JPS6479607A - Optical detector - Google Patents

Optical detector

Info

Publication number
JPS6479607A
JPS6479607A JP62236268A JP23626887A JPS6479607A JP S6479607 A JPS6479607 A JP S6479607A JP 62236268 A JP62236268 A JP 62236268A JP 23626887 A JP23626887 A JP 23626887A JP S6479607 A JPS6479607 A JP S6479607A
Authority
JP
Japan
Prior art keywords
light
inspected
light source
stand
irradiate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62236268A
Other languages
Japanese (ja)
Other versions
JP2764399B2 (en
Inventor
Kenichi Mizuno
Michiaki Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Mechatronics Co Ltd
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Toshiba Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd, Toshiba Seiki Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP62236268A priority Critical patent/JP2764399B2/en
Publication of JPS6479607A publication Critical patent/JPS6479607A/en
Application granted granted Critical
Publication of JP2764399B2 publication Critical patent/JP2764399B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Inking, Control Or Cleaning Of Printing Machines (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To enhance detection accuracy, by a simple structure wherein the light of a light source is brought to parallel light or approximate parallel light by an illumination apparatus to irradiate an object to be inspected. CONSTITUTION:In an illumination apparatus 13, three parallel illumination guide plates 15 are provided to the light path between a light source 11 and the setting stand 12A of an object 12 to be inspected and the distance l between the light source 11 and the stand 12A is set to a predetermined value to bring the light of the light source 11 to light approximate to parallel light 16 to irradiate the object 12 to be inspected. Even when the setting position of the object 12 to be inspected is positionally shifted by DELTAl toward the light source from a reference position l by the cause of the setting error of the stand 12A, since no change is generated in the quantity of the light allowed to irradiate the unit irradiation area of the object 12 to be inspected, the change in the quantity of the irregular reflected beam from the object 12 to be inspected is zero or near to zero and the quantity of the light received by a photodetector 14 also becomes same. By this method, the effect of the change in the relative distance between the light source 11 and the setting position of the object 12 to be inspected on the light receiving result of the apparatus 14 is suppressed and detection accuracy can be enhanced by a simple structure not enhancing the relative positioning accuracy of the light source 11 and the stand 12A even when the object to be inspected has slight warpage.
JP62236268A 1987-09-22 1987-09-22 Picture area ratio measuring device Expired - Lifetime JP2764399B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62236268A JP2764399B2 (en) 1987-09-22 1987-09-22 Picture area ratio measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62236268A JP2764399B2 (en) 1987-09-22 1987-09-22 Picture area ratio measuring device

Publications (2)

Publication Number Publication Date
JPS6479607A true JPS6479607A (en) 1989-03-24
JP2764399B2 JP2764399B2 (en) 1998-06-11

Family

ID=16998264

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62236268A Expired - Lifetime JP2764399B2 (en) 1987-09-22 1987-09-22 Picture area ratio measuring device

Country Status (1)

Country Link
JP (1) JP2764399B2 (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5327055A (en) * 1976-08-26 1978-03-13 Asahi Glass Co Ltd Method of measuring thickness of transparent board
JPS59137506U (en) * 1983-02-10 1984-09-13 小森印刷機械株式会社 Plate holding device for printing plate pattern area ratio meter
JPS60100710A (en) * 1983-11-07 1985-06-04 Sumitomo Heavy Ind Ltd Measuring device for pattern area rate of print plate of offset printing machine
JPS60122308A (en) * 1984-10-25 1985-06-29 Toshiba Corp Evaluating method of bonding
JPS61134605A (en) * 1984-12-05 1986-06-21 Jeol Ltd Measuring device of surface height of object
JPS6210611U (en) * 1985-07-06 1987-01-22
JPS6259810U (en) * 1985-10-02 1987-04-14

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5327055A (en) * 1976-08-26 1978-03-13 Asahi Glass Co Ltd Method of measuring thickness of transparent board
JPS59137506U (en) * 1983-02-10 1984-09-13 小森印刷機械株式会社 Plate holding device for printing plate pattern area ratio meter
JPS60100710A (en) * 1983-11-07 1985-06-04 Sumitomo Heavy Ind Ltd Measuring device for pattern area rate of print plate of offset printing machine
JPS60122308A (en) * 1984-10-25 1985-06-29 Toshiba Corp Evaluating method of bonding
JPS61134605A (en) * 1984-12-05 1986-06-21 Jeol Ltd Measuring device of surface height of object
JPS6210611U (en) * 1985-07-06 1987-01-22
JPS6259810U (en) * 1985-10-02 1987-04-14

Also Published As

Publication number Publication date
JP2764399B2 (en) 1998-06-11

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