JPS6461674A - Low-temperature testing device - Google Patents
Low-temperature testing deviceInfo
- Publication number
- JPS6461674A JPS6461674A JP21964087A JP21964087A JPS6461674A JP S6461674 A JPS6461674 A JP S6461674A JP 21964087 A JP21964087 A JP 21964087A JP 21964087 A JP21964087 A JP 21964087A JP S6461674 A JPS6461674 A JP S6461674A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- low
- semiconductor device
- opening part
- capacitors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To preclude dew condensation and dew sticking on a body to be tested effectively without increasing the number of members by arranging part of freezing cycle equipment which rises in temperature at its external wall above ambient temperature nearby the opening part of a low-temperature test part. CONSTITUTION:A semiconductor device 6 which is guided up to the low- temperature test part 13 is arranged in the low-temperature test part 13 through the opening part 13a and characteristic inspection is carried out. Here, capacitors 3 are provided above and below a conveyance path for the semiconductor device 6 nearby the opening part 13a. Those capacitors radiate the heat of vapor compressed by a comparator and are higher in temperature than the space surrounding the test part 13. The periphery of the opening part 13a exceeds its ambient temperature and dew condensation is caused on the surface of the semiconductor device 6. Thus, simple means for arranging some of the capacitors securely precludes the dew condensation and dew sticking on the semiconductor device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21964087A JPS6461674A (en) | 1987-09-02 | 1987-09-02 | Low-temperature testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21964087A JPS6461674A (en) | 1987-09-02 | 1987-09-02 | Low-temperature testing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6461674A true JPS6461674A (en) | 1989-03-08 |
Family
ID=16738695
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21964087A Pending JPS6461674A (en) | 1987-09-02 | 1987-09-02 | Low-temperature testing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6461674A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4810504A (en) * | 1987-03-19 | 1989-03-07 | Huls Aktiengesellschaft | Method of producing a mushroom aroma in mushroom cell masses |
JP2009234703A (en) * | 2008-03-26 | 2009-10-15 | Kumagai Gumi Co Ltd | Roller conveyor |
-
1987
- 1987-09-02 JP JP21964087A patent/JPS6461674A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4810504A (en) * | 1987-03-19 | 1989-03-07 | Huls Aktiengesellschaft | Method of producing a mushroom aroma in mushroom cell masses |
JP2009234703A (en) * | 2008-03-26 | 2009-10-15 | Kumagai Gumi Co Ltd | Roller conveyor |
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