TW201930464A - Heat curable resin composition, insulation film, interlayer insulation film, multilayer wiring board and semiconductor apparatus - Google Patents

Heat curable resin composition, insulation film, interlayer insulation film, multilayer wiring board and semiconductor apparatus Download PDF

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TW201930464A
TW201930464A TW107141682A TW107141682A TW201930464A TW 201930464 A TW201930464 A TW 201930464A TW 107141682 A TW107141682 A TW 107141682A TW 107141682 A TW107141682 A TW 107141682A TW 201930464 A TW201930464 A TW 201930464A
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resin composition
thermosetting resin
insulating film
cured product
composition according
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TWI809006B (en
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佐藤淳也
黒川津与志
吉田真樹
寺木慎
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日商納美仕有限公司
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L71/00Compositions of polyethers obtained by reactions forming an ether link in the main chain; Compositions of derivatives of such polymers
    • C08L71/08Polyethers derived from hydroxy compounds or from their metallic derivatives
    • C08L71/10Polyethers derived from hydroxy compounds or from their metallic derivatives from phenols
    • C08L71/12Polyphenylene oxides
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F290/00Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups
    • C08F290/02Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups on to polymers modified by introduction of unsaturated end groups
    • C08F290/06Polymers provided for in subclass C08G
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F299/00Macromolecular compounds obtained by interreacting polymers involving only carbon-to-carbon unsaturated bond reactions, in the absence of non-macromolecular monomers
    • C08F299/02Macromolecular compounds obtained by interreacting polymers involving only carbon-to-carbon unsaturated bond reactions, in the absence of non-macromolecular monomers from unsaturated polycondensates
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18Manufacture of films or sheets
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/34Silicon-containing compounds
    • C08K3/36Silica
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/04Oxygen-containing compounds
    • C08K5/13Phenols; Phenolates
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/54Silicon-containing compounds
    • C08K5/541Silicon-containing compounds containing oxygen
    • C08K5/5425Silicon-containing compounds containing oxygen containing at least one C=C bond
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K9/00Use of pretreated ingredients
    • C08K9/04Ingredients treated with organic substances
    • C08K9/06Ingredients treated with organic substances with silicon-containing compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L53/00Compositions of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Compositions of derivatives of such polymers
    • C08L53/02Compositions of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Compositions of derivatives of such polymers of vinyl-aromatic monomers and conjugated dienes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate

Abstract

An object of present invention is to provide a polyphenylene ether (PPE) type heat curable resin composition that has high frequency characteristics, excellent heat resistance reliability (change amount of dielectric loss tangent (tan [delta]) is small) and excellent solder heat resistance. Provided is a heat curable resin composition having (A) a polyphenylene ether having an unsaturated double bond at its terminal and having a number average molecular weight of 800 to 4500; (B) phenolic antioxidant having a melting point of 200 DEG C or higher; and (C) thermoplastic elastomer.

Description

熱硬化性樹脂組成物、絕緣性膜、層間絕緣性膜、多層配線板及半導體裝置  Thermosetting resin composition, insulating film, interlayer insulating film, multilayer wiring board, and semiconductor device  

本發明係關於為熱硬化性樹脂組成物、絕緣性膜、層間絕緣性膜、多層配線板及半導體裝置。尤其係關於可對應高頻化之熱硬化性樹脂組成物、絕緣性膜、層間絕緣性膜、多層配線板及半導體裝置。 The present invention relates to a thermosetting resin composition, an insulating film, an interlayer insulating film, a multilayer wiring board, and a semiconductor device. In particular, it is a thermosetting resin composition, an insulating film, an interlayer insulating film, a multilayer wiring board, and a semiconductor device which can correspond to high frequency.

現今各種通訊機器等電子機器多要求高頻化。例如毫米波通訊等高頻用途的多層印刷配線板多要求低傳送損失。該高頻用途的多層印刷配線板之接著層或被覆層、或基板本身所使用材料已知有使用具有優異高頻特性之聚苯醚(PPE)。 Today, electronic devices such as various communication devices require high frequency. For example, a multilayer printed wiring board for high-frequency applications such as millimeter wave communication requires low transmission loss. It is known that a polyphenylene ether (PPE) having excellent high-frequency characteristics is used as an adhesive layer or a coating layer of the multilayer printed wiring board for high-frequency use or a material used for the substrate itself.

另一方面,曾報告指出使用環氧樹脂等硬化成分或彈性體使樹脂組成物具有媲美PPE之高頻特性(專利文獻1),且記載環氧樹脂所含之苯酚系抗氧化劑可在不使樹脂組成物之高頻特性惡化下使用。 On the other hand, it has been reported that the use of a hardening component such as an epoxy resin or an elastomer makes the resin composition have high-frequency characteristics comparable to PPE (Patent Document 1), and the phenol-based antioxidant contained in the epoxy resin can be prevented from being The high-frequency characteristics of the resin composition are deteriorated and used.

[先前技術文獻]  [Previous Technical Literature]   [專利文獻]  [Patent Literature]  

專利文獻1:日本特開2014-201642號公報。 Patent Document 1: Japanese Laid-Open Patent Publication No. 2014-201642.

又,以反應性及於溶劑之可溶性之觀點來看,熱硬化性PPE較佳為低分子量化。 Further, from the viewpoint of reactivity and solubility in a solvent, the thermosetting PPE is preferably low in molecular weight.

但是本發明人等發現:聚合低分子量熱硬化性PPE所得之PPE聚合物在高溫的氧化劣化非常快,使用於多層配線時,會有耐熱可靠性試驗後之介電損耗正切(tanδ)值變動之問題。另外,多層配線版亦要求焊料耐熱性,亦須滿足該要求。 However, the present inventors have found that the PPE polymer obtained by polymerizing the low molecular weight thermosetting PPE has a very high oxidative degradation at a high temperature, and when used in a multilayer wiring, there is a change in the dielectric loss tangent (tan δ) value after the heat resistance reliability test. The problem. In addition, the multilayer wiring board also requires solder heat resistance, and this requirement must also be met.

以上述觀點來看,本發明之目的在於提供高頻特性及耐熱可靠性優異(介電損耗正切(tanδ)的變化量小)且焊料耐熱性優異之PPE系熱硬化性樹脂組成物。 In view of the above, it is an object of the present invention to provide a PPE-based thermosetting resin composition which is excellent in high-frequency characteristics and heat-resistance reliability (the amount of change in dielectric loss tangent (tan δ) is small) and which is excellent in solder heat resistance.

本發明係關於藉由具有下述構成而解決上述問題之熱硬化性樹脂組成物、絕緣性膜、層間絕緣性膜、多層配線板及半導體裝置。 The present invention relates to a thermosetting resin composition, an insulating film, an interlayer insulating film, a multilayer wiring board, and a semiconductor device which solve the above problems by the following configuration.

〔1〕一種熱硬化性樹脂組成物,係含有:(A)於末端具有不飽和雙鍵之數量平均分子量為800至4500之聚苯醚,(B)熔點為200℃以上之苯酚系抗氧化劑,及 (C)熱塑性彈性體。 [1] A thermosetting resin composition comprising: (A) a polyphenylene ether having an average number of molecular weights of 800 to 4,500 having an unsaturated double bond at a terminal, and (B) a phenolic antioxidant having a melting point of 200 ° C or more And (C) a thermoplastic elastomer.

〔2〕如上述〔1〕所述之熱硬化性樹脂組成物,更含有(D)無機填充劑。 [2] The thermosetting resin composition according to the above [1], further comprising (D) an inorganic filler.

〔3〕如上述〔1〕或〔2〕所述之熱硬化性樹脂組成物,其中,(D)成分含有:經以通式(10)所示之矽烷耦合劑表面處理之氧化矽填充劑。 [3] The thermosetting resin composition according to the above [1], wherein the component (D) contains a cerium oxide filler surface-treated with a decane coupling agent represented by the formula (10). .

(式中,R21至R23分別獨立地為碳數1至3之烷基,R24為至少於末端具有不飽和雙鍵之官能基,n為3至9)。 (wherein R 21 to R 23 are each independently an alkyl group having 1 to 3 carbon atoms, and R 24 is a functional group having an unsaturated double bond at least at the terminal, and n is 3 to 9).

