JPWO2014119648A1 - LAMINATE, METHOD FOR PRODUCING LAMINATE, AND METHOD FOR PRODUCING FLEXIBLE ELECTRONIC DEVICE - Google Patents
LAMINATE, METHOD FOR PRODUCING LAMINATE, AND METHOD FOR PRODUCING FLEXIBLE ELECTRONIC DEVICE Download PDFInfo
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- JPWO2014119648A1 JPWO2014119648A1 JP2014559733A JP2014559733A JPWO2014119648A1 JP WO2014119648 A1 JPWO2014119648 A1 JP WO2014119648A1 JP 2014559733 A JP2014559733 A JP 2014559733A JP 2014559733 A JP2014559733 A JP 2014559733A JP WO2014119648 A1 JPWO2014119648 A1 JP WO2014119648A1
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- Prior art keywords
- polymer film
- inorganic substrate
- film
- coupling agent
- laminate
- Prior art date
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- RMTGISUVUCWJIT-UHFFFAOYSA-N n-[3-[3-aminopropoxy(dimethoxy)silyl]propyl]-1-phenylprop-2-en-1-amine;hydrochloride Chemical compound Cl.NCCCO[Si](OC)(OC)CCCNC(C=C)C1=CC=CC=C1 RMTGISUVUCWJIT-UHFFFAOYSA-N 0.000 description 1
- 229910001120 nichrome Inorganic materials 0.000 description 1
- 229910000623 nickel–chromium alloy Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229920001220 nitrocellulos Polymers 0.000 description 1
- 230000000414 obstructive effect Effects 0.000 description 1
- SLYCYWCVSGPDFR-UHFFFAOYSA-N octadecyltrimethoxysilane Chemical compound CCCCCCCCCCCCCCCCCC[Si](OC)(OC)OC SLYCYWCVSGPDFR-UHFFFAOYSA-N 0.000 description 1
- MSRJTTSHWYDFIU-UHFFFAOYSA-N octyltriethoxysilane Chemical compound CCCCCCCC[Si](OCC)(OCC)OCC MSRJTTSHWYDFIU-UHFFFAOYSA-N 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- JRZJOMJEPLMPRA-UHFFFAOYSA-N olefin Natural products CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- XYJRXVWERLGGKC-UHFFFAOYSA-D pentacalcium;hydroxide;triphosphate Chemical compound [OH-].[Ca+2].[Ca+2].[Ca+2].[Ca+2].[Ca+2].[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O XYJRXVWERLGGKC-UHFFFAOYSA-D 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920001643 poly(ether ketone) Polymers 0.000 description 1
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 1
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 1
- 229920002492 poly(sulfone) Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920001230 polyarylate Polymers 0.000 description 1
- 229920001707 polybutylene terephthalate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 238000006068 polycondensation reaction Methods 0.000 description 1
- 229920006393 polyether sulfone Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 239000011112 polyethylene naphthalate Substances 0.000 description 1
- 229920006290 polyethylene naphthalate film Polymers 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 150000008442 polyphenolic compounds Chemical class 0.000 description 1
- 235000013824 polyphenols Nutrition 0.000 description 1
- 229920006380 polyphenylene oxide Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920000123 polythiophene Polymers 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- 238000005546 reactive sputtering Methods 0.000 description 1
- 238000004064 recycling Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000007363 ring formation reaction Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 239000005060 rubber Substances 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 238000007086 side reaction Methods 0.000 description 1
- 239000005368 silicate glass Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 229910052642 spodumene Inorganic materials 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- 229920006259 thermoplastic polyimide Polymers 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- 210000003813 thumb Anatomy 0.000 description 1
- QORWJWZARLRLPR-UHFFFAOYSA-H tricalcium bis(phosphate) Chemical compound [Ca+2].[Ca+2].[Ca+2].[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O QORWJWZARLRLPR-UHFFFAOYSA-H 0.000 description 1
- SIPHWXREAZVVNS-UHFFFAOYSA-N trichloro(cyclohexyl)silane Chemical compound Cl[Si](Cl)(Cl)C1CCCCC1 SIPHWXREAZVVNS-UHFFFAOYSA-N 0.000 description 1
- HLWCOIUDOLYBGD-UHFFFAOYSA-N trichloro(decyl)silane Chemical compound CCCCCCCCCC[Si](Cl)(Cl)Cl HLWCOIUDOLYBGD-UHFFFAOYSA-N 0.000 description 1
- BNCXNUWGWUZTCN-UHFFFAOYSA-N trichloro(dodecyl)silane Chemical compound CCCCCCCCCCCC[Si](Cl)(Cl)Cl BNCXNUWGWUZTCN-UHFFFAOYSA-N 0.000 description 1
- ZOYFEXPFPVDYIS-UHFFFAOYSA-N trichloro(ethyl)silane Chemical compound CC[Si](Cl)(Cl)Cl ZOYFEXPFPVDYIS-UHFFFAOYSA-N 0.000 description 1
- LFXJGGDONSCPOF-UHFFFAOYSA-N trichloro(hexyl)silane Chemical compound CCCCCC[Si](Cl)(Cl)Cl LFXJGGDONSCPOF-UHFFFAOYSA-N 0.000 description 1
- PYJJCSYBSYXGQQ-UHFFFAOYSA-N trichloro(octadecyl)silane Chemical compound CCCCCCCCCCCCCCCCCC[Si](Cl)(Cl)Cl PYJJCSYBSYXGQQ-UHFFFAOYSA-N 0.000 description 1
- RCHUVCPBWWSUMC-UHFFFAOYSA-N trichloro(octyl)silane Chemical compound CCCCCCCC[Si](Cl)(Cl)Cl RCHUVCPBWWSUMC-UHFFFAOYSA-N 0.000 description 1
- KWDQAHIRKOXFAV-UHFFFAOYSA-N trichloro(pentyl)silane Chemical compound CCCCC[Si](Cl)(Cl)Cl KWDQAHIRKOXFAV-UHFFFAOYSA-N 0.000 description 1
- HKFSBKQQYCMCKO-UHFFFAOYSA-N trichloro(prop-2-enyl)silane Chemical compound Cl[Si](Cl)(Cl)CC=C HKFSBKQQYCMCKO-UHFFFAOYSA-N 0.000 description 1
- DOEHJNBEOVLHGL-UHFFFAOYSA-N trichloro(propyl)silane Chemical compound CCC[Si](Cl)(Cl)Cl DOEHJNBEOVLHGL-UHFFFAOYSA-N 0.000 description 1
- LPMVYGAHBSNGHP-UHFFFAOYSA-N trichloro(tetradecyl)silane Chemical compound CCCCCCCCCCCCCC[Si](Cl)(Cl)Cl LPMVYGAHBSNGHP-UHFFFAOYSA-N 0.000 description 1
- DWAWYEUJUWLESO-UHFFFAOYSA-N trichloromethylsilane Chemical compound [SiH3]C(Cl)(Cl)Cl DWAWYEUJUWLESO-UHFFFAOYSA-N 0.000 description 1
- FRGPKMWIYVTFIQ-UHFFFAOYSA-N triethoxy(3-isocyanatopropyl)silane Chemical compound CCO[Si](OCC)(OCC)CCCN=C=O FRGPKMWIYVTFIQ-UHFFFAOYSA-N 0.000 description 1
- DENFJSAFJTVPJR-UHFFFAOYSA-N triethoxy(ethyl)silane Chemical compound CCO[Si](CC)(OCC)OCC DENFJSAFJTVPJR-UHFFFAOYSA-N 0.000 description 1
- FZMJEGJVKFTGMU-UHFFFAOYSA-N triethoxy(octadecyl)silane Chemical compound CCCCCCCCCCCCCCCCCC[Si](OCC)(OCC)OCC FZMJEGJVKFTGMU-UHFFFAOYSA-N 0.000 description 1
- FHVAUDREWWXPRW-UHFFFAOYSA-N triethoxy(pentyl)silane Chemical compound CCCCC[Si](OCC)(OCC)OCC FHVAUDREWWXPRW-UHFFFAOYSA-N 0.000 description 1
- UMFJXASDGBJDEB-UHFFFAOYSA-N triethoxy(prop-2-enyl)silane Chemical compound CCO[Si](CC=C)(OCC)OCC UMFJXASDGBJDEB-UHFFFAOYSA-N 0.000 description 1
- VTHOKNTVYKTUPI-UHFFFAOYSA-N triethoxy-[3-(3-triethoxysilylpropyltetrasulfanyl)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCSSSSCCC[Si](OCC)(OCC)OCC VTHOKNTVYKTUPI-UHFFFAOYSA-N 0.000 description 1
- NMEPHPOFYLLFTK-UHFFFAOYSA-N trimethoxy(octyl)silane Chemical compound CCCCCCCC[Si](OC)(OC)OC NMEPHPOFYLLFTK-UHFFFAOYSA-N 0.000 description 1
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 description 1
- LFRDHGNFBLIJIY-UHFFFAOYSA-N trimethoxy(prop-2-enyl)silane Chemical compound CO[Si](OC)(OC)CC=C LFRDHGNFBLIJIY-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
- 239000005050 vinyl trichlorosilane Substances 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J5/00—Adhesive processes in general; Adhesive processes not provided for elsewhere, e.g. relating to primers
- C09J5/06—Adhesive processes in general; Adhesive processes not provided for elsewhere, e.g. relating to primers involving heating of the applied adhesive
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B17/00—Layered products essentially comprising sheet glass, or glass, slag, or like fibres
- B32B17/06—Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
- B32B17/10—Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/145—Organic substrates, e.g. plastic
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4611—Manufacturing multilayer circuits by laminating two or more circuit boards
- H05K3/4626—Manufacturing multilayer circuits by laminating two or more circuit boards characterised by the insulating layers or materials
- H05K3/4635—Manufacturing multilayer circuits by laminating two or more circuit boards characterised by the insulating layers or materials laminating flexible circuit boards using additional insulating adhesive materials between the boards
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/40—Additional features of adhesives in the form of films or foils characterized by the presence of essential components
- C09J2301/416—Additional features of adhesives in the form of films or foils characterized by the presence of essential components use of irradiation
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2400/00—Presence of inorganic and organic materials
- C09J2400/10—Presence of inorganic materials
- C09J2400/12—Ceramic
- C09J2400/123—Ceramic in the substrate
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2400/00—Presence of inorganic and organic materials
- C09J2400/10—Presence of inorganic materials
- C09J2400/14—Glass
- C09J2400/143—Glass in the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/389—Improvement of the adhesion between the insulating substrate and the metal by the use of a coupling agent, e.g. silane
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Laminated Bodies (AREA)
- Adhesives Or Adhesive Processes (AREA)
Abstract
【課題】ポリイミドフィルム、ポリエステルフィルムなどの高分子フィルムを無機基板に積層してデバイス形成後に剥離することによりフレキシブル電子デバイスを形成するための品位良好な積層体およびそれらの製法を提供する。【解決手段】ガラス板などの無機基板に気相を介してシランカップリング剤層を形成し、ついで活性化処理を行った高分子フィルムと重ね、加圧加熱することにより、高分子フィルム/無機基板間に異物が少ない積層体を得る。得られる積層体には収率良く電子デバイス形成が可能であり、無機基板から剥離することでフレキシブル電子デバイスを効率よく製作することができる。【選択図】なしProvided are a high-quality laminate for forming a flexible electronic device by laminating a polymer film such as a polyimide film or a polyester film on an inorganic substrate and peeling it after forming the device, and a method for producing the same. SOLUTION: A silane coupling agent layer is formed on an inorganic substrate such as a glass plate via a gas phase, and then superimposed on a polymer film subjected to an activation treatment, and heated under pressure, thereby polymer film / inorganic. A laminated body with few foreign substances between the substrates is obtained. An electronic device can be formed with high yield in the obtained laminate, and a flexible electronic device can be efficiently manufactured by peeling from the inorganic substrate. [Selection figure] None
Description
本発明は、フレキシブルな高分子フィルムをリジッドな仮支持用無機基板に仮固定し積層体として、次いで高分子フィルム上に各種電子デバイスを形成した後に、高分子フィルムを電子デバイス部ごと剥離して、フレキシブル電子デバイスを得る製造技術、及び該積層体に関する。 In the present invention, a flexible polymer film is temporarily fixed on a rigid temporary supporting inorganic substrate to form a laminate, and then various electronic devices are formed on the polymer film, and then the polymer film is peeled off together with the electronic device portion. The present invention relates to a manufacturing technique for obtaining a flexible electronic device, and the laminate.
情報通信機器(放送機器、移動体無線、携帯通信機器等)、レーダー、高速情報処理装置等における電子部品として、半導体素子、MEMS素子、ディスプレイ素子などの機能素子(デバイス)が用いられるが、これらは従来、ガラス、シリコンウエハ、セラミック基材等の無機基板上にて形成ないし搭載されるのが一般的であった。しかし、近年、電子部品の軽量化、小型・薄型化、フレキシビリティ化が求められるなか、高分子フィルム上に各種機能素子を形成する試みがなされている。 Functional elements (devices) such as semiconductor elements, MEMS elements, and display elements are used as electronic components in information communication equipment (broadcast equipment, mobile radio, portable communication equipment, etc.), radar, high-speed information processing devices, etc. Conventionally, it is generally formed or mounted on an inorganic substrate such as glass, a silicon wafer, or a ceramic substrate. However, in recent years, attempts have been made to form various functional elements on a polymer film, as electronic components are required to be lighter, smaller, thinner, and flexible.
各種機能素子を高分子フィルム表面に形成するにあたっては、高分子フィルムの特性であるフレキシビリティを利用した、いわゆるロール・トゥ・ロールプロセスにて加工することが理想とされる。しかしながら、半導体産業、MEMS産業、ディスプレイ産業等の業界においては、これまでウエハベースまたはガラス基板ベース等のリジッドな平面基板を対象としたプロセス技術が主流であった。そこで、既存インフラを利用して各種機能素子を高分子フィルム表面に形成するために、高分子フィルムを無機物(ガラス板、セラミック板、シリコンウエハ、金属板など)からなるリジッドな支持体に貼り合わせておき、所望の素子を形成した後に支持体から剥離するというプロセスが考案された。 In forming various functional elements on the surface of the polymer film, it is ideal to process by a so-called roll-to-roll process using the flexibility that is a characteristic of the polymer film. However, in the industries such as the semiconductor industry, the MEMS industry, and the display industry, a process technology for a rigid flat substrate such as a wafer base or a glass substrate base has been mainstream. Therefore, in order to form various functional elements on the surface of the polymer film using the existing infrastructure, the polymer film is bonded to a rigid support made of an inorganic material (glass plate, ceramic plate, silicon wafer, metal plate, etc.). A process has been devised in which a desired element is formed and then peeled off from the support.
一般に機能素子を形成する工程においては、比較的高温が用いられることが多い。例えば、ポリシリコンや酸化物半導体などの機能素子の形成においては200〜500℃程度の温度域が用いられる。低温ポリシリコン薄膜トランジスターの作製においては脱水素化のために450℃程度の加熱が必要になる場合がある。水素化アモルファスシリコン薄膜の作製においても200〜300℃程度の温度域が必要になる。ここに例示した温度域は、無機材料にとってはさほど高い温度ではないが、高分子フィルムや、一般に高分子フィルムの貼り合わせに利用される接着剤にとっては、相当に高い温度であると云わざるを得ない。先に述べた高分子フィルムを無機基板に貼り合わせ、機能素子形成後に剥離するという手法に於いて、用いられる高分子フィルムや貼り合わせに用いられる接着剤、粘着剤にも十分な耐熱性が求められる所以であるが、現実問題としてかかる高温域にて実用に耐える高分子フィルムは限られており、また、従来の貼り合わせ用接着剤、粘着剤に至っては十分な耐熱性を有したものがないのが現状であった。 In general, a relatively high temperature is often used in the step of forming a functional element. For example, a temperature range of about 200 to 500 ° C. is used in forming a functional element such as polysilicon or an oxide semiconductor. In the production of a low-temperature polysilicon thin film transistor, heating at about 450 ° C. may be required for dehydrogenation. Also in the production of a hydrogenated amorphous silicon thin film, a temperature range of about 200 to 300 ° C. is required. The temperature range exemplified here is not so high for inorganic materials, but it can be said that it is considerably high for polymer films and adhesives generally used for laminating polymer films. I don't get it. Adhering the above-mentioned polymer film to an inorganic substrate and peeling off after forming the functional element, the polymer film used, the adhesive used for bonding, and the adhesive also require sufficient heat resistance. However, as a practical matter, there are limited polymer films that can be practically used in such a high temperature range, and conventional adhesives and adhesives have sufficient heat resistance. There was no current situation.
高分子フィルムを無機基板に仮貼り付けする耐熱接着手段が得られないため、かかる用途においては、無機基板上に高分子フィルムの溶液、ないし前駆体溶液を塗布して無機基板上で乾燥・硬化させてフィルム化して当該用途に使用する技術が知られている。しかしながら、かかる手段により得られる高分子膜は、脆く裂けやすいため、無機基板から剥離する際に機能素子を破壊してしまう場合が多い。特に大面積のデバイスを剥離することは極めて難度が高く、およそ工業的に成り立つ歩留まりを得ることはできない。
本発明者らは、このような事情に鑑み、機能素子を形成するための高分子フィルムと支持体との積層体として、耐熱性に優れ強靭で薄膜化が可能なポリイミドフィルムを、カップリング剤を介して無機物からなる支持体(無機層)に貼り合わせてなる積層体を提案した(特許文献1〜3)。Since there is no heat-resistant adhesive means for temporarily attaching the polymer film to the inorganic substrate, in such applications, the polymer film solution or precursor solution is applied onto the inorganic substrate and then dried and cured on the inorganic substrate. A technique for forming a film and using it for the application is known. However, since the polymer film obtained by such means is brittle and easily torn, the functional element is often destroyed when it is peeled from the inorganic substrate. In particular, it is extremely difficult to peel off a device having a large area, and it is not possible to obtain a yield that can be industrially established.
In view of such circumstances, the present inventors, as a laminate of a polymer film and a support for forming a functional element, use a polyimide film that has excellent heat resistance and is strong and can be made into a thin film as a coupling agent. The laminated body formed by bonding to the support body (inorganic layer) which consists of an inorganic substance through this was proposed (patent documents 1-3).
上述した特許文献1〜3に記載の積層体によれば、所謂接着剤、粘着剤的な要素を用いることなく、高分子フィルムと無機基板との貼り合わせが可能となり、さらにその積層体は薄膜デバイスを製作するに必要な高温に暴露されても、高分子フィルムの剥離は生じない。従って当該積層体を、従来のガラス板やシリコンウエハなどの無機物の基板上に直接電子デバイスを形成するプロセスに、供することにより、高分子フィルム上に電子デバイスを製作することが可能であり、高分子フィルムを無機基板から剥離することによりフレキシブルな電子デバイスの実現が可能となった。 According to the laminate described in Patent Documents 1 to 3 described above, it is possible to bond the polymer film and the inorganic substrate without using a so-called adhesive or adhesive element, and the laminate is a thin film. Exfoliation of the polymer film does not occur even when exposed to the high temperatures required to fabricate the device. Therefore, it is possible to produce an electronic device on a polymer film by subjecting the laminate to a process for forming an electronic device directly on an inorganic substrate such as a conventional glass plate or silicon wafer. A flexible electronic device can be realized by peeling the molecular film from the inorganic substrate.
しかしながら、かかる技術は、以下に示すような工業生産上の課題が残るものであった。
特に高精細な電子デバイスの製作を行う場合には、収率が課題となる。高分子フィルムと無機基板間に異物が混入した場合、異物上、およびその周辺においては、異物を支柱と見立てたテント状の構造が生じる。これは高分子フィルムと無機基板の間に空隙を生じ、部分的に接着していない箇所を生じさせることになる。かかる空隙に閉じこめられた気体は、加熱環境下や減圧環境下において膨らもうとするため、膨れ欠陥(ブリスタートも云う)の原因となる。また、空隙部分は接着していない訳であるから、巨視的に接着強度を捉えた場合には、接着強度の変動が大となる。
異物が存在する近傍は、高分子フィルム自体が盛り上がった状態となり、特にフォトリソグラフを用いるパターン形成や、マイクロコンタクト印刷のような高精細なパターン形成の際に、阻害要因となり、良好な電子デバイス形成が行えない場合が生じる。However, this technique still has the following problems in industrial production.
In particular, when manufacturing a high-definition electronic device, yield is an issue. When foreign matter is mixed between the polymer film and the inorganic substrate, a tent-like structure in which the foreign matter is regarded as a support is formed on and around the foreign matter. This creates voids between the polymer film and the inorganic substrate, resulting in locations that are not partially bonded. Since the gas confined in the gap tends to swell in a heating environment or a reduced pressure environment, it causes a swell defect (also called blistering). Further, since the void portion is not bonded, when the bonding strength is macroscopically grasped, the variation in the bonding strength becomes large.
In the vicinity where foreign matter exists, the polymer film itself is in a raised state, which becomes an obstructive factor in pattern formation using photolithographs and high-definition patterns such as microcontact printing, and good electronic device formation There is a case that cannot be performed.
かかる異物は、無機基板表面と高分子フィルム表面の清浄化と、作業環境のクリーン化により減ずることが可能である。しかしながら、かかる技術の本質的な問題点として、シランカップリング剤そのものに起因する異物の発生がある。例示されている従来技術においては、シランカップリング剤の溶剤溶液を無機基板に液状直接塗布する例が記載されている。シランカップリング剤は取り扱い環境に存在する水分などの影響を受けて、凝集体を作りやすく、例示された直接塗布方法では、溶液中などで意図せずに生成したシランカップリング剤の凝集体も塗布されてしまい、その結果、無機基板上に、シランカップリング剤と共に、その凝集体が異物として散布されたような状態となることを本願発明者らは見出した。かかる異物による悪影響は先に述べたとおりである。 Such foreign matter can be reduced by cleaning the surface of the inorganic substrate and the surface of the polymer film and cleaning the work environment. However, an essential problem of this technique is the generation of foreign matters due to the silane coupling agent itself. In the illustrated prior art, an example in which a solvent solution of a silane coupling agent is directly applied in liquid form to an inorganic substrate is described. Silane coupling agents are easily affected by moisture and other factors present in the handling environment, and aggregates can easily be formed. In the illustrated direct coating method, aggregates of silane coupling agents that are generated unintentionally in solution or the like are also present. As a result, the inventors of the present application have found that the aggregate is dispersed as a foreign substance together with the silane coupling agent on the inorganic substrate. The adverse effects of such foreign substances are as described above.
本発明は上記の様な事情に着目してなされたものであって、シランカップリング剤の塗布方法を根本的に改めることにより、シランカップリング剤の凝集体が無機基板に付着することを防止し、品位に優れ、高分子フィルム/無機基板間の接着力が均質化された積層体を供給し、工業生産上の課題を解決するものである。
さらに本発明に寄れば、高分子フィルム剥離後の無機基板表面の粗度が小さく、簡単な洗浄操作後にてシランカップリング剤を再塗布して基板として活用することが可能となり、無機基板のリサイクル性が格段に向上する。The present invention has been made paying attention to the above-mentioned circumstances, and by fundamentally changing the coating method of the silane coupling agent, the aggregate of the silane coupling agent is prevented from adhering to the inorganic substrate. In addition, the present invention provides a laminate with excellent quality and a uniform adhesive force between the polymer film / inorganic substrate and solves the problems in industrial production.
Furthermore, according to the present invention, the roughness of the surface of the inorganic substrate after peeling the polymer film is small, and it becomes possible to re-apply the silane coupling agent after a simple cleaning operation and use it as a substrate. Sexually improves.
本発明者らは前記課題を解決するために鋭意検討した結果、無機基板へのシランカップリング剤塗布を気相にて行うことにより、高分子フィルムと無機基板との間に異物の介在しない良好な積層体を提供し、結果として収率良く高精細なフレキシブル電子デバイスの製作が可能となり、なおかつ無機基板のリサイクル性が改善されることを見出し、本発明を完成した。 As a result of intensive studies to solve the above-mentioned problems, the present inventors have successfully applied a silane coupling agent to an inorganic substrate in a gas phase so that no foreign matter is present between the polymer film and the inorganic substrate. As a result, it has been found that high-definition flexible electronic devices can be manufactured with high yield and the recyclability of the inorganic substrate is improved, and the present invention has been completed.
