JPS6448682U - - Google Patents
Info
- Publication number
- JPS6448682U JPS6448682U JP14525187U JP14525187U JPS6448682U JP S6448682 U JPS6448682 U JP S6448682U JP 14525187 U JP14525187 U JP 14525187U JP 14525187 U JP14525187 U JP 14525187U JP S6448682 U JPS6448682 U JP S6448682U
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- test device
- temperature air
- diameter conversion
- electronic components
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006243 chemical reaction Methods 0.000 claims description 5
- 229920000742 Cotton Polymers 0.000 claims description 2
- 238000012216 screening Methods 0.000 claims 2
- 230000005540 biological transmission Effects 0.000 claims 1
- 230000006698 induction Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000007664 blowing Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図は本考案の一実施例の全体構成図、第２
図は第１図で用いた送風ガイドの平面図および部
分断面図、第３図は本考案の他の実施例の全体構
成図、第４図は従来の実施例の全体構成図である
。
１…高低温供給試験装置、２…ホース、３…ア
ーム、４…キヤツプ、５…供試品（大規模集積回
路）、６…試験インタフエース台、７…インタフ
エースボード、８…インタフエース電子回路、９
…送風ガイド円筒フツク部、１０…Ｌ型ガイド円
筒部、１１…絶縁板、１２…高低温ガイド口径変
換部、１３…高低温誘導管、１４…熱遮断綿、１
５…ケーブル、１６…試験点検設備、１７…接触
型マイクロスイツチ。
Figure 1 is an overall configuration diagram of an embodiment of the present invention, Figure 2
The figures are a plan view and a partial sectional view of the air blowing guide used in FIG. 1, FIG. 3 is an overall configuration diagram of another embodiment of the present invention, and FIG. 4 is an overall configuration diagram of a conventional embodiment. 1...High and low temperature supply test equipment, 2...Hose, 3...Arm, 4...Cap, 5...Specimen (large-scale integrated circuit), 6...Test interface stand, 7...Interface board, 8...Interface electronics circuit, 9
...Blower guide cylindrical hook part, 10...L-shaped guide cylindrical part, 11...Insulating plate, 12...High and low temperature guide diameter conversion part, 13...High and low temperature guide tube, 14...Heat-insulating cotton, 1
5... Cable, 16... Test and inspection equipment, 17... Contact type micro switch.
Claims (1)
送風ガイドが逆Ｌ型取付部を有し、高低温風の伝
送変換部分は口径変換構造を有し、口径変換部分
と高低温誘導管の外周には熱遮断綿を有し、又、
高低温供給試験装置から発生した高温又は低温風
を供試品を経て、高低温送風ガイド円筒により試
験室外ににがす構造となていることを特徴とする
電子部品の温度選別試験装置。 In a temperature screening test device for electronic components, the high-temperature air blower guide has an inverted L-shaped attachment part, the transmission conversion part of the high-temperature air has a diameter conversion structure, and the diameter conversion part and the outer periphery of the high-temperature induction tube have a diameter conversion structure. It has heat-insulating cotton, and
A temperature screening test device for electronic components, characterized by having a structure in which high-temperature or low-temperature air generated from the high-temperature supply test device passes through the specimen and is directed out of the test chamber by a high-temperature air guide cylinder.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14525187U JPS6448682U (en) | 1987-09-21 | 1987-09-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14525187U JPS6448682U (en) | 1987-09-21 | 1987-09-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6448682U true JPS6448682U (en) | 1989-03-27 |
Family
ID=31413680
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14525187U Pending JPS6448682U (en) | 1987-09-21 | 1987-09-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6448682U (en) |
-
1987
- 1987-09-21 JP JP14525187U patent/JPS6448682U/ja active Pending
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