JP2764399B2 - Picture area ratio measuring device - Google Patents
Picture area ratio measuring deviceInfo
- Publication number
- JP2764399B2 JP2764399B2 JP62236268A JP23626887A JP2764399B2 JP 2764399 B2 JP2764399 B2 JP 2764399B2 JP 62236268 A JP62236268 A JP 62236268A JP 23626887 A JP23626887 A JP 23626887A JP 2764399 B2 JP2764399 B2 JP 2764399B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- printing plate
- receiving device
- light receiving
- area ratio
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Inking, Control Or Cleaning Of Printing Machines (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】
［産業上の利用分野］
本発明は、印刷版の絵柄面積率測定装置に関する。
［従来の技術］
従来、特開昭57−74605号公報、特開昭61−26806号公
報等に記載されるように、オフセット印刷用印刷版の絵
柄面積率測定装置にあっては、第４図に模式的に示す如
くの光学系が用いられている。この光学系は、光源１の
光を印刷版である被検体２の測定領域に照射する照明装
置と、照射された被検体２の測定領域からの乱反射光を
受光する受光装置３とを有し構成され、受光装置３の受
光量に基づいて被検体２の測定領域における反射光量を
検出し、被検体２の当該測定領域における絵柄面積率を
求めることを可能とする。
［発明が解決しようとする問題点］
しかしながら、従来の絵柄面積率測定装置にあって
は、光源１と被検体２の設定位置（設定テーブル2A）と
の距離ｌが光源１の径ｄに対して短いため、光源１から
被検体２の測定領域への光が放射光線４となっていた。
これにより、第５図に示すように、被検体２の設定位
置が基準位置（ｌ）よりも光源１の方（横軸原点の左
方）へ位置ずれ（Δｌ）すると、被検体２の測定領域に
おける単位照射面積への照射光量が増し、これにともな
い被検体２の測定領域からの乱反射光量も増して、受光
装置３による受光量が増してしまう。このため、同一の
被検体２を検出対象としているにもかかわらず、被検体
２が基準位置にある場合よりも光源１の方へ位置ずれて
いた場合には、あたかも被検体２の反射率が高いかの如
くの検出結果となってしまう。なお、第５図はｄ＝25m
m、ｌ＝55mmの場合の実施例で、また図中縦軸は受光装
置３の出力電圧変化率を示す。
そこで従来の絵柄面積率測定装置にあっては、その検
出精度を向上させるため、被検体２が必ず基準位置に設
定されるように、光源１と被検体２との相対距離を一定
に保つための高精度な位置決め構造を採用したり、被検
体２の厚み精度を確保したり反りを防止する必要があ
る。
本発明は、光源と印刷版との相対距離の変化や受光装
置に対する印刷版面の傾きが受光装置の受光結果に及ぼ
す影響を抑制し、絵柄面積率測定装置による絵柄面積率
の測定精度を、簡素な構造にて向上させることを目的と
する。
［課題を解決するための手段］
本発明は、印刷版設定部に設定された印刷版に光源の
光を照射する照明装置と、前記印刷版からの反射光を受
光する受光装置とを有し、この受光装置の受光量に基づ
いて前記印刷版の測定領域における絵柄面積率を測定す
る絵柄面積率測定装置において、前記光源と前記印刷版
設定部との間の光路に、前記光源からの照射光を平行光
線或いは近似的な平行光線として印刷版の測定領域に導
く照射案内部材を設けてなる前記照明装置を、前記受光
装置の両側に対をなして設け、両照明装置からの各照射
光は印刷版の測定領域で重なり、その合成された反射光
を前記受光装置で受光するようにしたものである。
［作用］
照明装置が印刷版の測定領域に照射する光は平行光線
或いは近似的な平行光線であるから、印刷版の設定位置
が、印刷版設定部の設定誤差、印刷版の厚み誤差、反り
等に起因して基準位置（ｌ）よりも光源の方へ位置ずれ
（Δｌ）したとしても、印刷版の測定領域における単位
照射面積への照射光量に変化を生ずることがなく、また
生じたとしても微小範囲に止まる。これにより、印刷版
の測定領域からの反射光量も変化がゼロかそれに近く、
受光装置の受光量の変化も同様となる。すなわち、光源
と印刷版との相対距離の変化が受光装置の受光装置の受
光結果に及ぼす影響を抑制し、絵柄面積率測定装置の検
出精度を簡素な構造にて向上させることができる。
上記の照明装置を受光装置の両側に一対（左右）を
なすように設け、両照明装置からの各照射光が印刷版の
測定領域で重なりその合成された反射光が受光装置で受
光されるようにしたから、受光装置に対して印刷版面が
傾いていても受光装置の受光結果に及ぼす影響を抑制で
きる。すなわち、印刷版が水平状態の場合と傾いた状態
の場合とを対比すると、版が右下がりに傾いた状態では
水平状態に比べ、左側の照明装置による照射範囲が増大
して、照射領域は暗くなる。つまり、平行光を照射する
照明装置が１個だけの場合には、版が傾いた状態では、
高精度の絵柄面積率値を求めることができない。ところ
が、さらにもう１つ、右側の照明装置があれば、この右
側の照明装置による照射範囲は減少し、逆に照射領域は
明るくなる。つまり、印刷版の傾きが生じた場合、一方
の照明装置による照度は減るが、その代わり他方の照明
装置による照度が上がることで補正され、測定領域にお
ける単位照射面積への照射光量変化が抑えられるものと
なり、その測定領域からの反射光量に基づいて絵柄面積
率を測定する本発明の場合、結果的に印刷版の傾きによ
る受光装置の受光結果に及ぼす影響が抑制され、絵柄面
積率測定装置の検出精度を簡素な構造にて向上させるこ
とができる。
［実施例］
第１図は本発明の基本的実施例を示す模式図である。
光学系10は、光源11の光を印刷版である被検体12に照
射する照明装置13と、照射された被検体12からの反射光
を受光する受光装置（フォトダイオード等の光センサ）
14とを有している。なお、この実施例の被検体12の反射
面は梨地状であり、被検体12からの反射光は乱反射光で
ある。ただし、本発明の実施にあっては、受光装置が被
検体からの正反射光を受光するものであってもよい。
ここで、照明装置13は、光源11と被検体12の設定装
置（設定テーブル12A）との間の光路に３枚の平行な照
射案内板15を設け、かつ光源11と被検体12の設定装置
との距離ｌを、光源の径ｄに対し、ｌ＝6.8d（ｄ＝25m
m、ｌ＝170mm）としている。これにより、照明装置13
は、光源11の光を平行光線16に近似的な光線として被検
体12の測定領域に照射する。
