JPWO2019044798A1 - パワー半導体装置を製造する方法、熱プレス用シート及び熱プレス用熱硬化性樹脂組成物 - Google Patents
パワー半導体装置を製造する方法、熱プレス用シート及び熱プレス用熱硬化性樹脂組成物 Download PDFInfo
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- NJLLQSBAHIKGKF-UHFFFAOYSA-N dipotassium dioxido(oxo)titanium Chemical compound [K+].[K+].[O-][Ti]([O-])=O NJLLQSBAHIKGKF-UHFFFAOYSA-N 0.000 description 1
- PWWSSIYVTQUJQQ-UHFFFAOYSA-N distearyl thiodipropionate Chemical compound CCCCCCCCCCCCCCCCCCOC(=O)CCSCCC(=O)OCCCCCCCCCCCCCCCCCC PWWSSIYVTQUJQQ-UHFFFAOYSA-N 0.000 description 1
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- 239000003480 eluent Substances 0.000 description 1
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- 150000002148 esters Chemical class 0.000 description 1
- UHKJHMOIRYZSTH-UHFFFAOYSA-N ethyl 2-ethoxypropanoate Chemical compound CCOC(C)C(=O)OCC UHKJHMOIRYZSTH-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
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- 239000011521 glass Substances 0.000 description 1
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- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 1
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- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- WTSJNHOXCQCNSM-UHFFFAOYSA-N hexyl 2-ethyl-2,5,5-trimethylheptaneperoxoate Chemical compound CC(C(=O)OOCCCCCC)(CCC(C)(CC)C)CC WTSJNHOXCQCNSM-UHFFFAOYSA-N 0.000 description 1
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- 150000003949 imides Chemical class 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
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- 238000005259 measurement Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- FQPSGWSUVKBHSU-UHFFFAOYSA-N methacrylamide Chemical compound CC(=C)C(N)=O FQPSGWSUVKBHSU-UHFFFAOYSA-N 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- NKHAVTQWNUWKEO-IHWYPQMZSA-N methyl hydrogen fumarate Chemical compound COC(=O)\C=C/C(O)=O NKHAVTQWNUWKEO-IHWYPQMZSA-N 0.000 description 1
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
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- 229910052759 nickel Inorganic materials 0.000 description 1
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- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
