JPWO2012066893A1 - 自動分析装置 - Google Patents
自動分析装置 Download PDFInfo
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- JPWO2012066893A1 JPWO2012066893A1 JP2012544160A JP2012544160A JPWO2012066893A1 JP WO2012066893 A1 JPWO2012066893 A1 JP WO2012066893A1 JP 2012544160 A JP2012544160 A JP 2012544160A JP 2012544160 A JP2012544160 A JP 2012544160A JP WO2012066893 A1 JPWO2012066893 A1 JP WO2012066893A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/272—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration for following a reaction, e.g. for determining photometrically a reaction rate (photometric cinetic analysis)
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21K, F21L, F21S and F21V, RELATING TO THE FORM OR THE KIND OF THE LIGHT SOURCES OR OF THE COLOUR OF THE LIGHT EMITTED
- F21Y2115/00—Light-generating elements of semiconductor light sources
- F21Y2115/10—Light-emitting diodes [LED]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/3181—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using LEDs
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N2035/00346—Heating or cooling arrangements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/023—Controlling conditions in casing
- G01N2201/0231—Thermostating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
- G01N2201/0624—Compensating variation in output of LED source
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0695—Supply to maintain constant beam intensity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/121—Correction signals
- G01N2201/1211—Correction signals for temperature
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- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
図5は、図3の温度調節機構における検証モデルの(a)は平面図、(b)は(a)のA−A線断面図、(c)は底面図である。
λ(熱伝導率)=熱伝導シート260=0.8W/m・K
S(熱伝導面積)=発熱を伴うリード252と熱伝導シート260とが接する面積=0.5mm×10mm×2(リード252が上下で熱伝導シート260と接するため)=10mm2=10×10−6m2
T1−T2(温度変化)=47−37=10K
h(厚さ)=熱伝導シート260の厚さf=1mm=1×10−3m
Q=0.8W/m・K×10×10−6m2×10K/1×10−3m=8×10−2W/S=0.08J
次に、図4に示した本発明の温度調節機構401について、図5の温度調節機構501と同様の寸法a〜d、gにてモデル化し、検証する。なお、温度調節機構401では、熱伝導シート260が存在しないため、寸法e、fについては考慮する必要がないことは言うまでもない。
S(熱伝導面積)=4(パイプ径)×π×1/2(パイプ円周の1/2)×36×π×1/2+2+2(簡略化のため配管中心部長さとする)×2(金属パイプ203が上下で熱伝導シート402と接するため)=760.13mm2=760×10−6m2
T1−T2(温度変化)=47−37=10K
h(厚さ)=熱伝導シート260の厚さf=1mm=1×10−3m
Q=0.8W/m・K×760×10−6m2×10K/1×10−3m=6.08W/S=6.08J
10 サンプリング機構
20 サンプリングアーム
101 サンプル容器
102 サンプルディスク
103 コンピュータ
104 インターフェイス
105 サンプル分注プローブ
106 反応容器
107 サンプル用シリンジポンプ
109 反応ディスク
110 試薬分注プローブ
111 試薬用シリンジポンプ
112 試薬ボトル
113 攪拌器
114 光源(発光ダイオード光源)
115 光度計
116 A/D変換器
117 プリンタ
118 CRT
119 洗浄機構
120 洗浄用ポンプ
121 キーボード
122 ハードディスク
125 試薬ディスク
151 液面検出回路
152 圧力センサ
153 圧力検出回路
201 温度調節機構
202 金属部材
202a 間隙
202b 貫通孔
203 金属パイプ(流水パイプ)
204 ピン(金属小片部材)
204a ピンの本体
205 断熱材
206 恒温槽
251 発光部
252 発熱を伴うリード
253 発熱を伴わないリード
254 断熱材(絶縁部材)
