JPWO2019103086A1 - Thermosetting resin compositions, insulating films, interlayer insulating films, multilayer wiring boards, and semiconductor devices - Google Patents

Thermosetting resin compositions, insulating films, interlayer insulating films, multilayer wiring boards, and semiconductor devices Download PDF

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JPWO2019103086A1
JPWO2019103086A1 JP2019555358A JP2019555358A JPWO2019103086A1 JP WO2019103086 A1 JPWO2019103086 A1 JP WO2019103086A1 JP 2019555358 A JP2019555358 A JP 2019555358A JP 2019555358 A JP2019555358 A JP 2019555358A JP WO2019103086 A1 JPWO2019103086 A1 JP WO2019103086A1
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佐藤 淳也
淳也 佐藤
津与志 黒川
津与志 黒川
吉田 真樹
真樹 吉田
慎 寺木
慎 寺木
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    • C08L71/00Compositions of polyethers obtained by reactions forming an ether link in the main chain; Compositions of derivatives of such polymers
    • C08L71/08Polyethers derived from hydroxy compounds or from their metallic derivatives
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    • C08F299/00Macromolecular compounds obtained by interreacting polymers involving only carbon-to-carbon unsaturated bond reactions, in the absence of non-macromolecular monomers
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Abstract

高周波特性、および耐熱信頼性に優れ(誘電正接(tanδ)の変化量が小さく)、かつはんだ耐熱性に優れる、ポリフェニレンエーテル(PPE)系熱硬化性樹脂組成物を提供することを、目的とする。(A)末端に不飽和二重結合を有する数平均分子量が800〜4500のポリフェニレンエーテル、(B)融点が200℃以上のフェノール系酸化防止剤、および(C)熱可塑性エラストマーを含むことを特徴とする、熱硬化性樹脂組成物である。【選択図】 なしAn object of the present invention is to provide a polyphenylene ether (PPE) -based thermosetting resin composition having excellent high-frequency characteristics and heat resistance (small change in dielectric loss tangent (tan δ)) and excellent solder heat resistance. .. It is characterized by containing (A) a polyphenylene ether having an unsaturated double bond at the terminal and having a number average molecular weight of 800 to 4500, (B) a phenolic antioxidant having a melting point of 200 ° C. or higher, and (C) a thermoplastic elastomer. It is a thermosetting resin composition. [Selection diagram] None

Description

本発明は、熱硬化性樹脂組成物、絶縁性フィルム、層間絶縁性フィルム、多層配線板、および半導体装置に関する。特に、高周波化に対応可能な熱硬化性樹脂組成物、絶縁性フィルム、層間絶縁性フィルム、多層配線板、および半導体装置に関する。 The present invention relates to thermosetting resin compositions, insulating films, interlayer insulating films, multilayer wiring boards, and semiconductor devices. In particular, the present invention relates to a thermosetting resin composition, an insulating film, an interlayer insulating film, a multilayer wiring board, and a semiconductor device capable of increasing the frequency.

現在、各種通信機器等の電子機器には、高周波化が求められることが多い。例えば、ミリ波通信等の高周波用途の多層プリント配線板には、低伝送損失が要求されることが多い。この高周波用途の多層プリント配線板の接着層やカバーレイ、または基板自体に使用される材料として、優れた高周波特性を有するポリフェニレンエーテル(PPE)を用いることが、知られている。 At present, electronic devices such as various communication devices are often required to have high frequencies. For example, a low transmission loss is often required for a multilayer printed wiring board for high frequency applications such as millimeter wave communication. It is known to use polyphenylene ether (PPE) having excellent high frequency characteristics as a material used for an adhesive layer or a coverlay of a multilayer printed wiring board for high frequency applications, or a substrate itself.

一方、エポキシ等の硬化成分やエラストマーを使用して、樹脂組成物に、PPE並みの高周波特性を持たせることが、報告されており(特許文献1)、エポキシ樹脂に含有されたフェノール系酸化防止剤が、樹脂組成物の高周波特性を悪化させることなく使用できると、記載されている。 On the other hand, it has been reported that a resin composition has high-frequency characteristics comparable to those of PPE by using a curing component such as epoxy or an elastomer (Patent Document 1), and a phenolic antioxidant contained in the epoxy resin. It is stated that the agent can be used without deteriorating the high frequency properties of the resin composition.

特開2014−201642号公報Japanese Unexamined Patent Publication No. 2014-201642

ところで、熱硬化性のPPEは、反応性及び溶媒への可溶性の観点から、低分子量化することが、好ましい。 By the way, it is preferable that the thermosetting PPE has a low molecular weight from the viewpoint of reactivity and solubility in a solvent.

しかしながら、低分子量の熱硬化性PPEを重合させて得られたPPE重合体は、高温での酸化劣化が非常に早く、多層配線板に使用した際に、耐熱信頼性試験後の誘電正接(tanδ)値が変動してしまう、という問題があることを、本発明者らは見出した。加えて、多層配線版には、はんだ耐熱性も要求され、この要求も満たす必要がある。 However, the PPE polymer obtained by polymerizing a low molecular weight thermosetting PPE has very rapid oxidative deterioration at high temperatures, and when used in a multilayer wiring board, it has a dielectric loss tangent (tan δ) after a heat resistance reliability test. ) The present inventors have found that there is a problem that the value fluctuates. In addition, the multilayer wiring plate is also required to have solder heat resistance, and this requirement must be satisfied.

本発明の目的は、上述の観点から、高周波特性、および耐熱信頼性に優れ(誘電正接(tanδ)の変化量が小さく)、かつはんだ耐熱性に優れる、PPE系熱硬化性樹脂組成物を提供することを、目的とする。 From the above viewpoint, an object of the present invention is to provide a PPE-based thermosetting resin composition having excellent high-frequency characteristics, heat resistance reliability (small change in dielectric loss tangent (tan δ)), and excellent solder heat resistance. The purpose is to do.

本発明は、以下の構成を有することによって上記問題を解決した熱硬化性樹脂組成物、絶縁性フィルム、層間絶縁性フィルム、多層配線板、および半導体装置に関する。
〔1〕(A)末端に不飽和二重結合を有する数平均分子量が800〜4500のポリフェニレンエーテル、
(B)融点が200℃以上のフェノール系酸化防止剤、および
(C)熱可塑性エラストマー
を含むことを特徴とする、熱硬化性樹脂組成物。
〔2〕さらに、(D)無機充填剤を含む、上記〔1〕記載の熱硬化性樹脂組成物。
〔3〕(D)成分が、一般式(10)で表されるシランカップリング剤で表面処理されたシリカフィラー
The present invention relates to a thermosetting resin composition, an insulating film, an interlayer insulating film, a multilayer wiring board, and a semiconductor device, which solve the above problems by having the following configurations.
[1] (A) A polyphenylene ether having an unsaturated double bond at the terminal and having a number average molecular weight of 800 to 4500.
A thermosetting resin composition comprising (B) a phenolic antioxidant having a melting point of 200 ° C. or higher, and (C) a thermoplastic elastomer.
[2] The thermosetting resin composition according to the above [1], which further comprises (D) an inorganic filler.
[3] A silica filler in which the component (D) is surface-treated with a silane coupling agent represented by the general formula (10).

Figure 2019103086
Figure 2019103086

(式中、R21〜R23は、それぞれ独立して、炭素数が1〜3のアルキル基であり、R24は、少なくとも末端に不飽和二重結合を有する官能基であり、nは、3〜9である)を含む、上記〔1〕または〔2〕記載の熱硬化性樹脂組成物。
〔4〕一般式(10)のR24が、ビニル基、または(メタ)アクリル基である、上記〔1〕〜〔3〕のいずれか記載の熱硬化性樹脂組成物。
〔5〕上記〔1〕〜〔4〕のいずれか記載の熱硬化性樹脂組成物を含む、絶縁性フィルム。
〔6〕上記〔1〕〜〔4〕のいずれか記載の熱硬化性樹脂組成物を含む、層間絶縁性フィルム。
〔7〕上記〔1〕〜〔4〕のいずれか記載の樹脂組成物の硬化物、上記〔5〕記載の絶縁性フィルム、または上記〔6〕記載の層間絶縁性フィルムの硬化物。
〔8〕上記〔1〕〜〔4〕のいずれか記載の樹脂組成物の硬化物、上記〔5〕記載の絶縁性フィルム、または上記〔6〕記載の層間絶縁性フィルムの硬化物を有する、多層配線板。
〔9〕上記〔1〕〜〔4〕のいずれか記載の熱硬化性樹脂組成物の硬化物、〔5〕記載の絶縁性フィルム、または上記〔6〕記載の層間絶縁性フィルムの硬化物を有する、半導体装置。
(In the formula, R 21 to R 23 are independently alkyl groups having 1 to 3 carbon atoms, R 24 is a functional group having an unsaturated double bond at least at the terminal, and n is. The thermosetting resin composition according to the above [1] or [2], which comprises (3 to 9).
[4] The thermosetting resin composition according to any one of the above [1] to [3], wherein R 24 of the general formula (10) is a vinyl group or a (meth) acrylic group.
[5] An insulating film containing the thermosetting resin composition according to any one of the above [1] to [4].
[6] An interlayer insulating film containing the thermosetting resin composition according to any one of the above [1] to [4].
[7] A cured product of the resin composition according to any one of the above [1] to [4], a cured product of the insulating film according to the above [5], or a cured product of the interlayer insulating film according to the above [6].
[8] A cured product of the resin composition according to any one of the above [1] to [4], a cured product of the insulating film according to the above [5], or a cured product of the interlayer insulating film according to the above [6]. Multi-layer wiring board.
[9] A cured product of the thermosetting resin composition according to any one of [1] to [4] above, an insulating film according to [5], or a cured product of an interlayer insulating film according to [6] above. Has a semiconductor device.

