CN213408765U - Cold and hot impact test bench convenient to control - Google Patents

Cold and hot impact test bench convenient to control Download PDF

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Publication number
CN213408765U
CN213408765U CN202022257100.6U CN202022257100U CN213408765U CN 213408765 U CN213408765 U CN 213408765U CN 202022257100 U CN202022257100 U CN 202022257100U CN 213408765 U CN213408765 U CN 213408765U
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box body
cold
control
gear
lower box
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CN202022257100.6U
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曹盘江
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Wuxi Eisenberg Precision Machinery Co ltd
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Wuxi Eisenberg Precision Machinery Co ltd
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Abstract

The utility model provides a cold and hot impact test platform convenient to control. The cold and hot impact test bed convenient to operate and control comprises a bottom plate; the lower box body is fixedly arranged at the top of the bottom plate, and the top of the lower box body is provided with an opening; the upper box body is hinged to the top of the lower box body; the four springs are fixedly arranged on the inner wall of the top of the upper box body and are distributed in an array; a linkage plate connected to bottom ends of the four springs; the box body is fixedly arranged on the inner wall of the bottom of the lower box body; and the semiconductor refrigeration piece is fixedly arranged at the bottom of the connecting plate. The utility model provides a cold and hot shock test platform convenient to control has convenient operation, takes up an area of the space little, and the advantage that detection efficiency is high.

