JPS6464249A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS6464249A
JPS6464249A JP62221504A JP22150487A JPS6464249A JP S6464249 A JPS6464249 A JP S6464249A JP 62221504 A JP62221504 A JP 62221504A JP 22150487 A JP22150487 A JP 22150487A JP S6464249 A JPS6464249 A JP S6464249A
Authority
JP
Japan
Prior art keywords
section
selector
output
logic
logic generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62221504A
Other languages
Japanese (ja)
Other versions
JPH0691191B2 (en
Inventor
Toshio Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62221504A priority Critical patent/JPH0691191B2/en
Publication of JPS6464249A publication Critical patent/JPS6464249A/en
Publication of JPH0691191B2 publication Critical patent/JPH0691191B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To facilitate testing of a semiconductor integrated circuit so that defective parts can be located easily in possible failures, by providing a selector in an output driver section, and connecting an output from an arbitrary point of an internal logic section to the selector such that output from the selector presents state of the internal logic section according to a switching signal. CONSTITUTION:Either of logic generating sections 11 and 12 is activated by a signal from a select section 13 and generates a signal but they are not activated simultaneously. In testing a semiconductor integrated circuit device including such circuit, it is impossible to detect that output is disenabled at the logic generating section 12 when the logic generating section 11 is active. For solving this problem, a selector 3 is provided in an output driver section 2 and output from the logic gene rating section 11 is connected to one input of the selector 3 while output from the logic generating section 12 is connected to the other input as indicated by the broken line in the drawing, so that the inputs to the selector 3 are switched over by a switching signal. In this manner, the state of the logic generating section 12 as well as of the logic generating section 11 can be tested by means of the outputs thereof.
JP62221504A 1987-09-03 1987-09-03 Semiconductor integrated circuit Expired - Lifetime JPH0691191B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62221504A JPH0691191B2 (en) 1987-09-03 1987-09-03 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62221504A JPH0691191B2 (en) 1987-09-03 1987-09-03 Semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS6464249A true JPS6464249A (en) 1989-03-10
JPH0691191B2 JPH0691191B2 (en) 1994-11-14

Family

ID=16767747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62221504A Expired - Lifetime JPH0691191B2 (en) 1987-09-03 1987-09-03 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH0691191B2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60192343A (en) * 1984-03-14 1985-09-30 Nec Corp Semiconductor integrated circuit
JPS61102763A (en) * 1984-10-26 1986-05-21 Matsushita Electronics Corp Semiconductor integrated circuit
JPS6298657A (en) * 1985-10-24 1987-05-08 Nec Corp Integrated circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60192343A (en) * 1984-03-14 1985-09-30 Nec Corp Semiconductor integrated circuit
JPS61102763A (en) * 1984-10-26 1986-05-21 Matsushita Electronics Corp Semiconductor integrated circuit
JPS6298657A (en) * 1985-10-24 1987-05-08 Nec Corp Integrated circuit

Also Published As

Publication number Publication date
JPH0691191B2 (en) 1994-11-14

Similar Documents

Publication Publication Date Title
JPS647635A (en) Semiconductor integrated circuit device with gate array and memory
KR940006230A (en) Semiconductor integrated circuit device and its functional test method
US5132614A (en) Semiconductor device and method and apparatus for testing the same
DE3686989D1 (en) REDUCING NOISE DURING CHECKING INTEGRATED CIRCUIT CHIPS.
KR960012401A (en) Semiconductor integrated device
JPS6464249A (en) Semiconductor integrated circuit
JPS5745942A (en) Semiconductor integrated circuit device
JP3077809B2 (en) Semiconductor integrated logic circuit
JPS6454380A (en) Electronic circuit package with automatic testing function
JPH08286942A (en) Semiconductor circuit device
JPH05341014A (en) Semiconductor module mono-body, semiconductor module device, and method for testing
JPS6378695A (en) Line connecting device
JPS6417460A (en) Semiconductor logic integrated circuit device
JP3438263B2 (en) Test method for input cell and semiconductor integrated circuit
JPH02128462A (en) Semiconductor integrated circuit device
JPH03150484A (en) Semiconductor device
JPH03115873A (en) Semiconductor integrated circuit
JPS6342486A (en) Testing device
JPH0577292B2 (en)
JPS61223568A (en) Interface board for ic tester
JPH0480676A (en) Semiconductor integrated circuit
KR930010559A (en) IC test connection control circuit
JPH02269984A (en) Method for testing component package printed board
JPS6077519A (en) Large scale integrated logical circuit
JPH01287487A (en) Semiconductor integrated circuit