本発明〔1〕によれば、高周波特性、および耐熱信頼性に優れ(誘電正接(tanδ)の変化量が小さく)、はんだ耐熱性に優れる、PPE系熱硬化性樹脂組成物を提供することができる。 According to the present invention [1], it is possible to provide a PPE-based thermosetting resin composition having excellent high-frequency characteristics, heat resistance reliability (small change in dielectric loss tangent (tan δ)), and excellent solder heat resistance. it can.

本発明〔5〕によれば、高周波特性、および耐熱信頼性に優れ、かつはんだ耐熱性に優れる、PPE系熱硬化性樹脂組成物により形成された層間絶縁性フィルムを提供することができる。
本発明〔6〕によれば、高周波特性、および耐熱信頼性に優れ、かつはんだ耐熱性に優れる、PPE系熱硬化性樹脂組成物により形成された層間絶縁性フィルムを提供することができる。
According to the present invention [5], it is possible to provide an interlayer insulating film formed of a PPE-based thermosetting resin composition, which has excellent high-frequency characteristics, heat resistance reliability, and solder heat resistance.
According to the present invention [6], it is possible to provide an interlayer insulating film formed of a PPE-based thermosetting resin composition, which has excellent high-frequency characteristics, heat resistance reliability, and solder heat resistance.

本発明〔7〕によれば、上記熱硬化性樹脂組成物の硬化物、上記絶縁性フィルム、または上記層間絶縁性フィルムの硬化物により、高周波特性、および耐熱信頼性に優れる多層配線板を提供することができる。本発明〔8〕によれば、上記熱硬化性樹脂組成物の硬化物、上記絶縁性フィルム、または上記層間絶縁性フィルムの硬化物により、高周波特性、および耐熱信頼性に優れる多層配線板を提供することができる。本発明〔9〕によれば、上記熱硬化性樹脂組成物の硬化物、上記絶縁性フィルム、または上記層間絶縁性フィルムの硬化物により、高周波特性、および耐熱信頼性に優れる半導体装置を提供することができる。 According to the present invention [7], a multilayer wiring board excellent in high frequency characteristics and heat resistance reliability is provided by a cured product of the thermosetting resin composition, the insulating film, or the cured product of the interlayer insulating film. can do. According to the present invention [8], a multilayer wiring board excellent in high frequency characteristics and heat resistance reliability is provided by a cured product of the thermosetting resin composition, the insulating film, or the cured product of the interlayer insulating film. can do. According to the present invention [9], a semiconductor device having excellent high frequency characteristics and heat resistance reliability is provided by the cured product of the thermosetting resin composition, the insulating film, or the cured product of the interlayer insulating film. be able to.

〔熱硬化性樹脂組成物〕
本発明の熱硬化性樹脂組成物は、
(A)末端に不飽和二重結合を有する数平均分子量が800〜4500のポリフェニレンエーテル、
(B)融点が200℃以上のフェノール系酸化防止剤、および
(C)熱可塑性エラストマー
を含む。
[Thermosetting resin composition]
The thermosetting resin composition of the present invention
(A) Polyphenylene ether having an unsaturated double bond at the terminal and having a number average molecular weight of 800 to 4500.
It contains (B) a phenolic antioxidant having a melting point of 200 ° C. or higher, and (C) a thermoplastic elastomer.

(A)成分は、末端に不飽和二重結合を有する数平均分子量が800〜4500のポリフェニレンエーテルであり、本発明の熱硬化性樹脂組成物(以下、熱硬化性樹脂組成物という)に、接着性、高周波特性、耐熱性を付与する。ここで、高周波特性とは、高周波領域での伝送損失を小さくする性質をいう。(A)成分は、10GHzにおける比誘電率(ε)が3.5以下、誘電正接(tanδ)が0.003以下であると、高周波特性の観点から、好ましい。(A)成分としては、末端にスチレン基を有するポリフェニレンエーテルが、好ましい。 The component (A) is a polyphenylene ether having an unsaturated double bond at the terminal and having a number average molecular weight of 800 to 4500, and is used in the thermosetting resin composition of the present invention (hereinafter referred to as the thermosetting resin composition). Provides adhesiveness, high frequency characteristics, and heat resistance. Here, the high frequency characteristic means a property of reducing the transmission loss in the high frequency region. The component (A) preferably has a relative permittivity (ε) of 3.5 or less and a dielectric loss tangent (tan δ) of 0.003 or less at 10 GHz from the viewpoint of high frequency characteristics. As the component (A), polyphenylene ether having a styrene group at the terminal is preferable.

末端にスチレン基を有するポリフェニレンエーテル(PPE)としては、高周波特性に優れ、誘電特性(特にtanδ)の温度依存性(常温(25℃)での測定値に対する、高温(120℃)での測定値の変化)が小さいため、一般式(1)で示される化合物が好ましい。 As a polyphenylene ether (PPE) having a styrene group at the end, it has excellent high frequency characteristics, and the dielectric property (particularly tan δ) is temperature-dependent (measured at high temperature (120 ° C) with respect to the measured value at room temperature (25 ° C). The compound represented by the general formula (1) is preferable because the change) is small.

Figure 2019103086
Figure 2019103086

(式(1)中、−(O−X−O)−は、一般式(2)または(3)で表される。) (In the formula (1),-(OX-O)-is represented by the general formula (2) or (3).)

Figure 2019103086
Figure 2019103086

Figure 2019103086
Figure 2019103086

(式(2)中、R,R,R,R,Rは、同一または異なってもよく、炭素数6以下のアルキル基またはフェニル基である。R,R,Rは、同一または異なってもよく、水素原子、炭素数6以下のアルキル基またはフェニル基である。)(In formula (2), R 1 , R 2 , R 3 , R 7 , and R 8 may be the same or different, and are alkyl or phenyl groups having 6 or less carbon atoms. R 4 , R 5 , R. 6 may be the same or different, and is a hydrogen atom, an alkyl group having 6 or less carbon atoms, or a phenyl group.)

(式(3)中、R,R10,R11,R12,R13,R14,R15,R16は、同一または異なってもよく、水素原子、炭素数6以下のアルキル基またはフェニル基である。−A−は、炭素数20以下の直鎖状、分岐状または環状の2価の炭化水素基である。)(In formula (3), R 9 , R 10 , R 11 , R 12 , R 13 , R 14 , R 15 , and R 16 may be the same or different, and may be the same or different, and may be a hydrogen atom, an alkyl group having 6 or less carbon atoms, or an alkyl group. It is a phenyl group. -A- is a linear, branched or cyclic divalent hydrocarbon group having 20 or less carbon atoms.)

(式(1)中、−(Y−O)−は、一般式(4)で表され、1種類の構造または2種類以上の構造がランダムに配列している。) (In the formula (1),-(YO)-is represented by the general formula (4), and one type of structure or two or more types of structures are randomly arranged.)

Figure 2019103086
Figure 2019103086

(式(4)中、R17,R18は、同一または異なってもよく、炭素数6以下のアルキル基またはフェニル基である。R19,R20は、同一または異なってもよく、水素原子、炭素数6以下のアルキル基またはフェニル基である。)(In the formula (4), R 17 and R 18 may be the same or different, and may be an alkyl group or a phenyl group having 6 or less carbon atoms. R 19 and R 20 may be the same or different and may be hydrogen atoms. , An alkyl group or a phenyl group having 6 or less carbon atoms.)