すなわち本発明は以下の構成からなる。
1.高分子フィルムと無機基板とが、シランカップリング剤層を介して接合された積層体であって、該高分子フィルムと該無機基板の間に存在する長径10μm以上の異物個数が3個/cm2以下、かつ該高分子フィルムと該無機基板との接着強度が、高分子フィルム
の破断強度の1/2以下であることを特徴とする積層体。
2.前記異物が、珪素原子を含む異物であることを特徴とする1.に記載の積層体。
3.前記高分子フィルムが、厚さ3μm以上のポリイミドフィルムであることを特徴とする、1.又は2.に記載の積層体。
4.前記無機基板が面積1000cm2以上のガラス板であることを特徴とする1.〜3.のいずれかに記載の積層体。
5.前記シランカップリング剤が、一分子あたりの一個の珪素原子を有する化学構造であることを特徴とする1.〜4.のいずれかに記載の積層体。
6.高分子フィルムと無機基板とが、シランカップリング剤層を介して接合された積層体であって、該高分子フィルムと該無機基板との間の接着強度が異なる良好接着部分と易剥離部分とを有しており、該良好接着部分と該易剥離部分とが所定のパターンを形成している事を特徴とする1.〜5.のいずれかに記載の積層体。That is, the present invention has the following configuration.
1. A laminate in which a polymer film and an inorganic substrate are bonded via a silane coupling agent layer, and the number of foreign matters having a major axis of 10 μm or more existing between the polymer film and the inorganic substrate is 3 / cm. 2 or less, and the adhesive strength between the polymer film and the inorganic substrate is ½ or less of the breaking strength of the polymer film.
2. The foreign matter is a foreign matter containing a silicon atom. The laminated body as described in.
3. The polymer film is a polyimide film having a thickness of 3 μm or more. Or 2. The laminated body as described in.
4). 1. The inorganic substrate is a glass plate having an area of 1000 cm 2 or more. ~ 3. The laminated body in any one of.
5. The silane coupling agent has a chemical structure having one silicon atom per molecule. ~ 4. The laminated body in any one of.
6). A laminate in which a polymer film and an inorganic substrate are bonded via a silane coupling agent layer, and a good adhesion portion and an easily peelable portion having different adhesion strengths between the polymer film and the inorganic substrate The good adhesion portion and the easily peelable portion form a predetermined pattern. ~ 5. The laminated body in any one of.
7.下記(1)〜(3)の工程を有することを特徴とする、積層体の製造方法。
(1) 気体化したシランカップリング剤に無機基板を暴露させることにより、無機基板上に、シランカップリング剤層を形成する工程、
(2)該シランカップリング剤層に、表面活性化処理を行った高分子フィルムを重ねる工程
(3)加熱加圧することにより両者を接着する工程
8.下記(1)〜(3)の工程を有することを特徴とする、積層体の製造方法。
(1) 気体化したシランカップリング剤に無機基板を暴露させることにより、無機基板上に、シランカップリング剤層を形成する工程
(2)高分子の溶液ないし高分子前駆体溶液を該シランカップリング剤層上に塗布する工程
(3)該高分子溶液ないし該高分子前駆体溶液を乾燥・加熱して高分子フィルムとして積層体を得る工程
9.前記(1)の工程が、略大気圧下にて行われることを特徴とする7.又は8.のいずれかに記載の積層体の製造方法。
10.前記(1)の工程が、減圧下にて行われることを特徴とする7.又は8.のいずれかに記載の積層体の製造方法。
11.前記積層体が、前記高分子フィルムと前記無機基板との間の接着強度が異なる良好接着部分と易剥離部分とを有しており、該良好接着部分と該易剥離部分とが所定のパターンを形成していることを特徴とする、7.〜10.のいずれかに記載の積層体の製造方法。
12.前記シランカップリング剤層を形成する際に、前記無機基板の一部をマスキングすることによって、前記良好接着部分と前記易剥離部分とが所定のパターンを形成することを特徴とする11.の積層体の製造方法。
13.前記シランカップリング剤層の形成後に、シランカップリング剤層の一部に活性エネルギー線を照射する事により、前記良好接着部分と前記易剥離部分とが所定のパターンを形成することを特徴とする11.の積層体の製造方法。7). It has the process of following (1)-(3), The manufacturing method of a laminated body characterized by the above-mentioned.
(1) forming a silane coupling agent layer on the inorganic substrate by exposing the inorganic substrate to the gasified silane coupling agent;
(2) A step of superposing a polymer film subjected to surface activation treatment on the silane coupling agent layer
(3) Step of bonding the two by heating and pressing 8. It has the process of following (1)-(3), The manufacturing method of a laminated body characterized by the above-mentioned.
(1) Forming a silane coupling agent layer on an inorganic substrate by exposing the inorganic substrate to a gasified silane coupling agent
(2) A step of applying a polymer solution or polymer precursor solution onto the silane coupling agent layer
(3) Step of drying and heating the polymer solution or the polymer precursor solution to obtain a laminate as a polymer film 9. 6. The step (1) is performed under substantially atmospheric pressure. Or 8. The manufacturing method of the laminated body in any one of.
10. 6. The step (1) is performed under reduced pressure. Or 8. The manufacturing method of the laminated body in any one of.
11. The laminate has a good adhesion part and an easy peeling part with different adhesive strengths between the polymer film and the inorganic substrate, and the good adhesion part and the easy peeling part have a predetermined pattern. 6. It is formed, -10. The manufacturing method of the laminated body in any one of.
12 10. When forming the silane coupling agent layer, by masking a part of the inorganic substrate, the good adhesion part and the easy peeling part form a predetermined pattern. The manufacturing method of the laminated body.
13. After the formation of the silane coupling agent layer, by irradiating a part of the silane coupling agent layer with active energy rays, the good adhesion portion and the easily peelable portion form a predetermined pattern. 11. The manufacturing method of the laminated body.
14.7.〜10.のいずれかの製造方法にて得られた積層体を用い、該積層体の高分子フィルム上に電子デバイスを形成し、 次いで、該高分子フィルムを該電子デバイスごと無機基板から剥離する事を特徴とするフレキシブル電子デバイスの製造方法。
15.11.〜13.のいずれかの製造方法にて得られた積層体を用い、
該積層体の高分子フィルムの、前記易剥離部分に相当する部分の上に電子デバイスを形成し、
次いで、該積層体の該易剥離部分の外周に沿って、該高分子フィルムに切り込みを入れ、該高分子フィルムを電子デバイスごと無機基板から剥離する事を特徴とするフレキシブル電子デバイスの製造方法。14.7. -10. Using the laminate obtained by any one of the manufacturing methods, an electronic device is formed on the polymer film of the laminate, and then the polymer film is peeled from the inorganic substrate together with the electronic device. A method for manufacturing a flexible electronic device.
15.11. -13. Using the laminate obtained by any of the production methods of
Forming an electronic device on a portion corresponding to the easily peelable portion of the polymer film of the laminate,
Next, a method for producing a flexible electronic device is characterized in that the polymer film is cut along the outer periphery of the easily peelable portion of the laminate, and the polymer film is peeled off from the inorganic substrate together with the electronic device.
本発明に寄れば、高分子フィルムと無機基板との間に異物の介在しない良好な積層体を得ることができ、結果として高分子フィルムと無機基板との接着強度が均質化される。
さらに、本発明によれば、シランカップリング剤層を、同シランカップリング剤の形成時に所定のパターンにて無機基板の一部をマスキングすること、ないし、シランカップリング剤層を形成後に、シランカップリング剤層の一部に所定のパターンに沿って活性エネルギー線照射を行い、意図的に接着力の有/無、ないし強/弱を得て、電子デバイスを形成する際に、デバイス形成プロセス時に高分子フィルムの剥離を生じさせないだけの十分な接着力有する良好接着部分と、比較的容易に高分子フィルムを剥離することが出来る易剥離部分とを所望のパターンで作り分けることができ、該易剥離部分周辺に沿って切り込みを入れて、当該エリア形成された機能素子部分を剥離することが可能となる。
なおさらには、本発明における高分子フィルム剥離後の無機基板表面は、高い平滑性を有し、比較的簡単な洗浄操作により、再びシランカップリング層を形成して、積層体の材料として用いることができるという効果も有する。
より好適には本発明において、高耐熱性を有する高分子フィルムを用いれば、耐熱性に劣る接着剤や粘着剤を用いることなく貼り合わせが可能であり、機能素子形成の際に180℃以上、好ましくは230℃以上、さらに好ましくは260℃以上の高温を用いて素子形成が可能となる。一般に半導体、誘電体等は、高温で形成した方が膜質の良い薄膜が得られるため、より高性能な機能素子形成が期待できる。本発明によれば、誘電体素子、半導体素子、MEMS素子、ディスプレイ素子、発光素子、光電変換素子、圧電変換素子、熱電変換素子等のデバイスをフィルム基材上に形成したフレキシブル電子デバイスの製造に有用である。According to the present invention, it is possible to obtain a good laminate with no foreign matter between the polymer film and the inorganic substrate, and as a result, the adhesive strength between the polymer film and the inorganic substrate is homogenized.
Further, according to the present invention, the silane coupling agent layer is masked on a part of the inorganic substrate in a predetermined pattern when the silane coupling agent is formed, or after the silane coupling agent layer is formed, When forming an electronic device by intentionally obtaining the presence / absence or strength / weakness of the adhesive force by irradiating a part of the coupling agent layer along a predetermined pattern with active energy rays, a device formation process Sometimes it is possible to create a desired pattern of a good adhesion part having sufficient adhesive strength that does not cause peeling of the polymer film and an easy peeling part that can peel the polymer film relatively easily, It is possible to make a cut along the periphery of the easily peelable part and peel off the functional element part formed in the area.
Still further, the surface of the inorganic substrate after peeling of the polymer film in the present invention has high smoothness, and a silane coupling layer is formed again by a relatively simple cleaning operation to be used as a material for the laminate. It also has the effect of being able to.
More preferably, in the present invention, if a polymer film having high heat resistance is used, bonding can be performed without using an adhesive or pressure-sensitive adhesive that is inferior in heat resistance. The element can be formed using a high temperature of preferably 230 ° C. or higher, more preferably 260 ° C. or higher. In general, semiconductors, dielectrics, and the like can be formed at a high temperature to obtain a thin film with better film quality, so that higher performance functional elements can be expected. According to the present invention, for manufacturing a flexible electronic device in which devices such as a dielectric element, a semiconductor element, a MEMS element, a display element, a light emitting element, a photoelectric conversion element, a piezoelectric conversion element, and a thermoelectric conversion element are formed on a film substrate. Useful.
(積層体および製造方法)
本発明の積層体は、少なくとも無機基板、シランカップリング剤及び高分子フィルムを用いて、これらから構成される積層体である。(Laminated body and manufacturing method)
The laminate of the present invention is a laminate comprising at least an inorganic substrate, a silane coupling agent, and a polymer film.
<無機基板>
本発明においては高分子フィルムの支持体として無機基板を用いる。無機基板とは無機物からなる基板として用いることのできる板状のものであればよく、例えば、ガラス板、セラミック板、半導体ウエハ、金属等を主体としているもの、および、これらガラス板、セラミック板、シリコンウエハ、金属の複合体として、これらを積層したもの、これらが分散されているもの、これらの繊維が含有されているものなどが挙げられる。<Inorganic substrate>
In the present invention, an inorganic substrate is used as a support for the polymer film. The inorganic substrate may be any plate-like material that can be used as a substrate made of an inorganic material, for example, a glass plate, a ceramic plate, a semiconductor wafer, a material mainly made of metal, etc., and these glass plates, ceramic plates, Examples of silicon wafers and metal composites include those obtained by laminating them, those in which they are dispersed, and those containing these fibers.
前記ガラス板としては、石英ガラス、高ケイ酸ガラス(96%シリカ)、ソーダ石灰ガラス、鉛ガラス、アルミノホウケイ酸ガラス、ホウケイ酸ガラス(パイレックス(登録商標))、ホウケイ酸ガラス(無アルカリ)、ホウケイ酸ガラス(マイクロシート)、アルミノケイ酸塩ガラス等が含まれる。これらの中でも、線膨張係数が5ppm/K以下のものが望ましく、市販品であれば、液晶用ガラスであるコーニング社製の「コーニング(登録商標)7059」や「コーニング(登録商標)1737」、「EAGLE」、旭硝子社製の「AN100」、日本電気硝子社製の「OA10」、SCHOTT社製の「AF32」などが望ましい。 Examples of the glass plate include quartz glass, high silicate glass (96% silica), soda lime glass, lead glass, aluminoborosilicate glass, borosilicate glass (Pyrex (registered trademark)), borosilicate glass (non-alkali), Borosilicate glass (microsheet), aluminosilicate glass and the like are included. Among these, those having a linear expansion coefficient of 5 ppm / K or less are desirable, and if it is a commercial product, “Corning (registered trademark) 7059” or “Corning (registered trademark) 1737” manufactured by Corning, which is a glass for liquid crystal, “EAGLE”, “AN100” manufactured by Asahi Glass, “OA10” manufactured by Nippon Electric Glass, “AF32” manufactured by SCHOTT, etc. are desirable.
前記セラミック板としては、Al2O3、Mullite、AlN、SiC、Si3N4、BN、結晶化ガラス、Cordierite、Spodumene、Pb−BSG+
CaZrO3+Al2O3、Crystallized glass+Al2O3、Cr
ystallized Ca−BSG、BSG+Quartz、BSG+Quartz、BSG+Al2O3、Pb+BSG+Al2O3、Glass−ceramic、ゼロデュア材などの基板用セラミックス、TiO2、チタン酸ストロンチウム、チタン酸カルシウム、チタン酸マグネシウム、アルミナ、MgO、ステアタイト、BaTi4O9、BaTiO3、BaTi4+CaZrO3、BaSrCaZrTiO3、Ba(TiZr)O3、PMN−PTやPFN−PFWなどのキャパシター材料、PbNb2O6、Pb0.5Be0.5Nb2O6、PbTiO3、BaTiO3、PZT、0.855PZT−95PT−0.5BT、0.873PZT−0.97PT−0.3BT、PLZTなどの圧電材料が含まれる。As the ceramic plate, Al2O3, Mullite, AlN, SiC, Si3N4, BN, crystallized glass, Cordierite, Spodumene, Pb-BSG +
CaZrO3 + Al2O3, Crystallized glass + Al2O3, Cr
Ystallized Ca-BSG, BSG + Quartz, BSG + Quartz, BSG + Al2O3, Pb + BSG + Al2O3, Glass-ceramic, Zero-durer ceramics for substrates, TiO2, Strontium titanate, Calcium titanate, Magnesium titanate, Alumina, MgO, Ti4B BaTi4 + CaZrO3, BaSrCaZrTiO3, Ba (TiZr) O3, capacitor materials such as PMN-PT and PFN-PFW, PbNb2O6, Pb0.5Be0.5Nb2O6, PbTiO3, BaTiO3, PZT, 0.855PZT-95PT-B Piezoelectric materials such as 0.97PT-0.3BT and PLZT are included.
前記半導体ウエハとしては、シリコンウエハ、半導体ウエハ、化合物半導体ウエハ等を用いることができ、シリコンウエハとしては単結晶ないし多結晶のシリコンを薄板上に加工した物であり、n型或はp型にドーピングされたシリコンウエハ、イントリンシックシリコンウエハ等の全てが含まれ、また、シリコンウエハの表面に酸化シリコン層や各種薄膜が堆積されたシリコンウエハも含まれ、シリコンウエハ以外にも、ゲルマニウム、シリコン−ゲルマニウム、ガリウム−ヒ素、アルミニウム−ガリウム−インジウム、窒素−リン−ヒ素−アンチモン、SiC、InP(インジウム燐)、InGaAs、GaInNAs、LT、LN、ZnO(酸化亜鉛)やCdTe(カドミウムテルル)、ZnSe(セレン化
亜鉛) などの半導体ウエハ、化合物半導体ウエハなどを用いることが出来る。As the semiconductor wafer, a silicon wafer, a semiconductor wafer, a compound semiconductor wafer, or the like can be used. The silicon wafer is obtained by processing single crystal or polycrystalline silicon on a thin plate, and is n-type or p-type. This includes all doped silicon wafers, intrinsic silicon wafers, etc., and also includes silicon wafers with silicon oxide layers and various thin films deposited on the surface of silicon wafers. Besides silicon wafers, germanium, silicon- Germanium, gallium-arsenic, aluminum-gallium-indium, nitrogen-phosphorus-arsenic-antimony, SiC, InP (indium phosphorus), InGaAs, GaInNAs, LT, LN, ZnO (zinc oxide), CdTe (cadmium tellurium), ZnSe ( Semiconductor wafers and compounds such as zinc selenide) A semiconductor wafer or the like can be used.
前記金属としては、W、Mo、Pt、Fe、Ni、Auといった単一元素金属、インコネル、モネル、ニモニック、炭素銅、Fe−Ni系インバー合金、スーパーインバー合金、といった合金等が含まれる。また、これら金属に、他の金属層、セラミック層を付加してなる多層金属板も含まれる。この場合、付加層との全体のCTEが低ければ、主金属層にCu、Alなども用いられる。付加金属層として使用される金属としては、ポリイミドフィルムとの密着性を強固にするもの、拡散がないこと、耐薬品性や耐熱性が良いこと等の特性を有するものであれば限定されるものではないが、クロム、ニッケル、TiN、Mo含有Cuが好適な例として挙げられる。 Examples of the metal include single element metals such as W, Mo, Pt, Fe, Ni, and Au, alloys such as inconel, monel, mnemonic, carbon copper, Fe-Ni invar alloy, and super invar alloy. In addition, a multilayer metal plate formed by adding other metal layers and ceramic layers to these metals is also included. In this case, if the total CTE with the additional layer is low, Cu, Al or the like is also used for the main metal layer. The metal used as the additional metal layer is limited as long as it has strong adhesion to the polyimide film, no diffusion, and good chemical resistance and heat resistance. Although it is not, chromium, nickel, TiN, and Mo containing Cu are mentioned as a suitable example.
前記無機基板の平面部分は、充分に平坦である事が望ましい。具体的には、表面粗さのP−V値が50nm以下、より好ましくは20nm以下、さらに好ましくは5nm以下である。これより粗いと、高分子フィルムと無機基板との接着強度が不充分となる場合がある。
前記無機基板の厚さは特に制限されないが、取り扱い性の観点より10mm以下の厚さが好ましく、3mm以下がなお好ましく、1.3mm以下がなお好ましい。厚さの加減については特に制限されないが、0.07mm以上、好ましくは0.15mm以上、なお好ましくは0.3mm以上が好ましく用いられる。The planar portion of the inorganic substrate is desirably sufficiently flat. Specifically, the PV value of the surface roughness is 50 nm or less, more preferably 20 nm or less, and even more preferably 5 nm or less. If it is rougher than this, the adhesive strength between the polymer film and the inorganic substrate may be insufficient.
The thickness of the inorganic substrate is not particularly limited, but is preferably 10 mm or less, more preferably 3 mm or less, and still more preferably 1.3 mm or less from the viewpoint of handleability. The thickness is not particularly limited, but 0.07 mm or more, preferably 0.15 mm or more, and more preferably 0.3 mm or more is preferably used.
前記無機基板の面積は、積層体やフレキシブル電子デバイスの生産効率・コストの観点より、大面積であることが好ましい。1000cm2以上であることが好ましく、150
0cm2であることがより好ましく、2000cm2であることがさらに好ましい。The area of the inorganic substrate is preferably a large area from the viewpoint of production efficiency and cost of the laminate and the flexible electronic device. It is preferably 1000 cm 2 or more, 150
It is more preferably 0 cm 2 and further preferably 2000 cm 2 .
<シランカップリング剤>
本発明におけるシランカップリング剤は、仮支持体と高分子フィルムとの間に物理的ないし化学的に介在し、両者間の接着力を高める作用を有する化合物を云う。
シランカップリング剤の好ましい具体例としては、N−2−(アミノエチル)−3−アミノプロピルメチルジメトキシシラン、N−2−(アミノエチル)−3−アミノプロピルトリメトキシシラン、N−2−(アミノエチル)−3−アミノプロピルトリエトキシシラン、3−アミノプロピルトリメトキシシラン、3−アミノプロピルトリエトキシシラン、3−トリエトキシシリル−N−(1,3−ジメチル−ブチリデン)プロピルアミン、2−(3,4−エポキシシクロへキシル)エチルトリメトキシシラン、3−グリシドキシプロピルトリメトキシシラン、3−グリシドキシプロピルメチルジエトキシシラン、3−グリシドキシプロピルトリエトキシシラン、ビニルトリクロルシラン、ビニルトリメトキシシラン、ビニルトリエトキシシラン、2−(3,4−エポキシシクロヘキシル)エチルトリ
メトキシシラン、3−グリシドキシプロピルトリメトキシシラン、3−グリシドキシプロピルメチルジエトキシシラン、3−グリシドキシプロピルトリエトキシシラン、p−スチリルトリメトキシシラン、3−メタクリロキシプロピルメチルジメトキシシラン、3−メタクリロキシプロピルトリメトキシシラン、3−メタクリロキシプロピルメチルジエトキシシラン、3−メタクリロキシプロピルトリエトキシシラン、3−アクリロキシプロピルトリメトキシシラン、N−フェニル−3−アミノプロピルトリメトキシシラン、N−(ビニルベンジル)−2−アミノエチル−3−アミノプロピルトリメトキシシラン塩酸塩、3−ウレイドプロピルトリエトキシシラン、3−クロロプロピルトリメトキシシラン、3−メルカプトプロピルメチルジメトキシシラン、3−メルカプトプロピルトリメトキシシラン、ビス(トリエトキシシリルプロピル)テトラスルフィド、3−イソシアネートプロピルトリエトキシシラン、トリス−(3−トリメトキシシリルプロピル)イソシアヌレート、クロロメチルフェネチルトリメトキシシラン、クロロメチルトリメトキシシラン、アミノフェニルトリメトキシシラン、アミノフェネチルトリメトキシシラン、アミノフェニルアミノメチルフェネチルトリメトキシシラン、ヘキサメチルジシラザンなどが挙げられる。<Silane coupling agent>
The silane coupling agent in the present invention refers to a compound having a function of physically or chemically interposing between the temporary support and the polymer film and enhancing the adhesive force between the two.
Preferable specific examples of the silane coupling agent include N-2- (aminoethyl) -3-aminopropylmethyldimethoxysilane, N-2- (aminoethyl) -3-aminopropyltrimethoxysilane, N-2- ( Aminoethyl) -3-aminopropyltriethoxysilane, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-triethoxysilyl-N- (1,3-dimethyl-butylidene) propylamine, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, 3-glycidoxypropyltriethoxysilane, vinyltrichlorosilane, Vinyltrimethoxysilane, vinyltriethoxysila 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, 3-glycidoxypropyltriethoxysilane, p-styryl Trimethoxysilane, 3-methacryloxypropylmethyldimethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-methacryloxypropylmethyldiethoxysilane, 3-methacryloxypropyltriethoxysilane, 3-acryloxypropyltrimethoxysilane, N-phenyl-3-aminopropyltrimethoxysilane, N- (vinylbenzyl) -2-aminoethyl-3-aminopropyltrimethoxysilane hydrochloride, 3-ureidopropyltriethoxysilane, 3-chloropropyl Limethoxysilane, 3-mercaptopropylmethyldimethoxysilane, 3-mercaptopropyltrimethoxysilane, bis (triethoxysilylpropyl) tetrasulfide, 3-isocyanatopropyltriethoxysilane, tris- (3-trimethoxysilylpropyl) isocyanurate Chloromethylphenethyltrimethoxysilane, chloromethyltrimethoxysilane, aminophenyltrimethoxysilane, aminophenethyltrimethoxysilane, aminophenylaminomethylphenethyltrimethoxysilane, hexamethyldisilazane and the like.