〔4〕如上述〔1〕至〔3〕中任一項所述之熱硬化性樹脂組成物,其中,通式(10)之R24為乙烯基或(甲基)丙烯醯基。 [4] The thermosetting resin composition according to any one of the above [1], wherein R 24 of the formula (10) is a vinyl group or a (meth) acrylonitrile group.

〔5〕一種絕緣性膜,係含有上述〔1〕至〔4〕中任一項所述之熱硬化性樹脂組成物。 [5] An insulating film comprising the thermosetting resin composition according to any one of the above [1] to [4].

〔6〕一種層間絕緣性膜,係含有上述〔1〕至〔4〕中任一項所述之熱硬化性樹脂組成物。 [6] An interlayer insulating film comprising the thermosetting resin composition according to any one of the above [1] to [4].

〔7〕一種硬化物,係上述〔1〕至〔4〕中任一項所述之熱硬化性樹脂組成物之硬化物、上述〔5〕所述之絕緣性膜或上述〔6〕所述之層間絕緣性膜之硬化物。 [7] A cured product of the thermosetting resin composition according to any one of the above [1] to [4], the insulating film according to the above [5], or the above [6] A cured product of an interlayer insulating film.

〔8〕一種多層配線板,係具有:上述〔1〕至〔4〕中任一項所述之樹脂組成物之硬化物、上述〔5〕所述之絕緣性膜 或上述〔6〕所述之層間絕緣性膜之硬化物。 [8] A cured wiring of the resin composition according to any one of the above [1] to [4], the insulating film according to the above [5], or the above [6] A cured product of an interlayer insulating film.

〔9〕一種半導體裝置,係具有:上述〔1〕至〔4〕中任一項所述之熱硬化性樹脂組成物之硬化物、〔5〕所述之絕緣性膜或上述〔6〕所述之層間絕緣性膜之硬化物。 (9) A cured product of the thermosetting resin composition according to any one of the above [1] to [4], the insulating film according to [5], or the above [6] A cured product of an interlayer insulating film.

根據本發明〔1〕,可提供高頻特性及耐熱可靠性優異(介電損耗正切(tanδ)的變化量小)且焊料耐熱性優異之PPE系熱硬化性樹脂組成物。 According to the invention [1], it is possible to provide a PPE-based thermosetting resin composition which is excellent in high-frequency characteristics and heat-resistance reliability (the amount of change in dielectric loss tangent (tan δ) is small) and which is excellent in solder heat resistance.

根據本發明〔5〕,可提供由高頻特性及耐熱可靠性優異且焊料耐熱性優異之PPE系熱硬化性樹脂組成物所形成之層間絕緣性膜。 According to the invention [5], it is possible to provide an interlayer insulating film formed of a PPE-based thermosetting resin composition which is excellent in high-frequency characteristics and heat-resistance reliability and excellent in solder heat resistance.

根據本發明〔6〕,可提供由高頻特性及耐熱可靠性優異且焊料耐熱性優異之PPE系熱硬化性樹脂組成物所形成之層間絕緣性膜。 According to the invention [6], it is possible to provide an interlayer insulating film formed of a PPE-based thermosetting resin composition which is excellent in high-frequency characteristics and heat-resistance reliability and excellent in solder heat resistance.

根據本發明〔7〕,可藉由上述熱硬化性樹脂組成物之硬化物、上述絕緣性膜或上述層間絕緣性膜之硬化物,而提供高頻特性及耐熱可靠性優異之多層配線板。根據本發明〔8〕,可藉由上述熱硬化性樹脂組成物之硬化物、上述絕緣性膜或上述層間絕緣性膜之硬化物,而提供高頻特性及耐熱可靠性優異之多層配線板。根據本發明〔9〕,可藉由上述熱硬化性樹脂組成物之硬化物、上述絕緣性膜或上述層間絕緣性膜之硬化物,而提供高頻特性及耐熱可靠性優異之半導體裝置。 According to the invention [7], the cured product of the thermosetting resin composition, the insulating film or the cured product of the interlayer insulating film can provide a multilayer wiring board excellent in high frequency characteristics and heat resistance reliability. According to the invention [8], the cured product of the thermosetting resin composition, the insulating film or the cured product of the interlayer insulating film can provide a multilayer wiring board excellent in high frequency characteristics and heat resistance reliability. According to the invention [9], it is possible to provide a semiconductor device excellent in high-frequency characteristics and heat-resistance reliability by the cured product of the thermosetting resin composition, the insulating film or the cured film of the interlayer insulating film.

〔熱硬化性樹脂組成物〕 [thermosetting resin composition]

本發明之熱硬化性樹脂組成物係含有:(A)於末端具有不飽和雙鍵之數量平均分子量為800至4500之聚苯醚,(B)熔點為200℃以上之苯酚系抗氧化劑,及(C)熱塑性彈性體。 The thermosetting resin composition of the present invention contains: (A) a polyphenylene ether having a number average molecular weight of 800 to 4,500 having an unsaturated double bond at the terminal, and (B) a phenolic antioxidant having a melting point of 200 ° C or more, and (C) Thermoplastic elastomer.

(A)成分為於末端具有不飽和雙鍵之數量平均分子量為800至4500之聚苯醚,且可對本發明之熱硬化性樹脂組成物(以下稱為熱硬化性樹脂組成物)賦予接著性、高頻特性、耐熱性。在此,高頻特性是指減少在高頻領域的傳送損失之性質。以高頻特性之觀點來看,(A)成分係以在10GHz的比介電率(ε)為3.5以下且介電損耗正切(tanδ)為0.003以下為較佳。(A)成分較佳為於末端具有苯乙烯基之聚苯醚。 The component (A) is a polyphenylene ether having a number average molecular weight of 800 to 4,500, which has an unsaturated double bond at the terminal, and can impart adhesion to the thermosetting resin composition (hereinafter referred to as a thermosetting resin composition) of the present invention. , high frequency characteristics, heat resistance. Here, the high frequency characteristic means a property of reducing transmission loss in the high frequency range. From the viewpoint of high-frequency characteristics, the component (A) preferably has a specific dielectric constant (ε) of 10 GHz of 3.5 or less and a dielectric loss tangent (tan δ) of 0.003 or less. The component (A) is preferably a polyphenylene ether having a styryl group at the terminal.

於末端具有苯乙烯基之聚苯醚(PPE)較佳為通式(1)所示化合物,因為其高頻特性優異,且介電特性(尤其tanδ)之溫度依存性(相對於常溫(25℃)測定值之在高溫(120℃)測定值的變化)較小。 The polyphenylene ether (PPE) having a styryl group at the terminal is preferably a compound represented by the formula (1) because of its high frequency characteristics and temperature dependence of dielectric properties (especially tan δ) (relative to normal temperature (25) °C) The measured value is small in the change in the measured value at high temperature (120 ° C).

(式(1)中,-(O-X-O)-以通式(2)或(3)表示。) (In the formula (1), -(O-X-O)- is represented by the formula (2) or (3).)

(式(2)中,R1、R2、R3、R7、R8可為相同或相異,且為碳數6以下的烷基或苯基。R4、R5、R6可為相同或相異,且為氫原子、碳數6以下的烷基或苯基。) (In the formula (2), R 1 , R 2 , R 3 , R 7 and R 8 may be the same or different and are an alkyl group having 6 or less carbon atoms or a phenyl group. R 4 , R 5 and R 6 may be used. They are the same or different and are a hydrogen atom, an alkyl group having 6 or less carbon atoms or a phenyl group.

(式(3)中,R9、R10、R11、R12、R13、R14、R15、R16可為相同或相異,且為氫原子、碳數6以下烷基或苯基。-A-為碳數20以下之直鏈狀、分支狀或環狀之2價烴基。) (In the formula (3), R 9 , R 10 , R 11 , R 12 , R 13 , R 14 , R 15 and R 16 may be the same or different and are a hydrogen atom, an alkyl group having 6 or less carbon atoms or a benzene group. -A- is a linear, branched or cyclic divalent hydrocarbon group having a carbon number of 20 or less.)

(式(1)中,-(Y-O)-以通式(4)表示,為1種類之構造或2種類以上之構造隨機排列。) (In the formula (1), -(Y-O)- is represented by the formula (4), and is a structure of one type or a structure in which two or more types are randomly arranged.)