(式(1)中、a,bは、少なくともいずれか一方が0でない、0〜100の整数を示す。) (In equation (1), a and b represent integers from 0 to 100 in which at least one of them is not 0.)

(式(3)における−A−としては、例えば、メチレン、エチリデン、1−メチルエチリデン、1,1−プロピリデン、1,4−フェニレンビス(1−メチルエチリデン)、1,3−フェニレンビス(1−メチルエチリデン)、シクロヘキシリデン、フェニルメチレン、ナフチルメチレン、1−フェニルエチリデン、等の2価の有機基が挙げられるが、これらに限定されるものではない。) (For example, -A- in the formula (3) includes methylene, ethylidene, 1-methylethylidene, 1,1-propyridene, 1,4-phenylenebis (1-methylethylidene), and 1,3-phenylenebis (1). -Methylethylidene), cyclohexylidene, phenylmethylene, naphthylmethylene, 1-phenylethylidene, and other divalent organic groups, but are not limited to these.)

(式(1)で示される化合物としては、R,R,R,R,R,R17,R18が炭素数3以下のアルキル基であり、R,R,R,R,R10,R11,R12,R13,R14,R15,R16,R19,R20が水素原子または炭素数3以下のアルキル基であるものが好ましく、特に一般式(2)または一般式(3)で表される−(O−X−O)−が、一般式(5)、一般式(6)、または一般式(7)であり、一般式(4)で表される−(Y−O)−が、式(8)または式(9)であるか、あるいは式(8)と式(9)がランダムに配列した構造であることがより好ましい。)(As the compound represented by the formula (1), R 1 , R 2 , R 3 , R 7 , R 8 , R 17 , and R 18 are alkyl groups having 3 or less carbon atoms, and R 4 , R 5 , R. 6 , R 9 , R 10 , R 11 , R 12 , R 13 , R 14 , R 15 , R 16 , R 19 , and R 20 are preferably hydrogen atoms or alkyl groups having 3 or less carbon atoms, and are particularly general. -(OX-O)-represented by the formula (2) or the general formula (3) is the general formula (5), the general formula (6), or the general formula (7), and the general formula (4). ) Is more preferably the formula (8) or the formula (9), or a structure in which the formulas (8) and (9) are randomly arranged. )

Figure 2019103086
Figure 2019103086

Figure 2019103086
Figure 2019103086

Figure 2019103086
Figure 2019103086

Figure 2019103086
Figure 2019103086

Figure 2019103086
Figure 2019103086

式(1)で示される化合物の製造方法は、特に限定されるものではなく、例えば、2官能フェノール化合物と1官能フェノール化合物を酸化カップリングさせて得られる2官能フェニレンエーテルオリゴマーの末端フェノール性水酸基をビニルベンジルエーテル化することで製造することができる。 The method for producing the compound represented by the formula (1) is not particularly limited, and for example, the terminal phenolic hydroxyl group of the bifunctional phenylene ether oligomer obtained by oxidation-coupling the bifunctional phenol compound and the monofunctional phenol compound. Can be produced by vinyl benzyl etherification.

(A)成分の熱硬化性樹脂の数平均分子量は、GPC法によるポリスチレン換算で800〜4,500の範囲であり、1000〜3500の範囲が好ましく、重合による酸化劣化の起点を減らしつつ低粘度化を図る観点から、1500〜2500の範囲が、より好ましい。数平均分子量が800以上であれば、本発明の熱硬化性樹脂組成物を塗膜状にした際にべたつき難く、また、4500以下であれば、溶剤への溶解性の低下を防止できる。(A)成分は、単独でも2種以上を併用してもよい。 The number average molecular weight of the thermosetting resin of the component (A) is in the range of 800 to 4,500 in terms of polystyrene by the GPC method, preferably in the range of 1000 to 3500, and has a low viscosity while reducing the origin of oxidative deterioration due to polymerization. The range of 1500 to 2500 is more preferable from the viewpoint of achieving the conversion. When the number average molecular weight is 800 or more, the thermosetting resin composition of the present invention is less sticky when it is formed into a coating film, and when it is 4500 or less, the decrease in solubility in a solvent can be prevented. The component (A) may be used alone or in combination of two or more.

(B)成分は、融点が200℃以上のフェノール系酸化防止剤であり、熱硬化性樹脂に、はんだ耐熱性を付与する。(B)成分の融点が、200℃未満では、熱硬化性樹脂のはんだ耐熱性が、不十分になる。(B)成分の融点が200℃以上のフェノール系酸化防止剤としては、1,3,5−トリス(3,5−ジ−tert−ブチル−4−ヒドロキシベンジル)−1,3,5−トリアジン−2,4,6(1H,3H,5H)−トリオン、1,3,5−トリス(3,5−ジ−tert−ブチル−4−ヒドロキシフェニルメチル)−2,4,6−トリメチルベンゼン、6,6’−ジ−tert−ブチル−4,4’−ブチリデネジ−m−クレゾール等が、挙げられる。 The component (B) is a phenolic antioxidant having a melting point of 200 ° C. or higher, and imparts solder heat resistance to the thermosetting resin. If the melting point of the component (B) is less than 200 ° C., the solder heat resistance of the thermosetting resin becomes insufficient. Examples of the phenolic antioxidant having a component (B) having a melting point of 200 ° C. or higher include 1,3,5-tris (3,5-di-tert-butyl-4-hydroxybenzyl) -1,3,5-triazine. -2,4,6 (1H, 3H, 5H) -trione, 1,3,5-tris (3,5-di-tert-butyl-4-hydroxyphenylmethyl) -2,4,6-trimethylbenzene, Examples thereof include 6,6'-di-tert-butyl-4,4'-butylidenes-m-cresol and the like.

(B)成分の市販品としては、1,3,5−トリス(3,5−ジ−tert−ブチル−4−ヒドロキシベンジル)−1,3,5−トリアジン−2,4,6(1H,3H,5H)−トリオン(アデカ製、品名:AO−20、融点:220〜222℃、分子量:784); Commercially available products of the component (B) include 1,3,5-tris (3,5-di-tert-butyl-4-hydroxybenzyl) -1,3,5-triazine-2,4,6 (1H,). 3H, 5H) -trione (manufactured by ADEKA, product name: AO-20, melting point: 220 to 222 ° C., molecular weight: 784);

Figure 2019103086
Figure 2019103086

1,3,5−トリス(3,5−ジ−tert−ブチル−4−ヒドロキシフェニルメチル)−2,4,6−トリメチルベンゼン(アデカ製、品名:AO−330、融点:243〜245℃): 1,3,5-Tris (3,5-di-tert-butyl-4-hydroxyphenylmethyl) -2,4,6-trimethylbenzene (manufactured by ADEKA, product name: AO-330, melting point: 243 to 245 ° C) :

Figure 2019103086
Figure 2019103086

が、挙げられる。(B)成分は、単独でも2種以上を併用してもよい。 However, it can be mentioned. The component (B) may be used alone or in combination of two or more.

(C)成分は、熱硬化性樹脂組成物に柔軟性を付与する、柔軟性付与樹脂として機能する。(C)成分の熱可塑性エラストマーとしては、誘電特性の観点から、スチレン系熱可塑性エラストマーが、好ましく、誘電特性(特にtanδ)の温度依存性(常温(25℃)での測定値に対する、高温(120℃)での測定値の変化)の小ささの観点から、水添スチレン系熱可塑性エラストマーが、より好ましい。なお、ポリブタジエンを水添したものは、耐熱性は良くなるが、温度依存性が増大する場合がある。 The component (C) functions as a flexibility-imparting resin that imparts flexibility to the thermosetting resin composition. As the thermoplastic elastomer of the component (C), a styrene-based thermoplastic elastomer is preferable from the viewpoint of dielectric properties, and the temperature dependence of the dielectric properties (particularly tan δ) (high temperature (25 ° C.) with respect to the measured value at room temperature (25 ° C.)) A hydrogenated styrene-based thermoplastic elastomer is more preferable from the viewpoint of small change in the measured value at 120 ° C.). Hydrogenated polybutadiene improves heat resistance, but may increase temperature dependence.