本発明で用いることのできるシランカップリング剤としては、上記のほかにn−プロピルトリメトキシシラン、ブチルトリクロロシラン、2−シアノエチルトリエトキシシラン、シクロヘキシルトリクロロシラン、デシルトリクロロシラン、ジアセトキシジメチルシラン、ジエトキシジメチルシラン、ジメトキシジメチルシラン、ジメトキシジフェニルシラン、ジメトキシメチルフェニルシラン、ドデシルリクロロシラン、ドデシルトリメトキシラン、エチルトリクロロシラン、ヘキシルトリメトキシシラン、オクタデシルトリエトキシシラン、オクタデシルトリメトキシシラン、n−オクチルトリクロロシラン、n−オクチルトリエトキシシラン、n−オクチルトリメトキシシラン、トリエトキシエチルシラン、トリエトキシメチルシラン、トリメトキシメチルシラン、トリメトキシフェニルシラン、ペンチルトリエトキシシラン、ペンチルトリクロロシラン、トリアセトキシメチルシラン、トリクロロヘキシルシラン、トリクロロメチルシラン、トリクロロオクタデシルシラン、トリクロロプロピルシラン、トリクロロテトラデシルシラン、トリメトキシプロピルシラン、アリルトリクロロシラン、アリルトリエトキシシラン、アリルトリメトキシシラン、ジエトキシメチルビニルシラン、ジメトキシメチルビニルシラン、トリクロロビニルシラン、トリエトキシビニルシラン、ビニルトリス(2−メトキシエトキシ)シラン、トリクロロ−2−シアノエチルシラン、ジエトキシ(3−グリシジルオキシプロピル)メチルシラン、3−グリシジルオキシプロピル(ジメトキシ)メチルシラン、3−グリシジルオキシプロピルトリメトキシシラン、などを使用することもできる。 In addition to the above, the silane coupling agent that can be used in the present invention includes n-propyltrimethoxysilane, butyltrichlorosilane, 2-cyanoethyltriethoxysilane, cyclohexyltrichlorosilane, decyltrichlorosilane, diacetoxydimethylsilane, di-silane. Ethoxydimethylsilane, dimethoxydimethylsilane, dimethoxydiphenylsilane, dimethoxymethylphenylsilane, dodecyltrichlorosilane, dodecyltrimethoxysilane, ethyltrichlorosilane, hexyltrimethoxysilane, octadecyltriethoxysilane, octadecyltrimethoxysilane, n-octyltrichlorosilane , N-octyltriethoxysilane, n-octyltrimethoxysilane, triethoxyethylsilane, triethoxymethylsilane Trimethoxymethylsilane, trimethoxyphenylsilane, pentyltriethoxysilane, pentyltrichlorosilane, triacetoxymethylsilane, trichlorohexylsilane, trichloromethylsilane, trichlorooctadecylsilane, trichloropropylsilane, trichlorotetradecylsilane, trimethoxypropylsilane, Allyltrichlorosilane, allyltriethoxysilane, allyltrimethoxysilane, diethoxymethylvinylsilane, dimethoxymethylvinylsilane, trichlorovinylsilane, triethoxyvinylsilane, vinyltris (2-methoxyethoxy) silane, trichloro-2-cyanoethylsilane, diethoxy (3- Glycidyloxypropyl) methylsilane, 3-glycidyloxypropyl (dimethoxy) Chirushiran, 3-glycidyloxypropyltrimethoxysilane, and the like may also be used.
かかるシランカップリング剤の中で、本発明にて好ましく用いられるシランカップリング剤はカップリング剤の、一分子あたりに一個の珪素原子を有する化学構造のシランカップリング剤が好ましい。
本発明では、特に好ましいシランカップリング剤としては、N−2−(アミノエチル)−3−アミノプロピルメチルジメトキシシラン、N−2−(アミノエチル)−3−アミノプロピルトリメトキシシラン、N−2−(アミノエチル)−3−アミノプロピルトリエトキシシラン、3−アミノプロピルトリメトキシシラン、3−アミノプロピルトリエトキシシラン、3−トリエトキシシリル−N−(1,3−ジメチル−ブチリデン)プロピルアミン、2−(3,4−エポキシシクロへキシル)エチルトリメトキシシラン、3−グリシドキシプロピルトリメトキシシラン、3−グリシドキシプロピルメチルジエトキシシラン、3−グリシドキシプロピルトリエトキシシラン、アミノフェニルトリメトキシシラン、アミノフェネチルトリメトキシシラン、アミノフェニルアミノメチルフェネチルトリメトキシシランなどが挙げられる。プロセスで特に高い耐熱性が要求される場合、Siとアミノ基の間を芳香族基でつないだものが望ましい。
なお本発明では必要に応じて、リン系カップリング剤、チタネート系カップリング剤等を併用しても良い。Among such silane coupling agents, the silane coupling agent preferably used in the present invention is preferably a silane coupling agent having a chemical structure having one silicon atom per molecule of the coupling agent.
In the present invention, particularly preferred silane coupling agents include N-2- (aminoethyl) -3-aminopropylmethyldimethoxysilane, N-2- (aminoethyl) -3-aminopropyltrimethoxysilane, and N-2. -(Aminoethyl) -3-aminopropyltriethoxysilane, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-triethoxysilyl-N- (1,3-dimethyl-butylidene) propylamine, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, 3-glycidoxypropyltriethoxysilane, aminophenyl Trimethoxysilane, aminophenethyltrimethoxysilane Emissions, such as aminophenyl aminomethyl phenethyltrimethoxysilane the like. In the case where particularly high heat resistance is required in the process, it is desirable to use an aromatic group between Si and an amino group.
In the present invention, if necessary, a phosphorus coupling agent, a titanate coupling agent, or the like may be used in combination.
<シランカップリング剤の塗布方法>
従来の技術では、シランカップリング剤の塗布は、シランカップリング剤をアルコールなどの溶媒で希釈した溶液状態で行われる。しかしながら、本発明ではこのシランカップリング剤塗布工程を気相を介して行うことに特徴がある。すなわち本発明では、無機基板をシランカップリング剤の蒸気、すなわち実質的に気体状態のシランカップリング剤に暴露することにより塗布を行う。シランカップリング剤の蒸気は、液体状態のシランカップリング剤を40℃〜シランカップリング剤の沸点までの温度に加温することによって得ることが出来る。シランカップリング剤の沸点は、化学構造によって異なるが、概ね100〜250℃の範囲である。ただし200℃以上の加熱は、シランカップリング剤の有機基がわの副反応を招く恐れがあるため好ましくない。
シランカップリング剤を加温する環境は、加圧下、略常圧下、減圧下のいずれでも構わないが、シランカップリング剤の気化を促進する場合には略常圧下ないし減圧下が好ましい。多くのシランカップリング剤は可燃性液体であるため、密閉容器内にて、好ましくは容器内を不活性ガスで置換した後に気化作業を行うことが好ましい。
無機基板をシランカップリング剤に暴露する時間は特に制限されないが、20時間以内、好ましくは60分以内、さらに好ましくは15分以内、なおさらに好ましくは1分以内である。
無機基板をシランカップリング剤に暴露する間の無機基板温度は、シランカップリング剤の種類と、求めるシランカップリング剤層の厚さにより−50℃から200℃の間の適正な温度に制御することが好ましい。
シランカップリング剤に暴露された無機基板は、好ましくは、暴露後に、70℃〜200℃、さらに好ましくは75℃〜150℃に加熱される。かかる加熱によって、無機基板表面の水酸基などと、シランカップリング剤のアルコキシ基やシラザン基が反応し、シランカップリング剤処理が完了する。加熱に要する時間は10秒以上10分程度以内である。温度が高すぎたり、時間が長すぎる場合にはカップリング剤の劣化が生じる場合がある。また短すぎると処理効果が得られない。なお、シランカップリング剤に暴露中の基板温度が既に80℃以上である場合には、事後の加熱を省略することも出来る。<Application method of silane coupling agent>
In the conventional technique, the silane coupling agent is applied in a solution state in which the silane coupling agent is diluted with a solvent such as alcohol. However, the present invention is characterized in that this silane coupling agent coating step is performed via a gas phase. That is, in the present invention, the coating is performed by exposing the inorganic substrate to the vapor of the silane coupling agent, that is, the substantially gaseous silane coupling agent. The vapor | steam of a silane coupling agent can be obtained by heating a silane coupling agent in a liquid state to a temperature from 40 ° C. to the boiling point of the silane coupling agent. Although the boiling point of a silane coupling agent changes with chemical structures, it is the range of about 100-250 degreeC in general. However, heating at 200 ° C. or higher is not preferable because the organic group of the silane coupling agent may cause a side reaction.
The environment for heating the silane coupling agent may be under pressure, at about normal pressure, or under reduced pressure, but is preferably at about normal pressure or under reduced pressure in order to promote vaporization of the silane coupling agent. Since many silane coupling agents are flammable liquids, it is preferable to perform the vaporizing operation in an airtight container, preferably after replacing the inside of the container with an inert gas.
The time for exposing the inorganic substrate to the silane coupling agent is not particularly limited, but is within 20 hours, preferably within 60 minutes, more preferably within 15 minutes, and even more preferably within 1 minute.
The inorganic substrate temperature during exposure of the inorganic substrate to the silane coupling agent is controlled to an appropriate temperature between −50 ° C. and 200 ° C. depending on the type of silane coupling agent and the desired thickness of the silane coupling agent layer. It is preferable.
The inorganic substrate exposed to the silane coupling agent is preferably heated to 70 ° C. to 200 ° C., more preferably 75 ° C. to 150 ° C. after the exposure. By such heating, the hydroxyl group on the surface of the inorganic substrate reacts with the alkoxy group or silazane group of the silane coupling agent, and the silane coupling agent treatment is completed. The time required for heating is about 10 seconds to 10 minutes. If the temperature is too high or the time is too long, the coupling agent may be deteriorated. If it is too short, the treatment effect cannot be obtained. If the substrate temperature being exposed to the silane coupling agent is already 80 ° C. or higher, the subsequent heating can be omitted.
本発明では、無機基板のシランカップリング剤塗布面を下向きに保持してシランカップリング剤蒸気に暴露することが好ましい。シランカップリング剤の溶液を塗布する従来法では、必然的に塗布中および塗布前後に無機基板の塗布面が上を向くため、作業環境下の浮遊異物などが無機基板表面に沈着する可能性を否定できない。しかしながら本発明では無機基板を下向きに保持することが出来るため。環境中の異物付着を大幅に減ずることが可能となる。
なおシランカップリング剤処理前の無機基板表面を短波長UV/オゾン照射などの手段により清浄化すること、ないしは液体洗浄剤で清浄化すること等は、好ましい操作である。In the present invention, it is preferable to expose the inorganic substrate to the silane coupling agent vapor while holding the silane coupling agent application surface of the inorganic substrate downward. In the conventional method of applying a solution of a silane coupling agent, the coated surface of the inorganic substrate inevitably faces up before and after coating, so there is a possibility that floating foreign substances and the like in the working environment are deposited on the surface of the inorganic substrate. I can't deny it. However, in the present invention, the inorganic substrate can be held downward. It is possible to greatly reduce the adhesion of foreign substances in the environment.
It is preferable to clean the surface of the inorganic substrate before the silane coupling agent treatment by means such as short wavelength UV / ozone irradiation, or cleaning with a liquid cleaning agent.
カップリング剤の塗布量、厚さについては理論上は1分子層あれば事足り、機械設計的には無視できるレベルの厚さで十分である。一般的には400nm未満(0.4μm未満)であり、200nm以下(0.2μm以下)が好ましく、さらに実用上は100nm以下(0.1μm以下)が好ましく、より好ましくは50nm以下、さらに好ましくは10nm以下である。ただし計算上5nm以下の領域になるとカップリング剤が均一な塗膜としてではなく、クラスター状に存在するケースが想定され、余り好ましくはない。
カップリング剤層の膜厚は、エリプソメトリー法または塗布時のカップリング剤溶液の濃度と塗布量から計算して求めることができる。As for the coating amount and thickness of the coupling agent, a single molecular layer is theoretically sufficient, and a thickness that can be ignored in terms of mechanical design is sufficient. Generally, it is less than 400 nm (less than 0.4 μm), preferably 200 nm or less (0.2 μm or less), more practically 100 nm or less (0.1 μm or less), more preferably 50 nm or less, still more preferably 10 nm or less. However, when the calculation is in the region of 5 nm or less, it is assumed that the coupling agent is present not in the form of a uniform coating but in a cluster shape, which is not preferable.
The film thickness of the coupling agent layer can be determined by ellipsometry or calculation from the concentration of the coupling agent solution at the time of coating and the coating amount.
<無機基板側のパターン化処理>
本発明においては無機基板側にパターン化処理を行うことができる。ここにパターン化とは、意図的にカップリング剤の塗布量ないし活性度等を操作した領域を作ることを云う。これにより、積層体において無機基板と高分子フィルムとの間の接着強度が異なる良好接着部分と易剥離部分を有し、該良好接着部分と該易剥離部分とが所定のパターンを形成することができる。パターン化処理として、シランカップリング剤塗布を行う際に、あらかじめ所定のパターンで準備されたマスクを用いて、シランカップリング剤の塗布量を操作する方法を例示できる。またシランカップリング剤の塗布面に活性エネルギー線照射を行い、その際に、マスキングないしスキャン操作などの手法を併用することによりパターン化することも可能である。ここに活性エネルギー線照射とは、紫外線、電子線、X線等のエネルギー線を照射する操作、さらには極短波長の紫外線照射処理のように紫外線照射光効果と同時に照射面近傍で発生するオゾンガスガス暴露の効果を併せ持つものを含める。さらにこれらの他に、コロナ処理、真空プラズマ処理、常圧プラズマ処理、サンドブラスと処理等によってパターン化処理を行うことも可能である。<Patterning treatment on the inorganic substrate>
In the present invention, patterning treatment can be performed on the inorganic substrate side. Here, patterning refers to creating a region where the coating amount or activity of the coupling agent is intentionally manipulated. Thereby, the laminate has a good adhesion part and an easy peeling part with different adhesive strengths between the inorganic substrate and the polymer film, and the good adhesion part and the easy peeling part form a predetermined pattern. it can. An example of the patterning treatment is a method of manipulating the coating amount of the silane coupling agent using a mask prepared in advance with a predetermined pattern when applying the silane coupling agent. It is also possible to perform patterning by irradiating the surface to which the silane coupling agent is applied with active energy rays and using a technique such as masking or scanning operation at the same time. Here, the active energy ray irradiation means the operation of irradiating energy rays such as ultraviolet rays, electron rays, X-rays, etc., and ozone gas generated near the irradiated surface simultaneously with the ultraviolet ray irradiation light effect as in the ultraviolet ray irradiation treatment of an extremely short wavelength. Include gas exposure effects. In addition to these, patterning can be performed by corona treatment, vacuum plasma treatment, atmospheric pressure plasma treatment, sandblasting and treatment, or the like.
<高分子フィルム>
本発明における高分子フィルムとしては、ポリエチレン、ポリプロピレン、ポリエチレンテレフタレート、ポリブチレンテレフタレート、ポリエチレンナフタレート、全芳香族ポリエステル、その他の共重合ポリエステル、ポリメチルメタクリレート、その他の共重合アクリレート、ポリカーボネート、ポリアミド、ポリスルフォン、ポリエーテルスルフォン、ポリエーテルケトン、ポリアミドイミド、ポリエーテルイミド、芳香族ポリイミド、脂環族ポリイミド、フッ素化ポリイミド、酢酸セルロース、硝酸セルロース、芳香族ポリアミド、ポリ塩化ビニル、ポリフェノール、ポリアリレート、ポリフェニレンスルフィド、ポリフェニレンオキシド、ポリスチレン等のフィルムを用いることが出来る。本発明において特に効果が顕著・有用であるものは耐熱性が100℃以上の高分子、所謂エンジニアリングプラスチックのフィルムである。ここに耐熱性とはガラス転移温度ないしは熱変形温度を云う。<Polymer film>
As the polymer film in the present invention, polyethylene, polypropylene, polyethylene terephthalate, polybutylene terephthalate, polyethylene naphthalate, wholly aromatic polyester, other copolymerized polyester, polymethyl methacrylate, other copolymerized acrylate, polycarbonate, polyamide, poly Sulfone, polyether sulfone, polyether ketone, polyamideimide, polyetherimide, aromatic polyimide, alicyclic polyimide, fluorinated polyimide, cellulose acetate, cellulose nitrate, aromatic polyamide, polyvinyl chloride, polyphenol, polyarylate, polyphenylene A film made of sulfide, polyphenylene oxide, polystyrene or the like can be used. In the present invention, what is particularly remarkable and useful is a polymer having a heat resistance of 100 ° C. or higher, that is, a so-called engineering plastic film. Here, the heat resistance refers to a glass transition temperature or a heat distortion temperature.
本発明の高分子フィルムは前記高分子材料の内、熱可塑性の高分子材料については、溶融延伸法によりフィルムを得ることが出来る。また、非熱可塑性の高分子については主に溶液製膜法が用いられる。また本発明の特殊な例として、無機基板上に高分子材料そのもの、ないしは前駆体の溶液を塗布乾燥してフィルム化する手法を用いることができる。 Regarding the polymer film of the present invention, a thermoplastic polymer material among the polymer materials can be obtained by a melt stretching method. For non-thermoplastic polymers, a solution casting method is mainly used. As a special example of the present invention, a technique of applying a polymer material itself or a precursor solution onto an inorganic substrate and drying it to form a film can be used.
本発明の高分子フィルムの厚さは3μm以上が好ましく、11μm以上がなお好ましく、さらには24μm以上が好ましく、なおさらには45μm以上が好ましい。高分子フィルムの厚さの上限は特に制限されないが、フレキシブル電子デバイスとしての要求より250μm以下であることが好ましく、さらに150μm以下、なおさらには90μm以下が好ましい。 The thickness of the polymer film of the present invention is preferably 3 μm or more, more preferably 11 μm or more, further preferably 24 μm or more, and still more preferably 45 μm or more. The upper limit of the thickness of the polymer film is not particularly limited, but is preferably 250 μm or less, more preferably 150 μm or less, and even more preferably 90 μm or less, as required for a flexible electronic device.
本発明で特に好ましく用いられる高分子フィルムはポリイミドフィルムであり、芳香族ポリイミド、脂環族ポリイミド、ポリアミドイミド、ポリエーテルイミドなどを用いることが出来る。本発明を特にフレキシブルディスプレイ素子製造に用いる場合には、無色透明性を有するポリイミド系樹脂フィルムを用いることが好ましいが、反射型、ないし自発光型のディスプレイの背面素子を形成する場合においては、特にこの限りではない。 The polymer film particularly preferably used in the present invention is a polyimide film, and aromatic polyimide, alicyclic polyimide, polyamideimide, polyetherimide, and the like can be used. When the present invention is used particularly for the production of flexible display elements, it is preferable to use a polyimide-based resin film having colorless transparency, but particularly when forming a back element of a reflective or self-luminous display. This is not the case.
一般にポリイミドフィルムは、溶媒中でジアミン類とテトラカルボン酸類とを反応させて得られるポリアミド酸(ポリイミド前駆体)溶液を、ポリイミドフィルム作製用支持体に塗布、乾燥してグリーンフィルム(「前駆体フィルム」または「ポリアミド酸フィルム」ともいう)となし、さらにポリイミドフィルム作製用支持体上で、あるいは該支持体から剥がした状態でグリーンフィルムを高温熱処理して脱水閉環反応を行わせることによって得られる。 In general, a polyimide film is obtained by applying a polyamic acid (polyimide precursor) solution obtained by reacting diamines and tetracarboxylic acids in a solvent to a polyimide film support and drying it to obtain a green film (“precursor film”). Or a “polyamic acid film”), and further, a green film is subjected to a high temperature heat treatment on a support for forming a polyimide film or in a state of being peeled from the support to cause a dehydration ring-closing reaction.
ポリアミド酸を構成するジアミン類としては、特に制限はなく、ポリイミド合成に通常用いられる芳香族ジアミン類、脂肪族ジアミン類、脂環式ジアミン類等を用いることができる。耐熱性の観点からは、芳香族ジアミン類が好ましく、芳香族ジアミン類の中では、ベンゾオキサゾール構造を有する芳香族ジアミン類がより好ましい。ベンゾオキサゾール構造を有する芳香族ジアミン類を用いると、高い耐熱性とともに、高弾性率、低熱収縮性、低線膨張係数を発現させることが可能になる。ジアミン類は、単独で用いてもよいし二種以上を併用してもよい。 There is no restriction | limiting in particular as diamine which comprises a polyamic acid, The aromatic diamine, aliphatic diamine, alicyclic diamine etc. which are normally used for a polyimide synthesis | combination can be used. From the viewpoint of heat resistance, aromatic diamines are preferable, and among aromatic diamines, aromatic diamines having a benzoxazole structure are more preferable. When aromatic diamines having a benzoxazole structure are used, it is possible to develop a high elastic modulus, a low heat shrinkage, and a low linear expansion coefficient as well as a high heat resistance. Diamines may be used alone or in combination of two or more.
ベンゾオキサゾール構造を有する芳香族ジアミン類としては、特に限定はなく、例えば、5−アミノ−2−(p−アミノフェニル)ベンゾオキサゾール、6−アミノ−2−(p−アミノフェニル)ベンゾオキサゾール、5−アミノ−2−(m−アミノフェニル)ベンゾオキサゾール、6−アミノ−2−(m−アミノフェニル)ベンゾオキサゾール、2,2’−p−フェニレンビス(5−アミノベンゾオキサゾール)、2,2’−p−フェニレンビス(6−アミノベンゾオキサゾール)、1−(5−アミノベンゾオキサゾロ)−4−(6−アミノベンゾオキサゾロ)ベンゼン、2,6−(4,4’−ジアミノジフェニル)ベンゾ[1,2−d:5,4−d’]ビスオキサゾール、2,6−(4,4’−ジアミノジフェニル)ベンゾ[1,2−d:4,5−d’]ビスオキサゾール、2,6−(3,4’−ジアミノジフェニル)ベンゾ[1,2−d:5,4−d’]ビスオキサゾール、2,6−(3,4’−ジアミノジフェニル)ベンゾ[1,2−d:4,5−d’]ビスオキサゾール、2,6−(3,3’−ジアミノジフェニル)ベンゾ[1,2−d:5,4−d’]ビスオキサゾール、2,6−(3,3’−ジアミノジフェニル)ベンゾ[1,2−d:4,5−d’]ビスオキサゾール等が挙げられる。 The aromatic diamine having a benzoxazole structure is not particularly limited. For example, 5-amino-2- (p-aminophenyl) benzoxazole, 6-amino-2- (p-aminophenyl) benzoxazole, 5 -Amino-2- (m-aminophenyl) benzoxazole, 6-amino-2- (m-aminophenyl) benzoxazole, 2,2'-p-phenylenebis (5-aminobenzoxazole), 2,2 ' -P-phenylenebis (6-aminobenzoxazole), 1- (5-aminobenzoxazolo) -4- (6-aminobenzoxazolo) benzene, 2,6- (4,4'-diaminodiphenyl) benzo [1,2-d: 5,4-d ′] bisoxazole, 2,6- (4,4′-diaminodiphenyl) benzo [1,2-d 4,5-d '] bisoxazole, 2,6- (3,4'-diaminodiphenyl) benzo [1,2-d: 5,4-d'] bisoxazole, 2,6- (3,4 ' -Diaminodiphenyl) benzo [1,2-d: 4,5-d '] bisoxazole, 2,6- (3,3'-diaminodiphenyl) benzo [1,2-d: 5,4-d'] Examples thereof include bisoxazole and 2,6- (3,3′-diaminodiphenyl) benzo [1,2-d: 4,5-d ′] bisoxazole.