(式(4)中,R17、R18可為相同或相異,且為碳數6以下之烷基或苯基。R19、R20可為相同或相異,且為氫原子、碳數6以下之烷基或苯基。) (In the formula (4), R 17 and R 18 may be the same or different and are an alkyl group having 6 or less carbon atoms or a phenyl group. R 19 and R 20 may be the same or different and are a hydrogen atom or a carbon. An alkyl group or a phenyl group of 6 or less.)

(式(1)中,a、b表示0至100之整數,且至少任一者不為0。) (In the formula (1), a and b represent an integer of 0 to 100, and at least either of them is not 0.)

(式(3)中的-A-可舉例如亞甲基、亞乙基、1-甲基亞乙基、1,1-亞丙基、1,4-伸苯基雙(1-甲基亞乙基)、1,3-伸苯基雙(1-甲基亞乙基)、環亞己基、苯基亞甲基、萘基亞甲基、1-苯基亞乙基等2價有機基,但並不限定於該等。) (-A- in the formula (3) may, for example, be a methylene group, an ethylene group, a 1-methylethylene group, a 1,1-propylene group, a 1,4-phenylene bis(1-methyl group) Ethylene), 1,3-phenylene bis(1-methylethylidene), cyclohexylene, phenylmethylene, naphthylmethylene, 1-phenylethylene, etc. Base, but not limited to these.)

(式(1)所示之化合物較佳為R1、R2、R3、R7、R8、R17、R18為碳數3以下烷基,且R4、R5、R6、R9、R10、R11、R12、R13、R14、R15、R16、R19、R20為氫原子或碳數3以下的烷基者,尤其更佳為通式(2)或通式(3)所示之-(O-X-O)-為通式(5)、通式(6)、或通式(7)且通式(4)所示之-(Y-O)-為式(8)或式(9)或式(8)與式(9)隨機排列之構造。) (The compound represented by the formula (1) is preferably R 1 , R 2 , R 3 , R 7 , R 8 , R 17 and R 18 are an alkyl group having 3 or less carbon atoms, and R 4 , R 5 and R 6 , R 9 , R 10 , R 11 , R 12 , R 13 , R 14 , R 15 , R 16 , R 19 and R 20 are each a hydrogen atom or an alkyl group having 3 or less carbon atoms, particularly preferably a formula (2). Or -(OXO)- represented by the formula (3) is a formula (5), a formula (6), or a formula (7), and a formula (4)-(YO)- is a formula (8) or a configuration in which (9) or (8) and (9) are randomly arranged.)

式(1)所示化合物之製造方法並無特別限定,例如可使2官能苯酚化合物與1官能苯酚化合物氧化耦合,將所得之2官能苯醚寡聚物之末端苯酚性羥基進行乙烯基苯甲基醚化而製造。 The method for producing the compound represented by the formula (1) is not particularly limited. For example, the bifunctional phenol compound and the monofunctional phenol compound may be oxidatively coupled, and the terminal phenolic hydroxyl group of the obtained bifunctional phenyl ether oligomer may be subjected to vinyl benzophenone. It is produced by etherification.

(A)成分之熱硬化性樹脂之數量平均分子量藉由GPC法以聚苯乙烯換算為800至4,500之範圍,較佳為1000至3500之範圍,以減少因聚合所造成的氧化劣化起點並予以低黏度化之觀點來看,更佳為1500至2500之範圍。若數量平均分子量為800以上,則使本發明之熱硬化性樹脂組成物形成為塗膜狀時不易沾黏,又,若為4500以下,則可防止對溶劑的溶解性降低。(A)成分可單獨使用或併用2種以上。 The number average molecular weight of the thermosetting resin of the component (A) is in the range of 800 to 4,500 in terms of polystyrene by the GPC method, preferably in the range of 1,000 to 3,500, to reduce the oxidative degradation starting point due to polymerization and to From the standpoint of low viscosity, it is more preferably in the range of 1,500 to 2,500. When the number average molecular weight is 800 or more, the thermosetting resin composition of the present invention is less likely to be adhered when it is formed into a coating film shape, and when it is 4,500 or less, the solubility in a solvent can be prevented from being lowered. The component (A) may be used singly or in combination of two or more.

(B)成分為熔點200℃以上之苯酚系抗氧化 劑,可對熱硬化性樹脂賦予焊料耐熱性。(B)成分之熔點未滿200℃時,熱硬化性樹脂之焊料耐熱性不充分。(B)成分之熔點為200℃以上之苯酚系抗氧化劑可舉出1,3,5-參(3,5-二第三丁基-4-羥基苯甲基)-1,3,5-三嗪-2,4,6(1H,3H,5H)-三酮、1,3,5-參(3,5-二第三丁基-4-羥基苯基甲基)-2,4,6-三甲基苯、6,6’-二第三丁基-4,4’-亞丁基-二間甲酚等。 The component (B) is a phenol-based antioxidant having a melting point of 200 ° C or higher, and the solder heat resistance can be imparted to the thermosetting resin. When the melting point of the component (B) is less than 200 ° C, the solder heat resistance of the thermosetting resin is insufficient. The phenol-based antioxidant having a melting point of (B) of 200 ° C or higher may be 1,3,5-gin(3,5-di-t-butyl-4-hydroxybenzyl)-1,3,5- Triazine-2,4,6(1H,3H,5H)-trione, 1,3,5-gin (3,5-di-t-butyl-4-hydroxyphenylmethyl)-2,4, 6-trimethylbenzene, 6,6'-di-tert-butyl-4,4'-butylene-di-cresol, and the like.

(B)成分之市售品可舉出1,3,5-参(3,5-二第三丁基-4-羥基苯甲基)-1,3,5-三嗪-2,4,6(1H,3H,5H)-三酮(ADEKA製,品名:AO-20,熔點:220至222℃,分子量:784); The commercially available product of the component (B) may, for example, be 1,3,5-gin(3,5-di-t-butyl-4-hydroxybenzyl)-1,3,5-triazine-2,4. 6(1H,3H,5H)-trione (manufactured by ADEKA, product name: AO-20, melting point: 220 to 222 ° C, molecular weight: 784);

1,3,5-參(3,5-二第三丁基-4-羥基苯基甲基)-2,4,6-三甲基苯(ADEKA製,品名:AO-330,熔點:243至245℃)。 1,3,5-parade (3,5-di-t-butyl-4-hydroxyphenylmethyl)-2,4,6-trimethylbenzene (made by ADEKA, product name: AO-330, melting point: 243 To 245 ° C).

(B)成分可單獨使用或併用2種以上。 The component (B) may be used alone or in combination of two or more.

(C)成分係發揮對熱硬化性樹脂組成物賦予柔軟性之柔軟性賦予樹脂的功能。以介電特性之觀點來看,(C)成分之熱塑性彈性體較佳為苯乙烯系熱塑性彈性體,以介電特性(尤其tanδ)之溫度依存性(相對於常溫(25℃)測定值之在高溫(120℃)測定值的變化)較小之觀點來看,更佳為氫化苯乙烯系熱塑性彈性體。又,使聚丁二烯氫化者雖耐熱性佳,但有溫度依存性變大之情形。 The component (C) exhibits a function of imparting flexibility to the thermosetting resin composition to impart flexibility. From the viewpoint of dielectric properties, the thermoplastic elastomer of the component (C) is preferably a styrene-based thermoplastic elastomer, and has a temperature dependence of dielectric properties (especially tan δ) (measured relative to a normal temperature (25 ° C)). From the viewpoint of a small change in the measured value at a high temperature (120 ° C), a hydrogenated styrene-based thermoplastic elastomer is more preferable. Further, although the polybutadiene is hydrogenated, the heat resistance is good, but the temperature dependency is increased.