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- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- NWVVVBRKAWDGAB-UHFFFAOYSA-N p-methoxyphenol Chemical group COC1=CC=C(O)C=C1 NWVVVBRKAWDGAB-UHFFFAOYSA-N 0.000 description 1
- 150000004965 peroxy acids Chemical class 0.000 description 1
- 150000004978 peroxycarbonates Chemical class 0.000 description 1
- 150000002989 phenols Chemical class 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- UEZVMMHDMIWARA-UHFFFAOYSA-M phosphonate Chemical compound [O-]P(=O)=O UEZVMMHDMIWARA-UHFFFAOYSA-M 0.000 description 1
- DOIRQSBPFJWKBE-UHFFFAOYSA-N phthalic acid di-n-butyl ester Natural products CCCCOC(=O)C1=CC=CC=C1C(=O)OCCCC DOIRQSBPFJWKBE-UHFFFAOYSA-N 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920003192 poly(bis maleimide) Polymers 0.000 description 1
- 229920002857 polybutadiene Polymers 0.000 description 1
- 229920006289 polycarbonate film Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920006290 polyethylene naphthalate film Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920000193 polymethacrylate Polymers 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- RGBXDEHYFWDBKD-UHFFFAOYSA-N propan-2-yl propan-2-yloxy carbonate Chemical compound CC(C)OOC(=O)OC(C)C RGBXDEHYFWDBKD-UHFFFAOYSA-N 0.000 description 1
- YPVDWEHVCUBACK-UHFFFAOYSA-N propoxycarbonyloxy propyl carbonate Chemical compound CCCOC(=O)OOC(=O)OCCC YPVDWEHVCUBACK-UHFFFAOYSA-N 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000012798 spherical particle Substances 0.000 description 1
- 229910052596 spinel Inorganic materials 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
- 150000003440 styrenes Chemical class 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- KKEYFWRCBNTPAC-UHFFFAOYSA-L terephthalate(2-) Chemical compound [O-]C(=O)C1=CC=C(C([O-])=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-L 0.000 description 1
- VNJISVYSDHJQFR-UHFFFAOYSA-N tert-butyl 4,4-dimethylpentaneperoxoate Chemical compound CC(C)(C)CCC(=O)OOC(C)(C)C VNJISVYSDHJQFR-UHFFFAOYSA-N 0.000 description 1
- NMOALOSNPWTWRH-UHFFFAOYSA-N tert-butyl 7,7-dimethyloctaneperoxoate Chemical compound CC(C)(C)CCCCCC(=O)OOC(C)(C)C NMOALOSNPWTWRH-UHFFFAOYSA-N 0.000 description 1
- SWAXTRYEYUTSAP-UHFFFAOYSA-N tert-butyl ethaneperoxoate Chemical compound CC(=O)OOC(C)(C)C SWAXTRYEYUTSAP-UHFFFAOYSA-N 0.000 description 1
