JPS6486533A - Ic package inspection device - Google Patents
Ic package inspection deviceInfo
- Publication number
- JPS6486533A JPS6486533A JP62244653A JP24465387A JPS6486533A JP S6486533 A JPS6486533 A JP S6486533A JP 62244653 A JP62244653 A JP 62244653A JP 24465387 A JP24465387 A JP 24465387A JP S6486533 A JPS6486533 A JP S6486533A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- package
- cap
- hold
- collar section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09B—ORGANIC DYES OR CLOSELY-RELATED COMPOUNDS FOR PRODUCING DYES, e.g. PIGMENTS; MORDANTS; LAKES
- C09B53/00—Quinone imides
- C09B53/02—Indamines; Indophenols
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To shorten the inspection time while simplifying a structure by positively bringing an electrode for an IC package and an electrode for an inspection base into contact with each other by forming an electrode pusher installed to an exchangeable hold-down member with a hold-down piece conformed to the electrode for the IC package so as to be moved vertically. CONSTITUTION:The outside diameter of a collar section 21f1 in a hold-down member 21f is shaped in size smaller than the inside diameter of a cap 21e and the collar section 21f1 is moved freely in the cap 21e, and the collar section 21f1 is also turned freely because it is placed on a flat bearing 21g. Consequently, the cap 21e is fastened and fixed to a fitting member 21d under the state in which each hold-down piece 21f3 is shifted and rotated so as to be positioned just above each electrode for an IC package, and a nut 21h is tightened and the cap 21e is fastened positively. Currents are flowed through the IC package C, and the normal operation of the IC package C is inspected. When inspection is completed, an electrode pusher 23 is returned to an original position.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62244653A JPS6486533A (en) | 1987-09-29 | 1987-09-29 | Ic package inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62244653A JPS6486533A (en) | 1987-09-29 | 1987-09-29 | Ic package inspection device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6486533A true JPS6486533A (en) | 1989-03-31 |
Family
ID=17121950
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62244653A Pending JPS6486533A (en) | 1987-09-29 | 1987-09-29 | Ic package inspection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6486533A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0232075U (en) * | 1988-08-22 | 1990-02-28 |
-
1987
- 1987-09-29 JP JP62244653A patent/JPS6486533A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0232075U (en) * | 1988-08-22 | 1990-02-28 |
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