作為(C)成分較佳的氫化苯乙烯系熱塑性彈性體為分子中主鏈之不飽和雙鍵經氫化之苯乙烯系嵌段共聚物,該氫化苯乙烯系嵌段共聚物可舉出苯乙烯-乙烯/丁烯-苯乙烯嵌段共聚物(SEBS)、苯乙烯-(乙烯-乙烯/丙烯)/苯乙烯嵌段共聚物(SEEPS)、苯乙烯-乙烯/丙烯-苯乙烯嵌段共聚物(SEPS)等,較佳為SEBS、SEEPS。因為SEBS或SEEPS的介電特性優異,且與屬於(A)成分之選項之聚苯醚(PPE)、改質PPE等的相溶性佳,可形成具耐熱性之熱硬化性樹脂組成物。又,苯乙烯系嵌段共聚物亦有助於熱硬 化性樹脂組成物之低彈性化,故可對絕緣性膜賦予柔軟性,且適合於對熱硬化性樹脂組成物之硬化物要求3GPa以下之低彈性之用途。 The hydrogenated styrene-based thermoplastic elastomer which is preferably a component (C) is a hydrogenated styrene block copolymer having a main chain unsaturated double bond in the molecule, and the hydrogenated styrene block copolymer may be styrene. -ethylene/butylene-styrene block copolymer (SEBS), styrene-(ethylene-ethylene/propylene)/styrene block copolymer (SEEPS), styrene-ethylene/propylene-styrene block copolymer (SEPS), etc., preferably SEBS, SEEPS. Since SEBS or SEEPS is excellent in dielectric properties, and has good compatibility with polyphenylene ether (PPE) or modified PPE which is an option of the component (A), a heat-resistant thermosetting resin composition can be formed. In addition, since the styrene-based block copolymer contributes to the low elasticity of the thermosetting resin composition, flexibility can be imparted to the insulating film, and it is suitable for the cured product of the thermosetting resin composition to be 3 GPa or less. The use of low elasticity.

(C)成分之重量平均分子量較佳為30,000至200,000,更佳為80,000至120,000。重量平均分子量係藉由凝膠滲透層析法(GPC)並使用標準聚苯乙烯之檢量線而得的值。(C)成分可單獨使用或併用2種以上。 The weight average molecular weight of the component (C) is preferably from 30,000 to 200,000, more preferably from 80,000 to 120,000. The weight average molecular weight is a value obtained by gel permeation chromatography (GPC) using a calibration curve of standard polystyrene. The component (C) may be used singly or in combination of two or more.

(A)成分與(C)成分為樹脂,(A)成分相對於(A)成分與(C)成分之合計100質量份,較佳為10至70質量份,更佳為20至60質量份。 The component (A) and the component (C) are resins, and the component (A) is preferably 10 to 70 parts by mass, more preferably 20 to 60 parts by mass, per 100 parts by mass of the total of the components (A) and (C). .

若(A)成分少,則熱硬化性樹脂組成物之硬化物之硬化不充分,容易產生剝離強度降低、熱膨張係數(CTE)增大、耐熱性降低等不良情形。若(A)成分多,則由熱硬化性樹脂組成物製作的薄膜較硬、脆且容易破裂,會損及薄膜性,且熱硬化性樹脂組成物之硬化物也會變硬、變脆,容易產生剝離強度降低、熱衝擊所導致的破裂,且因在高溫之氧化而降低耐熱可靠性等不良情形。 When the amount of the component (A) is small, the curing of the cured product of the thermosetting resin composition is insufficient, and the peeling strength is lowered, the thermal expansion coefficient (CTE) is increased, and the heat resistance is lowered. When the amount of the component (A) is large, the film made of the thermosetting resin composition is hard, brittle, and easily broken, and the film property is impaired, and the cured product of the thermosetting resin composition is hard and brittle. It is easy to cause a decrease in peel strength, cracking due to thermal shock, and a problem such as reduction in heat resistance reliability due to oxidation at a high temperature.

(A)成分及(C)成分以外之樹脂例如可併用環氧樹脂、馬來醯亞胺樹脂、氰酸酯樹脂、聚醯亞胺樹脂等。 As the resin other than the component (A) and the component (C), for example, an epoxy resin, a maleimide resin, a cyanate resin, or a polyimide resin can be used in combination.

以高頻特性之觀點來看,(B)成分相對於熱硬化性樹脂組成物中之樹脂成分100質量份,較佳為0.1至10質量份,更佳為0.3至5質量份,特佳為0.5至2質量份。 The component (B) is preferably 0.1 to 10 parts by mass, more preferably 0.3 to 5 parts by mass, more preferably 0.3 to 5 parts by mass, based on 100 parts by mass of the resin component in the thermosetting resin composition, from the viewpoint of high-frequency characteristics. 0.5 to 2 parts by mass.

以降低熱硬化性樹脂之硬化物之CTE之觀點來看,熱硬化性樹脂較佳為更含有(D)無機填充劑。以高頻特性之觀點來看,(D)成分較佳為氧化矽填充劑。以耐濕可靠性之觀點來看,(D)成分之無機填充劑更佳為經表面處理。以耐濕性提高之觀點來看,該表面處理劑較佳為通式(10)所示之矽烷耦合劑: The thermosetting resin preferably further contains (D) an inorganic filler from the viewpoint of lowering the CTE of the cured product of the thermosetting resin. From the viewpoint of high frequency characteristics, the component (D) is preferably a cerium oxide filler. From the viewpoint of moisture resistance reliability, the inorganic filler of the component (D) is preferably surface-treated. The surface treatment agent is preferably a decane coupling agent represented by the general formula (10) from the viewpoint of improving moisture resistance:

(式中,R21至R23分別獨立地為碳數1至3之烷基,R24為至少於末端具有不飽和雙鍵之官能基,n為3至9)。又,更佳為式中的n為5至9。又,以因反應性之與(A)之接著性之觀點來看,通式(10)之R24較佳為乙烯基或(甲基)丙烯醯基,以剝離強度之觀點來看,更佳為乙烯基。 (wherein R 21 to R 23 are each independently an alkyl group having 1 to 3 carbon atoms, and R 24 is a functional group having an unsaturated double bond at least at the terminal, and n is 3 to 9). Further, it is more preferable that n in the formula is 5 to 9. Further, R 24 of the general formula (10) is preferably a vinyl group or a (meth)acryl fluorenyl group from the viewpoint of reactivity and the adhesion to (A), and from the viewpoint of peel strength, Good for vinyl.

(D)成分可使用之矽烷耦合劑可舉出辛烯基三烷氧基矽烷或(甲基)丙烯醯氧基烷基三烷氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷。辛烯基三烷氧基矽烷可舉出辛烯基三甲氧基矽烷、辛烯基三乙氧基矽烷等。(甲基)丙烯醯氧基烷基三烷氧基矽烷可舉出(甲基)丙烯醯氧基辛基三甲氧基矽烷、(甲基)丙烯醯氧基辛基三乙氧基矽烷等。以提高熱硬化性樹脂組成物之剝離強度之觀點來看,更佳為辛烯基三甲氧基矽烷。(D)成分可使用之矽烷耦 合劑之市售品可舉出信越化學工業股份有限公司製辛烯基三甲氧基矽烷(品名:KBM-1083)、信越化學工業股份有限公司製甲基丙烯醯氧基辛基三甲氧基矽烷(品名:KBM-5803)、信越化學工業股份有限公司製3-甲基丙烯醯氧基丙基三甲氧基矽烷(品名:KBM-503)。(D)成分可使用之矽烷耦合劑可為單獨或2種以上。 The decane coupling agent which can be used for the component (D) may, for example, be an octenyltrialkoxydecane or a (meth)acryloxyalkyltrialkoxy alkane or a 3-methylpropenyloxypropyltrimethoxy group. Base decane. The octenyltrialkoxide may, for example, be octenyltrimethoxydecane or octenyltriethoxydecane. Examples of the (meth)acryloxyalkyltrial alkoxy decane include (meth) propylene oxime octyl trimethoxy decane, (meth) propylene decyl octyl triethoxy decane, and the like. From the viewpoint of improving the peel strength of the thermosetting resin composition, octenyltrimethoxydecane is more preferable. A commercially available product of a decane coupling agent which can be used as the component (D) is exemplified by octyl methoxy decane (product name: KBM-1083) manufactured by Shin-Etsu Chemical Co., Ltd., and methacryl oxime manufactured by Shin-Etsu Chemical Co., Ltd. Oxyoctyltrimethoxydecane (product name: KBM-5803), 3-methylpropenyloxypropyltrimethoxydecane manufactured by Shin-Etsu Chemical Co., Ltd. (product name: KBM-503). The decane coupling agent which can be used for the component (D) may be singly or in combination of two or more.