- WFYHNNDLDSVRPI-UHFFFAOYSA-N tert-butylperoxy 6-[(2-methylpropan-2-yl)oxyperoxycarbonyloxy]hexyl carbonate Chemical compound C(C)(C)(C)OOOC(=O)OCCCCCCOC(=O)OOOC(C)(C)C WFYHNNDLDSVRPI-UHFFFAOYSA-N 0.000 description 1
- CIHOLLKRGTVIJN-UHFFFAOYSA-N tert‐butyl hydroperoxide Chemical compound CC(C)(C)OO CIHOLLKRGTVIJN-UHFFFAOYSA-N 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- UIYCHXAGWOYNNA-UHFFFAOYSA-N vinyl sulfide Chemical group C=CSC=C UIYCHXAGWOYNNA-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D133/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Coating compositions based on derivatives of such polymers
- C09D133/04—Homopolymers or copolymers of esters
- C09D133/14—Homopolymers or copolymers of esters of esters containing halogen, nitrogen, sulfur or oxygen atoms in addition to the carboxy oxygen
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04026—Bonding areas specifically adapted for layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/061—Disposition
- H01L2224/0618—Disposition being disposed on at least two different sides of the body, e.g. dual array
- H01L2224/06181—On opposite sides of the body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/27001—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate
- H01L2224/27005—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate for aligning the layer connector, e.g. marks, spacers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/27011—Involving a permanent auxiliary member, i.e. a member which is left at least partly in the finished device, e.g. coating, dummy feature
- H01L2224/27013—Involving a permanent auxiliary member, i.e. a member which is left at least partly in the finished device, e.g. coating, dummy feature for holding or confining the layer connector, e.g. solder flow barrier
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/273—Manufacturing methods by local deposition of the material of the layer connector
- H01L2224/2731—Manufacturing methods by local deposition of the material of the layer connector in liquid form
- H01L2224/2732—Screen printing, i.e. using a stencil
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29199—Material of the matrix
- H01L2224/29294—Material of the matrix with a principal constituent of the material being a liquid not provided for in groups H01L2224/292 - H01L2224/29291
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29299—Base material
