JPH0459943U - - Google Patents
Info
- Publication number
- JPH0459943U JPH0459943U JP10239290U JP10239290U JPH0459943U JP H0459943 U JPH0459943 U JP H0459943U JP 10239290 U JP10239290 U JP 10239290U JP 10239290 U JP10239290 U JP 10239290U JP H0459943 U JPH0459943 U JP H0459943U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- support portion
- pressing
- block
- contact part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は本考案の一実施例に係る半導体装置の
試験装置の縦断面図、第２図は同実施例の試験装
置の閉動作状態を示す縦断面図、第３図はその側
面図、第４図は従来例図である。
１０……試験用ソケツト、１１……下ブロツク
、１２……上ブロツク、１４……支持部、１６…
…押圧部、２０……半導体装置、２２……リード
、３０……下側コンタクト部、３１……上側コン
タクト部。
FIG. 1 is a vertical cross-sectional view of a semiconductor device testing apparatus according to an embodiment of the present invention, FIG. 2 is a vertical cross-sectional view showing the test apparatus of the same embodiment in a closed operation state, and FIG. 3 is a side view thereof. FIG. 4 is a diagram of a conventional example. DESCRIPTION OF SYMBOLS 10... Test socket, 11... Lower block, 12... Upper block, 14... Support part, 16...
...Press portion, 20...Semiconductor device, 22...Lead, 30...Lower contact portion, 31...Upper contact portion.
Claims (1)
持された半導体装置から導出する各リードに対応
して該リードに弾性接触する下側コンタクト部と
を有する下ブロツクと、上記支持部に支持された
半導体装置を押圧固定する押圧部と、上記下側コ
ンタクト部に対応して設けられ上記リードに弾性
接触する上側コンタクト部とを有する開閉自在な
上ブロツクとよりなることを特徴とする半導体装
置の試験装置。 a lower block having a support portion for supporting a semiconductor device; a lower contact portion for elastically contacting each lead leading out from the semiconductor device supported by the support portion; A semiconductor device comprising: an openable and closable upper block having a pressing part for pressing and fixing a semiconductor device; and an upper contact part provided corresponding to the lower contact part and making elastic contact with the leads. Test equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10239290U JPH0459943U (en) | 1990-09-28 | 1990-09-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10239290U JPH0459943U (en) | 1990-09-28 | 1990-09-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0459943U true JPH0459943U (en) | 1992-05-22 |
Family
ID=31846611
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10239290U Pending JPH0459943U (en) | 1990-09-28 | 1990-09-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0459943U (en) |
-
1990
- 1990-09-28 JP JP10239290U patent/JPH0459943U/ja active Pending
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