JPS6454338A - Surface defect inspection instrument - Google Patents

Surface defect inspection instrument

Info

Publication number
JPS6454338A
JPS6454338A JP21232487A JP21232487A JPS6454338A JP S6454338 A JPS6454338 A JP S6454338A JP 21232487 A JP21232487 A JP 21232487A JP 21232487 A JP21232487 A JP 21232487A JP S6454338 A JPS6454338 A JP S6454338A
Authority
JP
Japan
Prior art keywords
level signal
light
shade
prescribed range
defect part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP21232487A
Other languages
Japanese (ja)
Other versions
JP2508122B2 (en
Inventor
Masato Sakakibara
Kazuo Fujimori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Motor Corp
Original Assignee
Toyota Motor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Motor Corp filed Critical Toyota Motor Corp
Priority to JP62212324A priority Critical patent/JP2508122B2/en
Publication of JPS6454338A publication Critical patent/JPS6454338A/en
Application granted granted Critical
Publication of JP2508122B2 publication Critical patent/JP2508122B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To inspect whether or not there is a defect in the surface of a body objectively, quantitatively, and automatically by projecting a predetermined light-shade stripe pattern on the surface to be inspected by a light-shade pattern projecting means. CONSTITUTION:An image pickup means M2 picks up an image of the light-shade strip pattern projected on the surface to be measured by the light-shade pattern projecting means M1 as a light intensity level signal. An output control means M3 controls the input light quantity or output level of the means M2 according to the intensity of the image pickup output level signal to put the value of the output level signal within a prescribed range. A defect part extracting means M4 extracts the defect part in the object surface according to the level signal outputted by the controlled means M2. Consequently, the level of the light intensity level signal outputted by the means M2 is put in the prescribed range regardless of a difference in the paint color of the object surface and the defect part in the object surface is extracted automatically from the level signal within the prescribed range.
JP62212324A 1987-08-26 1987-08-26 Surface defect inspection equipment Expired - Lifetime JP2508122B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62212324A JP2508122B2 (en) 1987-08-26 1987-08-26 Surface defect inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62212324A JP2508122B2 (en) 1987-08-26 1987-08-26 Surface defect inspection equipment

Publications (2)

Publication Number Publication Date
JPS6454338A true JPS6454338A (en) 1989-03-01
JP2508122B2 JP2508122B2 (en) 1996-06-19

Family

ID=16620653

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62212324A Expired - Lifetime JP2508122B2 (en) 1987-08-26 1987-08-26 Surface defect inspection equipment

Country Status (1)

Country Link
JP (1) JP2508122B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5894345A (en) * 1996-05-22 1999-04-13 Matsushita Electric Industrial Co., Ltd. Optical method of detecting defect and apparatus used therein
CN109459447A (en) * 2018-11-23 2019-03-12 菲特（天津）检测技术有限公司 Illuminating source structure, column workpiece detection device and detection method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58206908A (en) * 1982-05-28 1983-12-02 Dainippon Printing Co Ltd Detection of ruggedness on finished surface
JPS62135753A (en) * 1985-12-10 1987-06-18 Omron Tateisi Electronics Co Defect detecting device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58206908A (en) * 1982-05-28 1983-12-02 Dainippon Printing Co Ltd Detection of ruggedness on finished surface
JPS62135753A (en) * 1985-12-10 1987-06-18 Omron Tateisi Electronics Co Defect detecting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5894345A (en) * 1996-05-22 1999-04-13 Matsushita Electric Industrial Co., Ltd. Optical method of detecting defect and apparatus used therein
CN109459447A (en) * 2018-11-23 2019-03-12 菲特（天津）检测技术有限公司 Illuminating source structure, column workpiece detection device and detection method
CN109459447B (en) * 2018-11-23 2023-09-12 菲特（天津）检测技术有限公司 Luminous light source structure, cylindrical workpiece detection device and detection method

Also Published As

Publication number Publication date
JP2508122B2 (en) 1996-06-19

Similar Documents

Publication Publication Date Title
GB2170593B (en) Temperature measurement
DE3270572D1 (en) Improvements in or relating to the measurement of the size of particles
JPS57211044A (en) Inspecting device
ATE52331T1 (en) METHOD AND DEVICE FOR DETECTING MEASURING VARIABLES.
JPS55142254A (en) Inspecting method for pattern of printed wiring board
JPS5658676A (en) Inspection device
JPS55125439A (en) Defect inspection device
JPS6454338A (en) Surface defect inspection instrument
EP0316624A3 (en) Improved imaging and inspection apparatus and method
JPS5478191A (en) Detecting method of defect of rice grains
DE3377163D1 (en) Method and device for measuring the brightness of a colour
JPS5379594A (en) Surface inspecting apparatus of objects
ES8305929A1 (en) Method and device for the inspection of transparent material sheets.
JPS56132508A (en) Pattern measuring device
JPS5624535A (en) Method and device for measuring color
JPS54141661A (en) Assignment system of inspection area
JPS53131848A (en) Surface defect detector of photoreceptor
JPS57101742A (en) Optical concentration meter
JPS5566741A (en) Inspection device for board material having positive penetrating characteristic
JPS56110059A (en) Automatic inspecting device for printed wiring board
JPS56126741A (en) Device for projecting and receiving light
JPS5484787A (en) Surface inspector
JPS5550582A (en) Device for measuring electrolyte leakage of battery
GB1482462A (en) Photographic testing method
JPS56157555A (en) Correcting method for sensitivity of pattern detection

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term
FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 12

Free format text: PAYMENT UNTIL: 20080416