(D)成分所使用之氧化矽填充劑可舉出熔融氧化矽、普通矽石、球狀氧化矽、破碎氧化矽、結晶性氧化矽、非晶質氧化矽等,並無特別限定。以氧化矽填充劑之分散性、熱硬化性樹脂組成物之流動性、硬化物之表面平滑性、介電特性、低熱膨張率、接著性等觀點來看,較佳為球狀熔融氧化矽。又,氧化矽填充劑之平均粒徑(不為球狀時為其平均最長徑)並無特別限定,但以提升因比表面積小所致之硬化後耐濕性之觀點來看,較佳為0.05至20μm,更佳為0.1至10μm,又更佳為1至10μm。在此,氧化矽填充劑之平均粒徑係指藉由雷射散射繞射式粒度分佈測定裝置所測定得到之體積基準之中位粒徑。 The cerium oxide filler used in the component (D) is, for example, a molten cerium oxide, a common vermiculite, a spherical cerium oxide, a crushed cerium oxide, a crystalline cerium oxide, or an amorphous cerium oxide, and is not particularly limited. The spherical fused cerium oxide is preferred from the viewpoints of dispersibility of the cerium oxide filler, fluidity of the thermosetting resin composition, surface smoothness of the cured product, dielectric properties, low thermal expansion ratio, and adhesion. Further, the average particle diameter of the cerium oxide filler (the average longest diameter when it is not spherical) is not particularly limited, but it is preferably from the viewpoint of improving the moisture resistance after curing due to a small specific surface area. It is 0.05 to 20 μm, more preferably 0.1 to 10 μm, still more preferably 1 to 10 μm. Here, the average particle diameter of the cerium oxide filler refers to a volume-based median diameter measured by a laser scattering diffraction type particle size distribution measuring apparatus.

使用上述耦合劑対氧化矽填充劑進行表面處理之方法無特別限定,可舉例如乾式法、濕式法等。 The method of surface-treating using the above-mentioned coupling agent cerium oxide cerium filler is not particularly limited, and examples thereof include a dry method and a wet method.

乾式法係將氧化矽填充劑、及相對於氧化矽填充劑之表面積為適當量之矽烷耦合劑加入攪拌裝置,以適當條件攪拌,或是預先將氧化矽填充劑加入攪拌裝置並以適當條件攪拌,同時藉由滴入或噴霧等在原液或溶液中添加相對於氧化矽填充劑之表面積為適當量之矽烷耦合 劑,並藉由攪拌使矽烷耦合劑均勻附著於氧化矽填充劑表面(藉由加水分解)表面,以(藉由使其水解)進行表面處理之方法。攪拌裝置可舉例如亨歇爾混合器(Henschel mixer)等可以高速旋轉進行攪拌/混合之混合器,但並無限定。 In the dry method, the cerium oxide filler and the cerium coupling agent having a suitable surface area relative to the surface area of the cerium oxide filler are added to the stirring device, stirred under appropriate conditions, or the cerium oxide filler is added to the stirring device in advance and stirred under appropriate conditions. At the same time, a suitable amount of the decane coupling agent relative to the surface area of the cerium oxide filler is added to the stock solution or solution by dropping or spraying, and the decane coupling agent is uniformly attached to the surface of the cerium oxide filler by stirring (by The surface is hydrolyzed) to be surface treated (by hydrolysis). The stirring device may, for example, be a mixer that can be stirred and mixed at a high speed, such as a Henschel mixer, but is not limited thereto.

濕式法係將相對於要進行表面處理之氧化矽填充劑的表面積為充分量之矽烷耦合劑溶解於水或有機溶劑後,於所得的表面處理溶液中添加氧化矽填充劑,並拌攪成為漿體狀,藉此使矽烷耦合劑與氧化矽填充劑充分反應後,使用過濾或離心分離等將氧化矽填充劑從表面處理溶液分離,並加熱乾燥進行表面處理。 In the wet method, after a sufficient amount of the decane coupling agent is dissolved in water or an organic solvent with respect to the surface area of the cerium oxide filler to be surface-treated, a cerium oxide filler is added to the obtained surface treatment solution, and the mixture is stirred and mixed. In the form of a slurry, the cerium coupling agent is sufficiently reacted with the cerium oxide filler, and the cerium oxide filler is separated from the surface treatment solution by filtration, centrifugation or the like, and dried by heating to perform surface treatment.

(D)成分可單獨使用或併用2種以上。 The component (D) may be used singly or in combination of two or more.

以低CTE化之觀點來看,(D)成分在熱硬化性樹脂組成物(但不包含溶劑)中較佳為45至75體積%(若為實心氧化矽填充劑為64至88質量%),更佳為50至70體積%(若為實心氧化矽填充劑為69至85質量%)。若(D)成分少,則無法達成所求的熱硬化性樹脂組成物之CTE,若(D)成分多,則容易降低熱硬化性樹脂組成物之剝離強度。 From the viewpoint of low CTE, the component (D) is preferably 45 to 75 vol% in the thermosetting resin composition (but not including the solvent) (if the solid cerium oxide filler is 64 to 88% by mass) More preferably, it is 50 to 70% by volume (69 to 85% by mass in the case of a solid cerium oxide filler). When the component (D) is small, the CTE of the thermosetting resin composition to be obtained cannot be achieved, and if the component (D) is large, the peel strength of the thermosetting resin composition is likely to be lowered.

又,在不損及本發明效果之範圍內,熱硬化性樹脂組成物可含有:作為(A)成分之硬化促進劑之有機過氧化物、或矽烷耦合劑等耦合劑(整體摻混)、阻燃劑、黏著性賦予劑、消泡劑、流動調整劑、搖變劑、分散劑、抗氧化劑、阻燃劑等添加劑。矽烷耦合劑可舉出對苯乙烯基三甲氧基矽烷(信越化學工業股份有限公司製 KBM-1403)、雙(三乙氧基矽基丙基)四硫醚(信越化學工業股份有限公司製KBE-846)、多硫醚系矽烷耦合劑(股份有限公司大阪曹達製CABRUS 4)、辛烯基三甲氧基矽烷(信越化學工業股份有限公司製KBM-1083)、甲基丙烯醯氧基辛基三甲氧基矽烷(信越化學工業股份有限公司製KBM-5803)、3-甲基丙烯醯氧基丙基三甲氧基矽烷(信越化學工業股份有限公司製KBM-503)、3-甲基丙烯醯氧基丙基三乙氧基矽烷(信越化學工業股份有限公司製KBE-503)、3-環氧丙氧基丙基三甲氧基矽烷(信越化學工業股份有限公司製KBM-403)、3-環氧丙氧基丙基三乙氧基矽烷(信越化學工業股份有限公司製KBE-403)等。阻燃劑可舉出膦酸金屬鹽(CLARIANT JAPAN製OP-935)等。 In addition, the thermosetting resin composition may contain an organic peroxide as a curing accelerator of the component (A) or a coupling agent such as a decane coupling agent (integrally blended), insofar as the effect of the present invention is not impaired. Additives such as flame retardants, adhesion imparting agents, defoamers, flow regulators, shakers, dispersants, antioxidants, and flame retardants. Examples of the decane coupling agent include p-styryl trimethoxy decane (KBM-1403 manufactured by Shin-Etsu Chemical Co., Ltd.) and bis(triethoxymethyl propyl) tetrasulfide (KBE manufactured by Shin-Etsu Chemical Co., Ltd.) -846), polysulfide decane coupling agent (CABRUS 4 manufactured by Osaka Soda Co., Ltd.), octenyl trimethoxy decane (KBM-1083 manufactured by Shin-Etsu Chemical Co., Ltd.), methacrylic acid oxime octyl Trimethoxydecane (KBM-5803, manufactured by Shin-Etsu Chemical Co., Ltd.), 3-methacryloxypropyltrimethoxydecane (KBM-503, manufactured by Shin-Etsu Chemical Co., Ltd.), 3-methylpropene oxime Oxypropyltriethoxydecane (KBE-503, manufactured by Shin-Etsu Chemical Co., Ltd.), 3-glycidoxypropyltrimethoxydecane (KBM-403, Shin-Etsu Chemical Co., Ltd.), 3- Glycidoxypropyltriethoxydecane (KBE-403, manufactured by Shin-Etsu Chemical Co., Ltd.) and the like. The flame retardant may, for example, be a phosphonic acid metal salt (OP-935 manufactured by CLARIANT JAPAN).