- H01L2224/293—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29338—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/29339—Silver [Ag] as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29299—Base material
- H01L2224/293—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29338—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/29347—Copper [Cu] as principal constituent
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/32227—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the layer connector connecting to a bond pad of the item
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/753—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/75301—Bonding head
- H01L2224/75314—Auxiliary members on the pressing surface
- H01L2224/75315—Elastomer inlay
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7598—Apparatus for connecting with bump connectors or layer connectors specially adapted for batch processes
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/83053—Bonding environment
- H01L2224/83054—Composition of the atmosphere
- H01L2224/83065—Composition of the atmosphere being reducing
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/83053—Bonding environment
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- H01L2224/83075—Composition of the atmosphere being inert
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Abstract
Description
本明細書において「〜」を用いて示された数値範囲には、「〜」の前後に記載される数値がそれぞれ最小値及び最大値として含まれる。
本明細書において組成物中の各成分の含有量は、組成物中に各成分に該当する物質が複数種存在する場合、特に断らない限り、組成物中に存在する当該複数種の物質の合計の含有量を意味する。
本明細書において組成物中の各成分の粒径は、組成物中に各成分に該当する粒子が複数種存在する場合、特に断らない限り、組成物中に存在する当該複数種の粒子の混合物についての値を意味する。
本明細書において「層」との語には、当該層が存在する領域を観察したときに、当該領域の全体に形成されている場合に加え、当該領域の一部にのみ形成されている場合も含まれる。
図1、図2及び図3は、パワー半導体装置を製造する方法の一実施形態を示す断面図である。図1〜3に示す方法は、それぞれ1つのパワー半導体素子を含む複数の積層体を、1組のステージ及び圧着シートで挟むことによって一括して加熱及び加圧することを含む。
配線基板10は、絶縁基板11及び絶縁基板11上に設けられた配線層13を有する。絶縁基板11の種類は特に制限されない。例えば、FR4、FR5等の繊維基材を含む有機基板;繊維基材を含まないビルドアップ型の有機基板;ポリイミド、ポリエステル等の有機樹脂フィルム;及び、セラミック、アルミナ、ガラス、シリコン等の無機材料を含む基板から、絶縁基板11を選択することができる。特に、絶縁基板11が、パワー半導体装置に要求される耐熱性及び耐衝撃性の点で優れたセラミック基板であってもよい。
焼結材50Aは、金属粒子を含み、一般にペースト状である。金属粒子の粒径は、例えば100nm以下であってもよい。焼結材としては、例えば銅粒子を含む銅ペースト、又は銀粒子を含む銀ペーストを用いることができる。銀ペーストから形成される焼結金属層50は銀粒子が凝集して形成された焼結体(銀バルク)を含む。銀バルクを含む焼結金属層は、2次実装の際に再溶融し難いため、安定した接続の点で特に優れている。