(C)成分として好ましい水添スチレン系熱可塑性エラストマーは、分子中の主鎖の不飽和二重結合が水添されたスチレン系ブロックコポリマーであり、この水添スチレン系ブロックコポリマーとしては、スチレン−エチレン/ブチレン−スチレンブロック共重合体(SEBS)や、スチレン−(エチレン−エチレン/プロピレン)−スチレンブロック共重合体(SEEPS)、スチレン−エチレン/プロピレン−スチレンブロック共重合体(SEPS)等が、挙げられ、SEBS、SEEPSが好ましい。SEBSやSEEPSは、誘電特性に優れ、(A)成分の選択肢であるポリフェニレンエーテル(PPE)、変性PPE等と相溶性がよく、耐熱性をもつ熱硬化性樹脂組成物を形成できるからである。さらに、スチレン系ブロックコポリマーは、熱硬化性樹脂組成物の低弾性化にも寄与するため、絶縁性フィルムに柔軟性を付与し、また熱硬化性樹脂組成物の硬化物に3GPa以下の低弾性が求められる用途に好適である。 The preferred hydrogenated styrene-based thermoplastic elastomer as the component (C) is a styrene-based block copolymer in which an unsaturated double bond of the main chain in the molecule is hydrogenated, and the hydrogenated styrene-based block copolymer is styrene-. Ethylene / butylene-styrene block copolymer (SEBS), styrene- (ethylene-ethylene / propylene) -styrene block copolymer (SEEPS), styrene-ethylene / propylene-styrene block copolymer (SEPS), etc. SEBS and SEEPS are preferable. This is because SEBS and SEEPS are excellent in dielectric properties, have good compatibility with polyphenylene ether (PPE), modified PPE, etc., which are options of the component (A), and can form a thermosetting resin composition having heat resistance. Furthermore, since the styrene-based block copolymer also contributes to lowering the elasticity of the thermosetting resin composition, it imparts flexibility to the insulating film, and the cured product of the thermosetting resin composition has a low elasticity of 3 GPa or less. Is suitable for applications that require

(C)成分の重量平均分子量は、30,000〜200,000であるものが好ましく、80,000〜120,000であることがより好ましい。重量平均分子量は、ゲルパーミエーションクロマトグラフィー法(GPC)により、標準ポリスチレンによる検量線を用いた値とする。(C)成分は、単独でも2種以上を併用してもよい。 The weight average molecular weight of the component (C) is preferably 30,000 to 200,000, more preferably 80,000 to 120,000. The weight average molecular weight is set to a value using a calibration curve using standard polystyrene by gel permeation chromatography (GPC). The component (C) may be used alone or in combination of two or more.

(A)成分と(C)成分は樹脂であり、(A)成分は、(A)成分と(C)成分の合計100質量部に対して、10〜70質量部であると好ましく、20〜60質量部であると、より好ましい。 The component (A) and the component (C) are resins, and the component (A) is preferably 10 to 70 parts by mass with respect to 100 parts by mass in total of the components (A) and (C), and is 20 to 20 parts by mass. It is more preferably 60 parts by mass.

(A)成分が少ないと、熱硬化性樹脂組成物の硬化物の硬化が充分でなく、ピール強度の低下や熱膨張係数(CTE)の増大、耐熱性の低下等の不具合が生じやすくなる。(A)成分が多いと、熱硬化性樹脂組成物から作製されるフィルムが硬く、脆く、割れやすくなり、フィルム性が損なわれ、また熱硬化性樹脂組成物の硬化物も硬く、脆くなり、ピール強度の低下や、ヒートショックによるクラックが、発生しやすくなる、高温での酸化により耐熱信頼性が低下する、などの不具合が生じやすくなる。 If the amount of the component (A) is small, the cured product of the thermosetting resin composition is not sufficiently cured, and problems such as a decrease in peel strength, an increase in the coefficient of thermal expansion (CTE), and a decrease in heat resistance are likely to occur. When the amount of the component (A) is large, the film produced from the thermosetting resin composition becomes hard, brittle and easily cracked, the film property is impaired, and the cured product of the thermosetting resin composition also becomes hard and brittle. Problems such as a decrease in peel strength, a tendency for cracks due to heat shock to occur, and a decrease in heat resistance due to oxidation at a high temperature are likely to occur.

(A)成分および(C)成分以外の樹脂として、例えば、エポキシ樹脂、マレイミド樹脂、シアネート樹脂、ポリイミド樹脂等を併用してもよい。 As the resin other than the component (A) and the component (C), for example, an epoxy resin, a maleimide resin, a cyanate resin, a polyimide resin, or the like may be used in combination.

(B)成分は、熱硬化性樹脂組成物中の樹脂成分100質量部に対して、高周波特性の観点から、0.1〜10質量部であると好ましく、0.3〜5質量部であると、より好ましく、0.5〜2質量部であると特に好ましい。 The component (B) is preferably 0.1 to 10 parts by mass, preferably 0.3 to 5 parts by mass, with respect to 100 parts by mass of the resin component in the thermosetting resin composition from the viewpoint of high frequency characteristics. It is more preferable, and 0.5 to 2 parts by mass is particularly preferable.

熱硬化性樹脂は、さらに、(D)無機充填剤を含むと、熱硬化性樹脂の硬化物のCTEを低くする観点から、好ましい。(D)成分としては、高周波特性の観点から、シリカフィラーであると、好ましい。(D)成分の無機充填剤は、表面処理されていると、耐湿信頼性の観点から、より好ましい。この表面処理剤としては、一般式(10): It is preferable that the thermosetting resin further contains (D) an inorganic filler from the viewpoint of lowering the CTE of the cured product of the thermosetting resin. As the component (D), a silica filler is preferable from the viewpoint of high frequency characteristics. It is more preferable that the inorganic filler of the component (D) is surface-treated from the viewpoint of moisture resistance and reliability. As this surface treatment agent, the general formula (10):

Figure 2019103086
Figure 2019103086

(式中、R21〜R23は、それぞれ独立して、炭素数が1〜3のアルキル基であり、R24は、少なくとも末端に不飽和二重結合を有する官能基であり、nは、3〜9である)で表されるシランカップリング剤であると、耐湿性向上の観点から好ましく、また、式中、nは5〜9であると、より好ましい。さらに、一般式(10)のR24が、反応性による(A)との接着性の観点から、ビニル基、または(メタ)アクリル基であると好ましく、ビニル基であるとピール強度の観点から、より好ましい。(In the formula, R 21 to R 23 are independently alkyl groups having 1 to 3 carbon atoms, R 24 is a functional group having an unsaturated double bond at least at the terminal, and n is. The silane coupling agent represented by (3 to 9) is preferable from the viewpoint of improving moisture resistance, and n is more preferably 5 to 9 in the formula. Further, R 24 of the general formula (10) is preferably a vinyl group or a (meth) acrylic group from the viewpoint of adhesiveness to (A) due to reactivity, and a vinyl group is preferably from the viewpoint of peel strength. , More preferred.

(D)成分に使用されうるシランカップリング剤としては、オクテニルトリアルコキシシランや(メタ)アクリロキシアルキルトリアルコキシシラン、3−メタクリロキシプロピルトリメトキシシランが、挙げられる。オクテニルトリアルコキシシランとしては、オクテニルトリメトキシシラン、オクテニルトリエトキシシラン等が、挙げられる。(メタ)アクリロキシアルキルトリアルコキシシランとしては、(メタ)アクリロキシオクチルトリメトキシシラン、(メタ)アクリロキシオクチルトリエトキシシラン等が、挙げられる。熱硬化性樹脂組成物のピール強度向上の観点から、オクテニルトリメトキシシランが、より好ましい。(D)成分に使用されうるシランカップリング剤の市販品としては、信越化学工業(株)製オクテニルトリメトキシシラン(品名:KBM−1083)、信越化学工業(株)製メタクリロキシオクチルトリメトキシシラン(品名:KBM−5803)、信越化学工業(株)製3−メタクリロキシプロピルトリメトキシシラン(品名:KBM−503)が、挙げられる。(D)成分に使用されうるシランカップリング剤は、単独でも2種以上であってもよい。 Examples of the silane coupling agent that can be used as the component (D) include octenyltrialkoxysilane, (meth) acryloxyalkyltrialkoxysilane, and 3-methacryloxypropyltrimethoxysilane. Examples of the octenyltrialkoxysilane include octenyltrimethoxysilane and octenyltriethoxysilane. Examples of the (meth) acryloxyalkyltrialkoxysilane include (meth) acryloxyoctyltriethoxysilane and (meth) acryloxyoctyltrialkoxysilane. From the viewpoint of improving the peel strength of the thermosetting resin composition, octenyltrimethoxysilane is more preferable. Commercially available silane coupling agents that can be used as the component (D) include octenyltrimethoxysilane (product name: KBM-1083) manufactured by Shin-Etsu Chemical Co., Ltd. and methacryoxyoctyltrimethoxy manufactured by Shin-Etsu Chemical Co., Ltd. Examples thereof include silane (product name: KBM-5803) and 3-methacryloxypropyltrimethoxysilane (product name: KBM-503) manufactured by Shin-Etsu Chemical Co., Ltd. The silane coupling agent that can be used as the component (D) may be used alone or in combination of two or more.