可將構成樹脂組成物之(A)、(B)、(C)成分等原料溶解或分散於有機溶劑,藉此製作熱硬化性樹脂組成物。該等原料之溶解或分散等的裝置並無特別限定,可使用具有加熱裝置之攪拌機、溶解器、擂潰機、三輥研磨機、球磨機、行星混合器、珠磨機等。又,可適宜組合該等裝置使用。 A material such as the components (A), (B), and (C) constituting the resin composition can be dissolved or dispersed in an organic solvent to prepare a thermosetting resin composition. The apparatus for dissolving or dispersing the raw materials is not particularly limited, and a stirrer having a heating device, a dissolver, a pulverizer, a three-roll mill, a ball mill, a planetary mixer, a bead mill, or the like can be used. Moreover, it is suitable to use these apparatuses in combination.

作為有機溶劑,芳香族系溶劑可舉例如甲苯、二甲苯等,酮系溶劑可舉例如甲基乙酮、甲基異丁酮等。有機溶劑可單獨使用或組合2種以上使用。以操作性之觀點來看,熱硬化性樹脂組成物較佳為200至3000mPa‧s之黏度之範圍。黏度係使用E型黏度計以轉數50rpm在25℃測定的值。 Examples of the organic solvent include, for example, toluene and xylene. Examples of the ketone solvent include methyl ethyl ketone and methyl isobutyl ketone. The organic solvents may be used singly or in combination of two or more. From the viewpoint of workability, the thermosetting resin composition preferably has a viscosity in the range of 200 to 3000 mPa ‧ s. The viscosity was measured using an E-type viscometer at a rotation number of 50 rpm at 25 °C.

所得之熱硬化性樹脂組成物之高頻特性及耐熱可靠性優異(介電損耗正切(tanδ)的變化量小),且焊料耐熱性優異。 The obtained thermosetting resin composition is excellent in high-frequency characteristics and heat-resistance reliability (the amount of change in dielectric loss tangent (tan δ) is small), and is excellent in solder heat resistance.

〔絕緣性膜〕 [insulating film]

本發明之絕緣性膜係含有上述熱硬化性樹脂組成物。絕緣性膜係由熱硬化性樹脂組成物形成為所要求的形狀。具體而言,將上述熱硬化性樹脂組成物塗布於支持體上後乾燥,藉此可得到絕緣性膜。支持體無特別限定,可舉出銅、鋁等金屬箔、聚酯樹脂、聚乙烯樹脂、聚對苯二甲酸乙二酯樹脂(PET)等有機膜等。支持體也可以聚矽氧系化合物等進行脫模處理。又,熱硬化性樹脂組成物可以各種形狀使用,形狀並無特別限定。 The insulating film of the present invention contains the above thermosetting resin composition. The insulating film is formed into a desired shape from a thermosetting resin composition. Specifically, the thermosetting resin composition is applied onto a support and dried, whereby an insulating film can be obtained. The support is not particularly limited, and examples thereof include metal foils such as copper and aluminum, organic resins such as polyester resins, polyethylene resins, and polyethylene terephthalate resins (PET). The support may be subjected to a release treatment by a polyoxo compound or the like. Further, the thermosetting resin composition can be used in various shapes, and the shape is not particularly limited.

將熱硬化性樹脂組成物塗布於支持體之方法並無特別限定,但以薄膜化/控制膜厚之觀點來看,較佳為凹板法、狹縫式模具法、刮刀法。藉由狹縫式模具法,可得到厚度為5至300μm之熱硬化性樹脂組成物之未硬化膜,亦即絕緣性膜。 The method of applying the thermosetting resin composition to the support is not particularly limited, but from the viewpoint of film formation and control of the film thickness, a concave plate method, a slit mold method, or a doctor blade method is preferable. By the slit die method, an uncured film of a thermosetting resin composition having a thickness of 5 to 300 μm, that is, an insulating film can be obtained.

乾燥條件可因應熱硬化性樹脂組成物所使用的有機溶劑之種類或量、塗布厚度等而適宜設定,例如可為在50至120℃進行1至60分鐘程度。如此所得之絕緣性膜具有良好保存安定性。又,絕緣性膜可在所要求的時機從支持體剝離。 The drying conditions can be appropriately set depending on the kind or amount of the organic solvent used in the thermosetting resin composition, the coating thickness, and the like, and can be, for example, about 50 to 120 ° C for about 1 to 60 minutes. The insulating film thus obtained has good storage stability. Further, the insulating film can be peeled off from the support at a desired timing.

絕緣性膜之硬化例如可以150至230℃、30至180分鐘之條件進行。本發明之層間絕緣性膜可與上述 相同之方法製作,且可進行硬化。使用絕緣性膜作為層間絕緣性膜使用時,層間絕緣性膜之硬化可在以銅箔等形成配線之基板間夾住層間絕緣性膜後進行,也可在將以銅箔等形成配線之層間絕緣性膜適宜積層後進行。又,絕緣性膜亦可使用作為保護基板上的配線之被覆層,此時的硬化條件亦同樣。又,熱硬化性樹脂組成物亦可以同樣方式硬化。又,硬化時亦可以例如1至5MPa之壓力進行擠壓硬化。 The hardening of the insulating film can be carried out, for example, at 150 to 230 ° C for 30 to 180 minutes. The interlayer insulating film of the present invention can be produced in the same manner as described above and can be cured. When the insulating film is used as the interlayer insulating film, the interlayer insulating film may be cured by sandwiching the interlayer insulating film between the substrates formed by the copper foil or the like, or may be formed between the layers formed by the copper foil or the like. The insulating film is suitably laminated. Further, the insulating film may be used as a coating layer for protecting the wiring on the substrate, and the curing conditions at this time are also the same. Further, the thermosetting resin composition can be cured in the same manner. Further, it is also possible to carry out extrusion hardening at a pressure of, for example, 1 to 5 MPa at the time of hardening.

〔多層配線板〕 [Multilayer wiring board]

本發明之多層配線板具有上述熱硬化性樹脂組成物之硬化物、上述絕緣性膜或層間絕緣性膜之硬化物。本發明之印刷配線板係使用上述熱硬化性樹脂組成物、上述絕緣性膜、或層間絕緣性膜並使其硬化而製作。藉由上述熱硬化性樹脂組成物之硬化物、上述絕緣性膜或層間絕緣性膜之硬化物,使該印刷配線板於高頻特性及耐熱可靠性優異(介電損耗正切(tanδ)的變化量小),且焊料耐熱性優異。多層配線板中可舉出微波或毫米波通訊用基板,尤其是車輛用毫米波雷達基板等高頻用途的印刷配線板等。多層配線板之製造方法並無限定,可採用與使用一般預浸體而製作印刷配線板時相同之方法。 The multilayer wiring board of the present invention has a cured product of the above thermosetting resin composition, a cured product of the above insulating film or an interlayer insulating film. The printed wiring board of the present invention is produced by curing and curing the thermosetting resin composition, the insulating film, or the interlayer insulating film. The printed wiring board is excellent in high-frequency characteristics and heat-resistance reliability (dielectric loss tangent (tan δ) change by the cured product of the thermosetting resin composition, the insulating film, or the cured film of the interlayer insulating film. The amount is small) and the solder is excellent in heat resistance. The multilayer wiring board may be a substrate for microwave or millimeter wave communication, in particular, a printed wiring board for high frequency use such as a millimeter wave radar substrate for a vehicle. The method for producing the multilayer wiring board is not limited, and the same method as in the case of producing a printed wiring board using a general prepreg can be employed.

〔半導體裝置〕 [semiconductor device]

本發明之半導體裝置係使用上述熱硬化性樹脂組成物、上述絕緣性膜或層間絕緣性膜並使其硬化而製作。藉由上述熱硬化性樹脂組成物之硬化物、上述絕緣性膜或層 間絕緣性膜之硬化物,使該半導體裝置於高頻特性及耐熱可靠性優異(介電損耗正切(tanδ)的變化量小)。在此,半導體裝置是指可利用半導體特性而發揮功能之所有裝置,包括電子零件、半導體電路、組裝有該等之模組、電子機器等。 The semiconductor device of the present invention is produced by curing and curing the thermosetting resin composition, the insulating film or the interlayer insulating film. The semiconductor device is excellent in high frequency characteristics and heat resistance reliability (change in dielectric loss tangent (tan δ) by the cured product of the thermosetting resin composition, the insulating film or the cured film of the interlayer insulating film. small). Here, the semiconductor device refers to all devices that can function by utilizing semiconductor characteristics, and includes electronic components, semiconductor circuits, modules in which these are incorporated, electronic devices, and the like.

