JPS6488390A - Radiation pulse processing circuit - Google Patents
Radiation pulse processing circuitInfo
- Publication number
- JPS6488390A JPS6488390A JP24873687A JP24873687A JPS6488390A JP S6488390 A JPS6488390 A JP S6488390A JP 24873687 A JP24873687 A JP 24873687A JP 24873687 A JP24873687 A JP 24873687A JP S6488390 A JPS6488390 A JP S6488390A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- digital
- sent
- digital signal
- complement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Current Or Voltage (AREA)
- Measurement Of Radiation (AREA)
Abstract
PURPOSE:To reduce an error caused by waveform shaping by bringing a radiation pulse signal to A/D conversion, delaying and attenuating the obtained digital signal, calculating a complement and adding the digital signal which is subjected to complement processing and the original digital signal. CONSTITUTION:A radiation pulse signal (a) is outputted as a sampling pulse (b) through a high speed discriminator 11, brought to A/D conversion 13, and outputted as a digital signal (c). This signal (c) is sent to a digital adding circuit 14, and also, sent to a digital delaying circuit 15, and inputted to an attenuating and complement calculating circuit 16 after a prescribed delay time is given. A digital signal (d) which is delayed, attenuated and brought to complement processing in such a way is added 14 to the original signal (c), and its output signal (e) is cut as to its latter half part, and becomes that which is shortened. This signal (e) is sent to a digital adder 17 and integrated by being added one after another in accordance with an integral timing pulse which is sent from a pulse generating circuit 12. In such a way, the adjustment is simplified, and an error caused by waveform shaping can be reduced.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24873687A JPS6488390A (en) | 1987-09-30 | 1987-09-30 | Radiation pulse processing circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24873687A JPS6488390A (en) | 1987-09-30 | 1987-09-30 | Radiation pulse processing circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6488390A true JPS6488390A (en) | 1989-04-03 |
Family
ID=17182596
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24873687A Pending JPS6488390A (en) | 1987-09-30 | 1987-09-30 | Radiation pulse processing circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6488390A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010204124A (en) * | 2010-06-14 | 2010-09-16 | Toshiba Corp | Radiation detector |
WO2019058619A1 (en) * | 2017-09-20 | 2019-03-28 | オリンパス株式会社 | Optical measurement device, optical measurement method, and scanning microscope |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5374086A (en) * | 1976-12-13 | 1978-07-01 | Japan Atomic Energy Res Inst | Gammaaray dosimeter |
JPS60158719A (en) * | 1984-01-30 | 1985-08-20 | Nippon Atom Ind Group Co Ltd | Waveform shaping method |
JPS60187875A (en) * | 1984-03-07 | 1985-09-25 | Nippon Atom Ind Group Co Ltd | Shaping of waveform |
JPS613284A (en) * | 1984-05-29 | 1986-01-09 | シーメンス、アクチエンゲゼルシヤフト | Signal integration and integrator circuit |
-
1987
- 1987-09-30 JP JP24873687A patent/JPS6488390A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5374086A (en) * | 1976-12-13 | 1978-07-01 | Japan Atomic Energy Res Inst | Gammaaray dosimeter |
JPS60158719A (en) * | 1984-01-30 | 1985-08-20 | Nippon Atom Ind Group Co Ltd | Waveform shaping method |
JPS60187875A (en) * | 1984-03-07 | 1985-09-25 | Nippon Atom Ind Group Co Ltd | Shaping of waveform |
JPS613284A (en) * | 1984-05-29 | 1986-01-09 | シーメンス、アクチエンゲゼルシヤフト | Signal integration and integrator circuit |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010204124A (en) * | 2010-06-14 | 2010-09-16 | Toshiba Corp | Radiation detector |
WO2019058619A1 (en) * | 2017-09-20 | 2019-03-28 | オリンパス株式会社 | Optical measurement device, optical measurement method, and scanning microscope |
WO2019058438A1 (en) * | 2017-09-20 | 2019-03-28 | オリンパス株式会社 | Optical measurement device, optical measurement method, and scanning microscope |
US11237047B2 (en) | 2017-09-20 | 2022-02-01 | Olympus Corporation | Optical measurement device, optical measurement method, and scanning microscope |
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