(D)成分に使用されるシリカフィラーとしては、溶融シリカ、普通珪石、球状シリカ、破砕シリカ、結晶性シリカ、非晶質シリカ等が挙げられ、特に限定されない。シリカフィラーの分散性、熱硬化性樹脂組成物の流動性、硬化物の表面平滑性、誘電特性、低熱膨張率、接着性等の観点からは、球状の溶融シリカが、望ましい。また、シリカフィラーの平均粒径(球状でない場合は、その平均最大径)は、特に限定されないが、比表面積の小ささによる硬化後の耐湿性向上の観点から、0.05〜20μmであると、好ましく、0.1〜10μmであると、より好ましく、1〜10μmであると、さらに好ましい。ここで、シリカフィラーの平均粒径は、レーザー散乱回折式粒度分布測定装置により測定した体積基準のメジアン径をいう。 Examples of the silica filler used for the component (D) include fused silica, ordinary silica stone, spherical silica, crushed silica, crystalline silica, and amorphous silica, and are not particularly limited. From the viewpoints of dispersibility of the silica filler, fluidity of the thermosetting resin composition, surface smoothness of the cured product, dielectric properties, low thermal expansion rate, adhesiveness, and the like, spherical fused silica is desirable. The average particle size of the silica filler (or the average maximum diameter if it is not spherical) is not particularly limited, but is 0.05 to 20 μm from the viewpoint of improving the moisture resistance after curing due to the small specific surface area. It is preferably 0.1 to 10 μm, more preferably 1 to 10 μm, and even more preferably 1 to 10 μm. Here, the average particle size of the silica filler refers to a volume-based median diameter measured by a laser scattering diffraction type particle size distribution measuring device.

上述のカップリング剤を用いて、シリカフィラーを表面処理する方法は、特に限定されず、例えば、乾式法、湿式法等が、挙げられる。 The method for surface-treating the silica filler using the above-mentioned coupling agent is not particularly limited, and examples thereof include a dry method and a wet method.

乾式法は、シリカフィラーと、シリカフィラーの表面積に対して適切な量のシランカップリング剤を撹拌装置に入れ、適切な条件で撹拌するか、予めシリカフィラーを攪拌装置に入れ、適切な条件で攪拌しながら、シリカフィラーの表面積に対して適切な量のシランカップリング剤を、原液または溶液にて滴下または噴霧等により添加し、攪拌によってシリカフィラー表面にシランカップリング剤を均一に付着させ、(加水分解させることによって)表面処理する方法である。撹拌装置としては、例えば、ヘンシェルミキサー等の高速回転で、撹拌・混合ができるミキサーが挙げられるが、特に、限定されるものではない。 In the dry method, the silica filler and the silane coupling agent in an appropriate amount with respect to the surface area of the silica filler are put into a stirrer and stirred under appropriate conditions, or the silica filler is put in a stirrer in advance and under appropriate conditions. While stirring, an appropriate amount of the silane coupling agent with respect to the surface area of the silica filler is added in a stock solution or a solution by dropping or spraying, and the silane coupling agent is uniformly adhered to the surface of the silica filler by stirring. A method of surface treatment (by hydrolysis). Examples of the stirring device include, for example, a mixer capable of stirring and mixing at high speed rotation such as a Henschel mixer, but the stirring device is not particularly limited.

湿式法は、表面処理をするシリカフィラーの表面積に対して、十分な量のシランカップリング剤を、水または有機溶剤に溶解した表面処理溶液に、シリカフィラーを添加し、スラリー状になるよう撹拌することにより、シランカップリング剤とシリカフィラーを、十分反応させた後、濾過や遠心分離等を用い、シリカフィラーを表面処理溶液から分離し、加熱乾燥して、表面処理を行う方法である。 In the wet method, the silica filler is added to a surface treatment solution in which a sufficient amount of silane coupling agent is dissolved in water or an organic solvent with respect to the surface area of the silica filler to be surface-treated, and the mixture is stirred so as to form a slurry. This is a method in which the silica coupling agent and the silica filler are sufficiently reacted, and then the silica filler is separated from the surface treatment solution by filtration, centrifugation or the like, and then heat-dried to perform the surface treatment.

(D)成分は、単独でも2種以上を併用してもよい。 The component (D) may be used alone or in combination of two or more.

(D)成分は、低CTE化の観点から、熱硬化性樹脂組成物(但し、溶剤を除く)中、45〜75体積%(中実シリカフィラーであれば64〜88質量%)であることが好ましく、50〜70体積%(中実シリカフィラーであれば69〜85質量%)であることが、より好ましい。(D)成分が少ないと、所望する熱硬化性樹脂組成物のCTEを達成することができず、(D)成分が多いと、熱硬化性樹脂組成物のピール強度が低下しやすくなる。 The component (D) is 45 to 75% by volume (64 to 88% by mass in the case of a solid silica filler) in the thermosetting resin composition (excluding the solvent) from the viewpoint of reducing CTE. Is preferable, and 50 to 70% by volume (69 to 85% by mass in the case of a solid silica filler) is more preferable. If the amount of the component (D) is small, the desired CTE of the thermosetting resin composition cannot be achieved, and if the amount of the component (D) is large, the peel strength of the thermosetting resin composition tends to decrease.

なお、熱硬化性樹脂組成物は、本発明の効果を損なわない範囲で、(A)成分の硬化促進剤としての有機過酸化物や、シランカップリング剤等のカップリング剤(インテグラルブレンド)、難燃剤、粘着性付与剤、消泡剤、流動調整剤、揺変剤、分散剤、酸化防止剤、難燃剤等の添加剤を、含むことができる。シランカップリング剤としては、P−スチリルトリメトキシシラン(信越化学工業(株)製、KBM−1403)、ビス(トリエトキシシリルプロピル)テトラスルフィド(信越化学工業(株)製、KBE−846)、ポリスルフィド系シランカップリング剤(株式会社大阪ソーダ製、カブラス4)、オクテニルトリメトキシシラン(信越化学工業(株)製、KBM−1083)、メタクリロキシオクチルトリメトキシシラン(信越化学工業(株)製、KBM−5803)、3−メタクリロキシプロピルトリメトキシシラン(信越化学工業(株)製、KBM−503)、3−メタクリロキシプロピルトリエトキシシラン(信越化学工業(株)製、KBE−503)、3−グリシドキシプロピルトリメトキシシラン(信越化学工業(株)製、KBM−403)、3−グリシドキシプロピルトリエトキシシラン(信越化学工業(株)製、KBE−403)等が、挙げられる。難燃剤としては、ホスフィン酸金属塩(クラリアントジャパン製、OP−935)等が、挙げられる。 The thermosetting resin composition is an organic peroxide as a curing accelerator of the component (A) or a coupling agent (integral blend) such as a silane coupling agent as long as the effect of the present invention is not impaired. , Flame retardants, tackifiers, defoamers, flow regulators, rocking agents, dispersants, antioxidants, flame retardants and other additives can be included. Examples of the silane coupling agent include P-styryltrimethoxysilane (manufactured by Shin-Etsu Chemical Co., Ltd., KBM-1403), bis (triethoxysilylpropyl) tetrasulfide (manufactured by Shin-Etsu Chemical Co., Ltd., KBE-846), Polysulfide-based silane coupling agent (Osaka Soda Co., Ltd., Cabras 4), octenyltrimethoxysilane (Shin-Etsu Chemical Co., Ltd., KBM-1083), metharoxyoctyltrimethoxysilane (Shin-Etsu Chemical Co., Ltd.) , KBM-5803), 3-methacryloxypropyltrimethoxysilane (manufactured by Shin-Etsu Chemical Co., Ltd., KBM-503), 3-methacryloxypropyltriethoxysilane (manufactured by Shin-Etsu Chemical Co., Ltd., KBE-503), Examples thereof include 3-glycidoxypropyltrimethoxysilane (manufactured by Shin-Etsu Chemical Co., Ltd., KBM-403) and 3-glycidoxypropyltriethoxysilane (manufactured by Shin-Etsu Chemical Co., Ltd., KBE-403). .. Examples of the flame retardant include a phosphinic acid metal salt (manufactured by Clariant Japan, OP-935) and the like.