積層体を加熱及び加圧する際の、ステージ上に配置される積層体の数は、特に制限されない。生産効率の観点からは、ステージ上に配置される積層体の数が2個以上、3個以上、又は5個以上であってもよい。本実施形態の製造方法による効果は、一括して加熱及び加圧する積層体の数が多いほど顕著である。ステージ上に配置される積層体の個数の上限は、特に制限されないが、例えば100個以下であってもよい。
図5は、一実施形態に係る熱プレス用シートを示す断面図である。図5に示す熱プレス用シート3は、熱硬化性樹脂層31と、熱硬化性樹脂層31の両面上に設けられた離型シート33a,33bとを有する。熱硬化性樹脂層31は、熱硬化性樹脂を含有する熱硬化性樹脂組成物をシート状に成形したものである。熱硬化性樹脂層31又はこれを形成するための熱硬化性樹脂組成物は、熱硬化性樹脂の硬化のための重合開始剤、硬化剤又はこれらの両方を含有していてもよい。熱硬化性樹脂組成物が、必要によりその他の成分を更に含んでいてもよい。離型シートが熱硬化性樹脂層31の片面上に設けられていてもよい。
熱硬化性樹脂は、架橋構造体を形成して熱硬化性樹脂層を硬化させる反応性の官能基を有する化合物である。熱硬化性樹脂の例としては、(メタ)アクリレート化合物、エポキシ化合物、ビスマレイミド化合物、シアネート化合物、及びフェノール化合物が挙げられる。熱硬化性樹脂層の粘度及び熱硬化性樹脂組成物の硬化物の熱膨張率の観点から、熱硬化性樹脂が(メタ)アクリレート化合物、エポキシ化合物、ビスマレイミド化合物、及びフェノール化合物からなる群より選択される少なくとも1種を含んでもよく、(メタ)アクリレート化合物、エポキシ化合物、及びビスマレイミド化合物からなる群より選択される少なくとも1種を含んでもよい。硬化速度の観点から、熱硬化性樹脂が(メタ)アクリレート化合物及びエポキシ化合物からなる群より選択される少なくとも1種を含んでもよい。これらの熱硬化性樹脂は、1種を単独で用いても2種以上を組み合わせて用いてもよい。
熱硬化性樹脂層及びこれを形成するための熱硬化性樹脂組成物が、熱硬化性樹脂として(メタ)アクリレート化合物を含む場合、(メタ)アクリレート化合物の重合反応を促進するため、熱硬化性樹脂層及び熱硬化性樹脂組成物がラジカル重合開始剤を含有してもよい。ラジカル重合開始剤は、典型的には熱ラジカル重合開始剤であるが、光ラジカル重合開始剤であってもよい。ラジカル重合開始剤が、熱ラジカル重合開始剤と光ラジカル重合開始剤との組み合わせであってもよい。
熱硬化性樹脂層及びこれを形成するための熱硬化性樹脂組成物が、熱硬化性樹脂として(メタ)アクリレート化合物を含む場合、熱硬化性樹脂層及び熱硬化性樹脂組成物が重合禁止剤を更に含有してもよい。熱硬化性樹脂層及び熱硬化性樹脂組成物が、(メタ)アクリレート化合物。ラジカル重合開始剤及び重合禁止剤を含有してもよい。(メタ)アクリレート化合物は、後述のラジカル重合開始剤の有無にかかわらず、保存時に熱、酸素等の影響によりラジカル重合することがあり、これがパワー半導体装置製造の安定性に影響する可能性がある。(メタ)アクリレート化合物に重合禁止剤を組み合わせることにより、パワー半導体装置製造の安定性が向上すると考えられる。重合禁止剤は、ラジカル重合に対して重合禁止効果があればよく、特に制限はない。重合禁止剤は、例えば、フェノール系、リン系、若しくはチオエーテル系の重合禁止剤、又はこれらの組み合わせであってもよい。
熱硬化性樹脂層及びこれを形成するための熱硬化性樹脂組成物が、熱硬化性樹脂としてエポキシ化合物を含有してもよい。エポキシ化合物は、1分子中に2個以上のエポキシ基を有する化合物である。例えば、電子部品の製造のために一般的に使用されているエポキシ化合物を用いることができる。エポキシ化合物としては、例えば、ビスフェノール化合物のジグリシジルエーテルであるビスフェノール型エポキシ樹脂、ノボラック型エポキシ樹脂、グリシジルエステル型エポキシ樹脂、グリシジルアミン型エポキシ樹脂、線状脂肪族エポキシ樹脂、及び脂環族エポキシ樹脂が挙げられる。これらのエポキシ樹脂は、1種単独で用いても2種以上を組み合わせて用いてもよい。反応性及び耐熱性の観点からは、エポキシ化合物が、ビスフェノール型エポキシ樹脂、グリシジルアミン型エポキシ樹脂又はこれらの組み合わせを含んでもよい。
熱硬化性樹脂層及びこれを形成するための熱硬化性樹脂組成物が、熱硬化性樹脂としてエポキシ化合物を含有する場合、熱硬化性樹脂層及び熱硬化性樹脂組成物が、エポキシ化合物を硬化させる硬化剤を含有してもよい。硬化剤は、特に制限されず、通常用いられる硬化剤から選択することができる。硬化剤は25℃で固体又は液体であってもよい。固体の硬化剤と液体の硬化剤とを併用してもよい。短時間での硬化の観点からは、硬化剤が少なくとも1種の酸無水物を含んでもよい。
熱硬化性樹脂層及びこれを形成するための熱硬化性樹脂組成物が、熱硬化性樹脂としてエポキシ化合物を含む場合、熱硬化性樹脂層及び熱硬化性樹脂組成物が、エポキシ化合物と硬化剤との硬化反応を促進する硬化促進剤を更に含有してもよい。硬化促進剤としては、例えば、リン系硬化促進剤、アミン系硬化促進剤、イミダゾール系硬化促進剤、及びグアニジン系硬化促進剤が挙げられる。硬化促進剤が、リン系硬化促進剤、アミン系硬化促進剤、及びイミダゾール系硬化促進剤から選ばれる少なくとも1種であってもよい。硬化促進剤は、1種単独で用いてもよく、2種以上を組み合わせて用いてもよい。
