JPS6454341A - Measuring instrument for density and thickness - Google Patents

Measuring instrument for density and thickness

Info

Publication number
JPS6454341A
JPS6454341A JP62210343A JP21034387A JPS6454341A JP S6454341 A JPS6454341 A JP S6454341A JP 62210343 A JP62210343 A JP 62210343A JP 21034387 A JP21034387 A JP 21034387A JP S6454341 A JPS6454341 A JP S6454341A
Authority
JP
Japan
Prior art keywords
ray
density
thickness
intensity distribution
area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62210343A
Other languages
Japanese (ja)
Inventor
Shusaku Miyake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kasei Optonix Ltd
Original Assignee
Kasei Optonix Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kasei Optonix Ltd filed Critical Kasei Optonix Ltd
Priority to JP62210343A priority Critical patent/JPS6454341A/en
Publication of JPS6454341A publication Critical patent/JPS6454341A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

PURPOSE:To make measurement accurate and easy by calculating an X-ray intensity distribution from the outputs of X-ray detectors which have X-ray filters differing in thickness and obtaining a density value and a thickness value from the X-ray transmission range and subject area density of an area to be inspected. CONSTITUTION:The title instrument consists of an X-ray detection part 1, an arithmetic processing part 2 which calculates the density of a desired area of a sample, and a display part 6 which displays the output of the processing part 2. Further, the processing part 2 is equipped with an amplification part 3, an A/D conversion part 4, and an arithmetic and storage part 5. Then an incident X ray L is passed through a filter 9a with different thickness and converted into fluorescent light, which is detected by a photodetector 10a, etc., so that the X-ray intensity distribution is calculated 5 from information obtained by amplification 3 and digitization 4. Then simultaneous equations which contain the X-ray transmission distance and density of the sample area as unknown numbers are obtained according to the intensity distribution and the density value or thickness value is calculated 5 and displayed 6.
JP62210343A 1987-08-26 1987-08-26 Measuring instrument for density and thickness Pending JPS6454341A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62210343A JPS6454341A (en) 1987-08-26 1987-08-26 Measuring instrument for density and thickness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62210343A JPS6454341A (en) 1987-08-26 1987-08-26 Measuring instrument for density and thickness

Publications (1)

Publication Number Publication Date
JPS6454341A true JPS6454341A (en) 1989-03-01

Family

ID=16587833

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62210343A Pending JPS6454341A (en) 1987-08-26 1987-08-26 Measuring instrument for density and thickness

Country Status (1)

Country Link
JP (1) JPS6454341A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8300905B2 (en) 2005-11-18 2012-10-30 General Electric Company Adaptive image processing and display for digital and computed radiography images
CN103687542A (en) * 2011-10-07 2014-03-26 株式会社东芝 X-ray diagnostic device and dosage administration method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5850412A (en) * 1981-09-22 1983-03-24 Rigaku Denki Kogyo Kk Method for measuring film thickness of metal film or amount of inclusion of each element in metal film
JPS6249780B2 (en) * 1978-07-14 1987-10-21 Fujitsu Ltd

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6249780B2 (en) * 1978-07-14 1987-10-21 Fujitsu Ltd
JPS5850412A (en) * 1981-09-22 1983-03-24 Rigaku Denki Kogyo Kk Method for measuring film thickness of metal film or amount of inclusion of each element in metal film

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8300905B2 (en) 2005-11-18 2012-10-30 General Electric Company Adaptive image processing and display for digital and computed radiography images
CN103687542A (en) * 2011-10-07 2014-03-26 株式会社东芝 X-ray diagnostic device and dosage administration method
US9538977B2 (en) 2011-10-07 2017-01-10 Toshiba Medical Systems Corporation X-ray diagnosis apparatus and dose distribution data generation method

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