上述したベンゾオキサゾール構造を有する芳香族ジアミン類以外の芳香族ジアミン類としては、例えば、2,2’−ジメチル−4,4’−ジアミノビフェニル、1,4−ビス[2−(4−アミノフェニル)−2−プロピル]ベンゼン(ビスアニリン)、1,4−ビス(4−アミノ−2−トリフルオロメチルフェノキシ)ベンゼン、2,2’−ジトリフルオロメチル−4,4’−ジアミノビフェニル、4,4’−ビス(4−アミノフェノキシ)ビフェニル、4,4’−ビス(3−アミノフェノキシ)ビフェニル、ビス[4−(3−アミノフェノキシ)フェニル]ケトン、ビス[4−(3−アミノフェノキシ)フェニル]スルフィド、ビス[4−(3−アミノフェノキシ)フェニル]スルホン、2,2−ビス[4−(3−アミノフェノキシ)フェニル]プロパン、2,2−ビス[4−(3−アミノフェノキシ)フェニル]−1,1,1,3,3,3−ヘキサフルオロプロパン、m−フェニレンジアミン、o−フェニレンジアミン、p−フェニレンジアミン、m−アミノベンジルアミン、p−アミノベンジルアミン、3,3’−ジアミノジフェニルエーテル、3,4’−ジアミノジフェニルエーテル、4,4’−ジアミノジフェニルエーテル、3,3’−ジアミノジフェニルスルフィド、3,3’−ジアミノジフェニルスルホキシド、3,4’−ジアミノジフェニルスルホキシド、4,4’−ジアミノジフェニルスルホキシド、3,3’−ジアミノジフェニルスルホン、3,4’−ジアミノジフェニルスルホン、4,4’−ジアミノジフェニルスルホン、3,3’−ジアミノベンゾフェノン、3,4’−ジアミノベンゾフェノン、4,4’−ジアミノベンゾフェノン、3,3’−ジアミノジフェニルメタン、3,4’−ジアミノジフェニルメタン、4,4’−ジアミノジフェニルメタン、ビス[4−(4−アミノフェノキシ)フェニル]メタン、1,1−ビス[4−(4−アミノフェノキシ)フェニル]エタン、1,2−ビス[4−(4−アミノフェノキシ)フェニル]エタン、1,1−ビス[4−(4−アミノフェノキシ)フェニル]プロパン、1,2−ビス[4−(4−アミノフェノキシ)フェニル]プロパン、1,3−ビス[4−(4−アミノフェノキシ)フェニル]プロパン、2,2−ビス[4−(4−アミノフェノキシ)フェニル]プロパン、1,1−ビス[4−(4−アミノフェノキシ)フェニル]ブタン、1,3−ビス[4−(4−アミノフェノキシ)フェニル]ブタン、1,4−ビス[4−(4−アミノフェノキシ)フェニル]ブタン、2,2−ビス[4−(4−アミノフェノキシ)フェニル]ブタン、2,3−ビス[4−(4−アミノフェノキシ)フェニル]ブタン、2−[4−(4−アミノフェノキシ)フェニル]−2−[4−(4−アミノフェノキシ)−3−メチルフェニル]プロパン、2,2−ビス[4−(4−アミノフェノキシ)−3−メチルフェニル]プロパン、2−[4−(4−アミノフェノキシ)フェニル]−2−[4−(4−アミノフェノキシ)−3,5−ジメチルフェニル]プロパン、2,2−ビス[4−(4−アミノフェノキシ)−3,5−ジメチルフェニル]プロパン、2,2−ビス[4−(4−アミノフェノキシ)フェニル]−1,1,1,3,3,3−ヘキサフルオロプロパン、1,4−ビス(3−アミノフェノキシ)ベンゼン、1,3−ビス(3−アミノフェノキシ)ベンゼン、1,4−ビス(4−アミノフェノキシ)ベンゼン、4,4’−ビス(4−アミノフェノキシ)ビフェニル、ビス[4−(4−アミノフェノキシ)フェニル]ケトン、ビス[4−(4−アミノフェノキシ)フェニル]スルフィド、ビス[4−(4−アミノフェノキシ)フェニル]スルホキシド、ビス[4−(4−アミノフェノキシ)フェニル]スルホン、ビス[4−(3−アミノフェノキシ)フェニル]エーテル、ビス[4−(4−アミノフェノキシ)フェニル]エーテル、1,3−ビス[4−(4−アミノフェノキシ)ベンゾイル]ベンゼン、1,3−ビス[4−(3−アミノフェノキシ)ベンゾイル]ベンゼン、1,4−ビス[4−(3−アミノフェノキシ)ベンゾイル]ベンゼン、4,4’−ビス[(3−アミノフェノキシ)ベンゾイル]ベンゼン、1,1−ビス[4−(3−アミノフェノキシ)フェニル]プロパン、1,3−ビス[4−(3−アミノフェノキシ)フェニル]プロパン、3,4’−ジアミノジフェニルスルフィド、2,2−ビス[3−(3−アミノフェノキシ)フェニル]−1,1,1,3,3,3−ヘキサフルオロプロパン、ビス[4−(3−アミノフェノキシ)フェニル]メタン、1,1−ビス[4−(3−アミノフェノキシ)フェニル]エタン、1,2−ビス[4−(3−アミノフェノキシ)フェニル]エタン、ビス[4−(3−アミノフェノキシ)フェニル]スルホキシド、4,4’−ビス[3−(4−アミノフェノキシ)ベンゾイル]ジフェニルエーテル、4,4’−ビス[3−(3−アミノフェノキシ)ベンゾイル]ジフェニルエーテル、4,4’−ビス[4−(4−アミノ−α,α−ジメチルベンジル)フェノキシ]ベンゾフェノン、4,4’−ビス[4−(4−アミノ−α,α−ジメチルベンジル)フェノキシ]ジフェニルスルホン、ビス[4−{4−(4−アミノフェノキシ)フェノキシ}フェニル]スルホン、1,4−ビス[4−(4−アミノフェノキシ)フェノキシ−α,α−ジメチルベンジル]ベンゼン、1,3−ビス[4−(4−アミノフェノキシ)フェノキシ−α,α−ジメチルベンジル]ベンゼン、1,3−ビス[4−(4−アミノ−6−トリフルオロメチルフェノキシ)−α,α−ジメチルベンジル]ベンゼン、1,3−ビス[4−(4−アミノ−6−フルオロフェノキシ)−α,α−ジメチルベンジル]ベンゼン、1,3−ビス[4−(4−アミノ−6−メチルフェノキシ)−α,α−ジメチルベンジル]ベンゼン、1,3−ビス[4−(4−アミノ−6−シアノフェノキシ)−α,α−ジメチルベンジル]ベンゼン、3,3’−ジアミノ−4,4’−ジフェノキシベンゾフェノン、4,4’−ジアミノ−5,5’−ジフェノキシベンゾフェノン、3,4’−ジアミノ−4,5’−ジフェノキシベンゾフェノン、3,3’−ジアミノ−4−フェノキシベンゾフェノン、4,4’−ジアミノ−5−フェノキシベンゾフェノン、3,4’−ジアミノ−4−フェノキシベンゾフェノン、3,4’−ジアミノ−5’−フェノキシベンゾフェノン、3,3’−ジアミノ−4,4’−ジビフェノキシベンゾフェノン、4,4’−ジアミノ−5,5’−ジビフェノキシベンゾフェノン、3,4’−ジアミノ−4,5’−ジビフェノキシベンゾフェノン、3,3’−ジアミノ−4−ビフェノキシベンゾフェノン、4,4’−ジアミノ−5−ビフェノキシベンゾフェノン、3,4’−ジアミノ−4−ビフェノキシベンゾフェノン、3,4’−ジアミノ−5’−ビフェノキシベンゾフェノン、1,3−ビス(3−アミノ−4−フェノキシベンゾイル)ベンゼン、1,4−ビス(3−アミノ−4−フェノキシベンゾイル)ベンゼン、1,3−ビス(4−アミノ−5−フェノキシベンゾイル)ベンゼン、1,4−ビス(4−アミノ−5−フェノキシベンゾイル)ベンゼン、1,3−ビス(3−アミノ−4−ビフェノキシベンゾイル)ベンゼン、1,4−ビス(3−アミノ−4−ビフェノキシベンゾイル)ベンゼン、1,3−ビス(4−アミノ−5−ビフェノキシベンゾイル)ベンゼン、1,4−ビス(4−アミノ−5−ビフェノキシベンゾイル)ベンゼン、2,6−ビス[4−(4−アミノ−α,α−ジメチルベンジル)フェノキシ]ベンゾニトリル、および上記芳香族ジアミンの芳香環上の水素原子の一部もしくは全てが、ハロゲン原子、炭素数1〜3のアルキル基またはアルコキシル基、シアノ基、またはアルキル基またはアルコキシル基の水素原子の一部もしくは全部がハロゲン原子で置換された炭素数1〜3のハロゲン化アルキル基またはアルコキシル基で置換された芳香族ジアミン等が挙げられる。 Examples of the aromatic diamine other than the aromatic diamine having the benzoxazole structure described above include 2,2′-dimethyl-4,4′-diaminobiphenyl, 1,4-bis [2- (4-aminophenyl). ) -2-propyl] benzene (bisaniline), 1,4-bis (4-amino-2-trifluoromethylphenoxy) benzene, 2,2′-ditrifluoromethyl-4,4′-diaminobiphenyl, 4,4 '-Bis (4-aminophenoxy) biphenyl, 4,4'-bis (3-aminophenoxy) biphenyl, bis [4- (3-aminophenoxy) phenyl] ketone, bis [4- (3-aminophenoxy) phenyl ] Sulfide, bis [4- (3-aminophenoxy) phenyl] sulfone, 2,2-bis [4- (3-aminophenoxy) phene Ru] propane, 2,2-bis [4- (3-aminophenoxy) phenyl] -1,1,1,3,3,3-hexafluoropropane, m-phenylenediamine, o-phenylenediamine, p-phenylene Diamine, m-aminobenzylamine, p-aminobenzylamine, 3,3′-diaminodiphenyl ether, 3,4′-diaminodiphenyl ether, 4,4′-diaminodiphenyl ether, 3,3′-diaminodiphenyl sulfide, 3,3 '-Diaminodiphenyl sulfoxide, 3,4'-diaminodiphenyl sulfoxide, 4,4'-diaminodiphenyl sulfoxide, 3,3'-diaminodiphenyl sulfone, 3,4'-diaminodiphenyl sulfone, 4,4'-diaminodiphenyl sulfone 3,3′-Diaminobenzopheno 3,4′-diaminobenzophenone, 4,4′-diaminobenzophenone, 3,3′-diaminodiphenylmethane, 3,4′-diaminodiphenylmethane, 4,4′-diaminodiphenylmethane, bis [4- (4-aminophenoxy ) Phenyl] methane, 1,1-bis [4- (4-aminophenoxy) phenyl] ethane, 1,2-bis [4- (4-aminophenoxy) phenyl] ethane, 1,1-bis [4- ( 4-aminophenoxy) phenyl] propane, 1,2-bis [4- (4-aminophenoxy) phenyl] propane, 1,3-bis [4- (4-aminophenoxy) phenyl] propane, 2,2-bis [4- (4-aminophenoxy) phenyl] propane, 1,1-bis [4- (4-aminophenoxy) phenyl] butane, 1,3- Bis [4- (4-aminophenoxy) phenyl] butane, 1,4-bis [4- (4-aminophenoxy) phenyl] butane, 2,2-bis [4- (4-aminophenoxy) phenyl] butane, 2,3-bis [4- (4-aminophenoxy) phenyl] butane, 2- [4- (4-aminophenoxy) phenyl] -2- [4- (4-aminophenoxy) -3-methylphenyl] propane 2,2-bis [4- (4-aminophenoxy) -3-methylphenyl] propane, 2- [4- (4-aminophenoxy) phenyl] -2- [4- (4-aminophenoxy) -3 , 5-dimethylphenyl] propane, 2,2-bis [4- (4-aminophenoxy) -3,5-dimethylphenyl] propane, 2,2-bis [4- (4-aminophenoxy) phenyl -1,1,1,3,3,3-hexafluoropropane, 1,4-bis (3-aminophenoxy) benzene, 1,3-bis (3-aminophenoxy) benzene, 1,4-bis (4 -Aminophenoxy) benzene, 4,4'-bis (4-aminophenoxy) biphenyl, bis [4- (4-aminophenoxy) phenyl] ketone, bis [4- (4-aminophenoxy) phenyl] sulfide, bis [ 4- (4-aminophenoxy) phenyl] sulfoxide, bis [4- (4-aminophenoxy) phenyl] sulfone, bis [4- (3-aminophenoxy) phenyl] ether, bis [4- (4-aminophenoxy) Phenyl] ether, 1,3-bis [4- (4-aminophenoxy) benzoyl] benzene, 1,3-bis [4- (3-aminophene) Xyl) benzoyl] benzene, 1,4-bis [4- (3-aminophenoxy) benzoyl] benzene, 4,4′-bis [(3-aminophenoxy) benzoyl] benzene, 1,1-bis [4- ( 3-aminophenoxy) phenyl] propane, 1,3-bis [4- (3-aminophenoxy) phenyl] propane, 3,4'-diaminodiphenyl sulfide, 2,2-bis [3- (3-aminophenoxy) Phenyl] -1,1,1,3,3,3-hexafluoropropane, bis [4- (3-aminophenoxy) phenyl] methane, 1,1-bis [4- (3-aminophenoxy) phenyl] ethane 1,2-bis [4- (3-aminophenoxy) phenyl] ethane, bis [4- (3-aminophenoxy) phenyl] sulfoxide, 4,4′-bis [ 3- (4-aminophenoxy) benzoyl] diphenyl ether, 4,4′-bis [3- (3-aminophenoxy) benzoyl] diphenyl ether, 4,4′-bis [4- (4-amino-α, α-dimethyl) Benzyl) phenoxy] benzophenone, 4,4′-bis [4- (4-amino-α, α-dimethylbenzyl) phenoxy] diphenylsulfone, bis [4- {4- (4-aminophenoxy) phenoxy} phenyl] sulfone 1,4-bis [4- (4-aminophenoxy) phenoxy-α, α-dimethylbenzyl] benzene, 1,3-bis [4- (4-aminophenoxy) phenoxy-α, α-dimethylbenzyl] benzene 1,3-bis [4- (4-amino-6-trifluoromethylphenoxy) -α, α-dimethylbenzyl] benzene, , 3-bis [4- (4-amino-6-fluorophenoxy) -α, α-dimethylbenzyl] benzene, 1,3-bis [4- (4-amino-6-methylphenoxy) -α, α- Dimethylbenzyl] benzene, 1,3-bis [4- (4-amino-6-cyanophenoxy) -α, α-dimethylbenzyl] benzene, 3,3′-diamino-4,4′-diphenoxybenzophenone, 4 , 4′-diamino-5,5′-diphenoxybenzophenone, 3,4′-diamino-4,5′-diphenoxybenzophenone, 3,3′-diamino-4-phenoxybenzophenone, 4,4′-diamino- 5-phenoxybenzophenone, 3,4'-diamino-4-phenoxybenzophenone, 3,4'-diamino-5'-phenoxybenzophenone, 3,3'-diamino -4,4'-dibiphenoxybenzophenone, 4,4'-diamino-5,5'-dibiphenoxybenzophenone, 3,4'-diamino-4,5'-dibiphenoxybenzophenone, 3,3'-diamino-4 -Biphenoxybenzophenone, 4,4'-diamino-5-biphenoxybenzophenone, 3,4'-diamino-4-biphenoxybenzophenone, 3,4'-diamino-5'-biphenoxybenzophenone, 1,3-bis (3-amino-4-phenoxybenzoyl) benzene, 1,4-bis (3-amino-4-phenoxybenzoyl) benzene, 1,3-bis (4-amino-5-phenoxybenzoyl) benzene, 1,4- Bis (4-amino-5-phenoxybenzoyl) benzene, 1,3-bis (3-amino-4-biphenoxyben) Yl) benzene, 1,4-bis (3-amino-4-biphenoxybenzoyl) benzene, 1,3-bis (4-amino-5-biphenoxybenzoyl) benzene, 1,4-bis (4-amino-) 5-biphenoxybenzoyl) benzene, 2,6-bis [4- (4-amino-α, α-dimethylbenzyl) phenoxy] benzonitrile, and some or all of the hydrogen atoms on the aromatic ring of the aromatic diamine Is a halogen atom, an alkyl group having 1 to 3 carbon atoms or an alkoxyl group, a cyano group, or an alkyl group or alkoxyl group in which some or all of the hydrogen atoms are substituted with halogen atoms. An aromatic diamine substituted with a group or an alkoxyl group.
前記脂肪族ジアミン類としては、例えば、1,2−ジアミノエタン、1,4−ジアミノブタン、1,5−ジアミノペンタン、1,6−ジアミノヘキサン、1,8−ジアミノオクタン等が挙げられる。
前記脂環式ジアミン類としては、例えば、1,4−ジアミノシクロヘキサン、4,4’−メチレンビス(2,6−ジメチルシクロヘキシルアミン)等が挙げられる。
芳香族ジアミン類以外のジアミン(脂肪族ジアミン類および脂環式ジアミン類)の合計量は、全ジアミン類の20質量%以下が好ましく、より好ましくは10質量%以下、さらに好ましくは5質量%以下である。換言すれば、芳香族ジアミン類は全ジアミン類の80質量%以上が好ましく、より好ましくは90質量%以上、さらに好ましくは95質量%以上である。Examples of the aliphatic diamines include 1,2-diaminoethane, 1,4-diaminobutane, 1,5-diaminopentane, 1,6-diaminohexane, 1,8-diaminooctane, and the like.
Examples of the alicyclic diamines include 1,4-diaminocyclohexane, 4,4′-methylenebis (2,6-dimethylcyclohexylamine), and the like.
The total amount of diamines other than aromatic diamines (aliphatic diamines and alicyclic diamines) is preferably 20% by mass or less, more preferably 10% by mass or less, and still more preferably 5% by mass or less of the total diamines. It is. In other words, the aromatic diamine is preferably 80% by mass or more of the total diamines, more preferably 90% by mass or more, and still more preferably 95% by mass or more.
ポリアミド酸を構成するテトラカルボン酸類としては、ポリイミド合成に通常用いられる芳香族テトラカルボン酸類(その酸無水物を含む)、脂肪族テトラカルボン酸類(その酸無水物を含む)、脂環族テトラカルボン酸類(その酸無水物を含む)を用いることができる。中でも、芳香族テトラカルボン酸無水物類、脂環族テトラカルボン酸無水物類が好ましく、耐熱性の観点からは芳香族テトラカルボン酸無水物類がより好ましく、光透過性の観点からは脂環族テトラカルボン酸類がより好ましい。これらが酸無水物である場合、分子内に無水物構造は1個であってもよいし2個であってもよいが、好ましくは2個の無水物構造を有するもの(二無水物)がよい。テトラカルボン酸類は単独で用いてもよいし、二種以上を併用してもよい。 The tetracarboxylic acids constituting the polyamic acid include aromatic tetracarboxylic acids (including acid anhydrides), aliphatic tetracarboxylic acids (including acid anhydrides), and alicyclic tetracarboxylic acids that are commonly used for polyimide synthesis. Acids (including acid anhydrides thereof) can be used. Among them, aromatic tetracarboxylic acid anhydrides and alicyclic tetracarboxylic acid anhydrides are preferable, aromatic tetracarboxylic acid anhydrides are more preferable from the viewpoint of heat resistance, and alicyclic from the viewpoint of light transmission. Group tetracarboxylic acids are more preferred. In the case where these are acid anhydrides, the number of anhydride structures in the molecule may be one or two, but those having two anhydride structures (dianhydrides) are preferred. Good. Tetracarboxylic acids may be used alone or in combination of two or more.
脂環族テトラカルボン酸類としては、例えば、シクロブタンテトラカルボン酸、1,2,4,5−シクロヘキサンテトラカルボン酸、3,3’,4,4’−ビシクロヘキシルテトラカルボン酸等の脂環族テトラカルボン酸、およびこれらの酸無水物が挙げられる。これらの中でも、2個の無水物構造を有する二無水物(例えば、シクロブタンテトラカルボン酸二無水物、1,2,4,5−シクロヘキサンテトラカルボン酸二無水物、3,3’,4,4’−ビシクロヘキシルテトラカルボン酸二無水物等)が好適である。なお、脂環族テトラカルボン酸類は単独で用いてもよいし、二種以上を併用してもよい。
脂環式テトラカルボン酸類は、透明性を重視する場合には、例えば、全テトラカルボン酸類の80質量%以上が好ましく、より好ましくは90質量%以上、さらに好ましくは95質量%以上である。Examples of the alicyclic tetracarboxylic acids include alicyclic tetracarboxylic acids such as cyclobutanetetracarboxylic acid, 1,2,4,5-cyclohexanetetracarboxylic acid, and 3,3 ′, 4,4′-bicyclohexyltetracarboxylic acid. Carboxylic acids and their acid anhydrides are mentioned. Among these, dianhydrides having two anhydride structures (for example, cyclobutanetetracarboxylic dianhydride, 1,2,4,5-cyclohexanetetracarboxylic dianhydride, 3,3 ′, 4,4 '-Bicyclohexyltetracarboxylic dianhydride and the like) are preferred. In addition, alicyclic tetracarboxylic acids may be used independently and may use 2 or more types together.
In the case where importance is attached to transparency, the alicyclic tetracarboxylic acids are, for example, preferably 80% by mass or more of all tetracarboxylic acids, more preferably 90% by mass or more, and further preferably 95% by mass or more.
芳香族テトラカルボン酸類としては、特に限定されないが、ピロメリット酸残基(すなわちピロメリット酸由来の構造を有するもの)であることが好ましく、その酸無水物であることがより好ましい。このような芳香族テトラカルボン酸類としては、例えば、ピロメリット酸二無水物、3,3’,4,4’−ビフェニルテトラカルボン酸二無水物、4,4’−オキシジフタル酸二無水物、3,3’,4,4’−ベンゾフェノンテトラカルボン酸二無水物、3,3’,4,4’−ジフェニルスルホンテトラカルボン酸二無水物、2,2−ビス[4−(3,4−ジカルボキシフェノキシ)フェニル]プロパン酸無水物等が挙げられる。
芳香族テトラカルボン酸類は、耐熱性を重視する場合には、例えば、全テトラカルボン酸類の80質量%以上が好ましく、より好ましくは90質量%以上、さらに好ましくは95質量%以上である。The aromatic tetracarboxylic acids are not particularly limited, but are preferably pyromellitic acid residues (that is, those having a structure derived from pyromellitic acid), and more preferably acid anhydrides thereof. Examples of such aromatic tetracarboxylic acids include pyromellitic dianhydride, 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride, 4,4′-oxydiphthalic dianhydride, 3 , 3 ′, 4,4′-benzophenone tetracarboxylic dianhydride, 3,3 ′, 4,4′-diphenylsulfone tetracarboxylic dianhydride, 2,2-bis [4- (3,4-di Carboxyphenoxy) phenyl] propanoic anhydride and the like.
In the case of placing importance on heat resistance, the aromatic tetracarboxylic acids are, for example, preferably 80% by mass or more, more preferably 90% by mass or more, and still more preferably 95% by mass or more of all tetracarboxylic acids.
本発明のポリイミドフィルムは、ガラス転移温度が250℃以上、好ましくは300℃以上、さらに好ましくは350℃以上であり、あるいは500℃以下の領域においてガラス転移点が観測されないことが好ましい。本発明におけるガラス転移温度は、示差熱分析(DSC)により求めるものである。 The polyimide film of the present invention preferably has a glass transition temperature of 250 ° C. or higher, preferably 300 ° C. or higher, more preferably 350 ° C. or higher, or no glass transition point is observed in the region of 500 ° C. or lower. The glass transition temperature in the present invention is determined by differential thermal analysis (DSC).
本発明の高分子フィルムの線膨張係数(CTE)は、好ましくは、−5ppm/K〜+20ppm/Kであり、より好ましくは−5ppm/K〜+15ppm/Kであり、さらに好ましくは1ppm/K〜+10ppm/Kである。CTEが前記範囲であると、一般的な支持体との線膨張係数の差を小さく保つことができ、熱を加えるプロセスに供してもポリイミドフィルムと無機物からなる支持体とが剥がれることを回避できる。 The linear expansion coefficient (CTE) of the polymer film of the present invention is preferably −5 ppm / K to +20 ppm / K, more preferably −5 ppm / K to +15 ppm / K, and further preferably 1 ppm / K to +10 ppm / K. When the CTE is in the above range, the difference in coefficient of linear expansion from a general support can be kept small, and the polyimide film and the support made of an inorganic material can be prevented from being peeled even when subjected to a process of applying heat. .