次に、上記実施例の作用について説明する。
上記実施例によれば、照明装置13が被検体12の測定領
域に照射する光は平行光線16に近似的な光線であるか
ら、被検体12の設定位置が被検体テーブルの設定誤差、
被検体の厚み誤差、反り等に起因して基準位置（ｌ）よ
りも光源11の方へ位置ずれ（Δｌ）したとしても、被検
体12の測定領域における単位照射面積への照射光量に変
化をほとんど生ずることがない。これにより、被検体12
の測定領域からの乱反射光量も変化がゼロかそれに近
く、受光装置14の受光量も同様となる。すなわち、光源
11と被検体12の設定位置との相対距離の変化が受光装置
14の受光結果に及ぼす影響を抑制し、光源11と設定テー
ブル12Aの相対的な位置決め精度を高精度化するような
ことのない簡素な構造にて、また被検体12がある程度の
厚み誤差や反りがある等においても、光学系10の検出精
度を向上することができる。
第２図は上記した光学系を印刷版の絵柄面積率測定装
置に適用した実施例を示す模式図である。
絵柄面積率測定装置20は、被検体テーブル21に設定さ
れる印刷版の測定領域に光源22の光を照射する照明装置
23と、印刷版の測定領域からの反射光（乱反射光）を受
光する受光装置24とを有し、受光装置24の受光量に基づ
いて印刷版の測定領域における反射光量を検出し、印刷
版の当該測定領域における絵柄面積率を求めることを可
能としている。
なお、照明装置23は、受光装置24の両側に対をなす如
くに配設され、各１本の蛍光灯を光源22としている。ま
た、受光装置24は多数の遮光ボックス25を第２図の紙面
に直交する方向に列状をなす如く整列配置し、各遮光ボ
ックス25の頂部にフォトダイオード等の光センサ26を配
置している。
しかして、絵柄面積率測定装置20の照明装置23は、
光源22と被検体テーブル21との間の光路に相互に平行を
なす照射案内壁27、28、照射案内板29を設け、かつ光
源22の背面側に、光源22の光を平行光線化する球面状反
射鏡30を設け、さらに光源22と被検体テーブル21との
距離（ｌ）を光源22の径（ｄ）に対し、ｌ＝6.8dとして
いる。これにより、両照明装置23は、各光源22の光が平
行光線化せしめられて、印刷版の測定領域で重なりその
合成された反射光を受光装置24で受光するようにしてい
る。
したがって、上記絵柄面積率測定装置20によれば、被
検体テーブル21に設定される印刷版と光源22との相対距
離の変化が受光装置24の受光結果に及ぼす影響を抑制
し、被検体テーブル21と光源22の相対的な位置決め構造
を高精度化するようなことのない簡素な構造にて、また
印刷版がある程度の厚み誤差や反りがある等において
も、印刷版の絵柄面積率測定装置20の検出精度を向上さ
せることができる。
また、上記絵柄面積率測定装置20によれば、受光装置
24の両側に一対をなすように左右の照明装置23、23を設
け、両照明装置23、23からの各照射光が印刷版の測定領
域で重なりその合成された反射光が受光装置24で受光さ
れるようにしたから、受光装置24に対し印刷版面が傾い
ていても受光装置24の受光結果に及ぼす影響を抑制し、
絵柄面積率測定装置20の検出精度を向上させることがで
きる。
ここで実験例を第３図に示す。図において横軸は被検
体の基準位置（ｌ）からの位置ずれ（Δｌ）、縦軸は光
センサ26の出力電圧変化率を示す。この例の場合、光源
はｄ＝25mmの蛍光灯を用い、またｌを170mmとした。こ
れによると、位置ずれ（Δｌ）の増減に対して光センサ
26の出力電圧変化率も変化するものの、第５図と比較し
て明らかなようにその変化率は誤差範囲内に含まれる程
度の微量で、測定値への影響は生じない。なお、光源22
の光を平行光線化する他の手段として、光源と印刷版設
定部との間の光路に、光源の光を平行光線化するレンズ
系を設けても良く、さらにこの手段を上記実施例と組合
わせて採用しても良い。
［発明の効果］
以上のように、本発明によれば、光源と印刷版との相
対距離の変化や受光装置に対する印刷版面の傾きが受光
装置の受光結果に及ぼす影響を抑制し、絵柄面積率測定
装置の検出精度を簡素な構造にて向上させることができ
る。Description: TECHNICAL FIELD The present invention relates to an apparatus for measuring a pattern area ratio of a printing plate. [Prior Art] Conventionally, as described in JP-A-57-74605, JP-A-61-26806, etc., in a picture area ratio measuring apparatus of a printing plate for offset printing, An optical system as schematically shown in the figure is used. The optical system includes an illumination device that irradiates the light from a light source 1 to a measurement area of a subject 2 which is a printing plate, and a light receiving device 3 that receives irregularly reflected light from the irradiated measurement area of the subject 2. It is configured to detect the amount of reflected light in the measurement area of the subject 2 based on the amount of light received by the light receiving device 3 and to obtain the picture area ratio of the subject 2 in the measurement area. [Problems to be Solved by the Invention] However, in the conventional pattern area ratio measuring device, the distance 1 between the light source 1 and the set position (setting table 2A) of the subject 2 is larger than the diameter d of the light source 1. Therefore, the light from the light source 1 to the measurement area of the subject 2 is a radiated light 4. Thereby, as shown in FIG. 5, when the set position of