JPS649619B2 - - Google Patents

Info

Publication number
JPS649619B2
JPS649619B2 JP7050183A JP7050183A JPS649619B2 JP S649619 B2 JPS649619 B2 JP S649619B2 JP 7050183 A JP7050183 A JP 7050183A JP 7050183 A JP7050183 A JP 7050183A JP S649619 B2 JPS649619 B2 JP S649619B2
Authority
JP
Japan
Prior art keywords
mask
cleaning
back surfaces
tank
cleaned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7050183A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59195652A (ja
Inventor
Toshio Wada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP58070501A priority Critical patent/JPS59195652A/ja
Publication of JPS59195652A publication Critical patent/JPS59195652A/ja
Publication of JPS649619B2 publication Critical patent/JPS649619B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82Auxiliary processes, e.g. cleaning or inspecting

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
JP58070501A 1983-04-21 1983-04-21 光露光用マスクの洗浄方法 Granted JPS59195652A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58070501A JPS59195652A (ja) 1983-04-21 1983-04-21 光露光用マスクの洗浄方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58070501A JPS59195652A (ja) 1983-04-21 1983-04-21 光露光用マスクの洗浄方法

Publications (2)

Publication Number Publication Date
JPS59195652A JPS59195652A (ja) 1984-11-06
JPS649619B2 true JPS649619B2 (enrdf_load_stackoverflow) 1989-02-17

Family

ID=13433330

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58070501A Granted JPS59195652A (ja) 1983-04-21 1983-04-21 光露光用マスクの洗浄方法

Country Status (1)

Country Link
JP (1) JPS59195652A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH073577B2 (ja) * 1985-06-05 1995-01-18 株式会社ニコン 基板の洗浄方法
JPS6268581A (ja) * 1985-09-20 1987-03-28 松下電器産業株式会社 一槽式水洗槽
JP6961913B2 (ja) * 2016-08-18 2021-11-05 東洋製罐株式会社 洗浄装置及び洗浄方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58115044A (ja) * 1981-12-28 1983-07-08 Watanabe Shoko:Kk ガラスの洗浄方法

Also Published As

Publication number Publication date
JPS59195652A (ja) 1984-11-06

Similar Documents

Publication Publication Date Title
US4569695A (en) Method of cleaning a photo-mask
JP3920429B2 (ja) 位相シフトフォトマスクの洗浄方法および洗浄装置
JPH05134397A (ja) ガラス基板の洗浄方法、及び洗浄装置
JPH08187475A (ja) スクラバ中の金属を除去する方法
US4116714A (en) Post-polishing semiconductor surface cleaning process
US3898351A (en) Substrate cleaning process
CN109092801A (zh) 一种蓝宝石晶片的清洗方法及其采用的设备
JPS649619B2 (enrdf_load_stackoverflow)
JPS649618B2 (enrdf_load_stackoverflow)
CN114887990A (zh) 胶合镜片超声波清洗工艺
JP2002273358A (ja) 光学素子の洗浄方法
KR19980073947A (ko) 웨이퍼 세정방법
JP3304174B2 (ja) 薄板の洗浄方法
JPS59195653A (ja) フオトマスクの洗浄方法および洗浄装置
JPS649621B2 (enrdf_load_stackoverflow)
JP2002151453A (ja) 精密基板の洗浄方法及び洗浄装置
JP3324181B2 (ja) ウエハの洗浄方法
JP2002131889A (ja) フォトマスク用石英基板の洗浄方法及び洗浄装置
CN106024693B (zh) 用于半导体微纳器件湿法工艺的铁氟龙夹具及其应用
CN104124136A (zh) 半导体晶片清洗方法
JP2002049144A (ja) 基板端面洗浄装置
JP4205106B2 (ja) 位相シフトフォトマスクの洗浄方法および洗浄装置
JPS59195649A (ja) ホトマスク洗浄装置
JP2000315672A (ja) 半導体基板の洗浄方法および洗浄装置
JPS58115044A (ja) ガラスの洗浄方法