Description

Cold and hot impact test bench convenient to control
Technical Field
The utility model relates to a cold and hot impact test technical field especially relates to a cold and hot impact test platform convenient to control.
Background
The high-low temperature impact machine is suitable for the adaptability test of equipment in national defense industry, aviation industry, soldier industry, automatic parts, automobile parts, electronic and electric instrument parts, electrical products, plastic cement, chemical industry, food industry, BGA, PCB base plates, electronic chip IC, semiconductor ceramic pharmaceutical industry, related products and the like under the condition of rapid change of ambient atmospheric temperature.
A semiconductor refrigerating plate, also called thermoelectric refrigerating plate, is a heat pump, its advantage is that there is no sliding part, apply to some space and is limited, the reliability is required to be high, the occasion without refrigerant pollution, utilize Peltier effect of the semiconductor material, when the direct current passes through the galvanic couple that two kinds of different semiconductor materials are connected in series, can absorb the heat and emit the heat separately at both ends of the galvanic couple, can realize the refrigerated purpose it is a refrigeration technology producing negative thermal resistance, its characteristic is there is no moving part, the reliability is also higher.
High low temperature strikes and generally uses high low temperature impact test case, and the proof box need set up refrigeration room and heating room, need pass two rooms with article and test, and traditional equipment occupation of land space is big, and the operation is inconvenient, still needs control article to pass two rooms, and detection efficiency is not high.
Therefore, it is necessary to provide a new thermal shock test bed which is convenient to operate and control to solve the above technical problems.
SUMMERY OF THE UTILITY MODEL
The utility model provides a technical problem provide a cold and hot impact test bench of being convenient for control that has convenient operation, occupation of land space is little, and detection efficiency is high.
In order to solve the technical problem, the utility model provides a cold and hot shock test platform convenient to control includes: a base plate; the lower box body is fixedly arranged at the top of the bottom plate, and the top of the lower box body is provided with an opening; the upper box body is hinged to the top of the lower box body; the four springs are fixedly arranged on the inner wall of the top of the upper box body and are distributed in an array; a linkage plate connected to bottom ends of the four springs; the box body is fixedly arranged on the inner wall of the bottom of the lower box body; the semiconductor refrigeration piece is fixedly arranged at the bottom of the connecting plate; the pressure sensor is arranged on the semiconductor refrigerating sheet; the lifting mechanism is arranged on the box body; and the fixing mechanism is arranged on the lower box body and the upper box body.
Preferably, elevating system includes support, motor, first gear, sleeve, second gear, threaded rod and roof, support fixed mounting is in on the inner wall of box body, motor fixed mounting is in on the bottom inner wall of box body, the fixed cover of first gear is established on the output shaft of motor, the sleeve rotates to be installed on the support, the fixed cover of second gear is established on the sleeve, just the second gear with first gear intermeshing, the threaded rod screw thread is installed on the sleeve, roof fixed mounting is in the top of threaded rod.
Preferably, fixed establishment includes first fixed block, second fixed block, thread groove, thread piece, connecting rod and operating handle, first fixed block fixed mounting be in one side of last box, second fixed block fixed mounting be in one side of box down, the thread groove is seted up the top of second fixed block, the connecting rod sets up on the first fixed block, thread piece fixed mounting be in the bottom of connecting rod, operating handle fixed mounting be in the top of connecting rod, the thread piece with the inner wall of thread groove closes mutually soon.
Preferably, a storage groove is formed in one side of the thread groove, a rotating hole is formed in one side of the storage groove, and the connecting rod penetrates through the storage groove and the rotating hole respectively.
Preferably, the bottom of roof fixed mounting has two gag lever posts, two the gag lever post all with box body sliding connection.
Preferably, one side of the upper box body is fixedly provided with a U-shaped handle, and the U-shaped handle is fixedly sleeved with an anti-skidding sleeve.
Compared with the prior art, the utility model provides a cold and hot shock test bench convenient to control has following beneficial effect:
the utility model provides a cold and hot impact test bench convenient to control, place the article that need the test on the roof, rotate the operating handle, further make and fix between last box and the lower box, the starter motor, test on article move the semiconductor refrigeration piece, it is relatively convenient, can be fine fix article through pressure sensor, and can prevent the too big damage article of pressure, can refrigerate through the semiconductor refrigeration piece, change the current direction and can heat, switch conveniently, and only need set up a test chamber can, the occupation of land space is little, high durability and convenient operation, detection efficiency has just also effectively improved.
Drawings
Fig. 1 is a schematic structural diagram of a preferred embodiment of a thermal shock test bed convenient to operate and control provided by the present invention;
FIG. 2 is an enlarged view of portion A of FIG. 1;
fig. 3 is an enlarged schematic view of a portion B shown in fig. 1.
Reference numbers in the figures: 1. a base plate; 2. a lower box body; 3. an upper box body; 4. a spring; 5. a connector tile; 6. a semiconductor refrigeration sheet; 7. a pressure sensor; 8. a box body; 9. a support; 10. a motor; 11. a first gear; 12. a sleeve; 13. a second gear; 14. a threaded rod; 15. a top plate; 16. a first fixed block; 17. a second fixed block; 18. a thread groove; 19. a thread block; 20. a connecting rod; 21. the handle is operated.
Detailed Description
The present invention will be further described with reference to the accompanying drawings and embodiments.
Please refer to fig. 1, fig. 2 and fig. 3, wherein fig. 1 is a schematic structural diagram of a thermal shock testing platform convenient to operate and control according to a preferred embodiment of the present invention; FIG. 2 is an enlarged view of portion A of FIG. 1; fig. 3 is an enlarged schematic view of a portion B shown in fig. 1. Cold and hot shock test platform convenient to control includes: a base plate 1; the lower box body 2 is fixedly arranged at the top of the bottom plate 1, and the top of the lower box body 2 is provided with an opening; the upper box body 3 is hinged to the top of the lower box body 2; the four springs 4 are fixedly arranged on the inner wall of the top of the upper box body 3, and the four springs 4 are distributed in an array; a connecting plate 5, wherein the connecting plate 5 is connected to the bottom ends of the four springs 4; the box body 8 is fixedly arranged on the inner wall of the bottom of the lower box body 2; the semiconductor refrigerating piece 6 is fixedly arranged at the bottom of the connecting plate 5; the pressure sensor 7 is arranged on the semiconductor refrigerating sheet 6, and the pressure sensor 7 is arranged on the semiconductor refrigerating sheet 6; the lifting mechanism is arranged on the box body 8; and the fixing mechanism is arranged on the lower box body 2 and the upper box body 3.
Elevating system includes support 9, motor 10, first gear 11, sleeve 12, second gear 13, threaded rod 14 and roof 15, support 9 fixed mounting is in on the inner wall of box body 8, motor 10 fixed mounting is in on the bottom inner wall of box body 8, the fixed cover of first gear 11 is established on the output shaft of motor 10, sleeve 12 rotates to be installed on support 9, the fixed cover of second gear 13 is established sleeve 12 is last, just second gear 13 with first gear 11 intermeshing, threaded rod 14 screw thread is installed sleeve 12 is last, roof 15 fixed mounting be in the top of threaded rod 14.
Fixed establishment includes first fixed block 16, second fixed block 17, thread groove 18, screw block 19, connecting rod 20 and operating handle 21, first fixed block 16 fixed mounting be in one side of last box 3, second fixed block 17 fixed mounting be in one side of box 2 down, screw groove 18 sets up the top of second fixed block 17, connecting rod 20 sets up on first fixed block 16, screw block 19 fixed mounting be in the bottom of connecting rod 20, operating handle 21 fixed mounting be in the top of connecting rod 20, screw block 19 with the inner wall of thread groove 18 closes mutually soon.
A storage groove is formed in one side of the thread groove 18, a rotation hole is formed in one side of the storage groove, and the connecting rod 20 penetrates through the storage groove and the rotation hole respectively.
The bottom fixed mounting of roof 15 has two gag lever posts, two the gag lever post all with 8 sliding connection of box body.
One side fixed mounting of going up box 3 has U type handle, just U type is fixed the cover on hand and is equipped with anti-skidding cover.
The utility model provides a cold and hot impact test platform convenient to control's theory of operation as follows:
firstly, an article to be tested is placed on a top plate 15, then an upper box body 3 is closed, an operating handle 21 is rotated, the operating handle 21 drives a connecting rod 20 to move, the connecting rod 20 drives a thread block 19 to move until the thread block 19 moves into a thread groove 18 to be sufficiently screwed with the thread block, so that a first fixing block 16 and a second fixing block 17 are mutually fixed, the upper box body 3 and a lower box body 2 are further fixed, finally, a motor 10 is started, the motor 10 drives a first gear 11 to rotate, the first gear 11 drives a second gear 13 to rotate, the second gear 13 drives a sleeve 12 to rotate, the sleeve 12 drives a threaded rod 14 to move upwards, the threaded rod 14 drives the top plate 15 to move upwards, the top plate 15 drives a detected article to move upwards, and the article moves onto a semiconductor refrigerating sheet 6 to be tested, so that the test is convenient;
the pressure sensor 7 can well fix the articles and prevent the articles from being damaged due to overlarge pressure;
can refrigerate through semiconductor refrigeration piece 6, change the current direction and can heat, switch conveniently, and only need set up a test chamber can, take up an area of the space little, convenient operation, detection efficiency has just also effectively improved.
Compared with the prior art, the utility model provides a cold and hot shock test bench convenient to control has following beneficial effect:
the utility model provides a cold and hot shock test bench convenient to control, place the article that need the test on roof 15, rotate operation handle 21, further make and fix between last box 3 and the lower box 2, starter motor 10, move to the semiconductor refrigeration piece 6 on test until article, it is more convenient, can be fine fix article through pressure sensor 7, and can prevent the too big damage article of pressure, can refrigerate through semiconductor refrigeration piece 6, change the current direction and can heat, the switching is convenient, and only need set up a test chamber can, the occupation of land space is little, high durability and convenient operation, detection efficiency has just effectively improved.
The above only is the embodiment of the present invention, not limiting the scope of the present invention, all the equivalent structures or equivalent processes of the present invention are used in the specification and the attached drawings, or directly or indirectly applied to other related technical fields, and the same principle is included in the protection scope of the present invention.

