JPS6450973A - Device measuring apparatus - Google Patents
Device measuring apparatusInfo
- Publication number
- JPS6450973A JPS6450973A JP20784387A JP20784387A JPS6450973A JP S6450973 A JPS6450973 A JP S6450973A JP 20784387 A JP20784387 A JP 20784387A JP 20784387 A JP20784387 A JP 20784387A JP S6450973 A JPS6450973 A JP S6450973A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- terminal
- waveform
- transformer
- generating means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE:To more reduce the error due to looping, by generating an AC voltage waveform by a waveform generating means. CONSTITUTION:An AC voltage waveform slow in change in the vicinity of an earth level is generated by a waveform generating means 10. Next, a transformer 12 receives the AC voltage waveform from the waveform generating means 10 in its primary winding. Subsequently, a selective rectifying circuit 14 rectifies the output voltage from one terminal of the secondary winding of the transformer 12 and the rectified output voltage is applied to the other terminal of an element 18 to be measured earthed at one terminal thereof. Further, a voltage detection means 24 detects the voltage between both terminals of the device 18 to be measured. Further, the current detection means (constituted of a resistor 20 and a voltage detection circuit 30) inserted between the other terminal of the secondary winding of the transformer and earth is mounted. By this constitution, the error due to looping can be reduced.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62207843A JPH0721527B2 (en) | 1987-08-21 | 1987-08-21 | Element measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62207843A JPH0721527B2 (en) | 1987-08-21 | 1987-08-21 | Element measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6450973A true JPS6450973A (en) | 1989-02-27 |
JPH0721527B2 JPH0721527B2 (en) | 1995-03-08 |
Family
ID=16546447
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62207843A Expired - Lifetime JPH0721527B2 (en) | 1987-08-21 | 1987-08-21 | Element measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0721527B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013231724A (en) * | 2012-04-30 | 2013-11-14 | Agilent Technologies Inc | Power device analyzer |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5223222A (en) * | 1975-08-15 | 1977-02-22 | Hitachi Ltd | Code plate |
-
1987
- 1987-08-21 JP JP62207843A patent/JPH0721527B2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5223222A (en) * | 1975-08-15 | 1977-02-22 | Hitachi Ltd | Code plate |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013231724A (en) * | 2012-04-30 | 2013-11-14 | Agilent Technologies Inc | Power device analyzer |
Also Published As
Publication number | Publication date |
---|---|
JPH0721527B2 (en) | 1995-03-08 |
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