熱硬化性樹脂層及びこれを形成するための熱硬化性樹脂組成物は、熱可塑性樹脂を含有していてもよい。熱可塑性樹脂としては、例えば、アクリル樹脂、スチレン樹脂、ブタジエン樹脂、イミド樹脂、及びアミド樹脂が挙げられる。これらの熱可塑性樹脂は、1種を単独で用いても2種以上を組み合わせて用いてもよい。
ポンプ:L−6000型((株)日立製作所製、商品名)
カラム:Gelpack GL−R420+Gelpack GL−R430+Gelpack GL−R440(計3本)(日立化成(株)製、商品名)
溶離液:テトラヒドロフラン(THF)
測定温度:40℃
流速:2.05mL/分
検出器:L−3300型RI((株)日立製作所製、商品名)
熱硬化性樹脂層及びこれを形成するための熱硬化性樹脂組成物は、少なくとも1種の無機充填材を含有していてもよい。無機充填材は、例えば、シリカ(溶融シリカ、結晶シリカ等)、炭酸カルシウム、クレー、アルミナ(酸化アルミナ等)、窒化珪素、炭化珪素、窒化ホウ素、珪酸カルシウム、チタン酸カリウム、窒化アルミニウム、ベリリア、ジルコニア、ジルコン、フォステライト、ステアタイト、スピネル、ムライト、及びチタニア等から選ばれる無機材料を含む、粒子又は球形粒子を含んでもよい。無機充填材がガラス繊維を含んでもよい。これらの無機充填材は、1種を単独で用いても2種以上を組み合わせて用いてもよい。
(i)25℃における熱硬化性樹脂組成物の質量(Wc)を測定する。その熱硬化性樹脂組成物を空気中400℃で2時間、次いで700℃で3時間熱処理し、樹脂分を燃焼して除去する。残存した無機充填材の25℃における質量(Wf)を測定する。
(ii)電子比重計又は比重瓶を用いて、無機充填材の25℃における比重(df)を求める。
(iii)電子比重計又は比重瓶を用いて、熱硬化性樹脂組成物の25℃における比重(dc)を測定する。
(iv)(式1)により、熱硬化性樹脂組成物の体積(Vc)及び残存した無機充填材の体積(Vf)を求める。これらから無機充填材の体積比率(Vr)を求める。
(式1)
Vc=Wc/dc
Vf=Wf/df
Vr=Vf/Vc
Vc:熱硬化性樹脂組成物の体積(cm3)、Wc:熱硬化性樹脂組成物の質量(g)
dc:熱硬化性樹脂組成物の密度(g/cm3)
Vf:無機充填材の体積(cm3)、Wf:無機充填材の質量(g)
df:無機充填材の密度(g/cm3)
Vr:無機充填材の体積比率
熱硬化性樹脂層及びこれを形成するための熱硬化性樹脂組成物は、必要に応じてその他の成分を含有していてもよい。その他の成分としては、カップリング剤、着色剤、溶剤、界面活性剤、イオントラップ剤等を挙げることができる。熱硬化性樹脂層及び熱硬化性樹脂組成物が、光カチオン重合開始剤又は光アニオン重合開始剤を含有してもよい。
離型シート33a,33bは、積層体の加熱及び加圧の後、圧着ヘッド及び積層体に貼りつかない程度の離型性を有するシートである。離型シート33a,33bは、容易な離型のためには設けられる。ただし、例えば熱硬化性樹脂層31自体が硬化後に離型性を有する場合、離型シート33a,33bが設けられていなくてもよい。離型シート33a,33bとしては、例えば、ポリエチレンフィルム、ポリ塩化ビニル等のポリオレフィンフィルム、ポリエチレンテレフタレートフィルム、ポリエチレンナフタレートフィルム、ポリカーボネートフィルム、ポリイミドフィルム等の有機樹脂フィルム;離型紙;銅箔、アルミニウム箔等の金属箔が挙げられる。離型層付き有機樹脂フィルム、離型層付き金属箔も使用できる。離型シート33a,33bは、耐熱性の観点からポリイミドフィルム、又は、銅箔及びアルミニウム箔等の金属箔であってもよい。
熱プレス用シート3は、例えば、上述した熱硬化性樹脂を含む熱硬化性樹脂組成物のワニスを離型シート33a上に塗工し、塗工された熱硬化性樹脂組成物のワニスを乾燥して熱硬化性樹脂層31を形成することと、熱硬化性樹脂層31上に離型シート33bを積層することとを含む方法により、得ることができる。
(1)熱硬化性樹脂組成物の調製
攪拌機を備えたフラスコに、熱可塑性樹脂としてアクリル系ブロック共重合体((株)クラレ製、商品名「LA4285」)を196.6g、熱硬化性樹脂としてトリメチロールプロパントリアクリレート(日立化成(株)製、商品名「TMPT21」)を98.32g入れた。次いで、重合開始剤として1,1−ビス(t−ブチルパーオキシ)シクロヘキサン(日油(株)製、商品名「パーヘキサC」)1.5g、無機充填材としてシリカ粒子((株)アドマテックス製、商品名「SE2050」、体積平均粒径:0.5μm)を843.6g、溶剤としてメチルエチルケトン288.5gを加え、これらを攪拌して混合し、熱硬化性樹脂組成物のワニスを得た。
得られた熱硬化性樹脂組成物のワニスを、離型シートとしてのポリイミドフィルム(東レ・デュポン(株)製、商品名「カプトン100H」、平均厚み:25μm)に塗工した。塗工された熱硬化性樹脂組成物を70℃の乾燥機で10分間の加熱により乾燥して、ポリイミドフィルム上に平均厚み40μmの熱硬化性樹脂層を形成させた。熱硬化性樹脂層上に上記と同じポリイミドフィルムを重ね、ホットロールラミネーターを用いて100℃、0.5MPa、1.0m/分の条件で貼り合わせた。以上の手順により、ポリイミドフィルム、熱硬化性樹脂層及びポリイミドフィルムを有し、これらがこの順に積層された熱プレス用シートAを得た。
