JPS6486076A - Ic testing system - Google Patents
Ic testing systemInfo
- Publication number
- JPS6486076A JPS6486076A JP62244823A JP24482387A JPS6486076A JP S6486076 A JPS6486076 A JP S6486076A JP 62244823 A JP62244823 A JP 62244823A JP 24482387 A JP24482387 A JP 24482387A JP S6486076 A JPS6486076 A JP S6486076A
- Authority
- JP
- Japan
- Prior art keywords
- rank processing
- processing apparatuses
- program line
- test
- lower rank
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To rapidly perform the DC test to an element to be tested, by employing a hierarchical structure wherein a higher rank processing apparatus exclusively controls whether a program line is executed and the actual execution of the program line is performed so as to be dispersed to a plurality of lower rank processing apparatuses. CONSTITUTION:An IC testing system employing a hierarchical structure is constituted using a plurality of processing apparatuses 21, 23 and the higher rank processing apparatus 21 controls that a test program is executed at a program line unit and the actual reading and execution of the control content described in the program line are entrusted to the lower rank processing apparatuses 23A-N controlled by the higher rank processing apparatus 21. Exclusive memory devices 27A-N storing the statuses relating to hardware modules 25 to be connected are provided to the lower rank processing apparatuses 23A-N and the lower rank processing apparatuses 23A-N use the exclusive orders thereof to access the hardware modules or to renew the test statuses.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62244823A JP2627751B2 (en) | 1987-09-28 | 1987-09-28 | IC test system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62244823A JP2627751B2 (en) | 1987-09-28 | 1987-09-28 | IC test system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6486076A true JPS6486076A (en) | 1989-03-30 |
JP2627751B2 JP2627751B2 (en) | 1997-07-09 |
Family
ID=17124484
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62244823A Expired - Fee Related JP2627751B2 (en) | 1987-09-28 | 1987-09-28 | IC test system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2627751B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011001462A1 (en) * | 2009-06-29 | 2011-01-06 | 株式会社アドバンテスト | Test apparatus |
KR101138196B1 (en) * | 2008-01-23 | 2012-05-14 | 가부시키가이샤 어드밴티스트 | Testing apparatus |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7290192B2 (en) | 2003-03-31 | 2007-10-30 | Advantest Corporation | Test apparatus and test method for testing plurality of devices in parallel |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5186368A (en) * | 1975-01-27 | 1976-07-28 | Suwa Seikosha Kk | Handotaisochinoshikensochi |
-
1987
- 1987-09-28 JP JP62244823A patent/JP2627751B2/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5186368A (en) * | 1975-01-27 | 1976-07-28 | Suwa Seikosha Kk | Handotaisochinoshikensochi |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101138196B1 (en) * | 2008-01-23 | 2012-05-14 | 가부시키가이샤 어드밴티스트 | Testing apparatus |
WO2011001462A1 (en) * | 2009-06-29 | 2011-01-06 | 株式会社アドバンテスト | Test apparatus |
JPWO2011001462A1 (en) * | 2009-06-29 | 2012-12-10 | 株式会社アドバンテスト | Test equipment |
KR101239658B1 (en) * | 2009-06-29 | 2013-03-11 | 가부시키가이샤 어드밴티스트 | Test apparatus |
Also Published As
Publication number | Publication date |
---|---|
JP2627751B2 (en) | 1997-07-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |