JPS6486547A - Manufacture of semiconductor element - Google Patents

Manufacture of semiconductor element

Info

Publication number
JPS6486547A
JPS6486547A JP24498087A JP24498087A JPS6486547A JP S6486547 A JPS6486547 A JP S6486547A JP 24498087 A JP24498087 A JP 24498087A JP 24498087 A JP24498087 A JP 24498087A JP S6486547 A JPS6486547 A JP S6486547A
Authority
JP
Japan
Prior art keywords
semiconductor element
film
single crystal
type
sic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24498087A
Other languages
Japanese (ja)
Inventor
Akira Suzuki
Masaki Furukawa
Mitsuhiro Shigeta
Yoshihisa Fujii
Atsuko Uemoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP24498087A priority Critical patent/JPS6486547A/en
Publication of JPS6486547A publication Critical patent/JPS6486547A/en
Pending legal-status Critical Current

Links

Landscapes

  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE:To decrease the number of processes, and to realize an element having excellent performance, stability and reliability by constructing an Si semiconductor element by using a pattern film being employed for selectively growing a single crystal SiC film and composed of a high melting-point material as a mask and a surface protective film as it is without being peeled. CONSTITUTION:A gate electrode 9, a source electrode 10 and a drain electrode 11 are formed onto an N-type single crystal SiC film 4, thus constructing an SiC Schottky gate type field-effect transistor. A window is bored to an SiO2 pattern film 2a, and an ohmic electrode 12 to a P-type Si layer 7 and an ohmic electrode 13 to an N-type Si layer 8 are shaped, thus constituting an Si P-N junction diode. Consequently, an SiC semiconductor element and an Si semiconductor element can be built to the same single crystal Si substrate 1. An SiO2 pattern film used for selectively growing the single crystal SiC film can be utilized as a mask for manufacturing the Si semiconductor element and a surface protective film in the Si semiconductor element after manufacture as it is.
JP24498087A 1987-09-28 1987-09-28 Manufacture of semiconductor element Pending JPS6486547A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24498087A JPS6486547A (en) 1987-09-28 1987-09-28 Manufacture of semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24498087A JPS6486547A (en) 1987-09-28 1987-09-28 Manufacture of semiconductor element

Publications (1)

Publication Number Publication Date
JPS6486547A true JPS6486547A (en) 1989-03-31

Family

ID=17126803

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24498087A Pending JPS6486547A (en) 1987-09-28 1987-09-28 Manufacture of semiconductor element

Country Status (1)

Country Link
JP (1) JPS6486547A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5216264A (en) * 1989-06-07 1993-06-01 Sharp Kabushiki Kaisha Silicon carbide MOS type field-effect transistor with at least one of the source and drain regions is formed by the use of a schottky contact

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5216264A (en) * 1989-06-07 1993-06-01 Sharp Kabushiki Kaisha Silicon carbide MOS type field-effect transistor with at least one of the source and drain regions is formed by the use of a schottky contact

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