熱硬化性樹脂組成物は、樹脂組成物を構成する(A)、(B)、(C)成分等の原料を、有機溶剤に溶解又は分散等させることにより、作製することができる。これらの原料の溶解又は分散等の装置としては、特に限定されるものではないが、加熱装置を備えた攪拌機、デゾルバー、ライカイ機、3本ロールミル、ボールミル、プラネタリーミキサー、ビーズミル等を使用することができる。また、これら装置を適宜組み合わせて使用してもよい。 The thermosetting resin composition can be produced by dissolving or dispersing the raw materials such as the components (A), (B) and (C) constituting the resin composition in an organic solvent. The device for dissolving or dispersing these raw materials is not particularly limited, but a stirrer, a resolver, a Raikai machine, a three-roll mill, a ball mill, a planetary mixer, a bead mill or the like equipped with a heating device shall be used. Can be done. Moreover, you may use these devices in combination as appropriate.

有機溶剤としては、芳香族系溶剤として、例えば、トルエン、キシレン等、ケトン系溶剤として、例えばメチルエチルケトン、メチルイソブチルケトン等が挙げられる。有機溶剤は、単独でも、2種以上を組み合わせて用いてもよい。作業性の観点から、熱硬化性樹脂組成物は、200〜3000mPa・sの粘度の範囲であることが好ましい。粘度は、E型粘度計を用いて、回転数50rpm、25℃で測定した値とする。 Examples of the organic solvent include aromatic solvents such as toluene and xylene, and ketone solvents such as methyl ethyl ketone and methyl isobutyl ketone. The organic solvent may be used alone or in combination of two or more. From the viewpoint of workability, the thermosetting resin composition preferably has a viscosity in the range of 200 to 3000 mPa · s. The viscosity is a value measured at a rotation speed of 50 rpm and 25 ° C. using an E-type viscometer.

得られる熱硬化性樹脂組成物は、高周波特性、および耐熱信頼性に優れ(誘電正接(tanδ)の変化量が小さく)、かつはんだ耐熱性に優れる。 The obtained thermosetting resin composition is excellent in high frequency characteristics and heat resistance reliability (the amount of change in dielectric loss tangent (tan δ) is small), and is also excellent in solder heat resistance.

〔絶縁性フィルム〕
本発明の絶縁性フィルムは、上述の熱硬化性樹脂組成物を含む。絶縁性フィルムは、熱硬化性樹脂組成物から、所望の形状に形成される。具体的には、絶縁性フィルムは、上述の熱硬化性樹脂組成物を、支持体の上に、塗布した後、乾燥することにより、得ることができる。支持体は、特に限定されず、銅、アルミニウム等の金属箔、ポリエステル樹脂、ポリエチレン樹脂、ポリエチレンテレフタレート樹脂(PET)等の有機フィルム等が挙げられる。支持体はシリコーン系化合物等で離型処理されていてもよい。なお、熱硬化性樹脂組成物は、種々の形状で使用することができ、形状は特に限定されない。
[Insulating film]
The insulating film of the present invention contains the above-mentioned thermosetting resin composition. The insulating film is formed from the thermosetting resin composition into a desired shape. Specifically, the insulating film can be obtained by applying the above-mentioned thermosetting resin composition on a support and then drying it. The support is not particularly limited, and examples thereof include metal foils such as copper and aluminum, organic films such as polyester resin, polyethylene resin, and polyethylene terephthalate resin (PET). The support may be mold-released with a silicone compound or the like. The thermosetting resin composition can be used in various shapes, and the shape is not particularly limited.

熱硬化性樹脂組成物を支持体に塗布する方法は、特に限定されないが、薄膜化・膜厚制御の点からはグラビア法、スロットダイ法、ドクターブレード法が好ましい。スロットダイ法により、厚さが5〜300μmの熱硬化性樹脂組成物の未硬化フィルム、すなわち絶縁性フィルムを、得ることができる。 The method of applying the thermosetting resin composition to the support is not particularly limited, but the gravure method, the slot die method, and the doctor blade method are preferable from the viewpoint of thinning and film thickness control. By the slot die method, an uncured film having a thermosetting resin composition having a thickness of 5 to 300 μm, that is, an insulating film can be obtained.

乾燥条件は、熱硬化性樹脂組成物に使用される有機溶剤の種類や量、塗布の厚み等に応じて、適宜、設定することができ、例えば、50〜120℃で、1〜60分程度とすることができる。このようにして得られた絶縁性フィルムは、良好な保存安定性を有する。なお、絶縁性フィルムは、所望のタイミングで、支持体から剥離することができる。 The drying conditions can be appropriately set according to the type and amount of the organic solvent used in the thermosetting resin composition, the thickness of the coating, and the like. For example, at 50 to 120 ° C. for about 1 to 60 minutes. Can be. The insulating film thus obtained has good storage stability. The insulating film can be peeled off from the support at a desired timing.

絶縁性フィルムの硬化は、例えば、150〜230℃で、30〜180分間の条件で行うことができる。本発明の層間絶縁性フィルムは、上記と同様の方法で作製し、また、硬化を行うことができる。絶縁性フィルムを層間絶縁性フィルムとして用いる場合、層間絶縁性フィルムの硬化は、銅箔等による配線が形成された基板間に層間絶縁性フィルムを挟んでから行ってもよく、銅箔等による配線を形成した層間絶縁性フィルムを、適宜積層した後に行ってもよい。また、絶縁性フィルムは、基板上の配線を保護するカバーレイフィルムとして用いることもでき、その際の硬化条件も同様である。なお、熱硬化性樹脂組成物も、同様に硬化させることができる。また、硬化時に、例えば、1〜5MPaの圧力で、プレス硬化させてもよい。 The curing of the insulating film can be performed, for example, at 150 to 230 ° C. for 30 to 180 minutes. The interlayer insulating film of the present invention can be produced and cured in the same manner as described above. When the insulating film is used as the interlayer insulating film, the interlayer insulating film may be cured after the interlayer insulating film is sandwiched between the substrates on which the wiring made of copper foil or the like is formed, and the wiring made of copper foil or the like. The interlayer insulating film formed on the above may be laminated as appropriate. Further, the insulating film can also be used as a coverlay film for protecting the wiring on the substrate, and the curing conditions at that time are also the same. The thermosetting resin composition can also be cured in the same manner. Further, at the time of curing, press curing may be performed at a pressure of, for example, 1 to 5 MPa.

〔多層配線板〕
本発明の多層配線板は、上述の熱硬化性樹脂組成物の硬化物、上述の絶縁性フィルム、または層間絶縁性フィルムの硬化物を有する。本発明のプリント配線板は、上述の熱硬化性樹脂組成物、上述の絶縁性フィルム、または層間絶縁性フィルムを用い、これを硬化して作製する。このプリント配線板は、上記熱硬化性樹脂組成物の硬化物、上記絶縁性フィルム、または層間絶縁性フィルムの硬化物により、高周波特性、および耐熱信頼性に優れ(誘電正接(tanδ)の変化量が小さく)、かつはんだ耐熱性に優れる。多層配線板の中では、マイクロ波やミリ波通信用の基板、特に車載用ミリ波レーダー基板等の高周波用途のプリント配線板等が、挙げられる。多層配線板の製造方法は、特に、限定されず、一般的なプリプレグを使用してプリント配線板を作製する場合と同様の方法を、用いることができる。
[Multilayer wiring board]
The multilayer wiring board of the present invention has a cured product of the above-mentioned thermosetting resin composition, the above-mentioned insulating film, or a cured product of the interlayer insulating film. The printed wiring board of the present invention is produced by using the above-mentioned thermosetting resin composition, the above-mentioned insulating film, or interlayer insulating film and curing the same. This printed wiring board is excellent in high frequency characteristics and heat resistance reliability (change amount of dielectric positive contact (tan δ)) due to the cured product of the thermosetting resin composition, the insulating film, or the cured product of the interlayer insulating film. Is small) and has excellent solder heat resistance. Among the multilayer wiring boards, a substrate for microwave and millimeter wave communication, particularly a printed wiring board for high frequency applications such as an in-vehicle millimeter wave radar substrate, and the like can be mentioned. The method for manufacturing the multilayer wiring board is not particularly limited, and the same method as in the case of manufacturing the printed wiring board using a general prepreg can be used.

〔半導体装置〕
本発明の半導体装置は、上述の熱硬化性樹脂組成物、上述の絶縁性フィルム、または層間絶縁性フィルムを用い、これを硬化して作製する。この半導体装置は、上記熱硬化性樹脂組成物の硬化物、上記絶縁性フィルム、または層間絶縁性フィルムの硬化物により、高周波特性、および耐熱信頼性に優れる(誘電正接(tanδ)の変化量が小さい)。ここで、半導体装置とは、半導体特性を利用することで機能しうる装置全般を指し、電子部品、半導体回路、これらを組み込んだモジュール、電子機器等を含むものである。
[Semiconductor device]
The semiconductor device of the present invention is produced by using the above-mentioned thermosetting resin composition, the above-mentioned insulating film, or interlayer insulating film and curing the same. This semiconductor device is excellent in high frequency characteristics and heat resistance reliability due to the cured product of the thermosetting resin composition, the insulating film, or the cured product of the interlayer insulating film (the amount of change in dielectric loss tangent (tan δ) is changed). small). Here, the semiconductor device refers to all devices that can function by utilizing the semiconductor characteristics, and includes electronic components, semiconductor circuits, modules incorporating these, electronic devices, and the like.