the subject 2 is displaced (Δl) toward the light source 1 (to the left of the origin of the horizontal axis) from the reference position (l), the measurement of the subject 2 is performed. The amount of light applied to the unit irradiation area in the region increases, and accordingly, the amount of irregularly reflected light from the measurement region of the subject 2 also increases, and the amount of light received by the light receiving device 3 increases. For this reason, even though the same subject 2 is to be detected, if the subject 2 is displaced toward the light source 1 as compared with the case where the subject 2 is at the reference position, the reflectance of the subject 2 is reduced. The detection result is as if it were high. FIG. 5 shows d = 25 m
In the embodiment where m and l = 55 mm, the vertical axis in the figure indicates the output voltage change rate of the light receiving device 3. Therefore, in the conventional pattern area ratio measuring device, in order to improve the detection accuracy, the relative distance between the light source 1 and the subject 2 is kept constant so that the subject 2 is always set at the reference position. It is necessary to adopt a highly accurate positioning structure, to ensure the thickness accuracy of the subject 2, and to prevent warpage. The present invention suppresses the influence of the change in the relative distance between the light source and the printing plate and the inclination of the printing plate surface with respect to the light receiving device on the light receiving result of the light receiving device, thereby simplifying the measurement accuracy of the pattern area ratio by the pattern area ratio measuring device. The purpose is to improve with a simple structure. Means for Solving the Problems The present invention has an illuminating device that irradiates a printing plate set in a printing plate setting unit with light from a light source, and a light receiving device that receives light reflected from the printing plate. A pattern area ratio measuring device for measuring a pattern area ratio in a measurement region of the printing plate based on an amount of light received by the light receiving device, wherein the light source irradiates an optical path between the light source and the printing plate setting unit with the light source; The illumination device, which is provided with an irradiation guide member that guides light as a parallel light beam or an approximate parallel light to a measurement area of a printing plate, is provided in pairs on both sides of the light receiving device, and each irradiation light from both illumination devices is provided. Is an overlapped portion in the measurement area of the printing plate, and the combined reflected light is received by the light receiving device. [Operation] Since the light emitted from the illumination device to the measurement area of the printing plate is a parallel ray or an approximate parallel ray, the setting position of the printing plate is determined by a setting error of the printing plate setting unit, a thickness error of the printing plate, and a warpage. Even if the position shifts (Δl) toward the light source from the reference position (l) due to the above, there is no change in the irradiation light amount to the unit irradiation area in the measurement region of the printing plate, and Also stays in a very small range. As a result, the change in the amount of reflected light from the measurement area of the printing plate is zero or close thereto,