本発明における高分子フィルムの破断強度は、60MPa以上、好ましくは120MP以上、さらに好ましくは240MPa以上である。破断強度の上限に制限は無いが、事実上1000MPa程度未満である。なお、ここで前記高分子フィルムの破断強度とは、高分子フィルムのタテ方向とヨコ方向の平均値をさす。
本発明における高分子フィルムと無機基板の接着強度は、前記高分子フィルムの破断強度の1/2以下であることが必要である。
仮に、厚さ10μmのフィルムを用いた本発明の積層体において、フィルムの接着強度が0.5N/cmであったとする。
幅10mmのフィルムに加わる破断力は、0.5N/(10μm×10mm)=0.5N/0.1平方mm=5MPaとなる。かような場合、フィルムにこの10倍程度すなわち50MPa以上の破断強度があれば、フィルムを剥離する際に支障なく剥離操作が可能となる。
該接着強度は、好ましくは前記高分子フィルムの破断強度の1/3以下、より好ましくは1/4以下である。The breaking strength of the polymer film in the present invention is 60 MPa or more, preferably 120 MP or more, more preferably 240 MPa or more. The upper limit of the breaking strength is not limited, but is practically less than about 1000 MPa. Here, the breaking strength of the polymer film refers to an average value in the vertical direction and the horizontal direction of the polymer film.
In the present invention, the adhesive strength between the polymer film and the inorganic substrate needs to be ½ or less of the breaking strength of the polymer film.
Suppose that in the laminate of the present invention using a film having a thickness of 10 μm, the adhesive strength of the film was 0.5 N / cm.
The breaking force applied to the film having a width of 10 mm is 0.5 N / (10 μm × 10 mm) = 0.5 N / 0.1 square mm = 5 MPa. In such a case, if the film has a breaking strength of about 10 times, that is, 50 MPa or more, the peeling operation can be performed without any trouble when the film is peeled off.
The adhesive strength is preferably 1/3 or less, more preferably 1/4 or less of the breaking strength of the polymer film.
本発明における良好接着部分とは、無機基板とポリイミドフィルムの接着強度が強い部分を指し、本発明における易剥離部分とは、無機基板とポリイミドフィルムの接着強度が弱い部分を指す。前記易剥離部分の接着強度は、良好接着部分の接着強度の1/2以下であることが好ましく、より好ましくは、1/3以下、さらに好ましくは1/4以下である。接着強度の下限値は特に制限されないが、前記良好接着部分においては0.5N/cm以上、前記易剥離部分においては0.01N/cm以上であることが好ましい。 In the present invention, the good adhesion portion refers to a portion where the adhesive strength between the inorganic substrate and the polyimide film is strong, and the easy peelable portion refers to a portion where the adhesion strength between the inorganic substrate and the polyimide film is weak. The adhesive strength of the easily peelable portion is preferably 1/2 or less, more preferably 1/3 or less, and further preferably 1/4 or less of the adhesive strength of the good adhesive portion. Although the lower limit value of the adhesive strength is not particularly limited, it is preferably 0.5 N / cm or more at the good adhesion portion and 0.01 N / cm or more at the easy peel portion.
本発明における高分子フィルムの厚さ斑は、20%以下であることが好ましく、より好ましくは12%以下、さらに好ましくは7%以下、特に好ましくは4%以下である。厚さ斑が20%を超えると、狭小部へ適用し難くなる傾向がある。なお、フィルムの厚さ斑は、例えば接触式の膜厚計にて被測定フィルムから無作為に10点程度の位置を抽出してフィルム厚を測定し、下記式に基づき求めることができる。
フィルムの厚さ斑(%)
=100×(最大フィルム厚−最小フィルム厚)÷平均フィルム厚The thickness unevenness of the polymer film in the present invention is preferably 20% or less, more preferably 12% or less, still more preferably 7% or less, and particularly preferably 4% or less. When the thickness unevenness exceeds 20%, it tends to be difficult to apply to narrow portions. In addition, the thickness unevenness of a film can be calculated | required based on the following formula, for example, extracting about 10 points | pieces positions from a film to be measured at random with a contact-type film thickness meter, measuring film thickness.
Film thickness spots (%)
= 100 × (maximum film thickness−minimum film thickness) ÷ average film thickness
本発明における高分子フィルムは、その製造時において幅が300mm以上、長さが10m以上の長尺ポリイミドフィルムとして巻き取られた形態で得られるものが好ましく、巻取りコアに巻き取られたロール状ポリイミドフィルムの形態のものがより好ましい。 The polymer film in the present invention is preferably obtained in the form of being wound as a long polyimide film having a width of 300 mm or more and a length of 10 m or more at the time of production, and is a roll wound around a winding core. The thing of the form of a polyimide film is more preferable.
高分子フィルムにおいては、ハンドリング性および生産性を確保する為、フィルム中に滑材(粒子)を添加・含有させて、高分子ドフィルム表面に微細な凹凸を付与して滑り性を確保することが好ましい。前記滑材(粒子)とは、好ましくは無機物からなる微粒子であり、金属、金属酸化物、金属窒化物、金属炭素化物、金属酸塩、リン酸塩、炭酸塩、タルク、マイカ、クレイ、その他粘土鉱物、等からなる粒子を用いることができる。好ましくは、酸化珪素、リン酸カルシウム、リン酸水素カルシウム、リン酸二水素カルシウム、ピロリン酸カルシウム、ヒドロキシアパタイト、炭酸カルシウム、ガラスフィラーなどの金属酸化物、リン酸塩、炭酸塩を用いることができる。滑材は1種のみであってもよいし、2種以上であってもよい。 In polymer films, in order to ensure handling and productivity, lubricants (particles) are added to and contained in the film to provide fine irregularities on the polymer film surface to ensure slipperiness. Is preferred. The lubricant (particles) are preferably fine particles made of an inorganic substance, such as metals, metal oxides, metal nitrides, metal carbonides, metal acid salts, phosphates, carbonates, talc, mica, clay, and others. Particles made of clay minerals and the like can be used. Preferably, metal oxides such as silicon oxide, calcium phosphate, calcium hydrogen phosphate, calcium dihydrogen phosphate, calcium pyrophosphate, hydroxyapatite, calcium carbonate, glass filler, phosphates, and carbonates can be used. Only one type of lubricant may be used, or two or more types may be used.
前記滑材(粒子)の体積平均粒子径は、通常0.001〜10μmであり、好ましくは0.03〜2.5μm、より好ましくは0.05〜0.7μm、さらに好ましくは0.05〜0.3μmである。かかる体積平均粒子径は光散乱法で得られる測定値を基準とする。粒子径が下限より小さいと高分子フィルムの工業的生産が困難となり、また上限を超えると表面の凹凸が大きくなりすぎて貼り付け強度が弱くなり、実用上の支障が出る虞がある。 The volume average particle diameter of the lubricant (particles) is usually 0.001 to 10 μm, preferably 0.03 to 2.5 μm, more preferably 0.05 to 0.7 μm, still more preferably 0.05 to 0.3 μm. The volume average particle diameter is based on a measurement value obtained by a light scattering method. If the particle diameter is smaller than the lower limit, industrial production of the polymer film becomes difficult, and if the particle diameter exceeds the upper limit, the surface irregularities become too large and the sticking strength becomes weak, which may cause practical problems.
前記滑材の添加量は、高分子フィルム中の高分子成分に対する添加量として、0.02〜50質量%であり、好ましくは0.04〜3質量%、より好ましくは0.08〜1.2質量%である。滑材の添加量が少なすぎると滑材添加の効果が期待し難く、滑り性の確保がそれほどなく高分子フィルム製造に支障をきたす場合があり、多すぎると、フィルムの表面凹凸が大きくなり過ぎて、滑り性の確保が見られても平滑性の低下を招いたり、高分子フィルムの破断強度や破断伸度の低下を招いたり、CTEの上昇を招くなどの課題を招く場合がある。 The addition amount of the lubricant is 0.02 to 50% by mass, preferably 0.04 to 3% by mass, more preferably 0.08 to 1% as the addition amount with respect to the polymer component in the polymer film. 2% by mass. If the amount of lubricant added is too small, it is difficult to expect the effect of lubricant addition, and there is a case where the slipperiness is not sufficiently secured, which may hinder the production of polymer film. Even if the slipperiness is ensured, the smoothness may be lowered, the breaking strength or breaking elongation of the polymer film may be lowered, or the CTE may be raised.
高分子フィルムに滑材(粒子)を添加・含有させる場合、滑材が均一に分散した単層の高分子フィルムとしてもよいが、例えば、一方の面が滑材を含有させた高分子フィルムで構成され、他方の面が滑材を含有しないか含有していても滑材含有量が少量である高分子フィルムで構成された多層の高分子フィルムとしてもよい。このような多層高分子のフィルムにおいては、一方の層(フィルム)表面に微細な凹凸が付与されて該層(フィルム)で滑り性を確保することができ、良好なハンドリング性や生産性を確保できる。 When a lubricant (particles) is added to and contained in a polymer film, a single-layer polymer film in which the lubricant is uniformly dispersed may be used. For example, one surface may be a polymer film containing a lubricant. It is good also as a multilayer polymer film comprised by the polymer film which is comprised and the other surface does not contain a lubricant, or contains the lubricant, even if it contains a lubricant. In such a multilayer polymer film, fine unevenness is given to the surface of one layer (film), so that the slipperiness can be secured by the layer (film), and good handling properties and productivity are secured. it can.
多層高分子フィルムは、溶融延伸製膜法に製造されるフィルムの場合、例えばまず、滑剤含有しない高分子フィルム原料を用いてフィルム化を行い、その工程途上に置いて少なくともフィルムの片面に、滑剤を含有する樹脂層を塗布することにより得ることが出来る。もちろん、この逆で、滑剤を含有する高分子フィルム原料を用いてフィルム化を行い、その工程途上、ないし、フィルム化が完了した後に、滑剤を含有しない高分子フィルム原料を塗布してフィルムを得ることも出来る。
ポリイミドフィルムのような溶液製膜法を用いて得られる高分子フィルムの場合にも同様で、例えば、ポリアミド酸溶液(ポリイミドの前駆体溶液)として、滑材(好ましくは平均粒子径0.05〜2.5μm程度)をポリアミド酸溶液中のポリマー固形分に対して0.02質量%〜50質量%(好ましくは0.04〜3質量%、より好ましくは0.08〜1.2質量%)含有したポリアミド酸溶液と、滑材を含有しないか又はその含有量が少量(好ましくはポリアミド酸溶液中のポリマー固形分に対して0.02質量%未満、より好ましくは0.01質量%未満)である2種のポリアミド酸溶液を用いて製造することができる。In the case of a film produced by a melt-stretching film-forming method, for example, a multilayer polymer film is first formed into a film using a raw material for a polymer film that does not contain a lubricant, and is placed on the film at least on one side of the process. It can obtain by apply | coating the resin layer containing this. Of course, conversely, film formation is performed using a polymer film material containing a lubricant, and a film is obtained by applying a polymer film material not containing a lubricant during the process or after film formation is completed. You can also
The same applies to a polymer film obtained by using a solution casting method such as a polyimide film. For example, as a polyamic acid solution (polyimide precursor solution), a lubricant (preferably an average particle size of 0.05 to About 2.5 μm) to 0.02 mass% to 50 mass% (preferably 0.04 to 3 mass%, more preferably 0.08 to 1.2 mass%) based on the polymer solid content in the polyamic acid solution. Containing polyamic acid solution and no lubricant or a small amount thereof (preferably less than 0.02% by mass, more preferably less than 0.01% by mass with respect to polymer solids in the polyamic acid solution) Can be produced using two types of polyamic acid solutions.
多層高分子フィルムの多層化(積層)方法は、両層の密着に問題が生じなければ、特に限定されるものではなく、かつ接着剤層などを介することなく密着するものであればよい。
ポリイミドフィルムの場合、例えば、i)一方のポリイミドフィルムを作製後、このポリイミドフィルム上に他方のポリアミド酸溶液を連続的に塗布してイミド化する方法、ii)一方のポリアミド酸溶液を流延しポリアミド酸フィルムを作製後このポリアミド酸フィルム上に他方のポリアミド酸溶液を連続的に塗布した後、イミド化する方法、iii)共押し出しによる方法、iv)滑材を含有しないか又はその含有量が少量であるポリアミド酸溶液で形成したフィルムの上に、滑材を多く含有するポリアミド酸溶液をスプレーコート、Tダイ塗工などで塗布してイミド化する方法などを例示できる。本発明では、上記i)ないし上記ii)の方法を用いることが好ましい。The method of multilayering (lamination) of the multilayer polymer film is not particularly limited as long as no problem occurs in the adhesion between both layers, and any method may be used as long as the adhesion is achieved without using an adhesive layer or the like.
In the case of a polyimide film, for example, i) a method in which one polyimide film is produced and then the other polyamic acid solution is continuously applied onto the polyimide film to imidize, and ii) one polyamic acid solution is cast. After producing the polyamic acid film, the other polyamic acid solution is continuously applied onto the polyamic acid film and then imidized, iii) a method by co-extrusion, iv) a lubricant is not contained or the content thereof is An example is a method of imidizing a polyamic acid solution containing a large amount of a lubricant on a film formed with a small amount of a polyamic acid solution by spray coating, T-die coating, or the like. In the present invention, it is preferable to use the methods i) to ii).
多層の高分子フィルムにおける各層の厚さの比率は、特に限定されないが、滑材を多く含有する高分子層を(a)層、滑材を含有しないか又はその含有量が少量である高分子層を(b)層とすると、(a)層/(b)層は0.05〜0.95が好ましい。(a)層/(b)層が0.95を超えると(b)層の平滑性が失われがちとなり、一方0.05未満の場合、表面特性の改良効果が不足し易滑性が失われることがある。 The ratio of the thickness of each layer in the multi-layer polymer film is not particularly limited, but the polymer layer containing a large amount of the lubricant (a) is a layer, the polymer does not contain the lubricant or the content thereof is small. When the layer is the (b) layer, the (a) layer / (b) layer is preferably 0.05 to 0.95. If the (a) layer / (b) layer exceeds 0.95, the smoothness of the (b) layer tends to be lost. May be.
<高分子フィルムの表面活性化処理>
本発明において用いられる高分子フィルムには表面活性化処理を行うことが好ましい。該表面活性化処理によって、高分子フィルム表面は官能基が存在する状態(いわゆる活性化した状態)に改質され、無機基板に対する接着性が向上する。
本発明における表面活性化処理とは、乾式、ないし湿式の表面処理である。本発明の乾式処理としては、紫外線、電子線、X線などの活性エネルギー線を表面に照射する処理、コロナ処理、真空プラズマ処理、常圧プラズマ処理、火炎処理、イトロ処理等を用いることが出来る。湿式処理としては、フィルム表面を酸ないしアルカリ溶液に接触させる処理を例示できる。本発明に置いて好ましく用いられる表面活性化処理は、プラズマ処理であり、プラズマ処理と湿式の酸処理の組み合わせである。<Surface activation treatment of polymer film>
The polymer film used in the present invention is preferably subjected to a surface activation treatment. By the surface activation treatment, the surface of the polymer film is modified to a state in which a functional group is present (so-called activated state), and adhesion to the inorganic substrate is improved.
The surface activation treatment in the present invention is a dry or wet surface treatment. As the dry treatment of the present invention, treatment of irradiating active energy rays such as ultraviolet rays, electron beams, and X-rays on the surface, corona treatment, vacuum plasma treatment, atmospheric pressure plasma treatment, flame treatment, and intro treatment can be used. . Examples of the wet treatment include a treatment in which the film surface is brought into contact with an acid or alkali solution. The surface activation treatment preferably used in the present invention is plasma treatment, which is a combination of plasma treatment and wet acid treatment.
プラズマ処理は、特に限定されるものではないが、真空中でのRFプラズマ処理、マイクロ波プラズマ処理、マイクロ波ECRプラズマ処理、大気圧プラズマ処理、コロナ処理などがあり、フッ素を含むガス処理、イオン源を使ったイオン打ち込み処理、PBII法を使った処理、熱プラズマに暴露する火炎処理、イトロ処理なども含める。これらの中でも真空中でのRFプラズマ処理、マイクロ波プラズマ処理、大気圧プラズマ処理が好ましい。 The plasma treatment is not particularly limited, but includes RF plasma treatment in vacuum, microwave plasma treatment, microwave ECR plasma treatment, atmospheric pressure plasma treatment, corona treatment, etc., gas treatment containing fluorine, ion Includes ion implantation using a source, treatment using PBII, flame treatment exposed to thermal plasma, and intro treatment. Among these, RF plasma treatment, microwave plasma treatment, and atmospheric pressure plasma treatment in vacuum are preferable.
プラズマ処理の適当な条件としては、酸素プラズマ、CF4、C2F6などフッ素を含むプラズマなど化学的にエッチング効果が高いことが知られるプラズマ、或はArプラズマのように物理的なエネルギーを高分子表面に与えて物理的にエッチングする効果の高いプラズマによる処理が望ましい。また、CO2、H2、N2などプラズマ、およびこれらの混
合気体や、さらに水蒸気を付加することも好ましい。短時間での処理を目指す場合、プラズマのエネルギー密度が高く、プラズマ中のイオンの持つ運動エネルギーが高いもの、活性種の数密度が高いプラズマが望ましい。この観点からは、マイクロ波プラズマ処理、マイクロ波ECRプラズマ処理、高いエネルギーのイオンを打ち込みやすいイオン源によるプラズマ照射、PBII法なども望ましい。Appropriate conditions for the plasma treatment include oxygen plasma, plasma containing fluorine such as CF4 and C2F6, plasma known to have a high etching effect, or physical energy such as Ar plasma on the polymer surface. It is desirable to use plasma with a high effect of applying and physically etching. Further, it is also preferable to add plasma such as CO2, H2, and N2, a mixed gas thereof, and further water vapor. When aiming at processing in a short time, a plasma having a high plasma energy density, a high kinetic energy of ions in the plasma, and a high number density of active species are desirable. From this point of view, microwave plasma treatment, microwave ECR plasma treatment, plasma irradiation with an ion source that easily implants high-energy ions, PBII method, and the like are also desirable.
かかる表面活性化処理は高分子表面を清浄化し、さらに活性な官能基を生成する。生成した官能基は、カップリング剤層と水素結合ないし化学反応により結びつき、高分子フィルム層とカップリング剤層とを強固に接着することが可能となる。
プラズマ処理においては高分子フィルム表面をエッチングする効果も得ることが出来る。特に滑剤粒子を比較的多く含む高分子フィルムにおいては、滑剤による突起が、フィルムと無機基板との接着を阻害する場合がある。この場合、プラズマ処理によって高分子フィルム表面を薄くエッチングし、滑剤粒子の一部を露出せしめた上で、フ酸にて処理を行えば、フィルム表面近傍の滑剤粒子を除去することが可能である。Such surface activation treatment cleans the polymer surface and produces more active functional groups. The generated functional group is bonded to the coupling agent layer by hydrogen bonding or chemical reaction, and the polymer film layer and the coupling agent layer can be firmly bonded.
In the plasma treatment, the effect of etching the surface of the polymer film can also be obtained. In particular, in a polymer film containing a relatively large amount of lubricant particles, protrusions due to the lubricant may inhibit the adhesion between the film and the inorganic substrate. In this case, it is possible to remove the lubricant particles in the vicinity of the film surface by thinly etching the surface of the polymer film by plasma treatment to expose a part of the lubricant particles and then treating with hydrofluoric acid. .
表面活性化処理は、高分子フィルムの片面のみに施してもよいし、両面に施してもよい。片面にプラズマ処理を行う場合、並行平板型電極でのプラズマ処理で片側の電極上に高分子フィルムを接して置くことにより、高分子フィルムの電極と接していない側の面のみにプラズマ処理を施すことができる。また2枚の電極間の空間に電気的に浮かせる状態で高分子フィルムを置くようにすれば、両面にプラズマ処理が行える。また、高分子フィルムの片面に保護フィルムを貼った状態でプラズマ処理を行うことで片面処理が可能となる。なお保護フィルムとしては粘着剤付のPETフィルムやオレフィンフィルムなどが使用できる。 The surface activation treatment may be performed only on one side of the polymer film or on both sides. When plasma treatment is performed on one side, the polymer film is placed in contact with the electrode on one side in the plasma treatment with parallel plate electrodes, so that only the side of the polymer film not in contact with the electrode is subjected to plasma treatment. be able to. If a polymer film is placed in a state where it is electrically floated in the space between the two electrodes, plasma treatment can be performed on both sides. Moreover, single-sided processing becomes possible by performing plasma processing in the state which stuck the protective film on the single side | surface of the polymer film. In addition, as a protective film, a PET film with an adhesive or an olefin film can be used.
<フィルム側のパターン化処理>
本発明においては高分子フィルム側にパターン化処理を行うことができる。ここにパターン化とは、意図的に表面活性化処理の活性度等を操作した領域を作ることを云う。これにより、積層体において無機基板と高分子フィルムとの間の接着強度が異なる良好接着部分と易剥離部分を有し、該良好接着部分と該易剥離部分とが所定のパターンを形成することができる。パターン化処理として、表面活性化処理を行う際に、あらかじめ所定のパターンで準備されたマスクを用いて表面活性化処理量を操作する方法を例示できる。また表面活性化処理を行う際にマスキングないしスキャン操作などの手法を併用することによりパターン化することも可能である。表面活性化後の高分子フィルム表面に、さらに別の活性エネルギー線処理をマスキングないしスキャニングを併用して行い、活性度の強弱を実現することも可能である。ここに活性エネルギー線照射とは、紫外線、電子線、X線等のエネルギー線を照射する操作、さらには極短波長の紫外線照射処理のように紫外線照射光効果と同時に照射面近傍で発生するオゾンガスガス暴露の効果を併せ持つものを含める。さらにこれらの他に、コロナ処理、真空プラズマ処理、常圧プラズマ処理、サンドブラスと処理等によってパターン化処理を行うことも可能である。<Pattern processing on the film side>
In the present invention, the patterning treatment can be performed on the polymer film side. Here, patterning refers to creating a region where the activity of the surface activation treatment is intentionally manipulated. Thereby, the laminate has a good adhesion part and an easy peeling part with different adhesive strengths between the inorganic substrate and the polymer film, and the good adhesion part and the easy peeling part form a predetermined pattern. it can. An example of the patterning process is a method of manipulating the surface activation process amount using a mask prepared in a predetermined pattern in advance when the surface activation process is performed. Further, when performing the surface activation treatment, it is possible to form a pattern by using a technique such as masking or scanning operation together. The surface of the polymer film after the surface activation can be further subjected to another active energy ray treatment in combination with masking or scanning to realize the intensity of activity. Here, the active energy ray irradiation means the operation of irradiating energy rays such as ultraviolet rays, electron rays, X-rays, etc., and ozone gas generated near the irradiated surface simultaneously with the ultraviolet ray irradiation light effect as in the ultraviolet ray irradiation treatment of an extremely short wavelength. Include gas exposure effects. In addition to these, patterning can be performed by corona treatment, vacuum plasma treatment, atmospheric pressure plasma treatment, sandblasting and treatment, or the like.
<フィルムラミネート方法>
本発明では、仮支持体として所定のパターンにてシランカップリング剤層薄膜が形成された無機基板を用い、シランカップリング剤層を介して高分子フィルムを貼り合わせ、ないし、乾燥製膜することにより、積層体を得る。高分子フィルムを貼り合わせる場合には、シランカップリング剤層を形成した仮支持用無機基板に高分子フィルムの活性化した面を重ね、加熱・加圧することにより積層体を得る。
加圧・加熱処理は、例えば、大気圧雰囲気下あるいは真空中で、プレス、ラミネート、ロールラミネート等を、加熱しながら行えばよい。またフレキシブルなバッグに入れた状態で加圧加熱する方法も応用できる。生産性の向上や、高い生産性によりもたらされる低加工コスト化の観点からは、大気雰囲気下でのプレスまたはロールラミネートが好ましく、特にロールを用いて行う方法(ロールラミネート等)が好ましい。<Film laminating method>
In the present invention, an inorganic substrate on which a silane coupling agent layer thin film is formed in a predetermined pattern is used as a temporary support, and a polymer film is bonded through the silane coupling agent layer, or dry film formation is performed. Thus, a laminate is obtained. When a polymer film is bonded, a laminated body is obtained by overlaying the activated surface of the polymer film on a temporary supporting inorganic substrate on which a silane coupling agent layer is formed, and heating and pressing.
The pressurizing / heating treatment may be performed while heating a press, a laminate, a roll laminate, or the like, for example, in an atmospheric atmosphere or in a vacuum. A method of heating under pressure in a flexible bag can also be applied. From the viewpoint of improving productivity and reducing the processing cost brought about by high productivity, press or roll lamination in an air atmosphere is preferable, and a method using rolls (roll lamination or the like) is particularly preferable.