260 熱伝導シート
301 温度調節機構
401 温度調節機構
402 絶縁部材
501 温度調節機構
Claims (3)
- 発光ダイオード光源と、この発光ダイオード光源の温度調節機構とを備えた自動分析装置であって、前記温度調節機構は、前記発光ダイオード光源が設けられた金属部材と、この金属部材に埋設されて恒温槽水を流す流水パイプと、前記発光ダイオード光源の発熱を伴うリードのみを前記金属部材に直接接触させる金属小片部材と、から構成されることを特徴とする自動分析装置。
- 請求項1に記載の自動分析装置において、前記発光ダイオード光源の発熱を伴わないリードが絶縁部材で覆われることを特徴とする自動分析装置。
- 請求項1または2に記載の自動分析装置において、前記流水パイプが絶縁部材で覆われることを特徴とする自動分析装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012544160A JP5487324B2 (ja) | 2010-11-18 | 2011-10-18 | 自動分析装置 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010257446 | 2010-11-18 | ||
JP2010257446 | 2010-11-18 | ||
JP2012544160A JP5487324B2 (ja) | 2010-11-18 | 2011-10-18 | 自動分析装置 |
PCT/JP2011/073940 WO2012066893A1 (ja) | 2010-11-18 | 2011-10-18 | 自動分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP5487324B2 JP5487324B2 (ja) | 2014-05-07 |
JPWO2012066893A1 true JPWO2012066893A1 (ja) | 2014-05-12 |
Family
ID=46083833
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012544160A Active JP5487324B2 (ja) | 2010-11-18 | 2011-10-18 | 自動分析装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20130243657A1 (ja) |
EP (1) | EP2642299A1 (ja) |
JP (1) | JP5487324B2 (ja) |
CN (1) | CN103201632A (ja) |
WO (1) | WO2012066893A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107247040A (zh) * | 2017-05-24 | 2017-10-13 | 重庆大学 | 食源性致病菌荧光检测装置和工作方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU2003265308A1 (en) * | 2002-07-25 | 2004-02-16 | Jonathan S. Dahm | Method and apparatus for using light emitting diodes for curing |
JP3964291B2 (ja) | 2002-09-06 | 2007-08-22 | 富士フイルム株式会社 | 分析機器 |
JP2009545107A (ja) * | 2006-07-28 | 2009-12-17 | ティーアイアール テクノロジー エルピー | エッジ放出要素を有する光源 |
CN201059516Y (zh) * | 2007-09-06 | 2008-05-14 | 陈雪梅 | 一种发光体散热结构 |
WO2010013777A1 (ja) * | 2008-07-30 | 2010-02-04 | 株式会社日立ハイテクノロジーズ | 試料分析装置 |
JP5780761B2 (ja) * | 2008-12-24 | 2015-09-16 | 株式会社日立ハイテクノロジーズ | 光度計を備えた分析システム |
KR101574286B1 (ko) * | 2009-01-21 | 2015-12-04 | 삼성전자 주식회사 | 발광 장치 |
WO2010117026A1 (ja) * | 2009-04-08 | 2010-10-14 | 株式会社日立ハイテクノロジーズ | 光源装置及びそれを用いた分析装置及び液晶表示装置 |
US8383946B2 (en) * | 2010-05-18 | 2013-02-26 | Joinset, Co., Ltd. | Heat sink |
-
2011
- 2011-10-18 JP JP2012544160A patent/JP5487324B2/ja active Active
- 2011-10-18 EP EP11841497.8A patent/EP2642299A1/en not_active Withdrawn
- 2011-10-18 WO PCT/JP2011/073940 patent/WO2012066893A1/ja active Application Filing
- 2011-10-18 CN CN2011800542368A patent/CN103201632A/zh active Pending
- 2011-10-19 US US13/988,083 patent/US20130243657A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP2642299A9 (en) | 2013-12-11 |
WO2012066893A1 (ja) | 2012-05-24 |
EP2642299A1 (en) | 2013-09-25 |
US20130243657A1 (en) | 2013-09-19 |
JP5487324B2 (ja) | 2014-05-07 |
CN103201632A (zh) | 2013-07-10 |
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