The same applies to the change in the amount of light received by the light receiving device. That is, the influence of the change in the relative distance between the light source and the printing plate on the light receiving result of the light receiving device of the light receiving device can be suppressed, and the detection accuracy of the picture area ratio measuring device can be improved with a simple structure. The above illuminating devices are provided as a pair (left and right) on both sides of the light receiving device, and the respective illuminating lights from both illuminating devices overlap in the measurement area of the printing plate, and the combined reflected light is received by the light receiving device. Therefore, even if the printing plate surface is inclined with respect to the light receiving device, it is possible to suppress the influence on the light receiving result of the light receiving device. That is, comparing the case where the printing plate is in the horizontal state and the case where the printing plate is inclined, when the plate is inclined downward to the right, compared with the horizontal state, the irradiation range of the left illumination device is increased, and the irradiation area is dark. Become. In other words, if there is only one illumination device that emits parallel light, and the plate is tilted,
A highly accurate pattern area ratio value cannot be obtained. However, if there is another illumination device on the right side, the irradiation range of the illumination device on the right side decreases, and conversely, the illumination area becomes bright. That is, when the printing plate is tilted, the illuminance by one of the illuminating devices decreases, but is corrected by increasing the illuminance by the other illuminating device, thereby suppressing a change in the amount of irradiating light to the unit irradiation area in the measurement region. In the case of the present invention in which the pattern area ratio is measured based on the amount of reflected light from the measurement area, as a result, the influence of the inclination of the printing plate on the light receiving result of the light receiving device is suppressed, and the pattern area ratio measuring device Detection accuracy can be improved with a simple structure. Embodiment FIG. 1 is a schematic view showing a basic embodiment of the present invention. The optical system 10 includes an illuminating device 13 for irradiating the subject 12 which is a printing plate with light from a light source 11 and a light receiving device (an optical sensor such as a photodiode) for receiving reflected light from the illuminated subject 12.