加圧加熱処理の際の圧力としては、1MPa〜20MPaが好ましく、さらに好ましくは3MPa〜10MPaである。圧力が高すぎると、支持体を破損するおそれがあり、圧力が低すぎると、密着しない部分が生じ、接着が不充分になる場合がある。 加圧加熱処理の際の温度としては、用いる高分子フィルムの耐熱温度を超えない範囲にて行う。非熱可塑性のポリイミドフィルムの場合には150℃〜400℃、さらに好ましくは250℃〜350℃での処理が好ましい。
また加圧加熱処理は、上述のように大気圧雰囲気中で行うこともできるが、全面の安定した接着強度を得る為には、真空下で行うことが好ましい。このとき真空度は、通常の油回転ポンプによる真空度で充分であり、10Torr以下程度あれば充分である。
加圧加熱処理に使用することができる装置としては、真空中でのプレスを行うには、例えば井元製作所製の「11FD」等を使用でき、真空中でのロール式のフィルムラミネーターあるいは真空にした後に薄いゴム膜によりガラス全面に一度に圧力を加えるフィルムラミネーター等の真空ラミネートを行うには、例えば名機製作所製の「MVLP」等を使用できる。The pressure during the pressure heat treatment is preferably 1 MPa to 20 MPa, more preferably 3 MPa to 10 MPa. If the pressure is too high, the support may be damaged. If the pressure is too low, a non-adhering part may be produced, resulting in insufficient adhesion. The temperature during the pressure heat treatment is within a range not exceeding the heat resistance temperature of the polymer film to be used. In the case of a non-thermoplastic polyimide film, treatment at 150 ° C. to 400 ° C., more preferably 250 ° C. to 350 ° C. is preferable.
The pressure heat treatment can be performed in an atmospheric pressure atmosphere as described above, but is preferably performed under vacuum in order to obtain a stable adhesive strength on the entire surface. At this time, the degree of vacuum by a normal oil rotary pump is sufficient, and about 10 Torr or less is sufficient.
As an apparatus that can be used for pressure heat treatment, for example, “11FD” manufactured by Imoto Seisakusho can be used to perform pressing in a vacuum, and a roll-type film laminator in vacuum or a vacuum is used. For example, “MVLP” manufactured by Meiki Seisakusho Co., Ltd. can be used to perform vacuum laminating such as a film laminator that applies pressure to the entire glass surface at once with a thin rubber film.
前記加圧加熱処理は加圧プロセスと加熱プロセスとに分離して行うことが可能である。この場合、まず、比較的低温(例えば120℃未満、より好ましくは95℃以下の温度)で高分子フィルムと無機基板とを加圧(好ましくは0.2〜50MPa程度)して両者の密着確保し、その後、低圧(好ましくは0.2MPa未満、より好ましくは0.1MPa以下)もしくは常圧にて比較的高温(例えば120℃以上、より好ましくは120〜250℃、さらに好ましくは150〜230℃)で加熱することにより、密着界面の化学反応が促進されて高分子フィルムと仮支持用無機基板とを積層できる。 The pressure heat treatment can be performed separately in a pressure process and a heating process. In this case, first, the polymer film and the inorganic substrate are pressed (preferably about 0.2 to 50 MPa) at a relatively low temperature (for example, a temperature of less than 120 ° C., more preferably 95 ° C. or less) to ensure adhesion between the two. Then, at a low pressure (preferably less than 0.2 MPa, more preferably 0.1 MPa or less) or at a normal pressure, a relatively high temperature (for example, 120 ° C. or more, more preferably 120 to 250 ° C., further preferably 150 to 230 ° C.). ), The chemical reaction at the adhesion interface is promoted, and the polymer film and the temporary supporting inorganic substrate can be laminated.
<溶液塗布・乾燥による高分子フィルム層形成>
本発明の積層体の製造方法として、シランカップリング剤層を形成した無機基板上に、高分子の溶液ないし高分子前駆体溶液を塗布し、乾燥・製膜することによって高分子フィルム層を形成することが可能である。溶液の塗布方法としてはディップコート、スピンコート、カーテンコート、スリットダイコートなどの公知の手法を用いることが出来る。
ポリイミド系の樹脂においては、ポリイミド樹脂の原料となるジアミン類とテトラカルボン酸ないしその酸無水物を溶液中にて縮重合して得られるポリアミド酸溶液を、本発明の仮支持用無機基板に所定の厚さとなるように塗布し、乾燥、熱処理ないし化学イミド化処理を行って仮支持用無機基板上にてポリイミド膜を形成する。この場合、好ましい膜厚は7〜100μmであり、好ましくは15〜80μm、さらに好ましくは23〜45μmの範囲である。
通常、このような手法で得られるポリイミド樹脂層は、比較的脆く、剥離途中で引き裂きが生ずる場合が少なくなく、無機基板からの剥離が困難な場合が多いが、本発明では、シランカップリング剤層に存在する異物や凝集物が少ないため、かかる欠点を基点するフィルムの引き裂けが生じにくく、結果として剥離時の収率が大きく改善される。<Polymer film layer formation by solution application and drying>
As a method for producing the laminate of the present invention, a polymer film layer is formed by applying a polymer solution or a polymer precursor solution onto an inorganic substrate on which a silane coupling agent layer is formed, and drying and forming a film. Is possible. As a method for applying the solution, known methods such as dip coating, spin coating, curtain coating, and slit die coating can be used.
In the polyimide resin, a polyamic acid solution obtained by polycondensation of a diamine and a tetracarboxylic acid or an acid anhydride thereof as a raw material for the polyimide resin in a solution is predetermined on the temporary support inorganic substrate of the present invention. The polyimide film is formed on an inorganic substrate for temporary support by applying the film so as to have a thickness of 5 mm and drying, heat treatment or chemical imidization treatment. In this case, a preferable film thickness is 7 to 100 μm, preferably 15 to 80 μm, and more preferably 23 to 45 μm.
Usually, the polyimide resin layer obtained by such a method is relatively brittle, often tearing during the peeling, and often difficult to peel off from the inorganic substrate. In the present invention, the silane coupling agent Since there are few foreign substances and aggregates present in the layer, the film based on such defects is hardly torn, and as a result, the yield at the time of peeling is greatly improved.
<フレキシブル電子デバイスの製造方法>
本発明の積層体を用いると、既存の電子デバイス製造用の設備、プロセスを用いて積層体の高分子フィルム上に電子デバイスを形成し、積層体から高分子フィルムごと剥離することで、フレキシブルな電子デバイスを作製することができる。
本発明における電子デバイスとは、電気配線を担う配線基板、トランジスタ、ダイオードなどの能動素子や、抵抗、キャパシタ、インダクタなどの受動デバイスを含む電子回路、他、圧力、温度、光、湿度などをセンシングするセンサー素子、発光素子、液晶表示、電気泳動表示、自発光表示などの画像表示素子、無線、有線による通信素子、演算素子、記憶素子、MEMS素子、太陽電池、薄膜トランジスタなどを云う。
積層体から高分子フィルムを剥離する方法としては、無機基板側から強い光を照射し、無機基板と高分子フィルム間の接着部位を熱分解、ないし光分解させて剥離する方法、あらかじめ接着強度を弱めておき、高分子フィルムの弾性強度限界値未満の力で高分子フィルムを引きはがす方法、加熱水、加熱蒸気などに晒し、無機基板と高分子フィルム界面の結合強度を弱めて剥離させる方法などを例示することが出来る。<Method for manufacturing flexible electronic device>
When the laminate of the present invention is used, an electronic device is formed on the polymer film of the laminate using existing equipment and processes for manufacturing electronic devices, and the polymer film is peeled off from the laminate, so that the flexible film is flexible. An electronic device can be fabricated.
The electronic device in the present invention refers to an electronic circuit including an active element such as a wiring board, a transistor, and a diode that carries electric wiring, and a passive device such as a resistor, a capacitor, and an inductor, and others such as pressure, temperature, light, and humidity. An image display element such as a sensor element, a light emitting element, a liquid crystal display, an electrophoretic display, and a self-luminous display, a wireless, wired communication element, an arithmetic element, a memory element, a MEMS element, a solar cell, a thin film transistor, and the like.
As a method of peeling a polymer film from a laminate, a method in which strong light is radiated from the inorganic substrate side and the adhesive part between the inorganic substrate and the polymer film is thermally decomposed or photodecomposed and peeled off is used. Weaker, peel off the polymer film with a force less than the elastic strength limit value of the polymer film, expose to heated water, heated steam, etc., weaken the bond strength between the inorganic substrate and the polymer film interface, etc. Can be illustrated.
本発明において、無機基板側、ないし、高分子フィルム側、さらには両方にパターン化処理が成された場合、パターン化処理により高分子フィルムと無機基板との接着力が低くなる領域(易剥離部と呼ぶ)に電子デバイスを形成し、次いで、その領域の外周部に切り込みを入れ、高分子フィルムの電子デバイスが形成されたエリアを無機基板から剥離する事によりフレキシブル電子デバイスを得ることが出来る。該方法により、高分子フィルムと無機基板の剥離がより容易になる。 In the present invention, when the patterning process is performed on the inorganic substrate side or the polymer film side, or both, the region where the adhesive force between the polymer film and the inorganic substrate is reduced by the patterning process (easy peeling part) The flexible electronic device can be obtained by forming an electronic device on the outer peripheral portion of the region and then cutting off the area where the electronic device of the polymer film is formed from the inorganic substrate. By this method, peeling of the polymer film and the inorganic substrate becomes easier.
積層体の易剥離部の外周に沿って高分子フィルムに切り込みを入れる方法としては、刃物などの切削具によって高分子フィルムを切断する方法や、レーザーと積層体を相対的にスキャンさせることにより高分子フィルムを切断する方法、ウォータージェットと積層体を相対的にスキャンさせることにより高分子フィルムを切断する方法、半導体チップのダイシング装置により若干ガラス層まで切り込みつつ高分子フィルムを切断する方法などを用いることができる。また、これらの方法の組み合わせや、切削具に超音波を重畳させたり、往復動作や上下動作などを付け加えて切削性能を向上させる等の手法を適宜採用することもできる。 As a method of cutting the polymer film along the outer periphery of the easily peelable portion of the laminate, a method of cutting the polymer film with a cutting tool such as a blade or a method of relatively scanning the laser and the laminate can be used. A method of cutting a molecular film, a method of cutting a polymer film by relatively scanning a water jet and a laminate, a method of cutting a polymer film while cutting a glass layer slightly with a semiconductor chip dicing device, etc. are used. be able to. In addition, a combination of these methods, a method of superimposing ultrasonic waves on a cutting tool, or adding a reciprocating operation or an up / down operation to improve cutting performance can be appropriately employed.
積層体の易剥離部外周の高分子フィルムに切り込みを入れるにあたり、切り込みを入れる位置は、少なくとも易剥離部の一部を含んでいればよく、基本的には所定のパターンに従って切断すれば良いが、誤差の吸収、生産性の観点などより、適宜判断すればよい。 When cutting into the polymer film on the outer periphery of the easily peelable portion of the laminate, the position where the cut is made only needs to include at least part of the easily peelable portion, and basically may be cut according to a predetermined pattern. From the viewpoint of error absorption, productivity, etc., it may be determined as appropriate.
高分子フィルムを支持体から剥離する方法としては、特に制限されないが、ピンセットなどで端から捲る方法、デバイス付きの高分子フィルムの切り込み部分の1辺に粘着テープを貼着させた後にそのテープ部分から捲る方法、デバイス付きの高分子フィルムの切り込み部分の1辺を真空吸着した後にその部分から捲る方法等が採用できる。なお、剥離の際に、デバイス付きの高分子フィルムの切り込み部分に曲率が小さい曲がりが生じると、その部分のデバイスに応力が加わることになりデバイスを破壊する虞があるため、極力曲率の大きな状態で剥がすことが望ましい。例えば、曲率の大きなロールに巻き取りながら捲るか、あるいは曲率の大きなロールが剥離部分に位置するような構成の機械を使って捲ることが望ましい。
また、剥離する部分に予め別の補強基材を貼りつけて、補強基材ごと剥離する方法も有用である。剥離するフレキシブル電子デバイスが、表示デバイスのバックプレーンである場合、あらかじめ表示デバイスのフロントプレーンを貼りつけて、無機基板上で一体化した後に両者を同時に剥がし、フレキシブルな表示デバイスを得ることも可能である。The method of peeling the polymer film from the support is not particularly limited, but is a method of rolling from the end with tweezers, etc., and sticking the adhesive tape to one side of the cut portion of the polymer film with the device, and then the tape part For example, a method of winding from a part of a polymer film with a device after vacuum suction of one side of the cut part can be employed. In addition, when the bend with a small curvature occurs in the cut portion of the polymer film with the device at the time of peeling, stress may be applied to the device at that portion and the device may be destroyed. It is desirable to peel off with. For example, it is desirable to roll while winding on a roll having a large curvature, or to roll using a machine having a configuration in which the roll having a large curvature is located at the peeling portion.
In addition, a method in which another reinforcing base material is attached in advance to the part to be peeled and the whole reinforcing base material is peeled off is also useful. When the flexible electronic device to be peeled off is the backplane of the display device, it is also possible to obtain a flexible display device by pasting the front plane of the display device in advance and integrating them on the inorganic substrate before peeling them off at the same time. is there.
<無機基板のリサイクル>
本発明においては、目的である電子デバイスを剥離した後の支持基板から残存する高分子フィルムを完全に除去し、簡便な洗浄処理等を行う事により、無機基板の再利用が可能である。従来の、液状塗布によりシランカップリング剤層を形成した場合には、シランカップリング剤の凝集物や、その他の異物の付着により、高分子フィルムを剥離後の無機基板表面に、凹凸やシランカップリング剤層の厚さ斑などが存在し、再利用するためには無機基板表面層を研磨して平面を確保する必要があった。本発明の塗布法によれば、高分子フィルム剥離後の無機基板表面の品位が良く再研磨は不要となる。<Recycling of inorganic substrates>
In the present invention, the inorganic substrate can be reused by completely removing the remaining polymer film from the supporting substrate after peeling off the target electronic device and performing a simple cleaning treatment or the like. When a conventional silane coupling agent layer is formed by liquid coating, the polymer film is peeled off on the surface of the inorganic substrate due to the adhesion of silane coupling agent aggregates or other foreign substances, and irregularities or silane cups are formed. The thickness of the ring agent layer is present, and in order to reuse it, it is necessary to polish the surface layer of the inorganic substrate to ensure a flat surface. According to the coating method of the present invention, the quality of the inorganic substrate surface after peeling of the polymer film is good, and re-polishing is unnecessary.
以下、実施例及び比較例を示して本発明をより具体的に説明するが、本発明は以下の実施例によって限定されるものではない。なお、以下の実施例における物性の評価方法は下記の通りである。 EXAMPLES Hereinafter, although an Example and a comparative example are shown and this invention is demonstrated more concretely, this invention is not limited by a following example. In addition, the evaluation method of the physical property in the following examples is as follows.
<ポリアミド酸溶液の還元粘度>
ポリマー濃度が0.2g/dlとなるようにN,N−ジメチルアセトアミドに溶解した溶液についてウベローデ型の粘度管を用いて30℃で測定した。<Reduced viscosity of polyamic acid solution>
A solution dissolved in N, N-dimethylacetamide so that the polymer concentration was 0.2 g / dl was measured at 30 ° C. using an Ubbelohde type viscosity tube.
<高分子フィルムの厚さ>
高分子フィルムの厚さは、マイクロメーター(ファインリューフ社製「ミリトロン1245D」)を用いて測定した。<Thickness of polymer film>
The thickness of the polymer film was measured using a micrometer ("Millitron 1245D" manufactured by FineLuf).
<高分子フィルムの厚さ斑>
高分子フィルムの厚さ斑は、マイクロメーター(ファインリューフ社製「ミリトロン1245D」)を用いて、被測定フィルムから無作為に10点を抽出してフィルム厚を測定し、得られた10個の値の最大値(最大フィルム厚)、最小値(最小フィルム厚)、および平均値(平均フィルム厚)から、下記式に基づき算出した。
フィルムの厚さ斑(%)=100×(最大フィルム厚−最小フィルム厚)÷平均フィルム厚<Thickness unevenness of polymer film>
Ten thicknesses of the polymer film were obtained by randomly extracting 10 points from the film to be measured using a micrometer ("Millitron 1245D" manufactured by Finelfu) and measuring the film thickness. From the maximum value (maximum film thickness), the minimum value (minimum film thickness), and the average value (average film thickness), the following values were calculated.
Film thickness variation (%) = 100 × (maximum film thickness−minimum film thickness) ÷ average film thickness
<高分子フィルムの引張弾性率、引張強度および引張破断伸度>
測定対象とする高分子フィルムから、流れ方向(MD方向)及び幅方向(TD方向)がそれぞれ100mm×10mmである短冊状の試験片を切り出し、引張試験機(島津製作所社製「オートグラフ(登録商標);機種名AG−5000A」)を用い、引張速度50mm/分、チャック間距離40mmの条件で、MD方向、TD方向それぞれについて、引張弾性率、引張強度および引張破断伸度を測定した。<Tensile modulus, tensile strength and tensile elongation at break of polymer film>
A strip-shaped test piece having a flow direction (MD direction) and a width direction (TD direction) each of 100 mm × 10 mm was cut out from a polymer film to be measured, and a tensile tester (manufactured by Shimadzu Corporation “Autograph (registered) (Trademark); model name AG-5000A "), and the tensile modulus, tensile strength, and tensile elongation at break were measured in each of the MD direction and the TD direction under the conditions of a tensile speed of 50 mm / min and a distance between chucks of 40 mm.
<高分子フィルムの線膨張係数(CTE)>
測定対象とする高分子フィルムの流れ方向(MD方向)および幅方向(TD方向)について、下記条件にて伸縮率を測定し、15℃の間隔(30℃〜45℃、45℃〜60℃、…)での伸縮率/温度を測定し、この測定を300℃まで行って、MD方向およびTD方向で測定した全測定値の平均値を線膨張係数(CTE)として算出した。
機器名 ; MACサイエンス社製「TMA4000S」
試料長さ ; 20mm
試料幅 ; 2mm
昇温開始温度 ; 25℃
昇温終了温度 ; 400℃
昇温速度 ; 5℃/分
雰囲気 ; アルゴン
初荷重 ; 34.5g/mm2<Linear expansion coefficient (CTE) of polymer film>
About the flow direction (MD direction) and the width direction (TD direction) of the polymer film to be measured, the stretch rate is measured under the following conditions, and the intervals of 15 ° C. (30 ° C. to 45 ° C., 45 ° C. to 60 ° C., ...) was measured, and this measurement was performed up to 300 ° C., and an average value of all measured values measured in the MD direction and the TD direction was calculated as a linear expansion coefficient (CTE).
Device name: “TMA4000S” manufactured by MAC Science
Sample length; 20mm
Sample width: 2 mm
Temperature rise start temperature: 25 ° C
Temperature rising end temperature: 400 ° C
Temperature increase rate: 5 ° C./min Atmosphere: Argon initial load: 34.5 g / mm 2
<ガラス転移温度>
DSC示差熱分析装置を用いて、室温から500℃までの範囲での構造変化に起因する吸放熱の有無から高分子フィルムのガラス転移温度を求めた。<Glass transition temperature>
Using a DSC differential thermal analyzer, the glass transition temperature of the polymer film was determined from the presence or absence of heat absorption / dissipation due to the structural change in the range from room temperature to 500 ° C.
<高分子フィルムの評価:滑り性>
高分子フィルム2枚を、異なる面同士で重ね合わせ(すなわち、同じ面同士ではなく、フィルムロールとして巻いた場合の巻き外面と巻き内面とを重ね合わせ)、重ねたポリイミドフィルムを親指と人差し指で挟み、軽く摺り合わせたときに、高分子フィルムと高分子フィルムが滑る場合を「○」又は「良好」、滑らない場合を「×」又は「不良」と評価した。なお、巻き外面同士あるいは巻き内面同士では滑らない場合もあるが、これは評価項目とはしない。<Evaluation of polymer film: slipperiness>
Two polymer films are stacked on different surfaces (that is, not on the same surface but on the wound outer surface and the wound inner surface when wound as a film roll), and the polyimide film is sandwiched between the thumb and index finger When lightly rubbed, the case where the polymer film and the polymer film slip were evaluated as “◯” or “good”, and the case where the polymer film did not slip was evaluated as “x” or “bad”. In addition, although it may not slip on winding outer surfaces or between winding inner surfaces, this is not made into an evaluation item.
<カップリング剤層の厚さ>
カップリング剤層(SC層)の厚さ(nm)は、別途、洗浄したSiウエハ上に各実施例、比較例と同様の方法でカップリング剤を塗布乾燥させて得たサンプルを作製し、このSiウエハ上に形成したカップリング剤層の膜厚について、エリプソメトリー法にて、分光エリプソメータ(Photal社製「FE−5000」)を用いて下記の条件で測定した。
反射角度範囲 ; 45°から80°
波長範囲 ; 250nmから800nm
波長分解能 ; 1.25nm
スポット径 ; 1mm
tanΨ ; 測定精度±0.01
cosΔ ; 測定精度±0.01
測定 ; 方式回転検光子法
偏向子角度 ; 45°
入射角度 ; 70°固定
検光子 ; 11.25°刻みで0〜360°
波長 ; 250nm〜800nm
非線形最小2乗法によるフィッティングで膜厚を算出した。このとき、モデルとしては、Air/薄膜/Siのモデルで、
n=C3/λ4+C2/λ2+C1
k=C6/λ4+C5/λ2+C4
の式で波長依存C1〜C6を求めた。<Thickness of coupling agent layer>
The thickness (nm) of the coupling agent layer (SC layer) is separately prepared on a cleaned Si wafer by preparing a sample obtained by applying and drying the coupling agent in the same manner as in each example and comparative example, The film thickness of the coupling agent layer formed on this Si wafer was measured by the ellipsometry method using a spectroscopic ellipsometer (“FE-5000” manufactured by Photo) under the following conditions.
Reflection angle range: 45 ° to 80 °
Wavelength range: 250 nm to 800 nm
Wavelength resolution: 1.25 nm
Spot diameter: 1mm
tan Ψ; Measurement accuracy ± 0.01
cosΔ; Measurement accuracy ± 0.01
Measurement: Method Rotating analyzer method Deflector angle: 45 °
Incident angle: 70 ° fixed Analyzer: 0-360 ° in 11.25 ° increments
Wavelength: 250 nm to 800 nm
The film thickness was calculated by fitting by a non-linear least square method. At this time, the model is Air / thin film / Si,
n = C3 / λ4 + C2 / λ2 + C1
k = C6 / λ4 + C5 / λ2 + C4
The wavelength dependence C1 to C6 was determined by the following formula.
<接着強度>
仮支持用無機基板に、所定の方法でシランカップリング剤を塗布し、次いで所定のプロセスを経て高分子フィルムをラミネートし、仮支持用無機版と高分子フィルムとの接着強度を、JIS C6471に記載の180度剥離法に従い、下記条件で測定した。なお、この測定に供するサンプルには、120mm×120mmの正方形の基板に対して、半分の60mm×120mmをマスクし、残りの半分の領域に薄膜加工を行い、評価用の仮支持用無機基板とした。なお、高分子フィルムのラミネート時にはフィルムのサイズを110mm×200mmとし、片側にポリイミドフィルムの未接着部分を設け、この部分を“つかみしろ”に用い、測定サンプルのフィルム部分にナイフで切り込みを入れ、幅が10mmとなるようにして測定した。
装置名 : 島津製作所社製「オートグラフ(登録商標)AG−IS」
測定温度 : 室温
剥離速度 : 50mm/分
雰囲気 : 大気
測定サンプル幅 : 10mm
<外観>
品位については、積層体全体の目視検査での結果である。
<異物密度>
30mm×30mmの領域をサンプリングし、100倍拡大の測長機能付き顕微鏡にてサンプリング領域を観察し、100倍観察にて確認された異物については、さらに拡大率を400倍として長径長さを測定し、10μm以上のものの個数を係数し、観察面積で除して異物密度とした。<Adhesive strength>
A silane coupling agent is applied to the temporary support inorganic substrate by a predetermined method, and then a polymer film is laminated through a predetermined process. The adhesive strength between the temporary support inorganic plate and the polymer film is defined in JIS C6471. According to the described 180 degree peeling method, it measured on condition of the following. In addition, the sample used for this measurement masks a half of 60 mm × 120 mm with respect to a square substrate of 120 mm × 120 mm, performs thin film processing on the remaining half of the region, and provides a temporary supporting inorganic substrate for evaluation. did. In addition, when laminating a polymer film, the size of the film is 110 mm × 200 mm, an unadhered portion of the polyimide film is provided on one side, this portion is used for “grabbing”, and the film portion of the measurement sample is cut with a knife, The width was measured to be 10 mm.