ジプロピレングリコールメチルエーテルアセテート((株)ダイセル工業製、略称「DPMA」)12質量部、イソボルニルシクロヘキサノール(日本テルペン化学(株)製、略称「MTPH」)12質量部、及びステアリン酸0.88質量部を、らいかい機を用いて10分間混練し、液状成分を得た。得られた液状成分に、リン片状銀粒子(福田金属箔粉工業(株)製、商品名「AgC−239」)44質量部と球状銀粒子(メタロー・テクノロジー社製、商品名「K−0082P」)44質量部を加えた。混合物をらいかい機を用いて15分間混練し、銀ペーストを得た。
銀めっきが施された銅板上にメタルマスクを設置した。メタルマスクの上から、銀ペーストをスキージにより塗り広げ、それにより1つの銅板上に3箇所、厚み100μmの銀ペーストを印刷した。3箇所の銀ペーストは、それぞれ3mm×3mmの正方形状の範囲に印刷された。印刷された3箇所の銀ペーストそれぞれに、厚み200μmの銀めっきを電極として有するパワー半導体素子を、電極が銀ペーストに接する向きで1つずつ載せた。このようにして、1つの銅板上に銀ペーストを介して3つのパワー半導体素子が配置された積層体を得た。得られた積層体をステージ上に配置し、その上に3つのパワー半導体素子を覆うように熱プレス用シートAを1枚重ねた。その後、該ステージに対向して配置され170℃に加熱された圧着ヘッドとステージとにより、積層体を200Nの荷重で60秒間、加熱及び加圧した。その後、圧着ヘッドを300℃まで昇温してから、圧着ヘッドとステージとにより、積層体を2700Nの荷重で150秒間、加熱及び加圧した。これにより、銀ペーストを焼結して焼結金属層を形成し、接続性評価用の半導体素子搭載基板を得た。得られた半導体素子搭載基板において、銅板と3つのパワー半導体素子の電極とが焼結金属層を介して電気的に接続されていた。
熱プレス用シートAの代わりに、ポリイミドフィルム(東レ・デュポン(株)製、商品名「カプトン100H」、平均厚み:25μm)を用いたこと以外は実施例1−1と同様にして、3つのパワー半導体素子の電極を一括で銅板に電気的に接続させて、接続性評価用の半導体素子搭載基板を得た。
接続評価用の半導体素子搭載基板の内部を、超音波観察装置(インサイト(株)製、商品名「INSIGHT−300」)を用いて観察した。銅板に焼結金属層を介して接続されている3つのパワー半導体素子のうち、銅板と焼結金属層との間の剥離、焼結金属層の内部の剥離、焼結金属層とパワー半導体素子との間の剥離、又は、焼結金属層が疎になったことが観察されたものの個数(NG数)を数えた。結果を表1に示す。図6は実施例1−1の半導体素子搭載基板の超音波観察により得られた断面像であり、図7は比較例1−1の半導体素子搭載基板の超音波観察により得られた断面像である。図6に示されるように、実施例1−1の半導体素子搭載基板では剥離が観察されなかったのに対して、図7に示されるように、比較例1−1の半導体素子搭載基板では、3つのパワー半導体素子のうち枠A内の2つに関して、接続部分周縁部における剥離が観察された。
攪拌機を備えたフラスコに、熱可塑性樹脂として196.6gのアクリル系ブロック共重合体((株)クラレ製、商品名「LA4285」)と、(メタ)アクリレート化合物として98.32gのトリス(2−アクリロイルオキシエチル)イソシアヌレート(日立化成(株)製、商品名「FA731A」)とを入れた。次いで、重合開始剤として1.5gのジクミルパーオキサイド(日油(株)製、商品名「パークミルD」)と、無機充填材として843.6gのシリカ粒子((株)アドマテックス製、商品名「SE2050」、体積平均粒径:0.5μm)と、重合禁止剤として0.075gのヒンダードフェノール系重合禁止剤((株)ADEKA製、商品名「AO−60」)と、溶剤として288.5gのメチルエチルケトンとを加え、これらを攪拌して混合し、熱硬化性樹脂組成物のワニスを得た。重合禁止剤の含有量は、(メタ)アクリレート化合物100質量部に対して0.08質量部であった。
得られた熱硬化性樹脂組成物のワニスを用いて、実施例1−1と同様にして熱プレス用シートを作製した。作製された熱プレ用シートを用いて、実施例1−1と同様に接続評価用の半導体素子搭載基板を作製した。作製した当日の熱プレス用シート、又は作製から冷蔵で2週間若しくは4週間保存された熱プレス用シートを用いて、半導体素子搭載基板を作製した。
重合禁止剤をp−メトキシフェノール(東京化成工業(株)製)に代えたこと以外は実施例2−1と同様にして、ワニス及び熱プレス用シートを作製した。得られた熱プレス用シートを用いて、実施例2−1と同様にして接続性評価用の半導体素子搭載基板を作製した。
重合禁止剤を添加しなかったこと以外は実施例2−1と同様にして、ワニス及び熱プレス用シートを作製した。得られた熱プレス用シートを用いて、実施例2−1と同様にして接続性評価用の半導体素子搭載基板を作製した。
ポリイミドフィルム(東レ・デュポン(株)製、商品名「カプトン100H」、平均厚み:25μm)を熱プレス用シートとして用いて、実施例2−1と同様にして、接続性評価用の半導体素子搭載基板を得た。