14 and has. Note that the reflection surface of the subject 12 in this embodiment has a satin finish, and the light reflected from the subject 12 is irregularly reflected light. However, in the embodiment of the present invention, the light receiving device may receive regular reflection light from the subject. Here, the illumination device 13 is provided with three parallel irradiation guide plates 15 in the optical path between the light source 11 and the setting device (setting table 12A) for the subject 12, and the setting device for the light source 11 and the subject 12 With respect to the diameter d of the light source, l = 6.8d (d = 25 m
m, l = 170 mm). Thereby, the lighting device 13
Irradiates the light from the light source 11 to the measurement region of the subject 12 as a light beam approximate to the parallel light beam 16. Next, the operation of the above embodiment will be described. According to the above embodiment, since the light emitted from the illumination device 13 to the measurement region of the subject 12 is a light beam approximate to the parallel light beam 16, the setting position of the subject 12 is a setting error of the subject table,
Even if the position shifts (Δl) toward the light source 11 from the reference position (l) due to a thickness error, warpage, or the like of the subject, a change in the amount of light irradiated to the unit irradiation area in the measurement area of the subject 12 occurs. Hardly ever occurs. Thereby, the subject 12
The change in the amount of diffusely reflected light from the measurement area is zero or close thereto, and the amount of light received by the light receiving device 14 is the same. That is, the light source
The change in the relative distance between the setting position of 11 and the subject 12
14 has a simple structure that does not increase the relative positioning accuracy of the light source 11 and the setting table 12A by suppressing the influence on the light receiving result. Even if there is, the detection accuracy of the optical system 10 can be improved. FIG. 2 is a schematic view showing an embodiment in which the above-described optical system is applied to a device for measuring a pattern area ratio of a printing plate. The pattern area ratio measurement device 20 is an illumination device that irradiates the light of the light source 22 to the measurement area of the printing plate set in the subject table 21.
