-01-08 | 2019-01-08 | Touch sensor, touch module and touch sensor crack detection method |
PCT/CN2019/127169 WO2020143430A1 (en) | 2019-01-08 | 2019-12-20 | Touch panel, touch module and touch panel crack detection method |
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US (1) | US11181999B2 (en) |
EP (1) | EP3910455A4 (en) |
JP (1) | JP2022516387A (en) |
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- 2019-12-20 WO PCT/CN2019/127169 patent/WO2020143430A1/en unknown
- 2019-12-20 JP JP2020560904A patent/JP2022516387A/en active Pending
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