接続評価用の半導体素子搭載基板の内部を、超音波観察装置(インサイト(株)製、商品名「INSIGHT−300」)を用いて観察した。銅板に焼結金属層を介して接続されている3つのパワー半導体素子のうち、銅板と焼結金属層との間の剥離、燒結金属層の内部の剥離、又は焼結金属層とパワー半導体素子との間の剥離、又は、焼結金属層が疎になったことが観察されたものの個数(NG数)を数えた。結果を表2に示す。実施例2−1、2−2及び2−3において作製当日の熱プレス用シートを用いて得た半導体素子搭載基板では、剥離が観察されなかった。加えて、実施例2−1及び2−2の半導体素子搭載基板では、熱プレス用シートを4週間保存した後でも剥離が観察されなかった。実施例2−3の半導体素子搭載基板では、2週間以上保存した熱プレス用シートを用いた場合に、3つのパワー半導体素子のうち1つに関して、接続部分周縁部における剥離が観察された。
Claims (14)
- 配線基板及び該配線基板に搭載されたパワー半導体素子を備えるパワー半導体装置を製造する方法であって、
絶縁基板及び該絶縁基板上に設けられた配線層を有する配線基板と電極を有するパワー半導体素子と金属粒子を含む焼結材とを有する積層体であって、前記パワー半導体素子が前記配線層と前記電極とが対向するように配置され、対向する前記配線層と前記電極との間に前記焼結材が介在している、積層体を、ステージ及び圧着ヘッドで挟むことによって加熱及び加圧し、それにより、前記焼結材の焼結により形成された焼結金属層を介して前記配線層と前記電極とを電気的に接続する工程を備え、
前記配線層と前記電極とを電気的に接続する前記工程において、前記積層体と前記圧着ヘッドとの間に、熱硬化性樹脂層を有する熱プレス用シートを介在させた状態で、前記積層体が加熱及び加圧される、
方法。 - 前記熱硬化性樹脂層が、(メタ)アクリレート化合物、及び重合禁止剤を含有する、請求項1に記載の方法。
- 前記配線層と前記電極とを電気的に接続する前記工程において、それぞれ1つの前記パワー半導体素子を有する複数の前記積層体が、又は、1つの前記配線基板上に配置された複数の前記パワー半導体素子を有する1つ又は複数の前記積層体が、1組の前記ステージ及び前記圧着ヘッドで挟むことによって加熱及び加圧される、請求項1又は2に記載の方法。
- 熱硬化性樹脂層を有する熱プレス用シートであって、
絶縁基板及び該絶縁基板上に設けられた配線層を有する配線基板と電極を有するパワー半導体素子と金属粒子を含む焼結材とを有する積層体であって、前記パワー半導体素子が前記配線層と前記電極とが対向するように配置され、対向する前記配線層と前記電極との間に前記焼結材が介在している、積層体を、ステージ及び圧着ヘッドで挟むことによって加熱及び加圧し、それにより、前記焼結材の焼結により形成された焼結金属層を介して前記配線層と前記電極とを電気的に接続する工程において、前記積層体と前記圧着ヘッドとの間に介在させるために用いられる、熱プレス用シート。 - 前記熱硬化性樹脂層の厚みが20μm以上である、請求項4に記載の熱プレス用シート。
- 前記熱硬化性樹脂層の片面上又は両面上に設けられた離型シートを更に有する、請求項4又は5に記載の熱プレス用シート。
- 前記熱硬化性樹脂層が、(メタ)アクリレート化合物、及び重合開始剤を含有する、請求項4〜6のいずれか一項に記載の熱プレス用シート。
- 前記熱硬化性樹脂層が、(メタ)アクリレート化合物、及び重合禁止剤を含有する、請求項4〜6のいずれか一項に記載の熱プレス用シート。
- 前記熱硬化性樹脂層が、エポキシ化合物、及びその硬化剤を更に含有する、請求項7又は8に記載の熱プレス用シート。
- 熱硬化性樹脂を含有し、請求項4〜6のいずれか一項に記載の熱プレス用シートの熱硬化性樹脂層を形成するために用いられる、熱プレス用熱硬化性樹脂組成物。
- 前記熱硬化性樹脂として(メタ)アクリレート化合物を含有し、重合開始剤を更に含有する、請求項10に記載の熱プレス用熱硬化性樹脂組成物。
- 前記熱硬化性樹脂として(メタ)アクリレート化合物を含有し、重合禁止剤を更に含有する、請求項10に記載の熱プレス用熱硬化性樹脂組成物。
- 前記熱硬化性樹脂としてエポキシ化合物を更に含有し、前記エポキシ化合物の硬化剤を更に含有する、請求項10〜12のいずれか一項に記載の熱プレス用熱硬化性樹脂組成物。
- 溶剤を更に含有する、請求項10〜13のいずれか一項に記載の熱プレス用熱硬化性樹脂組成物。
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WO2013100174A1 (ja) * | 2011-12-27 | 2013-07-04 | パナソニック株式会社 | 熱伝導性樹脂組成物 |
JP2014135411A (ja) * | 2013-01-11 | 2014-07-24 | Mitsubishi Electric Corp | 半導体装置および半導体装置の製造方法 |
JP2017045996A (ja) * | 2015-08-28 | 2017-03-02 | 日立化成株式会社 | 離型層付き緩衝シート用組成物及び離型層付き緩衝シート |
JP2017121648A (ja) * | 2016-01-07 | 2017-07-13 | 日立化成株式会社 | 組立品の製造方法、加圧接合容器及び加圧接合装置 |
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WO2019044798A1 (ja) | 2019-03-07 |
JP7176523B2 (ja) | 2022-11-22 |
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