JPS5362953A - Test method for logical device - Google Patents
Test method for logical deviceInfo
- Publication number
- JPS5362953A JPS5362953A JP13820376A JP13820376A JPS5362953A JP S5362953 A JPS5362953 A JP S5362953A JP 13820376 A JP13820376 A JP 13820376A JP 13820376 A JP13820376 A JP 13820376A JP S5362953 A JPS5362953 A JP S5362953A
- Authority
- JP
- Japan
- Prior art keywords
- test method
- scan
- logical device
- circuit
- redundancy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To lower the redundancy by securing a circuit constitution in such a way that the address decoder part, scan-in circuit and scan-out circuit are formed into nearly a unit. As a result, the scan-in and scan-out can be realized.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13820376A JPS5362953A (en) | 1976-11-17 | 1976-11-17 | Test method for logical device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13820376A JPS5362953A (en) | 1976-11-17 | 1976-11-17 | Test method for logical device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5362953A true JPS5362953A (en) | 1978-06-05 |
JPS5646173B2 JPS5646173B2 (en) | 1981-10-31 |
Family
ID=15216481
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13820376A Granted JPS5362953A (en) | 1976-11-17 | 1976-11-17 | Test method for logical device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5362953A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5946247A (en) * | 1994-05-26 | 1999-08-31 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory testing device |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60112072U (en) * | 1984-01-06 | 1985-07-29 | 富士電気化学株式会社 | thin battery |
-
1976
- 1976-11-17 JP JP13820376A patent/JPS5362953A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5946247A (en) * | 1994-05-26 | 1999-08-31 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory testing device |
Also Published As
Publication number | Publication date |
---|---|
JPS5646173B2 (en) | 1981-10-31 |
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