JPS645175U - - Google Patents

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Publication number
JPS645175U
JPS645175U JP10057687U JP10057687U JPS645175U JP S645175 U JPS645175 U JP S645175U JP 10057687 U JP10057687 U JP 10057687U JP 10057687 U JP10057687 U JP 10057687U JP S645175 U JPS645175 U JP S645175U
Authority
JP
Japan
Prior art keywords
drive
drive circuits
test
output terminal
active state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10057687U
Other languages
Japanese (ja)
Other versions
JPH0650789Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10057687U priority Critical patent/JPH0650789Y2/en
Publication of JPS645175U publication Critical patent/JPS645175U/ja
Application granted granted Critical
Publication of JPH0650789Y2 publication Critical patent/JPH0650789Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を示すブロツク図
、第2図及び第3図はこの考案の動作を説明する
ための波形図、第4図はこの考案の要部の具体的
な構成を示す接続図、第5図はこの考案の要部の
変形例を示す接続図、第6図は出力段の変形例を
示す接続図、第7図は従来の技術を説明するため
の接続図である。 1……被試験IC、12……ICテスト用駆動
装置、13……駆動段、13A〜13N……駆動
回路、14……出力段、15……デイジタルデー
タ記憶手段、16,17……入力端子、18……
出力端子。
Fig. 1 is a block diagram showing an embodiment of this invention, Figs. 2 and 3 are waveform diagrams for explaining the operation of this invention, and Fig. 4 shows the specific configuration of the main parts of this invention. 5 is a connection diagram showing a modification of the main part of this invention, FIG. 6 is a connection diagram showing a modification of the output stage, and FIG. 7 is a connection diagram for explaining the conventional technology. be. DESCRIPTION OF SYMBOLS 1...IC under test, 12...Drive device for IC test, 13...Drive stage, 13A to 13N...Drive circuit, 14...Output stage, 15...Digital data storage means, 16, 17...Input Terminal, 18...
Output terminal.

Claims (1)

【実用新案登録請求の範囲】 A 論理信号によつて出力端子が高インピーダン
ス状態と能動状態に制御することができ、各入力
端子及び各出力端子を共通に接続した複数の駆動
回路によつて構成した駆動段と、 B この駆動段を構成する複数の駆動回路に論理
信号を与え、複数の駆動回路を選択的に能動状態
に制御するデイジタルデータ記憶手段と、 C 上記駆動段の出力によつて駆動され、被試験
ICに試験信号を与える出力段と、 によつて構成したICテスト用駆動装置。
[Claims for Utility Model Registration] A. An output terminal can be controlled into a high impedance state and an active state by a logic signal, and is composed of a plurality of drive circuits to which each input terminal and each output terminal are commonly connected. B) a digital data storage means for applying a logic signal to a plurality of drive circuits constituting this drive stage and selectively controlling the plurality of drive circuits to an active state; An IC test drive device comprising: an output stage that is driven and provides a test signal to an IC under test;
JP10057687U 1987-06-29 1987-06-29 IC test drive Expired - Lifetime JPH0650789Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10057687U JPH0650789Y2 (en) 1987-06-29 1987-06-29 IC test drive

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10057687U JPH0650789Y2 (en) 1987-06-29 1987-06-29 IC test drive

Publications (2)

Publication Number Publication Date
JPS645175U true JPS645175U (en) 1989-01-12
JPH0650789Y2 JPH0650789Y2 (en) 1994-12-21

Family

ID=31328776

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10057687U Expired - Lifetime JPH0650789Y2 (en) 1987-06-29 1987-06-29 IC test drive

Country Status (1)

Country Link
JP (1) JPH0650789Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7513913B2 (en) 1997-12-29 2009-04-07 Gerd Hoermansdoerfer Hobble turning method and preferred applications for said method
JP2019207253A (en) * 2016-03-18 2019-12-05 アナログ ディヴァイスィズ インク Segmented pin driver system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7513913B2 (en) 1997-12-29 2009-04-07 Gerd Hoermansdoerfer Hobble turning method and preferred applications for said method
JP2019207253A (en) * 2016-03-18 2019-12-05 アナログ ディヴァイスィズ インク Segmented pin driver system
US11300608B2 (en) 2016-03-18 2022-04-12 Analog Devices, Inc. Segmented pin driver system

Also Published As

Publication number Publication date
JPH0650789Y2 (en) 1994-12-21

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