JPS56111438A - White-x-rays stress measuring device - Google Patents
White-x-rays stress measuring deviceInfo
- Publication number
- JPS56111438A JPS56111438A JP1362680A JP1362680A JPS56111438A JP S56111438 A JPS56111438 A JP S56111438A JP 1362680 A JP1362680 A JP 1362680A JP 1362680 A JP1362680 A JP 1362680A JP S56111438 A JPS56111438 A JP S56111438A
- Authority
- JP
- Japan
- Prior art keywords
- white
- rays
- multiplexer
- sample
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/25—Measuring force or stress, in general using wave or particle radiation, e.g. X-rays, microwaves, neutrons
Landscapes
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To improve the stress measurement efficiency and measurement precision of a stress measuring device by constituting amplification and processing sytem in one system by using a couple of detectors formed from the same single crystal and having the same characteristics. CONSTITUTION:White X-rays radiated from white-X-rays source 2 strike sample 3 and are diffracted by sample 3. Those diffracted X-rays are detected by semiconductor detectors 4 and 5 made of the same single crystal. Their detection signals, after amplified by preamplifiers 6 and 7, are inputted to main amplifier 9 via the 1st multiplexer 8. The amplified signal is inputted to multichannel analyzer 11 for an energy analysis via the 2nd multiplexer synchronized with the 1st multiplexer 8. Analysis values of it are stored in memories 12 and 13 respectively and the stored values, when showing sufficient energy, are outputted to and analyzed by computer 14 to obtain the stress value of the sample. Thus, the efficiency and precision of the measurement can be improved.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1362680A JPS56111438A (en) | 1980-02-08 | 1980-02-08 | White-x-rays stress measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1362680A JPS56111438A (en) | 1980-02-08 | 1980-02-08 | White-x-rays stress measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56111438A true JPS56111438A (en) | 1981-09-03 |
Family
ID=11838439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1362680A Pending JPS56111438A (en) | 1980-02-08 | 1980-02-08 | White-x-rays stress measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56111438A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2409271A (en) * | 2000-08-03 | 2005-06-22 | Cambridge Imaging Ltd | X-ray inspection and material discrimination |
| US7502442B2 (en) | 2002-01-28 | 2009-03-10 | Smiths Heimann Gmbh | X-ray inspection system and method |
| CN110715946A (en) * | 2019-09-19 | 2020-01-21 | 西安交通大学 | Single crystal stress tensor measurement method based on monochromatic X-ray diffraction |
-
1980
- 1980-02-08 JP JP1362680A patent/JPS56111438A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2409271A (en) * | 2000-08-03 | 2005-06-22 | Cambridge Imaging Ltd | X-ray inspection and material discrimination |
| GB2409271B (en) * | 2000-08-03 | 2005-09-21 | Cambridge Imaging Ltd | Improvements in and relating to material identification using x-rays |
| US7502442B2 (en) | 2002-01-28 | 2009-03-10 | Smiths Heimann Gmbh | X-ray inspection system and method |
| CN110715946A (en) * | 2019-09-19 | 2020-01-21 | 西安交通大学 | Single crystal stress tensor measurement method based on monochromatic X-ray diffraction |
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