JPS6465868A - Solid-state image sensor - Google Patents

Solid-state image sensor

Info

Publication number
JPS6465868A
JPS6465868A JP62221207A JP22120787A JPS6465868A JP S6465868 A JPS6465868 A JP S6465868A JP 62221207 A JP62221207 A JP 62221207A JP 22120787 A JP22120787 A JP 22120787A JP S6465868 A JPS6465868 A JP S6465868A
Authority
JP
Japan
Prior art keywords
gate
insulating film
light generating
gate insulating
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62221207A
Other languages
Japanese (ja)
Inventor
Hisayuki Komaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP62221207A priority Critical patent/JPS6465868A/en
Publication of JPS6465868A publication Critical patent/JPS6465868A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a solid-state image sensor capable of being micronized which has functions such as an internal amplification, a nondestructive read, and a light signal memory function by a method wherein a gate insulating film of a gate storage type MOS photo FET is made to have a charge trap effect. CONSTITUTION:An N-type epitaxial layer 2 is made to overlap a P-type substrate 1, and a source 3 and a drain 4 both of N-type are diffused. A gate insulating film 7 composed of two layers, a SiO2 film 5 20-50Angstrom in thickness and a Si3N4 film 6 about 500Angstrom in thickness, is formed on a channel region. Al electrodes 8 and 9 are provided to the N<+> layers 3 and 4, and a transparent electrode 10 formed of SnO2 or the like is provided to the gate insulating film 7. By this structure, it can be provided with an internal amplification function the same as a conventional gate storage type POS photo FRT, light generating charges are stored just under a gate for a certain period as a gate electrode is kept in an invertedly biased state, and then when an inverted bias which makes light generating charges tunnel through the gate insulating film is applied, the light generating charges can be injected into a gate film and trapped there, and thus optical signals can be memorized. And, a transfer gate for light generating charges storage can be dispensed with and the sensor can be micronized.
JP62221207A 1987-09-05 1987-09-05 Solid-state image sensor Pending JPS6465868A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62221207A JPS6465868A (en) 1987-09-05 1987-09-05 Solid-state image sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62221207A JPS6465868A (en) 1987-09-05 1987-09-05 Solid-state image sensor

Publications (1)

Publication Number Publication Date
JPS6465868A true JPS6465868A (en) 1989-03-13

Family

ID=16763142

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62221207A Pending JPS6465868A (en) 1987-09-05 1987-09-05 Solid-state image sensor

Country Status (1)

Country Link
JP (1) JPS6465868A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6727522B1 (en) * 1998-11-17 2004-04-27 Japan Science And Technology Corporation Transistor and semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6727522B1 (en) * 1998-11-17 2004-04-27 Japan Science And Technology Corporation Transistor and semiconductor device
US7064346B2 (en) 1998-11-17 2006-06-20 Japan Science And Technology Agency Transistor and semiconductor device

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