本発明について、実施例により説明するが、本発明はこれらに限定されるものではない。なお、以下の実施例において、部、%はことわりのない限り、質量部、質量%を示す。 The present invention will be described with reference to Examples, but the present invention is not limited thereto. In the following examples, parts and% indicate parts by mass and% by mass unless otherwise specified.

〔実施例1〜11、比較例1〜3〕
〈熱硬化性樹脂組成物の作製〉
表1〜2に示す配合で、各成分を容器に計り取り、自転・公転式の攪拌機(品名:マゼルスター(登録商標)、クラボウ製)で3分間攪拌混合した後、ビーズミルを使用して分散し、トルエンで粘度調整して、熱硬化性樹脂組成物を調整した。次に、熱硬化性樹脂組成物を、塗布機により、ポリエチレンテレフタレート(PET)基材上に、50〜100μmの厚さになるよう塗布し、100〜120℃で10〜20分間、乾燥し、フィルム化した。
[Examples 1 to 11 and Comparative Examples 1 to 3]
<Preparation of thermosetting resin composition>
With the formulations shown in Tables 1 and 2, each component is measured in a container, stirred and mixed with a rotating / revolving stirrer (product name: Mazellster (registered trademark), manufactured by Kurabou) for 3 minutes, and then dispersed using a bead mill. , The viscosity was adjusted with toluene to prepare a thermosetting resin composition. Next, the thermosetting resin composition was applied onto a polyethylene terephthalate (PET) substrate with a coating machine to a thickness of 50 to 100 μm, and dried at 100 to 120 ° C. for 10 to 20 minutes. It was made into a film.

ここで、表1〜2に記載したOPE−2St 2200は、三菱ガス化学(株)製スチレン末端変性PPE(分子量(Mn):2200)を、
OPE−2St 1200は、三菱ガス化学(株)製スチレン末端変性PPE(分子量(Mn):1200)を、
AO−20は、ADEKA製ヒンダードフェノール系酸化防止剤(融点:220〜222℃)を、
AO−330は、ADEKA製ヒンダードフェノール系酸化防止剤(融点:243〜245℃)を、
AO−80は、ADEKA製ヒンダードフェノール系酸化防止剤(融点:110〜120℃、3,9−ビス{2−[3−(3−tert−ブチル−4−ヒドロキシ−5−メチルフェニル)プロピオニロキシ]−1,1−ジメチルエチル}−2,4,8,10−テトラオキサスピロ[5.5]ウンデカン:
Here, the OPE-2St 2200 shown in Tables 1 and 2 is a styrene-terminated PPE (molecular weight (Mn): 2200) manufactured by Mitsubishi Gas Chemical Company, Inc.
OPE-2St 1200 is a styrene-terminated PPE (molecular weight (Mn): 1200) manufactured by Mitsubishi Gas Chemical Company, Inc.
AO-20 is a ADEKA hindered phenolic antioxidant (melting point: 220-222 ° C.).
AO-330 is a ADEKA hindered phenolic antioxidant (melting point: 243 to 245 ° C.).
AO-80 is an ADEKA hindered phenolic antioxidant (melting point: 110-120 ° C., 3,9-bis {2- [3- (3-tert-butyl-4-hydroxy-5-methylphenyl) pro. Pionyloxy] -1,1-dimethylethyl} -2,4,8,10-tetraoxaspiro [5.5] undecane:

Figure 2019103086
Figure 2019103086

G1652は、クレイトンポリマー製SEBS(スチレン比30%エラストマー)を、
G1657は、クレイトンポリマー製SEBS(スチレン比13%エラストマー)を、
KBM−1403は、信越化学工業(株)製スチリル系カップリング剤(p−スチリルトリメトキシシラン)を、
カブラス4は、大阪ソーダ製スルフィド系カップリング剤を、
SFP−130MC M処理は、DENKA製SiOフィラー(平均粒径:0.7μm品)に、メタクリル系カップリング剤(信越化学工業(株)製3−メタクリロキシプロピルトリメトキシシラン、製品名:KBM−503)処理を行ったものを、
FB−3SDX M処理は、DENKA製SiOフィラー(平均粒径:3.4μm品)に、メタクリル系カップリング剤(信越化学工業(株)製3−メタクリロキシプロピルトリメトキシシラン、製品名:KBM−503)処理を行ったものを、
FB−3SDX O処理は、DENKA製SiOフィラー(平均粒径:3.4μm品)に、オクテニル系カップリング剤(信越化学工業(株)製7−オクテニルトリメトキシシラン、製品名:KBM−1083)処理を行ったものを、
FB−3SDX 未処理は、DENKA製SiOフィラー(平均粒径:3.4μm品)を、
使用した。
G1652 is a Kraton polymer SEBS (30% styrene ratio elastomer).
G1657 is a Kraton polymer SEBS (13% styrene ratio elastomer).
KBM-1403 is a styryl-based coupling agent (p-styryltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd.
Cabras 4 is a sulfide-based coupling agent manufactured by Osaka Soda.
For SFP-130MC M treatment, DENKA SiO 2 filler (average particle size: 0.7 μm product) and methacrylic coupling agent (3-methacryloxypropyltrimethoxysilane manufactured by Shin-Etsu Chemical Co., Ltd., product name: KBM) -503) The processed product
For FB-3SDX M treatment, DENKA SiO 2 filler (average particle size: 3.4 μm product) and methacrylic coupling agent (3-methacryloxypropyltrimethoxysilane manufactured by Shin-Etsu Chemical Co., Ltd., product name: KBM) -503) Processed product,
For FB-3SDX O treatment, DENKA SiO 2 filler (average particle size: 3.4 μm product) and octenyl coupling agent (Shin-Etsu Chemical Co., Ltd. 7-octenyltrimethoxysilane, product name: KBM- 1083) The processed product
For FB-3SDX untreated, use DENKA SiO 2 filler (average particle size: 3.4 μm product).
used.

〔評価方法〕 〔Evaluation method〕

〈誘電特性〉
PET基材から剥離したフィルムを、200℃で1時間、1MPaでプレス硬化させた後、70×50mmに裁断し、スプリットポスト誘電体共振器(SPDR)により、誘電体共振周波数10GHzで、常温常湿の比誘電率(ε)、誘電正接(tanδ)を測定した。比誘電率は、3.5以下、誘電正接は、0.0030以下であると、好ましい。表1〜2に、結果を示す。
<Dielectric property>
The film peeled from the PET substrate is press-cured at 200 ° C. for 1 hour at 1 MPa, cut into 70 × 50 mm, and subjected to a dielectric resonance frequency of 10 GHz by a split post dielectric resonator (SPDR) at room temperature. The relative permittivity (ε) and dielectric loss tangent (tan δ) of wetness were measured. The relative permittivity is preferably 3.5 or less, and the dielectric loss tangent is preferably 0.0030 or less. The results are shown in Tables 1 and 2.

〈耐熱信頼性(tanδ変化)〉
上述の誘電特性を測定した硬化フィルムを、125℃で200時間、放置した後、常温常湿で、SPDR法(10GHz)により、tanδを測定し、tanδの変化量と変化率を求めた。変化率は、80%以下であると、好ましい。表1〜2に、結果を示す。
<Heat resistance (tan δ change)>
The cured film having the above-mentioned dielectric properties measured was left at 125 ° C. for 200 hours, and then tan δ was measured by the SPDR method (10 GHz) at room temperature and humidity to determine the amount of change and the rate of change of tan δ. The rate of change is preferably 80% or less. The results are shown in Tables 1 and 2.

〈はんだ耐熱性〉
2枚のCu箔(福田金属箔粉工業(株)製、品名:CF−T9FZSV)に、PET基材から剥離したフィルムを挟み、200℃で1時間、1MPaでプレス硬化させて接着した後、3cm×3cmに切出したものを試験片とし、270℃の半田浴に60秒間フロートし、膨れ発生の有無を、目視で確認した。膨れ等の外観に変化がなかった場合を「OK」(合格)、膨れが観察された場合を「NG」(不合格)とした。表1〜2に、結果を示す。
<Solder heat resistance>
A film peeled from the PET base material was sandwiched between two Cu foils (manufactured by Fukuda Metal Foil Powder Industry Co., Ltd., product name: CF-T9FZSV), pressed and cured at 200 ° C. for 1 hour at 1 MPa, and then adhered. A test piece cut into 3 cm × 3 cm was used as a test piece, floated in a solder bath at 270 ° C. for 60 seconds, and the presence or absence of swelling was visually confirmed. When there was no change in the appearance such as swelling, it was evaluated as "OK" (passed), and when swelling was observed, it was evaluated as "NG" (failed). The results are shown in Tables 1 and 2.

