JPS6453129A - Creep testing machine - Google Patents

Creep testing machine

Info

Publication number
JPS6453129A
JPS6453129A JP21104187A JP21104187A JPS6453129A JP S6453129 A JPS6453129 A JP S6453129A JP 21104187 A JP21104187 A JP 21104187A JP 21104187 A JP21104187 A JP 21104187A JP S6453129 A JPS6453129 A JP S6453129A
Authority
JP
Japan
Prior art keywords
test
load
piece
set value
elapsed time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21104187A
Other languages
Japanese (ja)
Inventor
Munesada Soma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP21104187A priority Critical patent/JPS6453129A/en
Publication of JPS6453129A publication Critical patent/JPS6453129A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE:To increase and decrease a load automatically and to conduct a test efficiently by adjusting the length of a weight chain suspended on the load side of a test-piece to its folding point and increasing or decreasing the load weight when a measured strain quantity or elapsed time reaches a set value. CONSTITUTION:When the strain quantity measured by a strain measuring means 101 or elapsed time reaches the set value, a control means 105 drives a length adjusting means 104 to adjust the length of the weight chain 103 suspended on the load side of the test-piece TP to its folding point P, thereby increasing or decreasing the load placed by the weight chain 103. This constitution increases or decreases the specific load automatically when the strain quantity of the test-piece TP or elapsed time reaches the set value, thereby improving the test efficiency.
JP21104187A 1987-08-24 1987-08-24 Creep testing machine Pending JPS6453129A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21104187A JPS6453129A (en) 1987-08-24 1987-08-24 Creep testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21104187A JPS6453129A (en) 1987-08-24 1987-08-24 Creep testing machine

Publications (1)

Publication Number Publication Date
JPS6453129A true JPS6453129A (en) 1989-03-01

Family

ID=16599394

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21104187A Pending JPS6453129A (en) 1987-08-24 1987-08-24 Creep testing machine

Country Status (1)

Country Link
JP (1) JPS6453129A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002097399A1 (en) * 2001-05-31 2002-12-05 Nihon University School Juridical Person Universal material testing method and device therefor
WO2004068118A1 (en) * 2003-01-31 2004-08-12 Nihon University Method of detecting yield point of solid material, and device used therefor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002097399A1 (en) * 2001-05-31 2002-12-05 Nihon University School Juridical Person Universal material testing method and device therefor
JP2002357522A (en) * 2001-05-31 2002-12-13 Univ Nihon Method and apparatus for universal material test
US7021155B2 (en) 2001-05-31 2006-04-04 Nihon University School Juridical Person Universal material testing method and device therefor
WO2004068118A1 (en) * 2003-01-31 2004-08-12 Nihon University Method of detecting yield point of solid material, and device used therefor

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