(實施例)  (Example)  

藉由實施例說明本發明,但本發明並不限定於該等。又,以下的實施例中,只要未特別說明,份、%表示質量份、質量%。 The invention is illustrated by the examples, but the invention is not limited thereto. In the following examples, the parts and % represent parts by mass and mass% unless otherwise specified.

〔實施例1至11,比較例1至3〕 [Examples 1 to 11, Comparative Examples 1 to 3]

<熱硬化性樹脂組成物之製作> <Production of Thermosetting Resin Composition>

以表1至2所示之配方,於容器中量取各成分,以自轉/公轉式攪拌機(品名:MAZERUSTAR(註冊商標),倉敷紡績製)攪拌混合3分鐘後,使用珠磨機進行分散,以甲苯調整黏度以調整熱硬化性樹脂組成物。接著,以塗布機將熱硬化性樹脂組成物以成為50至100μm之厚度之方式塗布於聚對苯二甲酸乙二酯(PET)基材上,在100至120℃乾燥10至20分鐘以進行膜化。 In the formulation shown in Tables 1 to 2, each component was weighed and mixed in a spinning/revolving mixer (product name: MAZERUSTAR (registered trademark), Kurashiki Textile Co., Ltd.) for 3 minutes, and then dispersed using a bead mill. The viscosity was adjusted with toluene to adjust the thermosetting resin composition. Next, the thermosetting resin composition is applied onto a polyethylene terephthalate (PET) substrate in a thickness of 50 to 100 μm by a coater, and dried at 100 to 120 ° C for 10 to 20 minutes to carry out. Membrane.

在此,表1至2所記載的OPE-2St 2200係使用三菱氣體化學股份有限公司製苯乙烯末端改質PPE(分子量(Mn):2200)。 Here, the OPE-2St 2200 described in Tables 1 to 2 used a styrene-terminated PPE (molecular weight (Mn): 2,200) manufactured by Mitsubishi Gas Chemical Co., Ltd.

OPE-2St 1200係使用三菱氣體化學股份有限公司製苯乙烯末端改質PPE(分子量(Mn):1200)。 OPE-2St 1200 is a styrene end-modified PPE (molecular weight (Mn): 1200) manufactured by Mitsubishi Gas Chemical Co., Ltd.

AO-20係使用ADEKA製受阻苯酚系抗氧化劑(熔點:220 至222℃)。 The AO-20 system uses a hindered phenol-based antioxidant (melting point: 220 to 222 ° C) manufactured by ADEKA.

AO-330係使用ADEKA製受阻苯酚系抗氧化劑(熔點:243至245℃)。 AO-330 is a hindered phenol-based antioxidant (melting point: 243 to 245 ° C) manufactured by ADEKA.

AO-80係使用ADEKA製受阻苯酚系抗氧化劑(熔點:110至120℃,3,9-雙{2-[3-(3-第三丁基-4-羥基-5-甲基苯基)丙醯氧基]-1,1-二甲基乙基}-2,4,8,10-四氧雜螺[5.5]十一烷。 AO-80 is a hindered phenolic antioxidant made by ADEKA (melting point: 110 to 120 ° C, 3,9-bis {2-[3-(3-t-butyl-4-hydroxy-5-methylphenyl)) Propyloxy]-1,1-dimethylethyl}-2,4,8,10-tetraoxaspiro[5.5]undecane.

G1652係使用Kraton Polymer製SEBS(苯乙烯比30%之彈性體)。 G1652 uses SEBS (styrene to 30% elastomer) made of Kraton Polymer.

G1657係使用Kraton Polymer製SEBS(苯乙烯比13%之彈性體)。 G1657 uses SEBS (styrene ratio 13% elastomer) manufactured by Kraton Polymer.

KBM-1403係使用信越化學工業股份有限公司製苯乙烯基系耦合劑(對苯乙烯基三甲氧基矽烷)。 KBM-1403 is a styrene-based coupling agent (p-styryltrimethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd.

CABRUS 4係使用大阪曹達製硫醚系耦合劑。 The CABRUS 4 system uses a thioether-based coupling agent from Osaka Soda.

SFP-130MC M處理係使用於DENKA製SiO2填充劑(平均粒徑:0.7μm品)進行甲基丙烯酸系耦合劑(信越化學工業股份有限公司製3-甲基丙烯醯氧基丙基三甲氧基矽烷,製品名:KBM-503)處理過者。 SFP-130MC M treatment was carried out using SiO 2 filler (average particle size: 0.7 μm) manufactured by DENKA to carry out a methacrylic coupling agent (3-methacryloxypropyltrimethoxy) manufactured by Shin-Etsu Chemical Co., Ltd. Base decane, product name: KBM-503) treated.

FB-3SDX M處理係使用於DENKA製SiO2填充劑(平均粒徑:3.4μm品)進行甲基丙烯酸系耦合劑(信越化學工業股份有限公司製3-甲基丙烯醯氧基丙基三甲氧基矽烷,製品名:KBM-503)處理過者。 FB-3SDX M treatment was carried out using SiO 2 filler (average particle size: 3.4 μm) manufactured by DENKA to carry out a methacrylic coupling agent (3-methacryloxypropyltrimethoxy) manufactured by Shin-Etsu Chemical Co., Ltd. Base decane, product name: KBM-503) treated.

FB-3SDX O處理係使用於DENKA製SiO2填充劑(平均粒徑:3.4μm品)進行辛烯基系耦合劑(信越化學工業股份有限公司製7-辛烯基三甲氧基矽烷,製品名:KBM-1083)處理過者。 FB-3SDX O treatment was carried out using SiO 2 filler (average particle diameter: 3.4 μm) manufactured by DENKA to carry out an octenyl coupling agent (7-octenyltrimethoxydecane manufactured by Shin-Etsu Chemical Co., Ltd., product name) :KBM-1083) Processed.

FB-3SDX未處理係使用DENKA製SiO2填充劑(平均粒徑:3.4μm品)。 The untreated FB-3SDX was a SiO 2 filler (average particle diameter: 3.4 μm) manufactured by DENKA.

〔評價方法〕 [Evaluation method]

<介電特性> <Dielectric properties>

將從PET基材剝離之薄膜在200℃以1小時、1MPa擠壓硬化後,裁切為70×50mm,藉由分離式介電質共振器(split post dielectric resonator:SPDR)以介電質共振頻率數10GHz測定常溫常濕之比介電率(ε)、介電損耗正切(tanδ)。若比介電率為3.5以下且介電損耗正切為0.0030以下則為較佳。於表1至2表示結果。 The film peeled from the PET substrate was extruded and hardened at 200 ° C for 1 hour and 1 MPa, and then cut into 70 × 50 mm, and dielectric resonance was performed by a split-type dielectric resonator (SPDR). The ratio of dielectric constant (ε) and dielectric loss tangent (tan δ) at room temperature to normal humidity was measured at a frequency of 10 GHz. It is preferable that the specific dielectric constant is 3.5 or less and the dielectric loss tangent is 0.0030 or less. The results are shown in Tables 1 to 2.

<耐熱可靠性(tanδ變化)> <heat resistance reliability (tan δ change)>

將測定上述介電特性後的硬化膜在125℃放置200小時後,於常溫常濕藉由SPDR法(10GHz)測定tanδ,求出tanδ的變化量及變化率。若變化率為80%以下則為較佳。於表1至2表示結果。 After the cured film having the above dielectric properties was allowed to stand at 125 ° C for 200 hours, tan δ was measured by SPDR method (10 GHz) at normal temperature and normal humidity to determine the amount of change and the rate of change of tan δ. It is preferred if the rate of change is 80% or less. The results are shown in Tables 1 to 2.

<焊料耐熱性> <Solder heat resistance>

於2片Cu箔(福田金屬箔粉工業股份有限公司製,品名:CF-T9FZSV)夾住從PET基材剝離之薄膜,在200℃以1小時、1MPa進行擠壓硬化並接著後,切割出3cm×3cm,以此為試驗片,在270℃的焊料浴漂浮60秒,以目視確認 有無膨脹產生。未有膨脹等外觀變化時判定為「OK」(合格),觀察到膨脹時判定為「NG」(不合格)。於表1至2表示結果。 Two sheets of Cu foil (manufactured by Fukuda Metal Foil Powder Co., Ltd., product name: CF-T9FZSV) were sandwiched between the film peeled off from the PET substrate, and subjected to extrusion hardening at 200 ° C for 1 hour and 1 MPa, and then cut out. 3 cm × 3 cm, which was used as a test piece, was floated in a solder bath at 270 ° C for 60 seconds to visually confirm the presence or absence of expansion. It was judged as "OK" (passed) when there was no change in appearance such as expansion, and it was judged as "NG" (failed) when expansion was observed. The results are shown in Tables 1 to 2.