〈耐湿信頼性(tanδ変化)〉
上述の誘電特性を測定した硬化フィルムを、85℃/85%RHの恒温恒湿槽中に200時間放置した後、常温常湿で、SPDR法(10GHz)により、tanδを測定し、tanδの変化量と変化率を求めた。変化率は、55%以下であると好ましく、45%以下であると、より好ましく、40%以下であるとさらに好ましい。表3に、結果を示す。
<Moisture resistance reliability (tan δ change)>
The cured film whose dielectric properties were measured described above was left in a constant temperature and humidity chamber at 85 ° C./85% RH for 200 hours, and then tanδ was measured by the SPDR method (10 GHz) at room temperature and humidity, and the change in tanδ. The amount and rate of change were calculated. The rate of change is preferably 55% or less, more preferably 45% or less, and even more preferably 40% or less. Table 3 shows the results.

Figure 2019103086
Figure 2019103086

Figure 2019103086
Figure 2019103086

Figure 2019103086
Figure 2019103086

表1〜3からわかるように、実施例1〜11は、比誘電率(ε)、誘電正接(tanδ)、耐熱信頼性(tanδの変化量、変化率)、はんだ耐熱性、耐湿信頼性のすべてにおいて良好な結果であった。さらに、実施例1〜10は、耐湿信頼性(tanδの変化量、変化率)の結果も、より良好であった。なお、シランカップリング剤で処理されていないシリカフィラーを使用した実施例11は、耐湿信頼性の結果は、53%であった。これは、シリカフィラー自体の耐湿性が悪いため、単にシリカフィラーを加えると耐湿信頼性が低下するのに対し、シリカフィラーの表面処理を行うことで、耐湿信頼性の低下を防止できるためである、と考えられる。また、(A)成分の分子量が異なる実施例1と6とを比較すると、分子量の小さな方が、耐熱信頼性の結果が悪く、酸化劣化が進行することがわかる。これに対して、(B)成分を使用しなかった比較例1と2は、耐湿信頼性の変化率が大きかった。また、(B’)成分を使用した比較例3は、はんだ耐熱性が、悪かった。 As can be seen from Tables 1 to 11, Examples 1 to 11 have a relative permittivity (ε), a dielectric loss tangent (tan δ), heat resistance reliability (change amount and change rate of tan δ), solder heat resistance, and moisture resistance reliability. Good results in all. Further, in Examples 1 to 10, the result of moisture resistance reliability (change amount of tan δ, change rate) was also better. In Example 11 using a silica filler not treated with a silane coupling agent, the result of moisture resistance reliability was 53%. This is because the moisture resistance of the silica filler itself is poor, and the moisture resistance reliability is lowered by simply adding the silica filler, whereas the surface treatment of the silica filler can prevent the deterioration of the moisture resistance reliability. ,it is conceivable that. Further, when comparing Examples 1 and 6 in which the molecular weights of the component (A) are different, it can be seen that the smaller the molecular weight, the worse the heat reliability result and the more the oxidative deterioration progresses. On the other hand, in Comparative Examples 1 and 2 in which the component (B) was not used, the rate of change in moisture resistance reliability was large. Further, in Comparative Example 3 in which the component (B') was used, the solder heat resistance was poor.

本発明の熱硬化性樹脂組成物は、高周波特性、および耐熱信頼性に優れ(誘電正接(tanδ)の変化量が小さく)、かつはんだ耐熱性に優れる絶縁性フィルムや層間絶縁性フィルムを形成可能であり、非常に有用である。本発明の多層配線板は、上記熱硬化性樹脂組成物の硬化物、上記絶縁性フィルム、または層間絶縁性フィルムの硬化物により、高周波特性、および耐熱信頼性に優れる(誘電正接(tanδ)の変化量が小さい)。本発明の半導体装置は、上記熱硬化性樹脂組成物の硬化物、上記絶縁性フィルム、または層間絶縁性フィルムの硬化物により、高周波特性、および耐熱信頼性に優れる(誘電正接(tanδ)の変化量が小さい)ため、高周波用途に適する。 The thermosetting resin composition of the present invention can form an insulating film or an interlayer insulating film having excellent high frequency characteristics and heat resistance (the amount of change in dielectric loss tangent (tan δ) is small) and excellent solder heat resistance. It is very useful. The multilayer wiring board of the present invention is excellent in high frequency characteristics and heat resistance reliability due to the cured product of the thermosetting resin composition, the insulating film, or the cured product of the interlayer insulating film (dielectric loss tangent (tan δ)). The amount of change is small). The semiconductor device of the present invention is excellent in high frequency characteristics and heat resistance reliability due to the cured product of the thermosetting resin composition, the insulating film, or the cured product of the interlayer insulating film (change in dielectric loss tangent (tan δ)). (Small amount), suitable for high frequency applications.

Claims (9)

(A)末端に不飽和二重結合を有する数平均分子量が800〜4500のポリフェニレンエーテル、
(B)融点が200℃以上のフェノール系酸化防止剤、および
(C)熱可塑性エラストマー
を含むことを特徴とする、熱硬化性樹脂組成物。
(A) Polyphenylene ether having an unsaturated double bond at the terminal and having a number average molecular weight of 800 to 4500.
A thermosetting resin composition comprising (B) a phenolic antioxidant having a melting point of 200 ° C. or higher, and (C) a thermoplastic elastomer.
さらに、(D)無機充填剤を含む、請求項1記載の熱硬化性樹脂組成物。 The thermosetting resin composition according to claim 1, further comprising (D) an inorganic filler. (D)成分が、一般式(10)で表されるシランカップリング剤で表面処理されたシリカフィラー
Figure 2019103086
(式中、R21〜R23は、それぞれ独立して、炭素数が1〜3のアルキル基であり、R24は、少なくとも末端に不飽和二重結合を有する官能基であり、nは、3〜9である)を含む、請求項1または2記載の熱硬化性樹脂組成物。
A silica filler in which the component (D) is surface-treated with a silane coupling agent represented by the general formula (10).
Figure 2019103086
(In the formula, R 21 to R 23 are independently alkyl groups having 1 to 3 carbon atoms, R 24 is a functional group having an unsaturated double bond at least at the terminal, and n is. The thermosetting resin composition according to claim 1 or 2, which comprises (3 to 9).
一般式(10)のR24が、ビニル基、または(メタ)アクリル基である、請求項1〜3のいずれか1項記載の熱硬化性樹脂組成物。The thermosetting resin composition according to any one of claims 1 to 3, wherein R 24 of the general formula (10) is a vinyl group or a (meth) acrylic group. 請求項1〜4のいずれか1項記載の熱硬化性樹脂組成物を含む、絶縁性フィルム。 An insulating film containing the thermosetting resin composition according to any one of claims 1 to 4. 請求項1〜4のいずれか1項記載の熱硬化性樹脂組成物を含む、層間絶縁性フィルム。 An interlayer insulating film containing the thermosetting resin composition according to any one of claims 1 to 4. 請求項1〜4のいずれか1項記載の樹脂組成物の硬化物、請求項5記載の絶縁性フィルム、または請求項6記載の層間絶縁性フィルムの硬化物。 A cured product of the resin composition according to any one of claims 1 to 4, an insulating film according to claim 5, or a cured product of an interlayer insulating film according to claim 6. 請求項1〜4のいずれか1項記載の樹脂組成物の硬化物、請求項5記載の絶縁性フィルム、または請求項6記載の層間絶縁性フィルムの硬化物を有する、多層配線板。 A multilayer wiring board having a cured product of the resin composition according to any one of claims 1 to 4, an insulating film according to claim 5, or a cured product of an interlayer insulating film according to claim 6. 請求項1〜4のいずれか1項記載の熱硬化性樹脂組成物の硬化物、請求項5記載の絶縁性フィルム、または請求項6記載の層間絶縁性フィルムの硬化物を有する、半導体装置。 A semiconductor device having a cured product of the thermosetting resin composition according to any one of claims 1 to 4, a cured product of the insulating film according to claim 5, or a cured product of the interlayer insulating film according to claim 6.
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