23, and a light receiving device 24 for receiving reflected light (irregularly reflected light) from the measurement region of the printing plate. The amount of reflected light in the measurement region of the printing plate is detected based on the amount of light received by the light receiving device 24. It is possible to obtain the pattern area ratio in the measurement area of the above. The lighting devices 23 are arranged in pairs on both sides of the light receiving device 24, and each light source is a single fluorescent lamp. In the light receiving device 24, a large number of light shielding boxes 25 are arranged and arranged in a row in a direction perpendicular to the paper surface of FIG. 2, and an optical sensor 26 such as a photodiode is disposed at the top of each light shielding box 25. . Thus, the lighting device 23 of the pattern area ratio measuring device 20 is
Irradiation guide walls 27 and 28 and an irradiation guide plate 29 which are mutually parallel to the optical path between the light source 22 and the subject table 21 are provided, and a spherical surface which converts the light of the light source 22 into a parallel light beam on the back side of the light source 22 A reflecting mirror 30 is provided, and the distance (l) between the light source 22 and the object table 21 is set to 1 = 6.8d with respect to the diameter (d) of the light source 22. As a result, the light from each of the light sources 22 is made parallel by the two illumination devices 23 and overlaps in the measurement region of the printing plate, and the combined reflected light is received by the light receiving device 24. Therefore, according to the pattern area ratio measuring device 20, the influence of the change in the relative distance between the printing plate set in the subject table 21 and the light source 22 on the light receiving result of the light receiving device 24 is suppressed, and the subject table 21 With a simple structure that does not increase the relative positioning structure of the light source 22 and the light source 22, even if the printing plate has a certain thickness error or warpage, the printing plate image area ratio measuring device 20 Detection accuracy can be improved. Also, according to the pattern area ratio measuring device 20, the light receiving device
A pair of left and right lighting devices 23, 23 are provided on both sides of 24.Each irradiation light from both lighting devices 23, 23 overlaps in the measurement area of the printing plate, and the combined reflected light is received by the light receiving device 24. So that even if the printing plate surface is inclined with respect to the light receiving device 24, the effect on the light receiving result of the light receiving device 24 is suppressed,
The detection accuracy of the picture area ratio measuring device 20 can be improved. Here, an experimental example is shown in FIG. In the figure, the horizontal axis indicates the displacement (Δl) of the subject from the reference position (l), and the vertical axis indicates the output voltage change rate of the optical sensor 26. In the case of this example, a fluorescent light of d = 25 mm was used as a light source, and 1 was set to 170 mm. According to this, the optical sensor responds to the increase or decrease of the displacement (Δl).
Although the output voltage change rate of 26 also changes, as apparent from comparison with FIG. 5, the change rate is so small as to be within the error range, and does not affect the measured value. The light source 22
As another means for turning the light into a parallel light beam, a lens system for turning the light from the light source into a parallel light ray may be provided in the optical path between the light source and the printing plate setting unit. You may adopt together. [Effects of the Invention] As described above, according to the present invention, the influence of the change in the relative distance between the light source and the printing plate and the inclination of the printing plate surface with respect to the light receiving device on the light receiving result of the light receiving device is suppressed, and the pattern area ratio is reduced. The detection accuracy of the measuring device can be improved with a simple structure.
【図面の簡単な説明】
第１図は第１図の光学系の基本的実施例を示す模式図、
第２図は本発明を印刷板の絵柄面積率測定装置に適用し
た実施例を示す模式図、第３図は第２図における実験例
を示すグラフ、第４図は従来例を示す模式図、第５図は
第４図における実験例を示すグラフである。
10……光学系、
11……光源、
12……被検体、
13……照明装置、
14……受光装置、
15……照射案内板、
16……平行光線、
20……絵柄面積率測定装置、
22……光源、
23……照明装置、
24……受光装置、
27、28……照射案内壁、
29……照射案内板、
30……球面状反射鏡。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram showing a basic embodiment of the optical system of FIG.