Claims (6)

1. The utility model provides a cold and hot shock test platform convenient to control which characterized in that includes:
a base plate;
the lower box body is fixedly arranged at the top of the bottom plate, and the top of the lower box body is provided with an opening;
the upper box body is hinged to the top of the lower box body;
the four springs are fixedly arranged on the inner wall of the top of the upper box body and are distributed in an array;
a linkage plate connected to bottom ends of the four springs;
the box body is fixedly arranged on the inner wall of the bottom of the lower box body;
the semiconductor refrigeration piece is fixedly arranged at the bottom of the connecting plate;
the pressure sensor is arranged on the semiconductor refrigerating sheet;
the lifting mechanism is arranged on the box body;
and the fixing mechanism is arranged on the lower box body and the upper box body.
2. The cold-hot impact test bench convenient to control of claim 1, characterized in that, elevating system includes support, motor, first gear, sleeve, second gear, threaded rod and roof, support fixed mounting is on the inner wall of box body, motor fixed mounting is on the bottom inner wall of box body, the fixed cover of first gear is established on the output shaft of motor, the sleeve rotates to be installed on the support, the fixed cover of second gear is established on the sleeve, and the second gear with first gear intermeshing, the threaded rod screw thread is installed on the sleeve, roof fixed mounting is in the top of threaded rod.
3. A hot and cold impact test bench convenient to control as claimed in claim 1, wherein said fixing mechanism comprises a first fixing block, a second fixing block, a thread groove, a thread block, a connecting rod and an operating handle, said first fixing block is fixedly installed on one side of said upper box, said second fixing block is fixedly installed on one side of said lower box, said thread groove is opened on top of said second fixing block, said connecting rod is installed on said first fixing block, said thread block is fixedly installed on bottom end of said connecting rod, said operating handle is fixedly installed on top end of said connecting rod, said thread block is screwed with inner wall of said thread groove.
4. A thermal shock test platform convenient to operate and control as claimed in claim 3, wherein one side of said thread groove is opened with a storage groove, one side of said storage groove is opened with a rotation hole, said connection rod respectively penetrates through said storage groove and said rotation hole.
5. A cold-hot impact test bench convenient to operate and control as claimed in claim 2, wherein two limiting rods are fixedly mounted at the bottom of the top plate, and both limiting rods are slidably connected with the box body.
6. A cold-hot impact test bench convenient to operate and control as claimed in claim 1, wherein a U-shaped handle is fixedly mounted on one side of the upper box body, and an anti-skid sleeve is fixedly sleeved on the U-shaped handle.
CN202022257100.6U 2020-10-12 2020-10-12 Cold and hot impact test bench convenient to control Active CN213408765U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202022257100.6U CN213408765U (en) 2020-10-12 2020-10-12 Cold and hot impact test bench convenient to control

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202022257100.6U CN213408765U (en) 2020-10-12 2020-10-12 Cold and hot impact test bench convenient to control

Publications (1)

Publication Number Publication Date
CN213408765U true CN213408765U (en) 2021-06-11

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202022257100.6U Active CN213408765U (en) 2020-10-12 2020-10-12 Cold and hot impact test bench convenient to control

Country Status (1)

Country Link
CN (1) CN213408765U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114034594A (en) * 2021-11-22 2022-02-11 深圳市诺赛特系统有限公司 Chip pressing heat exchange device and cold-hot impact chip testing system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114034594A (en) * 2021-11-22 2022-02-11 深圳市诺赛特系统有限公司 Chip pressing heat exchange device and cold-hot impact chip testing system

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