Device name: “Autograph (registered trademark) AG-IS” manufactured by Shimadzu Corporation
Measurement temperature: Room temperature Peeling speed: 50 mm / min Atmosphere: Atmosphere Measurement sample width: 10 mm
<Appearance>
About quality, it is the result in the visual inspection of the whole laminated body.
<Dust density>
Sampling a 30mm x 30mm area, observing the sampling area with a microscope with a length measurement function of 100x magnification, and measuring the major axis length of foreign matter confirmed by 100x magnification with a magnification of 400x Then, the number of those having a size of 10 μm or more was factored and divided by the observation area to obtain the foreign substance density.
<ポリイミドフィルムの製造>
〔製造例1〕
(ポリアミド酸溶液の調製)
窒素導入管、温度計、攪拌棒を備えた反応容器内を窒素置換した後、3,3',4,4'−ビフェニルテトラカルボン酸二無水物(BPDA)398質量部と、パラフェニレンジアミン(PDA)147質量部とを、4600質量部のN、N−ジメチルアセトアミドに溶解させて加え、滑材としてコロイダルシリカをジメチルアセトアミドに分散してなる分散体(日産化学工業製「スノーテックス(登録商標)DMAC−ST30」)をシリカ(滑材)がポリアミド酸溶液中のポリマー固形分総量に対して0.15質量%になるように加え、25℃の反応温度で24時間攪拌して、表1に示す還元粘度を有する褐色で粘調なポリアミド酸溶液V1を得た。<Manufacture of polyimide film>
[Production Example 1]
(Preparation of polyamic acid solution)
After the inside of the reaction vessel equipped with a nitrogen introduction tube, a thermometer, and a stirring rod was purged with nitrogen, 398 parts by mass of 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride (BPDA) and paraphenylenediamine ( (PDA) 147 parts by mass is dissolved in 4600 parts by mass of N, N-dimethylacetamide, and a dispersion obtained by dispersing colloidal silica as a lubricant in dimethylacetamide (“Snowtex (registered trademark)” manufactured by Nissan Chemical Industries, Ltd. ) DMAC-ST30 ”) was added so that the silica (lubricant) was 0.15% by mass with respect to the total amount of polymer solids in the polyamic acid solution, and the mixture was stirred at a reaction temperature of 25 ° C. for 24 hours. A brown and viscous polyamic acid solution V1 having a reduced viscosity as shown in FIG.
(ポリイミドフィルムの作製)
上記で得られたポリアミド酸溶液V1を、スリットダイを用いて幅1050mmの長尺ポリエステルフィルム(東洋紡績株式会社製「A−4100」)の平滑面(無滑材面)上に、最終膜厚(イミド化後の膜厚)が25μmとなるように塗布し、105℃にて20分間乾燥した後、ポリエステルフィルムから剥離して、幅920mmの自己支持性のポリアミド酸フィルムを得た。
次いで、得られた自己支持性ポリアミド酸フィルムをピンテンターによって、150℃〜420℃の温度領域で段階的に昇温させて(1段目180℃×5分、2段目270℃×10分、3段目420℃×5分間)熱処理を施してイミド化させ、両端のピン把持部分をスリットにて落とし、幅850mmの長尺ポリイミドフィルムF1(1000m巻き)を得た。得られたフィルムF1の特性を表1に示す。(Preparation of polyimide film)
The final thickness of the polyamic acid solution V1 obtained above is applied on the smooth surface (non-sliding material surface) of a long polyester film (“A-4100” manufactured by Toyobo Co., Ltd.) having a width of 1050 mm using a slit die. The film was applied so that (film thickness after imidization) was 25 μm, dried at 105 ° C. for 20 minutes, and then peeled from the polyester film to obtain a self-supporting polyamic acid film having a width of 920 mm.
Next, the obtained self-supporting polyamic acid film was heated stepwise by a pin tenter in a temperature range of 150 ° C. to 420 ° C. (first stage 180 ° C. × 5 minutes, second stage 270 ° C. × 10 minutes, (Third stage 420 ° C. × 5 minutes) Heat treatment was performed to imidize, and pin grip portions at both ends were dropped with a slit to obtain a long polyimide film F1 (1000 m roll) having a width of 850 mm. Table 1 shows the characteristics of the obtained film F1.
〔製造例2〕
(ポリアミド酸溶液の調製)
窒素導入管、温度計、攪拌棒を備えた反応容器内を窒素置換した後、5−アミノ−2−(p−アミノフェニル)ベンゾオキサゾール(DAMBO)223質量部と、N,N−ジメチルアセトアミド4416質量部とを加えて完全に溶解させ、次いで、ピロメリット酸二無水物(PMDA)217質量部とともに、滑材としてコロイダルシリカをジメチルアセトアミドに分散してなる分散体(日産化学工業製「スノーテックス(登録商標)DMAC−ST30」)とをシリカ(滑材)がポリアミド酸溶液中のポリマー固形分総量にて0.12質量%)になるように加え、25℃の反応温度で24時間攪拌して、表1に示す還元粘度を有する褐色で粘調なポリアミド酸溶液V2を得た。[Production Example 2]
(Preparation of polyamic acid solution)
After the inside of the reaction vessel equipped with a nitrogen introduction tube, a thermometer, and a stirring rod was purged with nitrogen, 223 parts by mass of 5-amino-2- (p-aminophenyl) benzoxazole (DAMBO), N, N-dimethylacetamide 4416 Next, a dispersion formed by dispersing colloidal silica in dimethylacetamide as a lubricant together with 217 parts by mass of pyromellitic dianhydride (PMDA) (“Snowtex” manufactured by Nissan Chemical Industries, Ltd.) (Registered trademark) DMAC-ST30 ") so that silica (lubricant) is 0.12% by mass in the total amount of polymer solids in the polyamic acid solution, and stirred for 24 hours at a reaction temperature of 25 ° C. Thus, a brown and viscous polyamic acid solution V2 having a reduced viscosity shown in Table 1 was obtained.
(ポリイミドフィルムの作製)
ポリアミド酸溶液V1に代えて、上記で得られたポリアミド酸溶液V2を用い、ピンテンターによって、1段目150℃×5分、2段目220℃×5分、3段目485℃×10分間)熱処理を施してイミド化させ、両端のピン把持部分をスリットにて落とし、幅850mmの長尺ポリイミドフィルムF2(1000m巻き)を得た。得られたフィルムF2の特性を表1に示す。
〔製造例3〕
(ポリアミド酸溶液の調製)
製造例2において、コロイダルシリカをジメチルアセトアミドに分散してなる分散体(日産化学工業製「スノーテックス(登録商標)DMAC−ST30」)を添加しなかった以外は同様に操作し、ポリアミド酸溶液V3を得た。(Preparation of polyimide film)
(Instead of the polyamic acid solution V1, the polyamic acid solution V2 obtained above is used, and by a pin tenter, the first stage 150 ° C. × 5 minutes, the second stage 220 ° C. × 5 minutes, the third stage 485 ° C. × 10 minutes) It heat-processed and imidized, the pin holding part of both ends was dropped with the slit, and the long polyimide film F2 (1000 m winding) of width 850mm was obtained. Table 1 shows the characteristics of the obtained film F2.
[Production Example 3]
(Preparation of polyamic acid solution)
The same procedure as in Production Example 2 was carried out except that a dispersion obtained by dispersing colloidal silica in dimethylacetamide (“Snowtex (registered trademark) DMAC-ST30” manufactured by Nissan Chemical Industries, Ltd.) was added, and the polyamic acid solution V3 Got.
(ポリイミドフィルムの作製)
上記で得られたポリアミド酸溶液V3をコンマコーターを用いて幅1050mmの長尺ポリエステルフィルム(東洋紡績株式会社製「A−4100」)の平滑面(無滑材面)上に、最終膜厚(イミド化後の膜厚)が5μm相当となるように塗布し、次いでポリアミド酸溶液V2をスリットダイを用いて最終膜厚がV3含めて38μmとなるように塗布し、105℃にて25分間乾燥した後、ポリエステルフィルムから剥離して、幅920mmの自己支持性のポリアミド酸フィルムを得た。次いで、得られた自己支持性ポリアミド酸フィルムをピンテンターによって、1段目180℃×5分、2段目220℃×5分、3段目495℃×10分間)熱処理を施してイミド化させ、両端のピン把持部分をスリットにて落とし、幅850mmの長尺ポリイミドフィルムF3(1000m巻き)を得た。得られたフィルムF3の特性を表1に示す。(Preparation of polyimide film)
Using the comma coater, the polyamic acid solution V3 obtained as described above is formed on the smooth surface (non-sliding material surface) of a long polyester film (“A-4100” manufactured by Toyobo Co., Ltd.) having a width of 1050 mm. (Film thickness after imidization) is applied so that it corresponds to 5 μm, and then the polyamic acid solution V2 is applied using a slit die so that the final film thickness is 38 μm including V3, and dried at 105 ° C. for 25 minutes. Then, it was peeled from the polyester film to obtain a self-supporting polyamic acid film having a width of 920 mm. Next, the obtained self-supporting polyamic acid film was subjected to heat treatment with a pin tenter and subjected to imidization by performing heat treatment at the first stage 180 ° C. × 5 minutes, the second stage 220 ° C. × 5 minutes, the third stage 495 ° C. × 10 minutes, The pin grip portions at both ends were dropped with a slit to obtain a long polyimide film F3 (1000 m roll) having a width of 850 mm. The properties of the obtained film F3 are shown in Table 1.
<プラズマ処理フィルムの製造>
製造例1で得られたポリイミドフィルムF1の片面に真空プラズマ処理を施して、プラズマ処理ポリイミドフィルムP1を得た。得られたフィルムP1の特性を表2に示す。
真空プラズマ処理としては、平行平板型の電極を使ったRIEモード、RFプラズマによる処理を採用し、真空チャンバー内に窒素ガスを導入し、13.54MHzの高周波電力を導入するようにし、処理時間は3分間とした。<Manufacture of plasma-treated film>
One side of the polyimide film F1 obtained in Production Example 1 was subjected to vacuum plasma treatment to obtain a plasma-treated polyimide film P1. Table 2 shows the properties of the obtained film P1.
As the vacuum plasma processing, RIE mode using parallel plate type electrodes and RF plasma processing are adopted, nitrogen gas is introduced into the vacuum chamber, high frequency power of 13.54 MHz is introduced, and the processing time is 3 minutes.
ポリイミドフィルムF1に代えて製造例2で得られたポリイミドフィルムF2を用いたこと以外は同様にして、プラズマ処理ポリイミドフィルムP2を得た。さらにフィルムF3の滑剤を含まない層側の片面に同様にプラズマ処理を行い、フィルムP3とした。
ポリイミドフィルムF1に代えて、100μm厚のポリエチレンテレフタレートフィルムA4100(東洋紡株式会社製)を用いて、プラズマ処理フィルムP4を得た。
同様にポリイミドフィルムF1に代えて、100μm厚のポリエチレンナフタレートフィルム「テオネックス」(帝人株式会社製)を用いて、プラズマ処理フィルムP5を得た。
ポリイミドフィルムF2を用いて得た、プラズマ処理ポリイミドフィルムP2に、1mm厚のステンレス鋼板製の所定のマスクを重ね、LANテクニカルサービス社製のUV/オゾン照射装置を用いて、120秒間のUV/オゾン照射を行い、パターン化プラズマ処理フィルムPP2を得た。
得られたプラズマ処理フィルム、並びにパターン化プラズマ処理フィルムの特性を表2に示す。A plasma-treated polyimide film P2 was obtained in the same manner except that the polyimide film F2 obtained in Production Example 2 was used instead of the polyimide film F1. Furthermore, plasma treatment was similarly performed on one side of the film F3 on the layer side not containing the lubricant to obtain a film P3.
Instead of the polyimide film F1, a 100 μm thick polyethylene terephthalate film A4100 (manufactured by Toyobo Co., Ltd.) was used to obtain a plasma-treated film P4.
Similarly, instead of the polyimide film F1, a 100 μm thick polyethylene naphthalate film “Teonex” (manufactured by Teijin Limited) was used to obtain a plasma-treated film P5.
A predetermined mask made of a stainless steel plate having a thickness of 1 mm is overlaid on the plasma-treated polyimide film P2 obtained by using the polyimide film F2, and UV / ozone for 120 seconds using a UV / ozone irradiation apparatus manufactured by LAN Technical Service. Irradiation was performed to obtain a patterned plasma treated film PP2.
Table 2 shows the characteristics of the obtained plasma treated film and the patterned plasma treated film.
<無機基板へのカップリング剤層形成>
<塗布例1>
ホットプレートを有する真空チャンバーを用い、以下の条件にて無機基板へのシランカップリング剤塗布を行った。
シランカップリング剤(信越化学工業株式会社製「KBM−903」:3−アミノプロピルトリメトキシシラン)100質量部をシャーレに満たし、ホットプレートの上に静置した。このときホットプレート温度は25℃である。次いでシランカップリング剤の液面から垂直方向に300mm離れた箇所に、300mm×350mm×0.7mmtのパイレックスガラス板を水平に保持し、真空チャンバーを閉じ、大気圧にて酸素濃度が0.1%以下となるまで窒素ガスを導入し、次いで窒素ガスを止め、チャンバー内を3×10-4Paまで減圧し、ホットプレート温度を120℃まで昇温し、10分間保持してシランカップリング剤蒸気への暴露を行い、その後、ホットプレート温度を下げ、同時に真空チャンバー内にクリーンな窒素ガスを静かに導入して大気圧まで戻し、ガラス板を取り出し、クリーン環境下にて100℃のホットプレートに、シランカップリング剤塗布面を上にして乗せ、約3分間熱処理を行い、シランカップリング剤層を形成した無機基板S1を得た。
<塗布例2>
以下の条件にて無機基板へのシランカップリング剤塗布を行った。シランカップリング剤(信越化学工業株式会社製「KBM−903」:3−アミノプロピルトリメトキシシラン)100質量部をシャーレに満たし、蓋をした状態で換気実験台内に設置されたホットプレートの上に静置し、ホットプレートを160℃に加温した。次いでシランカップリング剤の液面から垂直方向に100mm離れた箇所に、100mm×100mm×1.0mmtのソーダ石灰ガラス板を水平に保持し、シャーレの蓋を開け、15分間保持してシランカップリング剤蒸気への暴露を行い、その後、ガラス板を100℃のホットプレートに、シランカップリング剤塗布面を上にして乗せ、約3分間熱処理を行い、シランカップリング剤層を形成した無機基板S2を得た。
<塗布例3>
シランカップリング剤(信越化学工業株式会社製「KBM−903」:3−アミノプロピルトリメトキシシラン)0.5質量部、イソプロピルアルコール99.5質量部を清浄なガラス容器内にて攪拌混合しシランカップリング剤溶液とした。一方300mm×350mm×0.7mmtのパイレックスガラス板をジャパンクリエイト社製スピンコーターにセットし、まずイソプロピルアルコール50mlをガラス中央に滴下し、500rpmにて振り切ることにより洗浄を行い、次いで、先に準備したシランカップリング剤溶液約30mlをガラス板中央に滴下し、500mlにて10秒、次いで回転数を1500rpmまで上げて20秒間回転させ、シランカップリング剤溶液を振り切った。次いで停止させたスピンコーターからガラス板を取り出し、クリーン環境下にて100℃のホットプレートに、シランカップリング剤塗布面を上にして乗せ、約3分間熱処理を行い、シランカップリング剤層を形成した無機基板S3を得た。
<塗布例4>
塗布例3と同様に、100mm×100mm×1.0mmtのソーダ石灰ガラス板にスピンコーターにてシランカップリング剤層を形成し、無機板S4を得た。
<塗布例5> パターン化
塗布例1にて得られた無機基板S1に、1mm厚のステンレス鋼板製の所定のマスクを重ね、LANテクニカルサービス社製のUV/オゾン照射装置を用いて、120秒間のUV/オゾン照射を行い、パターン化無機基板SP1を得た。
得られた無機版を表3に示す。<Coupling agent layer formation on inorganic substrate>
<Application example 1>
Using a vacuum chamber having a hot plate, a silane coupling agent was applied to the inorganic substrate under the following conditions.
100 parts by mass of a silane coupling agent (“KBM-903” manufactured by Shin-Etsu Chemical Co., Ltd .: 3-aminopropyltrimethoxysilane) was filled in a petri dish and allowed to stand on a hot plate. At this time, the hot plate temperature is 25 ° C. Next, a 300 mm × 350 mm × 0.7 mmt Pyrex glass plate is held horizontally at a location 300 mm away from the liquid surface of the silane coupling agent, the vacuum chamber is closed, and the oxygen concentration is 0.1 at atmospheric pressure. Nitrogen gas was introduced until it became less than%, then nitrogen gas was stopped, the inside of the chamber was depressurized to 3 × 10 −4 Pa, the hot plate temperature was raised to 120 ° C. and held for 10 minutes, and the silane coupling agent vapor was maintained. After that, the hot plate temperature is lowered, and at the same time, clean nitrogen gas is gently introduced into the vacuum chamber to return to atmospheric pressure, the glass plate is taken out, and the hot plate is heated to 100 ° C. in a clean environment. The inorganic substrate S1 on which the silane coupling agent application surface is placed and heat-treated for about 3 minutes to form a silane coupling agent layer It was.
<Application example 2>
The silane coupling agent was applied to the inorganic substrate under the following conditions. On a hot plate installed in a ventilation experiment table with 100 parts by mass of a silane coupling agent (“KBM-903” manufactured by Shin-Etsu Chemical Co., Ltd .: 3-aminopropyltrimethoxysilane) filled in a petri dish and covered. The hot plate was heated to 160 ° C. Next, a 100 mm × 100 mm × 1.0 mmt soda-lime glass plate is horizontally held at a location 100 mm away from the liquid surface of the silane coupling agent, and the petri dish lid is opened and held for 15 minutes for silane coupling. Inorganic substrate S2 on which a glass plate is placed on a hot plate at 100 ° C. with the silane coupling agent application surface facing upward and heat-treated for about 3 minutes to form a silane coupling agent layer. Got.
<Application example 3>
Silane coupling agent (“KBM-903” manufactured by Shin-Etsu Chemical Co., Ltd .: 3-aminopropyltrimethoxysilane) 0.5 parts by mass and 99.5 parts by mass of isopropyl alcohol were stirred and mixed in a clean glass container. A coupling agent solution was obtained. On the other hand, a Pyrex glass plate of 300 mm × 350 mm × 0.7 mmt was set on a spin coater manufactured by Japan Create Co., Ltd. First, 50 ml of isopropyl alcohol was dropped onto the center of the glass and washed by shaking off at 500 rpm, and then prepared in advance. About 30 ml of the silane coupling agent solution was dropped on the center of the glass plate, and the solution was shaken off by shaking the silane coupling agent solution at 500 ml for 10 seconds and then rotating the rotation speed to 1500 rpm for 20 seconds. Next, the glass plate is taken out from the stopped spin coater, placed on a hot plate at 100 ° C. in a clean environment with the silane coupling agent applied surface facing up, and heat-treated for about 3 minutes to form a silane coupling agent layer. The obtained inorganic substrate S3 was obtained.
<Application example 4>
In the same manner as in Application Example 3, a silane coupling agent layer was formed on a 100 mm × 100 mm × 1.0 mmt soda-lime glass plate by a spin coater to obtain an inorganic plate S4.
<Application Example 5> Patterning A predetermined mask made of a stainless steel plate having a thickness of 1 mm is overlaid on the inorganic substrate S1 obtained in Application Example 1, and 120 seconds using a UV / ozone irradiation device manufactured by LAN Technical Service. UV / ozone irradiation was performed to obtain a patterned inorganic substrate SP1.
The obtained inorganic plate is shown in Table 3.
<実施例1>
得られた無機基板S1のシランカップリング剤層側に、280mm×330mmの長方形にトリミングしたプラズマ処理フィルムP1のプラズマ処理面を、無機基板面が10mm露出するように重ね、クライムプロダクツ社製のラミネータを用いて、無機基板側温度100℃、ラミネート時のロール圧力5kg/cm2、ロール速度5mm/秒にて仮ラミ
ネートした。仮ラミネート後の高分子フィルムはフィルムの自重では剥がれないが、フィルム端部を引っ掻くと簡単に剥がれる程度の接着性であった。その後、得られた仮ラミネート基板をクリーンオーブンに入れ、200℃にて30分間加熱した後、室温まで放冷して、本発明の積層体L1を得た。得られた積層体の特性を表4に示す。
<実施例2〜5>
以下、無機基板S1と、表に示すプラズマ処理フィルムを用いて積層体を作製した。なお、プラズマ処理フィルムP4の場合には、クリーンオーブンでの加熱温度を140℃に、プラズマ処理フィルムP5の場合には175℃とした。得られた積層体の特性を表4示す。
<実施例6>
得られた無機基板S1とパターン化プラズマ処理フィルムPP2を用いて、同様に操作し、積層体L6を得た。積層体L6については、パターン化プラズマ処理フィルムのUV/オゾン照射が行われていない部分を通常部、照射された部分については易剥離部として評価した。
(比較例1)
得られた無機基板S1Cのシランカップリング剤層に、280mm×330mmの長方形にトリミングしたプラズマ処理フィルムP1のプラズマ処理面を、無機基板面が10mm露出するように重ね、クライムプロダクツ社製のラミネータを用いて、無機基板側温度100℃、ラミネート時のロール圧力5kg/cm2、ロール速度5mm/秒にて仮ラミネートした。仮ラミネート後の高分子フィルムはフィルムの自重では剥がれないが、フィルム端部を引っ掻くと簡単に剥がれる程度の接着性であった。その後、得られた仮ラミネート基板をクリーンオーブンに入れ、200℃にて30分間加熱した後、室温まで放冷して、本発明の積層体C1を得た。得られた積層体の特性を表4に示す。<Example 1>
The plasma processing surface of the plasma processing film P1 trimmed into a 280 mm × 330 mm rectangle is superimposed on the silane coupling agent layer side of the obtained inorganic substrate S1 so that the inorganic substrate surface is exposed 10 mm, and a laminator manufactured by Climb Products Co., Ltd. Was used for temporary lamination at an inorganic substrate side temperature of 100 ° C., a roll pressure during lamination of 5 kg / cm 2, and a roll speed of 5 mm / second. The polymer film after temporary lamination did not peel off due to its own weight, but had such adhesiveness that it was easily peeled off when the film edge was scratched. Thereafter, the obtained temporary laminate substrate was put in a clean oven, heated at 200 ° C. for 30 minutes, and then allowed to cool to room temperature to obtain a laminate L1 of the present invention. Table 4 shows the properties of the obtained laminate.
<Examples 2 to 5>
Hereinafter, a laminate was produced using the inorganic substrate S1 and the plasma treatment film shown in the table. In the case of the plasma-treated film P4, the heating temperature in the clean oven was 140 ° C., and in the case of the plasma-treated film P5, it was 175 ° C. Table 4 shows the properties of the obtained laminate.
<Example 6>
Using the obtained inorganic substrate S1 and the patterned plasma treatment film PP2, the same operation was performed to obtain a laminate L6. For the laminate L6, the part of the patterned plasma-treated film that was not irradiated with UV / ozone was evaluated as a normal part, and the irradiated part was evaluated as an easily peelable part.
(Comparative Example 1)
The plasma treatment surface of the plasma treatment film P1 trimmed into a 280 mm × 330 mm rectangle is overlapped on the silane coupling agent layer of the obtained inorganic substrate S1C so that the inorganic substrate surface is exposed 10 mm, and a laminator manufactured by Climb Products Co. is applied. The laminate was temporarily laminated at an inorganic substrate temperature of 100 ° C., a roll pressure of 5 kg / cm 2 during lamination, and a roll speed of 5 mm / second. The polymer film after temporary lamination did not peel off due to its own weight, but had such adhesiveness that it was easily peeled off when the film edge was scratched. Thereafter, the obtained temporary laminate substrate was put in a clean oven, heated at 200 ° C. for 30 minutes, and then allowed to cool to room temperature, to obtain a laminate C1 of the present invention. Table 4 shows the properties of the obtained laminate.