FIG. 2 is a schematic view showing an embodiment in which the present invention is applied to an apparatus for measuring the pattern area ratio of a printing plate, FIG. 3 is a graph showing an experimental example in FIG. 2, FIG. 4 is a schematic view showing a conventional example, FIG. 5 is a graph showing an experimental example in FIG. 10 optical system, 11 light source, 12 subject, 13 illumination device, 14 light receiving device, 15 irradiation guide plate, 16 parallel light beam, 20 image area ratio measuring device , 22 ... light source, 23 ... lighting device, 24 ... light receiving device, 27, 28 ... irradiation guide wall, 29 ... irradiation guide plate, 30 ... spherical reflector.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭60−100710（ＪＰ，Ａ) 特開 昭53−27055（ＪＰ，Ａ) 特開 昭61−134605（ＪＰ，Ａ) 特開 昭47−63459（ＪＰ，Ａ) 特開 昭60−122308（ＪＰ，Ａ) 実開 昭59−137506（ＪＰ，Ｕ) 実開 昭62−10611（ＪＰ，Ｕ) 実開 昭62−59810（ＪＰ，Ｕ) (58)調査した分野(Int.Cl.6，ＤＢ名) G01B 11/00 - 11/30──────────────────────────────────────────────────続 き Continuation of front page (56) References JP-A-60-100710 (JP, A) JP-A-53-27055 (JP, A) JP-A-61-134605 (JP, A) JP-A-47- 63459 (JP, A) JP-A-60-122308 (JP, A) JP-A-59-137506 (JP, U) JP-A-62-10611 (JP, U) JP-A-62-159810 (JP, U) (58) Field surveyed (Int. Cl. 6 , DB name) G01B 11/00-11/30
Claims (1)
する照明装置と、前記印刷版からの反射光を受光する受
光装置とを有し、この受光装置の受光量に基づいて前記
印刷版の測定領域における絵柄面積率を測定する絵柄面
積率測定装置において、 前記光源と前記印刷版設定部との間の光路に、前記光源
からの照射光を平行光線或いは近似的な平行光線として
印刷版の測定領域に導く照射案内部材を設けてなる前記
照明装置を、前記受光装置の両側に対をなして設け、 両照明装置からの各照射光は印刷版の測定領域で重な
り、その合成された反射光を前記受光装置で受光するこ
とを特徴とする絵柄面積率測定装置。(57) [Claims] An illumination device that irradiates the printing plate set in the printing plate setting unit with light from a light source, and a light receiving device that receives light reflected from the printing plate, and the printing plate is set based on the amount of light received by the light receiving device. A pattern area ratio measuring device for measuring a pattern area ratio in a measurement region, wherein the irradiation light from the light source is converted into a parallel light beam or an approximate parallel light beam in an optical path between the light source and the printing plate setting unit. The illumination device provided with an irradiation guide member for guiding to the measurement region of the light receiving device is provided in a pair on both sides of the light receiving device, and each irradiation light from both the illumination devices overlaps in the measurement region of the printing plate and is synthesized. A pattern area ratio measuring device, wherein reflected light is received by the light receiving device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62236268A JP2764399B2 (en) | 1987-09-22 | 1987-09-22 | Picture area ratio measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62236268A JP2764399B2 (en) | 1987-09-22 | 1987-09-22 | Picture area ratio measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6479607A JPS6479607A (en) | 1989-03-24 |
| JP2764399B2 true JP2764399B2 (en) | 1998-06-11 |
Family
ID=16998264
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62236268A Expired - Lifetime JP2764399B2 (en) | 1987-09-22 | 1987-09-22 | Picture area ratio measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2764399B2 (en) |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5327055A (en) * | 1976-08-26 | 1978-03-13 | Asahi Glass Co Ltd | Method of measuring thickness of transparent board |
| JPS59137506U (en) * | 1983-02-10 | 1984-09-13 | 小森印刷機械株式会社 | Plate holding device for printing plate pattern area ratio meter |
| JPS60100710A (en) * | 1983-11-07 | 1985-06-04 | Sumitomo Heavy Ind Ltd | Measuring device for pattern area rate of print plate of offset printing machine |
| JPS60122308A (en) * | 1984-10-25 | 1985-06-29 | Toshiba Corp | Evaluating method of bonding |
| JPS61134605A (en) * | 1984-12-05 | 1986-06-21 | Jeol Ltd | Measuring device of surface height of object |
| JPS6210611U (en) * | 1985-07-06 | 1987-01-22 | ||
| JPS6259810U (en) * | 1985-10-02 | 1987-04-14 |
-
1987
- 1987-09-22 JP JP62236268A patent/JP2764399B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6479607A (en) | 1989-03-24 |
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