<耐濕可靠性(tanδ變化)> <moisture resistance reliability (tan δ change)>

將測定上述介電特性後的硬化膜於85℃/85%RH之恆溫恆濕槽中放置200小時後,於常溫常濕藉由SPDR法(10GHz)測定tanδ,求tanδ的變化量及變化率。若變化率為55%以下則為較佳,若為45%以下則為更佳,若為40%以下則為又更佳。於表3表示結果。 After the cured film having the above dielectric properties was placed in a constant temperature and humidity chamber at 85 ° C / 85% RH for 200 hours, tan δ was measured by SPDR method (10 GHz) at room temperature and humidity to determine the amount of change and rate of change of tan δ. . The rate of change is preferably 55% or less, more preferably 45% or less, and even more preferably 40% or less. The results are shown in Table 3.

由表1至3可知,實施例1至11係在比介電率(ε)、介電損耗正切(tanδ)、耐熱可靠性(tanδ之變化量、變化率)、焊料耐熱性、耐濕可靠性全部皆為良好結果。而且,實施例1至10係在耐濕可靠性(tanδ之變化量、變化率)的結果更為良好。又,使用未經以矽烷耦合劑處理之氧化矽填充劑之實施例11的耐濕可靠性的結果為53%。咸認其原因如下:因氧化矽填充劑本身之耐濕性差,故若僅添加氧化矽填充劑則會降低耐濕可靠性,相對於此,藉由進行氧化矽填充劑之表面處理,可防止耐濕可靠性降低。又, 比較(A)成分之分子量相異之實施例1與實施例6,可知分子量較小者的耐熱可靠性的結果較差,會產生氧化劣化。相對於此,未使用(B)成分之比較例1與比較例2之耐濕可靠性的變化率較大。又,使用(B’)成分之比較例3之焊料耐熱性差。 As is apparent from Tables 1 to 3, Examples 1 to 11 are in the specific dielectric constant (ε), dielectric loss tangent (tan δ), heat resistance reliability (change amount of tan δ, rate of change), solder heat resistance, and moisture resistance reliability. All of them are good results. Further, in Examples 1 to 10, the results of the moisture resistance reliability (the amount of change in tan δ, the rate of change) were more excellent. Further, the moisture resistance reliability of Example 11 using a cerium oxide filler which was not treated with a decane coupling agent was 53%. The reason for this is as follows: Since the cerium oxide filler itself has poor moisture resistance, if only the cerium oxide filler is added, the moisture resistance reliability is lowered, whereas the surface treatment of the cerium oxide filler can be prevented. Reduced humidity resistance. Further, in Comparative Example 1 and Example 6 in which the molecular weights of the components (A) were different, it was found that the results of heat resistance reliability of the smaller molecular weight were inferior, and oxidative degradation occurred. On the other hand, the rate of change in the moisture resistance reliability of Comparative Example 1 and Comparative Example 2 in which the component (B) was not used was large. Further, the solder of Comparative Example 3 using the component (B') was inferior in heat resistance.

(產業上之可利用性)  (industrial availability)  

本發明之熱硬化性樹脂組成物可形成高頻特性及耐熱可靠性優異(介電損耗正切(tanδ)的變化量小),且焊料耐熱性優異之絕緣性膜或層間絕緣性膜,為非常具有用者。藉由上述熱硬化性樹脂組成物之硬化物、上述絕緣性膜或層間絕緣性膜之硬化物,使本發明之多層配線板於高頻特性及耐熱可靠性優異(介電損耗正切(tanδ)的變化量小)。藉由上述熱硬化性樹脂組成物之硬化物、上述絕緣性膜或層間絕緣性膜之硬化物,使本發明之半導體裝置於高頻特性及耐熱可靠性優異(介電損耗正切(tanδ)的變化量小),故適於高頻用途。 The thermosetting resin composition of the present invention is excellent in high-frequency characteristics and heat-resistance reliability (the amount of change in dielectric loss tangent (tan δ) is small), and the insulating film or the interlayer insulating film excellent in solder heat resistance is extremely Have users. The multilayer wiring board of the present invention is excellent in high frequency characteristics and heat resistance reliability by the cured product of the above-mentioned thermosetting resin composition, the above-mentioned insulating film or the cured film of the interlayer insulating film (dielectric loss tangent (tan δ)) The amount of change is small). The semiconductor device of the present invention is excellent in high-frequency characteristics and heat-resistance reliability (dielectric loss tangent (tan δ) by the cured product of the thermosetting resin composition, the insulating film or the cured film of the interlayer insulating film. It is suitable for high frequency applications because of the small amount of change.

Claims (9)

一種熱硬化性樹脂組成物,係含有:(A)於末端具有不飽和雙鍵之數量平均分子量為800至4500之聚苯醚,(B)熔點為200℃以上之苯酚系抗氧化劑,及(C)熱塑性彈性體。  A thermosetting resin composition comprising: (A) a polyphenylene ether having a number average molecular weight of 800 to 4,500 having an unsaturated double bond at a terminal, and (B) a phenolic antioxidant having a melting point of 200 ° C or more, and C) Thermoplastic elastomer.   如申請專利範圍第1項所述之熱硬化性樹脂組成物,更含有(D)無機填充劑。  The thermosetting resin composition according to claim 1, further comprising (D) an inorganic filler.   如申請專利範圍第1或2項所述之熱硬化性樹脂組成物,其中,(D)成分含有:經以通式(10)所示之矽烷耦合劑表面處理之氧化矽填充劑, 式中,R 21至R 23分別獨立地為碳數1至3之烷基,R 24為至少於末端具有不飽和雙鍵之官能基,n為3至9。 The thermosetting resin composition according to claim 1 or 2, wherein the component (D) contains a cerium oxide filler which is surface-treated with a decane coupling agent represented by the formula (10). Wherein R 21 to R 23 are each independently an alkyl group having 1 to 3 carbon atoms, and R 24 is a functional group having an unsaturated double bond at least at the terminal, and n is 3 to 9. 如申請專利範圍第1至3項中任一項所述之熱硬化性樹脂組成物,其中,通式(10)之R 24為乙烯基或(甲基)丙烯醯基。 The thermosetting resin composition according to any one of claims 1 to 3, wherein R 24 of the formula (10) is a vinyl group or a (meth) acrylonitrile group. 一種絕緣性膜,係含有申請專利範圍第1至4項中任一項所述之熱硬化性樹脂組成物。  An insulating film comprising the thermosetting resin composition according to any one of claims 1 to 4.   一種層間絕緣性膜,係含有申請專利範圍第1至4項中任一項所述之熱硬化性樹脂組成物。  An interlayer insulating film comprising the thermosetting resin composition according to any one of claims 1 to 4.   一種硬化物,係申請專利範圍第1至4項中任一項所述之熱硬化性樹脂組成物之硬化物、申請專利範圍第5項所述之絕緣性膜或申請專利範圍第6項所述之層間絕緣性膜之硬化物。  A cured product of the thermosetting resin composition according to any one of claims 1 to 4, the insulating film of claim 5 or the sixth application of the patent application. A cured product of an interlayer insulating film.   一種多層配線板,係具有:申請專利範圍第1至4項中任一項所述之熱硬化性樹脂組成物之硬化物、申請專利範圍第5項所述之絕緣性膜或申請專利範圍第6項所述之層間絕緣性膜之硬化物。  A multilayer wiring board comprising: a cured product of a thermosetting resin composition according to any one of claims 1 to 4, an insulating film according to claim 5 or a patent application scope A cured product of the interlayer insulating film according to item 6.   一種半導體裝置,係具有:申請專利範圍第1至4項中任一項所述之熱硬化性樹脂組成物之硬化物、申請專利範圍第5項所述之絕緣性膜或申請專利範圍第6項所述之層間絕緣性膜之硬化物。  A semiconductor device comprising: a cured product of a thermosetting resin composition according to any one of claims 1 to 4, an insulating film according to claim 5, or a patent application scope 6 A cured product of the interlayer insulating film according to the item.  
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