JPS56111438A - White-x-rays stress measuring device - Google Patents

White-x-rays stress measuring device

Info

Publication number
JPS56111438A
JPS56111438A JP1362680A JP1362680A JPS56111438A JP S56111438 A JPS56111438 A JP S56111438A JP 1362680 A JP1362680 A JP 1362680A JP 1362680 A JP1362680 A JP 1362680A JP S56111438 A JPS56111438 A JP S56111438A
Authority
JP
Japan
Prior art keywords
white
rays
multiplexer
sample
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1362680A
Other languages
Japanese (ja)
Inventor
Makoto Hayashi
Sadao Nemoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1362680A priority Critical patent/JPS56111438A/en
Publication of JPS56111438A publication Critical patent/JPS56111438A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/25—Measuring force or stress, in general using wave or particle radiation, e.g. X-rays, microwaves, neutrons

Landscapes

  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To improve the stress measurement efficiency and measurement precision of a stress measuring device by constituting amplification and processing sytem in one system by using a couple of detectors formed from the same single crystal and having the same characteristics. CONSTITUTION:White X-rays radiated from white-X-rays source 2 strike sample 3 and are diffracted by sample 3. Those diffracted X-rays are detected by semiconductor detectors 4 and 5 made of the same single crystal. Their detection signals, after amplified by preamplifiers 6 and 7, are inputted to main amplifier 9 via the 1st multiplexer 8. The amplified signal is inputted to multichannel analyzer 11 for an energy analysis via the 2nd multiplexer synchronized with the 1st multiplexer 8. Analysis values of it are stored in memories 12 and 13 respectively and the stored values, when showing sufficient energy, are outputted to and analyzed by computer 14 to obtain the stress value of the sample. Thus, the efficiency and precision of the measurement can be improved.
JP1362680A 1980-02-08 1980-02-08 White-x-rays stress measuring device Pending JPS56111438A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1362680A JPS56111438A (en) 1980-02-08 1980-02-08 White-x-rays stress measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1362680A JPS56111438A (en) 1980-02-08 1980-02-08 White-x-rays stress measuring device

Publications (1)

Publication Number Publication Date
JPS56111438A true JPS56111438A (en) 1981-09-03

Family

ID=11838439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1362680A Pending JPS56111438A (en) 1980-02-08 1980-02-08 White-x-rays stress measuring device

Country Status (1)

Country Link
JP (1) JPS56111438A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2409271A (en) * 2000-08-03 2005-06-22 Cambridge Imaging Ltd X-ray inspection and material discrimination
US7502442B2 (en) 2002-01-28 2009-03-10 Smiths Heimann Gmbh X-ray inspection system and method
CN110715946A (en) * 2019-09-19 2020-01-21 西安交通大学 Single crystal stress tensor measurement method based on monochromatic X-ray diffraction

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2409271A (en) * 2000-08-03 2005-06-22 Cambridge Imaging Ltd X-ray inspection and material discrimination
GB2409271B (en) * 2000-08-03 2005-09-21 Cambridge Imaging Ltd Improvements in and relating to material identification using x-rays
US7502442B2 (en) 2002-01-28 2009-03-10 Smiths Heimann Gmbh X-ray inspection system and method
CN110715946A (en) * 2019-09-19 2020-01-21 西安交通大学 Single crystal stress tensor measurement method based on monochromatic X-ray diffraction

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