JPS6454341A - Measuring instrument for density and thickness - Google Patents
Measuring instrument for density and thicknessInfo
- Publication number
- JPS6454341A JPS6454341A JP62210343A JP21034387A JPS6454341A JP S6454341 A JPS6454341 A JP S6454341A JP 62210343 A JP62210343 A JP 62210343A JP 21034387 A JP21034387 A JP 21034387A JP S6454341 A JPS6454341 A JP S6454341A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- density
- thickness
- intensity distribution
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003321 amplification Effects 0.000 abstract 2
- 230000005540 biological transmission Effects 0.000 abstract 2
- 238000003199 nucleic acid amplification method Methods 0.000 abstract 2
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
PURPOSE:To make measurement accurate and easy by calculating an X-ray intensity distribution from the outputs of X-ray detectors which have X-ray filters differing in thickness and obtaining a density value and a thickness value from the X-ray transmission range and subject area density of an area to be inspected. CONSTITUTION:The title instrument consists of an X-ray detection part 1, an arithmetic processing part 2 which calculates the density of a desired area of a sample, and a display part 6 which displays the output of the processing part 2. Further, the processing part 2 is equipped with an amplification part 3, an A/D conversion part 4, and an arithmetic and storage part 5. Then an incident X ray L is passed through a filter 9a with different thickness and converted into fluorescent light, which is detected by a photodetector 10a, etc., so that the X-ray intensity distribution is calculated 5 from information obtained by amplification 3 and digitization 4. Then simultaneous equations which contain the X-ray transmission distance and density of the sample area as unknown numbers are obtained according to the intensity distribution and the density value or thickness value is calculated 5 and displayed 6.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62210343A JPS6454341A (en) | 1987-08-26 | 1987-08-26 | Measuring instrument for density and thickness |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62210343A JPS6454341A (en) | 1987-08-26 | 1987-08-26 | Measuring instrument for density and thickness |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6454341A true JPS6454341A (en) | 1989-03-01 |
Family
ID=16587833
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62210343A Pending JPS6454341A (en) | 1987-08-26 | 1987-08-26 | Measuring instrument for density and thickness |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6454341A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8300905B2 (en) | 2005-11-18 | 2012-10-30 | General Electric Company | Adaptive image processing and display for digital and computed radiography images |
CN103687542A (en) * | 2011-10-07 | 2014-03-26 | 株式会社东芝 | X-ray diagnostic device and dosage administration method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5850412A (en) * | 1981-09-22 | 1983-03-24 | Rigaku Denki Kogyo Kk | Method for measuring film thickness of metal film or amount of inclusion of each element in metal film |
JPS6249780B2 (en) * | 1978-07-14 | 1987-10-21 | Fujitsu Ltd |
-
1987
- 1987-08-26 JP JP62210343A patent/JPS6454341A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6249780B2 (en) * | 1978-07-14 | 1987-10-21 | Fujitsu Ltd | |
JPS5850412A (en) * | 1981-09-22 | 1983-03-24 | Rigaku Denki Kogyo Kk | Method for measuring film thickness of metal film or amount of inclusion of each element in metal film |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8300905B2 (en) | 2005-11-18 | 2012-10-30 | General Electric Company | Adaptive image processing and display for digital and computed radiography images |
CN103687542A (en) * | 2011-10-07 | 2014-03-26 | 株式会社东芝 | X-ray diagnostic device and dosage administration method |
US9538977B2 (en) | 2011-10-07 | 2017-01-10 | Toshiba Medical Systems Corporation | X-ray diagnosis apparatus and dose distribution data generation method |
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