FR2290708A1 - Logic adapter tested in data processor peripheral - uses binary test elements and test command elements - Google Patents

Logic adapter tested in data processor peripheral - uses binary test elements and test command elements

Info

Publication number
FR2290708A1
FR2290708A1 FR7436865A FR7436865A FR2290708A1 FR 2290708 A1 FR2290708 A1 FR 2290708A1 FR 7436865 A FR7436865 A FR 7436865A FR 7436865 A FR7436865 A FR 7436865A FR 2290708 A1 FR2290708 A1 FR 2290708A1
Authority
FR
France
Prior art keywords
elements
test
test command
data processor
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7436865A
Other languages
French (fr)
Other versions
FR2290708B1 (en
Inventor
Marcel Rene Rottier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bull SA
Original Assignee
Societe Industrielle Honeywell Bull
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Societe Industrielle Honeywell Bull filed Critical Societe Industrielle Honeywell Bull
Priority to FR7436865A priority Critical patent/FR2290708A1/en
Publication of FR2290708A1 publication Critical patent/FR2290708A1/en
Application granted granted Critical
Publication of FR2290708B1 publication Critical patent/FR2290708B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Abstract

The testing device is used for a logic adaptor of a data processor peripheral unit, the latter being connected to the processor via a peripheral controller, with binary test elements and a test command element entered into the real memory of the controller. MEans are provided for addressing the controller memory, to obtain the binary test elements and the test command elements on the one hand and the binary test result elements on the other. An interpreting unit is connected to the memory for decoding and executing the binary test command elements. The logic adaptor to be tested can be disconnected from the other parts of the corresponding peripheral unit under the control of the test command elements, via the interpreting unit.
FR7436865A 1974-11-06 1974-11-06 Logic adapter tested in data processor peripheral - uses binary test elements and test command elements Granted FR2290708A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7436865A FR2290708A1 (en) 1974-11-06 1974-11-06 Logic adapter tested in data processor peripheral - uses binary test elements and test command elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7436865A FR2290708A1 (en) 1974-11-06 1974-11-06 Logic adapter tested in data processor peripheral - uses binary test elements and test command elements

Publications (2)

Publication Number Publication Date
FR2290708A1 true FR2290708A1 (en) 1976-06-04
FR2290708B1 FR2290708B1 (en) 1977-10-28

Family

ID=9144729

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7436865A Granted FR2290708A1 (en) 1974-11-06 1974-11-06 Logic adapter tested in data processor peripheral - uses binary test elements and test command elements

Country Status (1)

Country Link
FR (1) FR2290708A1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2391510A1 (en) * 1977-05-20 1978-12-15 Amdahl Corp INFORMATION PROCESSING DEVICE WITH A FAULT DETECTION CIRCUIT
EP0115566A2 (en) * 1982-12-09 1984-08-15 International Business Machines Corporation Method for testing the operation of an I/O controller in a data processing system
EP0169244A1 (en) * 1983-12-30 1986-01-29 Fujitsu Limited Method of and apparatus for diagnosing channel control unit
FR2675603A1 (en) * 1991-04-16 1992-10-23 Hewlett Packard Co Process and device for testing a circuit of a computer system
FR2675921A1 (en) * 1991-04-24 1992-10-30 Hewlett Packard Co METHOD AND DEVICE FOR TESTING A CARD OF A COMPUTER SYSTEM.

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3497685A (en) * 1965-11-03 1970-02-24 Ibm Fault location system
US3798614A (en) * 1972-05-26 1974-03-19 Storage Technology Corp Maintenance facility for a magnetic tape subsystem

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3497685A (en) * 1965-11-03 1970-02-24 Ibm Fault location system
US3798614A (en) * 1972-05-26 1974-03-19 Storage Technology Corp Maintenance facility for a magnetic tape subsystem

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PUBLICATION US DE "IEEE COMPUTER SOCIETY": "DIGEST OF PAPERS, 1972 INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING", 19-21 JUIN 1972, PAGES 68 A 72: "FACOM 230-60 DIAGNOSTIC PROGRAM" K. NOZAWA ) *
REVUE US "IBM TECHNICAL DISCLOSURE BULLETIN", VOLUME 15, NO. 4, SEPTEMBRE 1972, PAGES 1232-1233: "CHANNEL INITIATED SUBSYSTEM DIAGNOSTICS" SALMASSY *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2391510A1 (en) * 1977-05-20 1978-12-15 Amdahl Corp INFORMATION PROCESSING DEVICE WITH A FAULT DETECTION CIRCUIT
EP0115566A2 (en) * 1982-12-09 1984-08-15 International Business Machines Corporation Method for testing the operation of an I/O controller in a data processing system
EP0115566A3 (en) * 1982-12-09 1987-05-13 International Business Machines Corporation Method for testing the operation of an i/o controller in a data processing system
EP0169244A1 (en) * 1983-12-30 1986-01-29 Fujitsu Limited Method of and apparatus for diagnosing channel control unit
EP0169244A4 (en) * 1983-12-30 1987-03-26 Fujitsu Ltd Method of and apparatus for diagnosing channel control unit.
FR2675603A1 (en) * 1991-04-16 1992-10-23 Hewlett Packard Co Process and device for testing a circuit of a computer system
FR2675921A1 (en) * 1991-04-24 1992-10-30 Hewlett Packard Co METHOD AND DEVICE FOR TESTING A CARD OF A COMPUTER SYSTEM.
EP0515290A1 (en) * 1991-04-24 1992-11-25 Hewlett-Packard Company A method and a device for testing a computer system board
US5436856A (en) * 1991-04-24 1995-07-25 Hewlett-Packard Company Self testing computer system with circuits including test registers

Also Published As

Publication number Publication date
FR2290708B1 (en) 1977-10-28

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