<実施例7〜11>
無機基板S2のシランカップリング剤層側に、90mm×90mmの長方形にトリミングしたプラズマ処理フィルムP1のプラズマ処理面を、無機基板面の端が5mm露出するように重ね、井元製作所製真空プレス機に、上下にカーボンシートからなるクッション材で挟み、真空下にて熱板温度を300℃として20分間プレスし、室温まで冷却し、積層体L7を得た。また同様にプラズマ処理フィルムP2〜P5を用いて同様に積層体を得た。なお、プラズマ処理フィルムP4の場合には、真空プレス温度を140℃に、プラズマ処理フィルムP5の場合には175℃とした。得られた積層体の特性を表4示す。
<比較例2>
無機基板S4を用いた他は、実施例7と同様に操作して積層体C2を得た。得られた積層体の特性を表4示す。
<実施例12>
パターン化無機基板SP1とプラズマ処理フィルムP2を用い、以下、実施例1と同様に操作して積層体L12を得た。積層体L6については、パターン化無機板のUV/オゾン照射が行われていない部分を通常部、照射された部分については易剥離部として評価した。
<実施例13>
パターン化無機基板SP1とパターン化プラズマ処理フィルムPP2を用い、以下、実施例1と同様に操作して積層体L13を得た。なお、無機板側のパターン化処理に用いたマスクと、プラズマ処理フィルム側のパターン化処理に用いたマスクの形状は同じであり、共に処理を行われた部分どうしが重なるように配置されている。積層体L13については、UV/オゾン照射が行われていない部分を通常部、照射された部分については易剥離部として評価した。結果を表4に示す。
<実施例14>
パターン化無機基板SP1に、製造例2で得られたポリアミド酸溶液をダイコーターにて最終膜厚が25μmとなるように塗布し、防爆型オーブンに入れて80℃にて100分間乾燥後、200℃までて5℃/分で昇温し、200℃にて60分間保持し、次いで480℃まで10℃/分で昇温し480℃にて5分保持した後、30℃/分で100℃まで冷却し、オーブンの扉をあけて室温付近まで冷却して高分子フィルム層を直接無機基板面上にて形成した積層体L14を得た。結果を表4に示す。<Examples 7 to 11>
The plasma processing surface of the plasma processing film P1 trimmed into a 90 mm × 90 mm rectangle is stacked on the side of the silane coupling agent layer of the inorganic substrate S2 so that the edge of the inorganic substrate surface is exposed by 5 mm, and the vacuum pressing machine manufactured by Imoto Seisakusho is used. The laminate was sandwiched between upper and lower cushioning materials, pressed at a hot plate temperature of 300 ° C. for 20 minutes under vacuum, and cooled to room temperature to obtain a laminate L7. Similarly, laminates were similarly obtained using the plasma-treated films P2 to P5. In the case of the plasma-treated film P4, the vacuum press temperature was 140 ° C., and in the case of the plasma-treated film P5, it was 175 ° C. Table 4 shows the properties of the obtained laminate.
<Comparative example 2>
A laminate C2 was obtained in the same manner as in Example 7 except that the inorganic substrate S4 was used. Table 4 shows the properties of the obtained laminate.
<Example 12>
Using the patterned inorganic substrate SP1 and the plasma-treated film P2, the same procedure as in Example 1 was followed to obtain a laminate L12. For the laminate L6, the portion of the patterned inorganic plate that was not irradiated with UV / ozone was evaluated as a normal portion, and the irradiated portion was evaluated as an easily peelable portion.
<Example 13>
Using the patterned inorganic substrate SP1 and the patterned plasma-treated film PP2, the same procedure as in Example 1 was followed to obtain a laminate L13. The shape of the mask used for the patterning process on the inorganic plate side and the shape of the mask used for the patterning process on the plasma processing film side are the same, and both the processed parts are arranged so as to overlap each other. . As for the layered product L13, the part where UV / ozone irradiation was not performed was evaluated as a normal part, and the irradiated part was evaluated as an easily peelable part. The results are shown in Table 4.
<Example 14>
The polyamic acid solution obtained in Production Example 2 was applied to the patterned inorganic substrate SP1 with a die coater so that the final film thickness was 25 μm, placed in an explosion-proof oven and dried at 80 ° C. for 100 minutes, and then 200 The temperature was raised to 5 ° C./minute up to 5 ° C., held at 200 ° C. for 60 minutes, then heated up to 480 ° C. at 10 ° C./minute, held at 480 ° C. for 5 minutes, and then 30 ° C./minute at 100 ° C. The laminate L14 was obtained by opening the oven door and cooling to near room temperature to form a polymer film layer directly on the inorganic substrate surface. The results are shown in Table 4.
(応用例1)
実施例1〜6、実施例12、実施例13、実施例14、比較例1により得られた積層体を用い、以下の工程により、ボトムゲート型の薄膜トランジスタアレイを試作した。
ガスバリア層の形成 高分子フィルム側全面に反応性スパッタリング法を用いてSiONからなる100nmのガスバリア膜を形成した。次いで、厚さ80nmのアルミニウム層をスパッタリング法にて形成し、フォトリソグラフ法によりゲート配線とゲート電極を形成した。次いで、スリットダイコーターを用いてエポキシ樹脂系のゲート絶縁膜(厚さ80nm)を形成した。さらにスパッタリング法にて5nmのクロム層、40nmの金層を形成し、フォトリソグラフ法にてソース電極とドレイン電極を形成した。次いでスリットダイコーターを用いて、絶縁層兼ダム層となるエポキシ樹脂を塗布し、UV−YAGレーザーによるアブレーションにて、ソース電極とドレイン電極を含む半導体層用の厚さ250nmのダム層を直径100μmの円形となるように形成し、また上部電極との接続点となるビア形成も同時に行った。次いで、インクジェット印刷法により有機半導体であるポリチオフェンをダム内に塗出、ビア部には銀ペーストを埋め込み、さらに上部電極としてアルミ配線を形成し640×480ピクセルを有する薄膜トランジスタアレイを形成した。
得られた薄膜トランジスタアレイをバックプレーンとし、フロントプレーンに電気泳動表示媒体を重ねることにより、ディスプレイ素子とし、トランジスタの収率と表示性能を、各ピクセルのON/OFFにて判定した。結果、実施例において得られた薄膜トランジスタアレイについては、いずれも表示性能は良好であった。一方比較例となる積層体C1においては、縦方向に12本、横方向に5本のラインの表示が欠陥となった。
なお、比較例C1において欠陥となったピクセルは、いずれもゲート配線の断線か、あるいは上部電極の断線が生じていた。断線部分に相当する高分子フィルムの下面、すなわちガラス板との接着面には長径10μm以上の異物が観察され、断線は異物によってフォトリソ工程での露光が阻害されたことが示唆された。断線の原因となった異物を組成分析した結果、Si元素が異物の25%以上を占めており、シランカップリング剤の凝集物であると判断された。
パターン化を行ったL6、L12、L13、L14については、フロントプレーンを重ねた後に、パターン化処理部の外周に沿ってUV−YAGレーザーにて高分子フィルム部を焼き切り、切れ目の端部から薄いカミソリ上の刃を用いてすくい上げるように剥離を行ったところ、いずれも容易に剥離することができ、フレキシブル電気泳動ディスプレイデバイスを得ることができた。
パターン化処理を行っていない残りの積層体については、ガラス基板側からYAGレーザーをスキャニングしながら全面に照射し、高分子フィルムとガラス板との接着性を弱めた状態で、同様に薄い刃を用いてすくい上げるように剥離操作を行い、同様にフレキシブル電気泳動ディスプレイデバイスを得た。
得られたフレキシブル電気泳動ディスプレイデバイスは、L14から得られたものを除き、直径3mmの円柱に巻き付けても表示性能が劣化することはなく、実用十分なフレキシブル性を有することが確認された。L14から得られたフレキシブル電気泳動ディスプレイデバイスについては直径5mm円柱に巻き付けについては問題なかったが、直径3mmの円柱に巻き付けた場合、高分子フィルムの端部に裂けが生じた。これは、高分子フィルム自体が若干脆いことに起因する。(Application 1)
Using the laminates obtained in Examples 1 to 6, Example 12, Example 13, Example 14, and Comparative Example 1, a bottom gate type thin film transistor array was prototyped by the following steps.
Formation of Gas Barrier Layer A 100 nm gas barrier film made of SiON was formed on the entire surface of the polymer film using a reactive sputtering method. Next, an aluminum layer having a thickness of 80 nm was formed by a sputtering method, and a gate wiring and a gate electrode were formed by a photolithography method. Next, an epoxy resin-based gate insulating film (thickness 80 nm) was formed using a slit die coater. Further, a 5 nm chromium layer and a 40 nm gold layer were formed by sputtering, and a source electrode and a drain electrode were formed by photolithography. Next, using a slit die coater, an epoxy resin serving as an insulating layer and dam layer is applied, and a 250-nm thick dam layer for a semiconductor layer including a source electrode and a drain electrode is formed by ablation with a UV-YAG laser with a diameter of 100 μm. The via was also formed at the same time as a connection point with the upper electrode. Next, polythiophene, which is an organic semiconductor, was coated in the dam by ink jet printing, a silver paste was buried in the via portion, and an aluminum wiring was formed as an upper electrode to form a thin film transistor array having 640 × 480 pixels.
The obtained thin film transistor array was used as a back plane, and an electrophoretic display medium was overlaid on the front plane to form a display element. The yield and display performance of the transistor were determined by ON / OFF of each pixel. As a result, the thin film transistor arrays obtained in the examples all had good display performance. On the other hand, in the laminate C1 as a comparative example, the display of 12 lines in the vertical direction and 5 lines in the horizontal direction was defective.
In each of the pixels that were defective in the comparative example C1, the gate wiring was disconnected or the upper electrode was disconnected. Foreign matter having a major axis of 10 μm or more was observed on the lower surface of the polymer film corresponding to the broken portion, that is, the adhesive surface with the glass plate, suggesting that the breakage hindered exposure in the photolithography process. As a result of the compositional analysis of the foreign matter that caused the disconnection, it was determined that the Si element accounted for 25% or more of the foreign matter and was an aggregate of the silane coupling agent.
For L6, L12, L13, and L14 subjected to patterning, after overlapping the front plane, the polymer film part is burned out with a UV-YAG laser along the outer periphery of the patterning processing part, and thin from the edge of the cut When peeling was performed using a blade on a razor to scoop up, both could be easily peeled off and a flexible electrophoretic display device could be obtained.
For the remaining laminate that has not been patterned, irradiate the entire surface while scanning with a YAG laser from the glass substrate side, and use a thin blade in the same manner in a state where the adhesion between the polymer film and the glass plate is weakened. A peeling operation was performed so as to scoop up and a flexible electrophoretic display device was obtained in the same manner.
It was confirmed that the obtained flexible electrophoretic display device has practically sufficient flexibility without deterioration in display performance even when it is wound around a cylinder having a diameter of 3 mm, except for the one obtained from L14. For the flexible electrophoretic display device obtained from L14, there was no problem with winding around a cylinder with a diameter of 5 mm, but when wound around a cylinder with a diameter of 3 mm, the end of the polymer film was torn. This is because the polymer film itself is slightly brittle.
<応用例2>
実施例1にて得られた積層体L1において、応用例1にてフレキシブル電気泳動ディスプレイデバイスを剥離した後に、元の基板であったパイレックスガラス板を、10%の水酸化ナトリウム水溶液に室温にて20時間浸積し、ついで水洗の後、液晶基板用ガラス洗浄装置にてクリーニング洗浄を行った。洗浄後のガラス板を用いて、再び実施例1と同様にして、実施例1で用いた側と同じ面にシランカップリング剤層を形成し、以下同様に操作して積層体を得た。得られた積層体の品位は良好で、異物密度は0.5個/cm2であ
り、十分にリサイクル使用が可能なことが示された。
<比較応用例>
比較例で得られた積層体C1において、応用例2と同様にフレキシブル電気泳動ディスプレイデバイスを剥離した後に、同様に洗浄操作を行い、再び同様の操作にて積層体を形成したが、異物密度が46個/cm2にまで増加し、品位低下が著しいことが確認された
。
(応用例3)
実施例7〜11、比較例2にて得られた積層体を、開口部を有するステンレス製の枠を被せてスパッタリング装置
内の基板ホルダーに固定した。基板ホルダーと積層体の支持体とを密着するように固定して、基板ホルダー内に冷媒を流すことによって、積層体の温度を設定できるようにし、積層体の温度を2℃に設定した。まず、積層体の高分子フィルム表面にプラズマ処理を施した。プラズマ処理条件は、アルゴンガス中で、周波数13.56MHz、出力200W、ガス圧1×10−3Torrの条件とし、処理時の温度は2℃、処理時間は2分間とした。次いで、周波数13.56MHz、出力450W、ガス圧3×10−3Torrの条件で、ニッケル−クロム(クロム10質量%)合金のターゲットを用いて、アルゴン雰囲気下にてDCマグネトロンスパッタリング法により、1nm/秒のレートで厚さ11nmのニッケル−クロム合金被膜(下地層)を形成した。次いで、積層体の温度を2℃に設定し、スパッタリングを行った。そして、10nm/秒のレートで銅を蒸着させ、厚さ0.22μmの銅薄膜を形成した。このようにして、各積層体から下地金属薄膜形成フィルム付きの積層板を得た。なお、銅およびNiCr層の厚さは蛍光X線法によって確認した。<Application example 2>
In the laminate L1 obtained in Example 1, after peeling the flexible electrophoretic display device in Application Example 1, the Pyrex glass plate that was the original substrate was placed in a 10% aqueous sodium hydroxide solution at room temperature. It was immersed for 20 hours, then washed with water, and then cleaned with a glass substrate glass cleaning device. Using the glass plate after washing, a silane coupling agent layer was formed on the same surface as that used in Example 1 again in the same manner as in Example 1, and the same procedure was followed to obtain a laminate. The quality of the obtained laminate was good, and the foreign matter density was 0.5 / cm 2 , indicating that it could be fully recycled.
<Comparative application>
In the laminate C1 obtained in the comparative example, the flexible electrophoretic display device was peeled off in the same manner as in the application example 2, and then the washing operation was performed in the same manner, and the laminate was formed again by the same operation. It increased to 46 pieces / cm < 2 >, and it was confirmed that the quality reduction is remarkable.
(Application 3)
The laminates obtained in Examples 7 to 11 and Comparative Example 2 were covered with a stainless steel frame having an opening and fixed to the substrate holder in the sputtering apparatus. The substrate holder and the support of the laminate were fixed in close contact with each other, and a coolant was allowed to flow through the substrate holder so that the temperature of the laminate could be set. The temperature of the laminate was set to 2 ° C. First, plasma treatment was applied to the polymer film surface of the laminate. The plasma treatment conditions were as follows: argon gas, frequency 13.56 MHz, output 200 W, gas pressure 1 × 10 −3 Torr, treatment temperature 2 ° C., treatment time 2 minutes. Next, under the conditions of a frequency of 13.56 MHz, an output of 450 W, and a gas pressure of 3 × 10 −3 Torr, a nickel-chrome (chromium 10 mass%) alloy target is used to obtain a 1 nm / A nickel-chromium alloy coating (underlayer) having a thickness of 11 nm was formed at a rate of seconds. Subsequently, the temperature of the laminated body was set to 2 ° C., and sputtering was performed. Then, copper was vapor-deposited at a rate of 10 nm / second to form a copper thin film having a thickness of 0.22 μm. Thus, the laminated board with a base metal thin film formation film was obtained from each laminated body. The thicknesses of the copper and NiCr layers were confirmed by the fluorescent X-ray method.
次に、各フィルムからの下地金属薄膜形成フィルム付きの積層板をCu製の枠に固定し、硫酸銅めっき浴を用い、電解めっき液(硫酸銅80g/l、硫酸210g/l、HCl、光沢剤少量)に浸漬し、電気を1.5A/dm2流すことにより、厚さ4μmの厚付け
銅メッキ層(厚付け層)を形成した。引き続き120℃で10分間熱処理して乾燥し、積層体の高分子フィルム面に銅箔層を形成した。Next, a laminated board with a base metal thin film forming film from each film is fixed to a Cu frame, and an electroplating solution (copper sulfate 80 g / l, sulfuric acid 210 g / l, HCl, gloss, using a copper sulfate plating bath). A thick copper plating layer (thickening layer) having a thickness of 4 μm was formed by immersing in a small amount of the agent and flowing 1.5 A / dm 2 of electricity. Then, it heat-processed for 10 minutes at 120 degreeC, it dried, and the copper foil layer was formed in the polymer film surface of a laminated body.
得られた各金属化ポリイミドフィルム・支持体積層体に対して、フォトレジスト(シプレー社製「FR−200」)を塗布乾燥した後に、ガラスフォトマスクでオフコンタクト露光し、さらに1.2質量%KOH水溶液にて現像した。次に、HClおよび過酸化水素を含む塩化第二銅のエッチングラインで、40℃、2kgf/cm2のスプレー圧でエッ
チングし、ライン/スペース=20μm/20μmのライン列をテストパターンとして形成した。次いで、0.5μm厚に無電解スズメッキを施した後、125℃で1時間のアニール処理を行い、配線パターンを得た。
得られた配線パターンを光学顕微鏡で観察し、またテストパターンを用いて断線/短絡の有無をチェックした。結果、実施例7〜11の積層体から得られた配線パターンには、断線、短絡は無く、パターン形状も良好であった。一方比較例2の積層体から得られた配線パターンでは一部に断線が観察された。断線部の配線形状は配線が痩せてかすれるような形状になっており、フォトレジスト工程での露光が阻害された結果によると結論された。また断線部位においては高分子フィルム部分が凸状態となっており、高分子フィルムとガラス基板間に異物が存在していることが判明した。異物は組成分析の結果Si元素が25%以上を占めており、シランカップリング剤の凝集物であると結論された。
次いで、応用例1と同様の手法にてガラス板から高分子フィルムを剥離し、フレキシブル配線基板とした。得られたフレキシブル配線板の屈曲性は良好であった。
以上の結果より、本発明の積層体がフレキシブル電子デバイスの製造に有用であり、なおかつ基板のリサイクル性においても優れることが示された。After applying and drying a photoresist (“FR-200” manufactured by Shipley Co., Ltd.) on each metallized polyimide film / support laminate, the resulting metallized polyimide film / support laminate was subjected to off-contact exposure with a glass photomask, and further 1.2 mass%. Development was performed with an aqueous KOH solution. Next, etching was performed with a cupric chloride etching line containing HCl and hydrogen peroxide at 40 ° C. and a spray pressure of 2 kgf / cm 2 to form a line array of lines / spaces = 20 μm / 20 μm as a test pattern. Next, after electroless tin plating was performed to a thickness of 0.5 μm, annealing treatment was performed at 125 ° C. for 1 hour to obtain a wiring pattern.
The obtained wiring pattern was observed with an optical microscope, and the presence or absence of disconnection / short circuit was checked using the test pattern. As a result, the wiring patterns obtained from the laminates of Examples 7 to 11 had no disconnection or short circuit, and the pattern shape was good. On the other hand, in the wiring pattern obtained from the laminate of Comparative Example 2, disconnection was observed in part. It was concluded that the wiring shape of the disconnection part was such that the wiring was thin and faint, and that the exposure in the photoresist process was hindered. Further, it was found that the polymer film portion was in a convex state at the disconnection site, and foreign matter was present between the polymer film and the glass substrate. As a result of the compositional analysis, the foreign matter accounted for 25% or more of the Si element, and it was concluded that it was an aggregate of the silane coupling agent.
Subsequently, the polymer film was peeled from the glass plate by the same method as in Application Example 1 to obtain a flexible wiring board. The flexibility of the obtained flexible wiring board was good.
From the above results, it was shown that the laminate of the present invention is useful for the production of flexible electronic devices and is also excellent in substrate recyclability.
本発明の積層体は、電子デバイスを作成した後に無機基板から電子デバイス付き高分子フィルムを容易に剥離することが可能であるのみならず、積層体の接着に使用するシランカップリング剤の凝集体が無機基板に付着することを防止し、品位に優れ、高分子フィルム/無機基板間の接着力が均質化された積層体を供給するものであり、産業界への寄与は大きい。
さらに本発明によれば、高分子フィルム剥離後の無機基板表面の粗度が小さく、簡単な洗浄操作後にてシランカップリング剤を再塗布して基板として活用することが可能となり、無機基板のリサイクル性が格段に向上する。The laminate of the present invention is not only capable of easily peeling a polymer film with an electronic device from an inorganic substrate after the electronic device is prepared, but also an aggregate of silane coupling agents used for adhesion of the laminate. Is a layered product in which the adhesion between the polymer film and the inorganic substrate is homogenized, and the contribution to the industry is great.
Furthermore, according to the present invention, the roughness of the inorganic substrate surface after peeling the polymer film is small, and it becomes possible to re-apply the silane coupling agent after a simple cleaning operation and use it as a substrate. Sexually improves.
Claims (15)
破断強度の1/2以下であることを特徴とする積層体。A laminate in which a polymer film and an inorganic substrate are bonded via a silane coupling agent layer, and the number of foreign matters having a major axis of 10 μm or more existing between the polymer film and the inorganic substrate is 3 / cm. 2 or less, and the adhesive strength between the polymer film and the inorganic substrate is ½ or less of the breaking strength of the polymer film.
3のいずれかに記載の積層体。The inorganic substrate is a glass plate having an area of 1000 cm 2 or more.
4. The laminate according to any one of 3 above.
(1) 気体化したシランカップリング剤に無機基板を暴露させることにより、無機基板上に、シランカップリング剤層を形成する工程
(2)該シランカップリング剤層に、表面活性化処理を行った高分子フィルムを重ねる工程
(3)加熱加圧することにより両者を接着する工程It has the process of following (1)-(3), The manufacturing method of a laminated body characterized by the above-mentioned.
(1) Forming a silane coupling agent layer on an inorganic substrate by exposing the inorganic substrate to a gasified silane coupling agent
(2) A step of superposing a polymer film subjected to surface activation treatment on the silane coupling agent layer
(3) Adhering both by heating and pressing
(1) 気体化したシランカップリング剤に無機基板を暴露させることにより、無機基板上に、シランカップリング剤層を形成する工程
(2)高分子の溶液ないし高分子前駆体溶液を該シランカップリング剤層上に塗布する工程
(3)該高分子溶液ないし該高分子前駆体溶液を乾燥・加熱して高分子フィルムとして積層体を得る工程It has the process of following (1)-(3), The manufacturing method of a laminated body characterized by the above-mentioned.
(1) Forming a silane coupling agent layer on an inorganic substrate by exposing the inorganic substrate to a gasified silane coupling agent
(2) A step of applying a polymer solution or polymer precursor solution onto the silane coupling agent layer
(3) A step of drying and heating the polymer solution or the polymer precursor solution to obtain a laminate as a polymer film
該積層体の高分子フィルム上に電子デバイスを形成し、
次いで、該高分子フィルムを該電子デバイスごと無機基板から剥離する事を特徴とするフレキシブル電子デバイスの製造方法。Using the laminate obtained by the production method according to claim 7,
Forming an electronic device on the polymer film of the laminate,
Next, the method for producing a flexible electronic device, wherein the polymer film is peeled off from the inorganic substrate together with the electronic device.
該積層体の高分子フィルムの、前記易剥離部分に相当する部分の上に電子デバイスを形成し、
次いで、該積層体の該易剥離部分の外周に沿って、該高分子フィルムに切り込みを入れ、
該高分子フィルムを電子デバイスごと無機基板から剥離する事を特徴とするフレキシブル電子デバイスの製造方法。Using the laminate obtained by the production method according to claim 11,
Forming an electronic device on a portion corresponding to the easily peelable portion of the polymer film of the laminate,
Then, along the outer periphery of the easily peelable portion of the laminate, cut into the polymer film,
A method for producing a flexible electronic device, comprising peeling the polymer film together with the electronic device from an inorganic substrate.
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TWI524991B (en) | 2016-03-11 |
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